Abstract

We report that a narrow guided-mode resonance (GMR) filter with high-index substrate can be achieved by introducing an added layer on the substrate. For this type of GMR filter, the refractive index and thickness of the added layer are the critical parameters for the GMR effect to occur. We demonstrate that this filter has good fabrication tolerances for the grating thickness and fill factor. Our design may promote the application of GMR filters in practice.

© 2012 Optical Society of America

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2011

2010

2009

2008

2006

R. Magnusson and Y. Ding, IEEE Photon. Technol. Lett. 18, 1479 (2006).
[CrossRef]

2005

T. Kobayashi, Y. Kanamori, and K. Hane, Appl. Phys. Lett. 87, 151106 (2005).
[CrossRef]

A. Mizutani, H. Kikuta, and K. Iwata, J. Opt. Soc. Am. A 22, 355 (2005).
[CrossRef]

2004

Y. Ding and R. Magnusson, Opt. Express 12, 5661 (2004).
[CrossRef]

C. F. R. Mateus, M. C. Y. Huang, Y. F. Deng, A. R. Neureuther, and C. J. C. Hasnain, IEEE Photon. Technol. Lett. 16, 518 (2004).
[CrossRef]

C. F. R. Mateus, M. C. Y. Huang, L. Chen, C. J. C. Hasnain, and Y. Suzuki, IEEE Photon. Technol. Lett. 16, 1676 (2004).
[CrossRef]

2003

P. S. Priambodo, T. A. Maldonado, and R. Magnusson, Appl. Phys. Lett. 83, 3248 (2003).
[CrossRef]

2000

D. Wawro, S. Tibuleac, R. Magnusson, and H. Liu, Proc. SPIE 3911, 86 (2000).
[CrossRef]

1997

1995

1992

R. Magnusson and S. S. Wang, Appl. Phys. Lett. 61, 1022 (1992).
[CrossRef]

Alasaarela, T.

Bae, B. S.

Bai, B.

Chang, J. Y.

Chen, L.

C. F. R. Mateus, M. C. Y. Huang, L. Chen, C. J. C. Hasnain, and Y. Suzuki, IEEE Photon. Technol. Lett. 16, 1676 (2004).
[CrossRef]

Choi, K. H.

Deng, Y. F.

C. F. R. Mateus, M. C. Y. Huang, Y. F. Deng, A. R. Neureuther, and C. J. C. Hasnain, IEEE Photon. Technol. Lett. 16, 518 (2004).
[CrossRef]

Ding, Y.

R. Magnusson and Y. Ding, IEEE Photon. Technol. Lett. 18, 1479 (2006).
[CrossRef]

Y. Ding and R. Magnusson, Opt. Express 12, 5661 (2004).
[CrossRef]

Foland, S.

Friesem, A. A.

Gaylord, T. K.

Grann, E. B.

Guo, H.

Hane, K.

T. Kobayashi, Y. Kanamori, and K. Hane, Appl. Phys. Lett. 87, 151106 (2005).
[CrossRef]

Hasnain, C. J. C.

C. F. R. Mateus, M. C. Y. Huang, L. Chen, C. J. C. Hasnain, and Y. Suzuki, IEEE Photon. Technol. Lett. 16, 1676 (2004).
[CrossRef]

C. F. R. Mateus, M. C. Y. Huang, Y. F. Deng, A. R. Neureuther, and C. J. C. Hasnain, IEEE Photon. Technol. Lett. 16, 518 (2004).
[CrossRef]

Honkanen, S.

Hsu, C. L.

Huang, L.

Huang, M. C. Y.

C. F. R. Mateus, M. C. Y. Huang, Y. F. Deng, A. R. Neureuther, and C. J. C. Hasnain, IEEE Photon. Technol. Lett. 16, 518 (2004).
[CrossRef]

C. F. R. Mateus, M. C. Y. Huang, L. Chen, C. J. C. Hasnain, and Y. Suzuki, IEEE Photon. Technol. Lett. 16, 1676 (2004).
[CrossRef]

Iwata, K.

Jin, J.

Kanamori, Y.

T. Kobayashi, Y. Kanamori, and K. Hane, Appl. Phys. Lett. 87, 151106 (2005).
[CrossRef]

Kikuta, H.

Kobayashi, T.

T. Kobayashi, Y. Kanamori, and K. Hane, Appl. Phys. Lett. 87, 151106 (2005).
[CrossRef]

Kuittinen, M.

Lai, Z.

Lee, C. C.

Lee, J. B.

Lee, K. J.

Liu, H.

D. Wawro, S. Tibuleac, R. Magnusson, and H. Liu, Proc. SPIE 3911, 86 (2000).
[CrossRef]

Liu, W.

Liu, Y.

Magnusson, R.

