Abstract

We carried out an experimental and numerical investigation of photoinduced voltage at normal incidence in the nondiffraction regime, which was not predicted to occur by the simple momentum conservation model. We prepared two samples: one having space inversion symmetry and the other without this feature. At normal incidence in the nondiffraction regime, we observed a finite signal only for the asymmetric structure. We found that surface plasmon polaritons (SPPs) are excited by the signal and are attributed to the origin of the voltage. We also evaluated the radiation force of light by using the Maxwell stress tensor and found that pressure of light and not shear force is mainly induced in the structure due to the asymmetric excitation of SPPs.

© 2012 Optical Society of America

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2011

D. Inoue, A. Miura, T. Nomura, H. Fujikawa, K. Sato, N. Ikeda, D. Tsuya, Y. Sugimoto, and Y. Koide, Appl. Phys. Lett. 98, 093113 (2011).
[CrossRef]

N. Noginova, A. V. Yakim, J. Soimo, L. Gu, and M. A. Noginov, Phys. Rev. B 84, 035447 (2011).
[CrossRef]

B. A. Kemp, J. Appl. Phys. 109, 111101 (2011).
[CrossRef]

2009

M. Durach, A. Rusina, and M. I. Stockman, Phys. Rev. Lett. 103, 186801 (2009).
[CrossRef]

2008

2006

E. Ozbay, Science 311, 189 (2006).
[CrossRef]

2005

A. S. Vengurlekar and T. Ishihara, Appl. Phys. Lett. 87, 091118 (2005).
[CrossRef]

2003

T. Ishihara, K. Koshino, and H. Nakashima, Phys. Rev. Lett. 91, 253901 (2003).
[CrossRef]

2002

S. G. Tikhodeev, A. L. Yablonskii, E. A. Muljarov, N. A. Gippius, and T. Ishihara, Phys. Rev. B 66, 045102 (2002).
[CrossRef]

1998

1997

1996

1969

E. N. Economou, Phys. Rev. 182, 539 (1969).
[CrossRef]

Djurišic, A. B.

Durach, M.

M. Durach, A. Rusina, and M. I. Stockman, Phys. Rev. Lett. 103, 186801 (2009).
[CrossRef]

Economou, E. N.

E. N. Economou, Phys. Rev. 182, 539 (1969).
[CrossRef]

Elazar, J. M.

Fujikawa, H.

D. Inoue, A. Miura, T. Nomura, H. Fujikawa, K. Sato, N. Ikeda, D. Tsuya, Y. Sugimoto, and Y. Koide, Appl. Phys. Lett. 98, 093113 (2011).
[CrossRef]

Gippius, N. A.

S. G. Tikhodeev, A. L. Yablonskii, E. A. Muljarov, N. A. Gippius, and T. Ishihara, Phys. Rev. B 66, 045102 (2002).
[CrossRef]

Gu, L.

N. Noginova, A. V. Yakim, J. Soimo, L. Gu, and M. A. Noginov, Phys. Rev. B 84, 035447 (2011).
[CrossRef]

Hatano, T.

Ikeda, N.

D. Inoue, A. Miura, T. Nomura, H. Fujikawa, K. Sato, N. Ikeda, D. Tsuya, Y. Sugimoto, and Y. Koide, Appl. Phys. Lett. 98, 093113 (2011).
[CrossRef]

Inoue, D.

D. Inoue, A. Miura, T. Nomura, H. Fujikawa, K. Sato, N. Ikeda, D. Tsuya, Y. Sugimoto, and Y. Koide, Appl. Phys. Lett. 98, 093113 (2011).
[CrossRef]

Ishihara, T.

H. Kurosawa and T. Ishihara, Opt. Express 20, 1561 (2012).
[CrossRef]

T. Hatano, B. Nishikawa, M. Iwanaga, and T. Ishihara, Opt. Express 16, 8236 (2008).
[CrossRef]

A. S. Vengurlekar and T. Ishihara, Appl. Phys. Lett. 87, 091118 (2005).
[CrossRef]

T. Ishihara, K. Koshino, and H. Nakashima, Phys. Rev. Lett. 91, 253901 (2003).
[CrossRef]

S. G. Tikhodeev, A. L. Yablonskii, E. A. Muljarov, N. A. Gippius, and T. Ishihara, Phys. Rev. B 66, 045102 (2002).
[CrossRef]

Iwanaga, M.

Kemp, B. A.

B. A. Kemp, J. Appl. Phys. 109, 111101 (2011).
[CrossRef]

Koide, Y.

D. Inoue, A. Miura, T. Nomura, H. Fujikawa, K. Sato, N. Ikeda, D. Tsuya, Y. Sugimoto, and Y. Koide, Appl. Phys. Lett. 98, 093113 (2011).
[CrossRef]

Koshino, K.

T. Ishihara, K. Koshino, and H. Nakashima, Phys. Rev. Lett. 91, 253901 (2003).
[CrossRef]

Kurosawa, H.

Li, L.

Majewski, M. L.

Miura, A.

D. Inoue, A. Miura, T. Nomura, H. Fujikawa, K. Sato, N. Ikeda, D. Tsuya, Y. Sugimoto, and Y. Koide, Appl. Phys. Lett. 98, 093113 (2011).
[CrossRef]

Muljarov, E. A.

S. G. Tikhodeev, A. L. Yablonskii, E. A. Muljarov, N. A. Gippius, and T. Ishihara, Phys. Rev. B 66, 045102 (2002).
[CrossRef]

Nakashima, H.

T. Ishihara, K. Koshino, and H. Nakashima, Phys. Rev. Lett. 91, 253901 (2003).
[CrossRef]

Nishikawa, B.

