Abstract

Imaging systems that combine a phase mask in the pupil and digital postprocessing may have better performance than conventional ones. We have built such a system to enhance the depth of field of an uncooled thermal camera. The phase masks are binary, their structures are optimized thanks to an image quality criterion, and they have been realized with three different technologies that give equivalent results. The deconvolution postprocessing is performed in real time with a graphics processing unit. A significant increase of the depth of field of a factor 3 has been obtained.

© 2011 Optical Society of America

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References

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2010 (1)

2009 (1)

2004 (1)

Z. Wang, A. C. Bovik, H. R. Sheikh, and E. P. Simoncelli, IEEE Trans. Image Process. 13, 600 (2004).
[CrossRef]

2001 (1)

1995 (2)

Bonnot, P.

P. Bonnot, F. Lemonnier, G. Edelin, G. Gaillat, O. Ruch, and P. Gauget, Proceedings on Design, Automation and Test in Europe (EDAA, 2008), p. 610.
[CrossRef]

Bovik, A. C.

Z. Wang, A. C. Bovik, H. R. Sheikh, and E. P. Simoncelli, IEEE Trans. Image Process. 13, 600 (2004).
[CrossRef]

Cathey, T.

Diaz, F.

Dowski, E.

Edelin, G.

P. Bonnot, F. Lemonnier, G. Edelin, G. Gaillat, O. Ruch, and P. Gauget, Proceedings on Design, Automation and Test in Europe (EDAA, 2008), p. 610.
[CrossRef]

Gaillat, G.

P. Bonnot, F. Lemonnier, G. Edelin, G. Gaillat, O. Ruch, and P. Gauget, Proceedings on Design, Automation and Test in Europe (EDAA, 2008), p. 610.
[CrossRef]

Gan, F.

Gauget, P.

P. Bonnot, F. Lemonnier, G. Edelin, G. Gaillat, O. Ruch, and P. Gauget, Proceedings on Design, Automation and Test in Europe (EDAA, 2008), p. 610.
[CrossRef]

Goudail, F.

Hugonin, J. P.

J. P. Hugonin and P. Lalanne, trademark of the Institut d’Optique (2005).

Huignard, J.-P.

Lalanne, P.

J. P. Hugonin and P. Lalanne, trademark of the Institut d’Optique (2005).

Lemonnier, F.

P. Bonnot, F. Lemonnier, G. Edelin, G. Gaillat, O. Ruch, and P. Gauget, Proceedings on Design, Automation and Test in Europe (EDAA, 2008), p. 610.
[CrossRef]

Loiseaux, B.

Moharam, M. G.

Ruch, O.

P. Bonnot, F. Lemonnier, G. Edelin, G. Gaillat, O. Ruch, and P. Gauget, Proceedings on Design, Automation and Test in Europe (EDAA, 2008), p. 610.
[CrossRef]

Sheikh, H. R.

Z. Wang, A. C. Bovik, H. R. Sheikh, and E. P. Simoncelli, IEEE Trans. Image Process. 13, 600 (2004).
[CrossRef]

Simoncelli, E. P.

Z. Wang, A. C. Bovik, H. R. Sheikh, and E. P. Simoncelli, IEEE Trans. Image Process. 13, 600 (2004).
[CrossRef]

Wang, H.

Wang, Z.

Z. Wang, A. C. Bovik, H. R. Sheikh, and E. P. Simoncelli, IEEE Trans. Image Process. 13, 600 (2004).
[CrossRef]

Appl. Opt. (2)

IEEE Trans. Image Process. (1)

Z. Wang, A. C. Bovik, H. R. Sheikh, and E. P. Simoncelli, IEEE Trans. Image Process. 13, 600 (2004).
[CrossRef]

J. Opt. Soc. Am. A (2)

Opt. Lett. (1)

Other (2)

J. P. Hugonin and P. Lalanne, trademark of the Institut d’Optique (2005).

P. Bonnot, F. Lemonnier, G. Edelin, G. Gaillat, O. Ruch, and P. Gauget, Proceedings on Design, Automation and Test in Europe (EDAA, 2008), p. 610.
[CrossRef]

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Figures (4)

Fig. 1
Fig. 1

(a) BPM structure and SNR out (dB) of the imaging system according to the BPM parameters (b) with and (c) without postprocessing and optimal BPM parameters.

Fig. 2
Fig. 2

Subwavelength BPM and scanning electron microphotograph showing the border between the inner and the outer ring. To synthesize the desired effective index and thus the desired phase in the inner zone, the geometry of the pillars is controlled properly and manufactured through optical lithography and inductively coupled plasma etching.

Fig. 3
Fig. 3

Schematic of the experimental setup.

Fig. 4
Fig. 4

Comparison of the image obtained (a) without the BPM, (b) with the BPM, and (c) with the postprocessing. (d)–(f) Details of the postprocessed images obtained with the different BPM.

Equations (5)

Equations on this page are rendered with MathJax. Learn more.

ψ = π R 2 / λ × ( 1 / d O + 1 / d I 1 / f ) ,
I ( r ) = h ψ ( r ) * O ( r ) + n ( r ) ,
O ^ ψ ( r ) = d ( r ) * I ( r ) .
MSE ψ = | O ^ ψ ( r ) O ( r ) | 2 .
SNR out = 10 log 10 [ S o o ( ν ) d ν / min ψ ( MSE ψ ) ] ,

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