K. J. Lee, J. Jin, B. S. Bae, and R. Magnusson, Opt. Lett. 34, 2510 (2009).
[CrossRef]

M. Shokooh-Saremi and R. Magnusson, Opt. Express 16, 18249 (2008).
[CrossRef]

R. Magnusson and Y. Ding, IEEE Photon. Technol. Lett. 18, 1479 (2006).
[CrossRef]

Y. Ding and R. Magnusson, Opt. Express 12, 5661 (2004).
[CrossRef]

P. S. Priambodo, T. A. Maldonado, and R. Magnusson, Appl. Phys. Lett. 83, 3248 (2003).
[CrossRef]

D. Wawro, S. Tibuleac, R. Magnusson, and H. Liu, Proc. SPIE 3911, 86 (2000).
[CrossRef]

S. Tibuleac and R. Magnusson, J. Opt. Soc. Am. A 14, 1617 (1997).
[CrossRef]

R. Magnusson and S. S. Wang, Appl. Phys. Lett. 61, 1022 (1992).
[CrossRef]

Maldonado, T. A.

P. S. Priambodo, T. A. Maldonado, and R. Magnusson, Appl. Phys. Lett. 83, 3248 (2003).
[CrossRef]

Mateus, C. F. R.

C. F. R. Mateus, M. C. Y. Huang, Y. F. Deng, A. R. Neureuther, and C. J. C. Hasnain, IEEE Photon. Technol. Lett. 16, 518 (2004).
[CrossRef]

C. F. R. Mateus, M. C. Y. Huang, L. Chen, C. J. C. Hasnain, and Y. Suzuki, IEEE Photon. Technol. Lett. 16, 1676 (2004).
[CrossRef]

Mizutani, A.

Moharam, M. G.

Neureuther, A. R.

C. F. R. Mateus, M. C. Y. Huang, Y. F. Deng, A. R. Neureuther, and C. J. C. Hasnain, IEEE Photon. Technol. Lett. 16, 518 (2004).
[CrossRef]

Pommet, D. A.

Priambodo, P. S.

P. S. Priambodo, T. A. Maldonado, and R. Magnusson, Appl. Phys. Lett. 83, 3248 (2003).
[CrossRef]

Priimagi, A.

Rosenblatt, D.

Sharon, A.

Shokooh-Saremi, M.

Suzuki, Y.

C. F. R. Mateus, M. C. Y. Huang, L. Chen, C. J. C. Hasnain, and Y. Suzuki, IEEE Photon. Technol. Lett. 16, 1676 (2004).
[CrossRef]

Tervonen, A.

Tibuleac, S.

D. Wawro, S. Tibuleac, R. Magnusson, and H. Liu, Proc. SPIE 3911, 86 (2000).
[CrossRef]

S. Tibuleac and R. Magnusson, J. Opt. Soc. Am. A 14, 1617 (1997).
[CrossRef]

Tsai, Y. L.

Tu, Z. R.

Turunen, J.

Wang, C. M.

Wang, S. S.

R. Magnusson and S. S. Wang, Appl. Phys. Lett. 61, 1022 (1992).
[CrossRef]

Wawro, D.

D. Wawro, S. Tibuleac, R. Magnusson, and H. Liu, Proc. SPIE 3911, 86 (2000).
[CrossRef]

Wu, M. L.

Zheng, D.

Appl. Phys. Lett.

R. Magnusson and S. S. Wang, Appl. Phys. Lett. 61, 1022 (1992).
[CrossRef]

T. Kobayashi, Y. Kanamori, and K. Hane, Appl. Phys. Lett. 87, 151106 (2005).
[CrossRef]

P. S. Priambodo, T. A. Maldonado, and R. Magnusson, Appl. Phys. Lett. 83, 3248 (2003).
[CrossRef]

IEEE Photon. Technol. Lett.

C. F. R. Mateus, M. C. Y. Huang, Y. F. Deng, A. R. Neureuther, and C. J. C. Hasnain, IEEE Photon. Technol. Lett. 16, 518 (2004).
[CrossRef]

C. F. R. Mateus, M. C. Y. Huang, L. Chen, C. J. C. Hasnain, and Y. Suzuki, IEEE Photon. Technol. Lett. 16, 1676 (2004).
[CrossRef]

R. Magnusson and Y. Ding, IEEE Photon. Technol. Lett. 18, 1479 (2006).
[CrossRef]

J. Opt. Soc. Am. A

Opt. Express

Opt. Lett.

Proc. SPIE

D. Wawro, S. Tibuleac, R. Magnusson, and H. Liu, Proc. SPIE 3911, 86 (2000).
[CrossRef]

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Figures (5)

Fig. 1.
Fig. 1.

Scheme of the triple-layer GMR filter with high-index substrate. The first layer is a grating, the second is a waveguide, and the waveguide layer and substrate are separated by an added layer. The added layer is critical for the GMR effect to occur.

Fig. 2.
Fig. 2.

Reflection response of the triple-layer GMR filter for a normal-incidence TE-polarized wave. The parameters are nc=1, ng=nw=1.97, nu=1.65, ns=2.14, f=0.2, Λ=0.351μm, dg=0.11μm, dw=0.3μm, and du=0.57μm.

Fig. 3.
Fig. 3.

Electric field distribution profile at the resonant wavelength of 0.6495 μm. White lines indicate the interfaces of the different layers.

Fig. 4.
Fig. 4.

Effect of the underlayer: reflection responses of the GMR filter for (a) various thicknesses and (b) refractive indices of the underlayer. The remaining parameters are the same as in Fig. 2.

Fig. 5.
Fig. 5.

Reflectivity as a function of wavelength and (a) grating thickness and (b) grating fill factor. The remaining parameters are the same as in Fig. 2.

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