Abstract

We propose a new method for three-dimensional (3D) position measurement of nanoparticles using an in-line digital holographic microscope. The method improves the signal-to-noise ratio of the amplitude of the interference fringes to achieve higher accuracy in the position measurement by increasing weak scattered light from a nanoparticle relative to the reference light by using a low spatial frequency attenuation filter. We demonstrated the improvements of signal-to-noise ratio of the optical system and contrast of the interference fringes, allowing the 3D positions of nanoparticles to be determined more precisely.

© 2012 Optical Society of America

Three-dimensional motion detection of a 20-nm gold nanoparticle using twilight-field digital holography with coherence regulation

Kazufumi Goto and Yoshio Hayasaki
Opt. Lett. 40(14) 3344-3347 (2015)

Three-dimensional subpixel estimation in holographic position measurement of an optically trapped nanoparticle

Akira Sato, Quang Duc Pham, Satoshi Hasegawa, and Yoshio Hayasaki
Appl. Opt. 52(1) A216-A222 (2013)

Three-dimensional positioning of optically trapped nanoparticles

Takayuki Higuchi, Quang Duc Pham, Satoshi Hasegawa, and Yoshio Hayasaki
Appl. Opt. 50(34) H183-H188 (2011)

High-accuracy three-dimensional position measurement of tens of micrometers size transparent microspheres using digital in-line holographic microscopy

Yong-Seok Choi and Sang-Joon Lee
Opt. Lett. 36(21) 4167-4169 (2011)

Full off-axis red-green-blue digital holographic microscope with LED illumination

F. Dubois and C. Yourassowsky
Opt. Lett. 37(12) 2190-2192 (2012)