Noginov, M. A.

N. Noginova, A. V. Yakim, J. Soimo, L. Gu, and M. A. Noginov, Phys. Rev. B 84, 035447 (2011).
[CrossRef]

Noginova, N.

N. Noginova, A. V. Yakim, J. Soimo, L. Gu, and M. A. Noginov, Phys. Rev. B 84, 035447 (2011).
[CrossRef]

Nomura, T.

D. Inoue, A. Miura, T. Nomura, H. Fujikawa, K. Sato, N. Ikeda, D. Tsuya, Y. Sugimoto, and Y. Koide, Appl. Phys. Lett. 98, 093113 (2011).
[CrossRef]

Ozbay, E.

E. Ozbay, Science 311, 189 (2006).
[CrossRef]

Rakic, A. D.

Rusina, A.

M. Durach, A. Rusina, and M. I. Stockman, Phys. Rev. Lett. 103, 186801 (2009).
[CrossRef]

Sato, K.

D. Inoue, A. Miura, T. Nomura, H. Fujikawa, K. Sato, N. Ikeda, D. Tsuya, Y. Sugimoto, and Y. Koide, Appl. Phys. Lett. 98, 093113 (2011).
[CrossRef]

Soimo, J.

N. Noginova, A. V. Yakim, J. Soimo, L. Gu, and M. A. Noginov, Phys. Rev. B 84, 035447 (2011).
[CrossRef]

Stockman, M. I.

M. Durach, A. Rusina, and M. I. Stockman, Phys. Rev. Lett. 103, 186801 (2009).
[CrossRef]

Sugimoto, Y.

D. Inoue, A. Miura, T. Nomura, H. Fujikawa, K. Sato, N. Ikeda, D. Tsuya, Y. Sugimoto, and Y. Koide, Appl. Phys. Lett. 98, 093113 (2011).
[CrossRef]

Tikhodeev, S. G.

S. G. Tikhodeev, A. L. Yablonskii, E. A. Muljarov, N. A. Gippius, and T. Ishihara, Phys. Rev. B 66, 045102 (2002).
[CrossRef]

Tsuya, D.

D. Inoue, A. Miura, T. Nomura, H. Fujikawa, K. Sato, N. Ikeda, D. Tsuya, Y. Sugimoto, and Y. Koide, Appl. Phys. Lett. 98, 093113 (2011).
[CrossRef]

Vengurlekar, A. S.

A. S. Vengurlekar and T. Ishihara, Appl. Phys. Lett. 87, 091118 (2005).
[CrossRef]

Yablonskii, A. L.

S. G. Tikhodeev, A. L. Yablonskii, E. A. Muljarov, N. A. Gippius, and T. Ishihara, Phys. Rev. B 66, 045102 (2002).
[CrossRef]

Yakim, A. V.

N. Noginova, A. V. Yakim, J. Soimo, L. Gu, and M. A. Noginov, Phys. Rev. B 84, 035447 (2011).
[CrossRef]

Appl. Opt.

Appl. Phys. Lett.

D. Inoue, A. Miura, T. Nomura, H. Fujikawa, K. Sato, N. Ikeda, D. Tsuya, Y. Sugimoto, and Y. Koide, Appl. Phys. Lett. 98, 093113 (2011).
[CrossRef]

A. S. Vengurlekar and T. Ishihara, Appl. Phys. Lett. 87, 091118 (2005).
[CrossRef]

J. Appl. Phys.

B. A. Kemp, J. Appl. Phys. 109, 111101 (2011).
[CrossRef]

J. Opt. Soc. Am. A

Opt. Express

Phys. Rev.

E. N. Economou, Phys. Rev. 182, 539 (1969).
[CrossRef]

Phys. Rev. B

S. G. Tikhodeev, A. L. Yablonskii, E. A. Muljarov, N. A. Gippius, and T. Ishihara, Phys. Rev. B 66, 045102 (2002).
[CrossRef]

N. Noginova, A. V. Yakim, J. Soimo, L. Gu, and M. A. Noginov, Phys. Rev. B 84, 035447 (2011).
[CrossRef]

Phys. Rev. Lett.

M. Durach, A. Rusina, and M. I. Stockman, Phys. Rev. Lett. 103, 186801 (2009).
[CrossRef]

T. Ishihara, K. Koshino, and H. Nakashima, Phys. Rev. Lett. 91, 253901 (2003).
[CrossRef]

Science

E. Ozbay, Science 311, 189 (2006).
[CrossRef]

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Figures (4)

Fig. 1.
Fig. 1.

Schematics (top) and top view of SEM images (below) of (a) the symmetric and (b) the asymmetric structures.

Fig. 2.
Fig. 2.

Experimental result of PIV measurement (top) and transmission (below) at normal incidence. The green vertical line indicates the wavelength at which the first diffraction channel in the substrate opens. Insets (a) and (b) show magnetic field distribution patterns for the wavelengths 1030 and 1050 nm, respectively. Inset (c) shows the calculation result of transmission (multiplied by 10 for comparison) and absorption spectra.

Fig. 3.
Fig. 3.

Calculated radiation force on the asymmetric structure with experimental result (top) and transmission (middle) and diffraction spectra (below). For comparison, shear force is multiplied by 100 and the experimental result of transmission is doubled, respectively.

Fig. 4.
Fig. 4.

Contour plots of pressure at the wavelengths (a) 1030 nm and (b) 1050 nm in the case of normal incidence for the asymmetric structure.

Equations (2)

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V(λ)=C[A(λ)sinθλΛgDg(λ)g]cosθ,
TijDC=18πRe[EiEj*+HiHj*12(E2+H2)δij].

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