Abstract

Photonic crystal slab cavities were investigated for increased light–matter interaction based on selective placement of sublattice hole sized defect holes inside L3 cavities. A multiple-hole defect (MHD) consisting of three defect holes placed in the regions of highest cavity mode field intensity were demonstrated through finite-difference time-domain simulations and experiments to exhibit the strongest light–matter interaction without introducing significant scattering losses. Compared to an L3 cavity without defect holes, these strategically designed three-hole MHD cavities presented higher quality factor and more than double the resonance wavelength shift upon exposure to a thin oxide and two small chemical molecules.

© 2012 Optical Society of America

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2010 (2)

C. Kang, C. T. Phare, Y. A. Vlasov, S. Assefa, and S. M. Weiss, Opt. Express 18, 27930 (2010).
[CrossRef]

B. Hatton, V. Kitaev, D. Perovic, G. Ozin, and J. Aizenberg, J. Mat. Chem. 20, 6009 (2010).
[CrossRef]

2008 (2)

X. Wei, C. Kang, M. Liscidini, G. Rong, S. T. Retterer, M. Patrini, J. E. Sipe, and S. M. Weiss, J. Appl. Phys. 104, 123113 (2008).
[CrossRef]

G. Rong, J. D. Ryckman, R. L. Mernaugh, and S. M. Weiss, Appl. Phys. Lett. 93, 161109 (2008).
[CrossRef]

2007 (3)

2004 (2)

H. Takano, Y. Akahane, T. Asano, and S. Noda, Appl. Phys. Lett. 84, 2226 (2004).
[CrossRef]

V. R. Almeida, Q. Xu, C. A. Barrios, and M. Lipson, Opt. Lett. 29, 1209 (2004).
[CrossRef]

2003 (2)

Y. Akahane, T. Asano, B. S. Song, and S. Noda, Nature 425, 944 (2003).
[CrossRef]

M. Loncar, A. Scherer, and Y. Qiu, Appl. Phys. Lett. 82, 4648 (2003).
[CrossRef]

Aizenberg, J.

B. Hatton, V. Kitaev, D. Perovic, G. Ozin, and J. Aizenberg, J. Mat. Chem. 20, 6009 (2010).
[CrossRef]

Akahane, Y.

H. Takano, Y. Akahane, T. Asano, and S. Noda, Appl. Phys. Lett. 84, 2226 (2004).
[CrossRef]

Y. Akahane, T. Asano, B. S. Song, and S. Noda, Nature 425, 944 (2003).
[CrossRef]

Almeida, V. R.

Asano, T.

Y. Takahashi, H. Hagino, Y. Tanaka, B. S. Song, T. Asano, and S. Noda, Opt. Express 15, 17206 (2007).
[CrossRef]

H. Takano, Y. Akahane, T. Asano, and S. Noda, Appl. Phys. Lett. 84, 2226 (2004).
[CrossRef]

Y. Akahane, T. Asano, B. S. Song, and S. Noda, Nature 425, 944 (2003).
[CrossRef]

Assefa, S.

C. Kang, C. T. Phare, Y. A. Vlasov, S. Assefa, and S. M. Weiss, Opt. Express 18, 27930 (2010).
[CrossRef]

J. Gao, X. Yang, C. W. Wong, W. M. J. Green, Y. Vlasov, and S. Assefa, in Conference on Lasers and Electro-Optics, OSA Technical Digest (CD) (Optical Society of America, 2009), paper CFE5.

Barrios, C. A.

Fauchet, P. M.

Gao, J.

J. Gao, X. Yang, C. W. Wong, W. M. J. Green, Y. Vlasov, and S. Assefa, in Conference on Lasers and Electro-Optics, OSA Technical Digest (CD) (Optical Society of America, 2009), paper CFE5.

Green, W. M. J.

J. Gao, X. Yang, C. W. Wong, W. M. J. Green, Y. Vlasov, and S. Assefa, in Conference on Lasers and Electro-Optics, OSA Technical Digest (CD) (Optical Society of America, 2009), paper CFE5.

Hagino, H.

Hatton, B.

B. Hatton, V. Kitaev, D. Perovic, G. Ozin, and J. Aizenberg, J. Mat. Chem. 20, 6009 (2010).
[CrossRef]

Kang, C.

C. Kang, C. T. Phare, Y. A. Vlasov, S. Assefa, and S. M. Weiss, Opt. Express 18, 27930 (2010).
[CrossRef]

X. Wei, C. Kang, M. Liscidini, G. Rong, S. T. Retterer, M. Patrini, J. E. Sipe, and S. M. Weiss, J. Appl. Phys. 104, 123113 (2008).
[CrossRef]

Kitaev, V.

B. Hatton, V. Kitaev, D. Perovic, G. Ozin, and J. Aizenberg, J. Mat. Chem. 20, 6009 (2010).
[CrossRef]

Lee, M.

Lee, M. R.

Lipson, M.

Liscidini, M.

X. Wei, C. Kang, M. Liscidini, G. Rong, S. T. Retterer, M. Patrini, J. E. Sipe, and S. M. Weiss, J. Appl. Phys. 104, 123113 (2008).
[CrossRef]

Loncar, M.

M. Loncar, A. Scherer, and Y. Qiu, Appl. Phys. Lett. 82, 4648 (2003).
[CrossRef]

Mernaugh, R. L.

G. Rong, J. D. Ryckman, R. L. Mernaugh, and S. M. Weiss, Appl. Phys. Lett. 93, 161109 (2008).
[CrossRef]

Noda, S.

Y. Takahashi, H. Hagino, Y. Tanaka, B. S. Song, T. Asano, and S. Noda, Opt. Express 15, 17206 (2007).
[CrossRef]

H. Takano, Y. Akahane, T. Asano, and S. Noda, Appl. Phys. Lett. 84, 2226 (2004).
[CrossRef]

Y. Akahane, T. Asano, B. S. Song, and S. Noda, Nature 425, 944 (2003).
[CrossRef]

Ozin, G.

B. Hatton, V. Kitaev, D. Perovic, G. Ozin, and J. Aizenberg, J. Mat. Chem. 20, 6009 (2010).
[CrossRef]

Patrini, M.

X. Wei, C. Kang, M. Liscidini, G. Rong, S. T. Retterer, M. Patrini, J. E. Sipe, and S. M. Weiss, J. Appl. Phys. 104, 123113 (2008).
[CrossRef]

Perovic, D.

B. Hatton, V. Kitaev, D. Perovic, G. Ozin, and J. Aizenberg, J. Mat. Chem. 20, 6009 (2010).
[CrossRef]

Phare, C. T.

Qiu, Y.

M. Loncar, A. Scherer, and Y. Qiu, Appl. Phys. Lett. 82, 4648 (2003).
[CrossRef]

Retterer, S. T.

X. Wei, C. Kang, M. Liscidini, G. Rong, S. T. Retterer, M. Patrini, J. E. Sipe, and S. M. Weiss, J. Appl. Phys. 104, 123113 (2008).
[CrossRef]

Rong, G.

X. Wei, C. Kang, M. Liscidini, G. Rong, S. T. Retterer, M. Patrini, J. E. Sipe, and S. M. Weiss, J. Appl. Phys. 104, 123113 (2008).
[CrossRef]

G. Rong, J. D. Ryckman, R. L. Mernaugh, and S. M. Weiss, Appl. Phys. Lett. 93, 161109 (2008).
[CrossRef]

Ryckman, J. D.

G. Rong, J. D. Ryckman, R. L. Mernaugh, and S. M. Weiss, Appl. Phys. Lett. 93, 161109 (2008).
[CrossRef]

Scherer, A.

M. Loncar, A. Scherer, and Y. Qiu, Appl. Phys. Lett. 82, 4648 (2003).
[CrossRef]

Sipe, J. E.

X. Wei, C. Kang, M. Liscidini, G. Rong, S. T. Retterer, M. Patrini, J. E. Sipe, and S. M. Weiss, J. Appl. Phys. 104, 123113 (2008).
[CrossRef]

Song, B. S.

Takahashi, Y.

Takano, H.

H. Takano, Y. Akahane, T. Asano, and S. Noda, Appl. Phys. Lett. 84, 2226 (2004).
[CrossRef]

Tanaka, Y.

Vlasov, Y.

J. Gao, X. Yang, C. W. Wong, W. M. J. Green, Y. Vlasov, and S. Assefa, in Conference on Lasers and Electro-Optics, OSA Technical Digest (CD) (Optical Society of America, 2009), paper CFE5.

Vlasov, Y. A.

Wei, X.

X. Wei, C. Kang, M. Liscidini, G. Rong, S. T. Retterer, M. Patrini, J. E. Sipe, and S. M. Weiss, J. Appl. Phys. 104, 123113 (2008).
[CrossRef]

Weiss, S. M.

C. Kang, C. T. Phare, Y. A. Vlasov, S. Assefa, and S. M. Weiss, Opt. Express 18, 27930 (2010).
[CrossRef]

X. Wei, C. Kang, M. Liscidini, G. Rong, S. T. Retterer, M. Patrini, J. E. Sipe, and S. M. Weiss, J. Appl. Phys. 104, 123113 (2008).
[CrossRef]

G. Rong, J. D. Ryckman, R. L. Mernaugh, and S. M. Weiss, Appl. Phys. Lett. 93, 161109 (2008).
[CrossRef]

Wong, C. W.

J. Gao, X. Yang, C. W. Wong, W. M. J. Green, Y. Vlasov, and S. Assefa, in Conference on Lasers and Electro-Optics, OSA Technical Digest (CD) (Optical Society of America, 2009), paper CFE5.

Xu, Q.

Yang, X.

J. Gao, X. Yang, C. W. Wong, W. M. J. Green, Y. Vlasov, and S. Assefa, in Conference on Lasers and Electro-Optics, OSA Technical Digest (CD) (Optical Society of America, 2009), paper CFE5.

Appl. Phys. Lett. (3)

H. Takano, Y. Akahane, T. Asano, and S. Noda, Appl. Phys. Lett. 84, 2226 (2004).
[CrossRef]

M. Loncar, A. Scherer, and Y. Qiu, Appl. Phys. Lett. 82, 4648 (2003).
[CrossRef]

G. Rong, J. D. Ryckman, R. L. Mernaugh, and S. M. Weiss, Appl. Phys. Lett. 93, 161109 (2008).
[CrossRef]

J. Appl. Phys. (1)

X. Wei, C. Kang, M. Liscidini, G. Rong, S. T. Retterer, M. Patrini, J. E. Sipe, and S. M. Weiss, J. Appl. Phys. 104, 123113 (2008).
[CrossRef]

J. Mat. Chem. (1)

B. Hatton, V. Kitaev, D. Perovic, G. Ozin, and J. Aizenberg, J. Mat. Chem. 20, 6009 (2010).
[CrossRef]

Nature (1)

Y. Akahane, T. Asano, B. S. Song, and S. Noda, Nature 425, 944 (2003).
[CrossRef]

Opt. Express (3)

Opt. Lett. (2)

Other (1)

J. Gao, X. Yang, C. W. Wong, W. M. J. Green, Y. Vlasov, and S. Assefa, in Conference on Lasers and Electro-Optics, OSA Technical Digest (CD) (Optical Society of America, 2009), paper CFE5.

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Figures (3)

Fig. 1.
Fig. 1.

(a) Schematic of the L3 PhC cavity, and (b) Ey-field of the resonant mode simulated using FDTD analysis; (c) Illustrations of the approximate defect hole positions in the L3 cavity with different degrees of light–matter interaction based on the spatial overlap between the defect holes and cavity mode.

Fig. 2.
Fig. 2.

Trends of MHD PhC cavity resonance (black, closed) and quality factor (blue, open) as a function of defect hole spacing for (a) FDTD simulation and (b) experiment. The intensity of the field through the vertical cut line shown in (c) demonstrates the slot effect enhancement in the y direction.

Fig. 3.
Fig. 3.

Resonance shifts due to ALD deposition (red), 3-APTES binding (blue), and Sulfo-SMCC binding (green). Data is shown for an L3 cavity (top, no defect holes) and d=380mm MHD (bottom) with 60 nm defect holes.

Tables (1)

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Table 1. Resonance Shift Due to Molecular Attachment

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