Abstract

A fiber Mach–Zehnder interferometer (MZI) sensor, novel to our knowledge, based on a single “S”-like fiber taper has been fabricated via applying nonaxial pull in fiber tapering by a fusion splicer. The typical feature size of the structure has a length of 660μm and the axial offset of 96μm. This S fiber taper MZI has a refractive index (RI) sensitivity of 1590nm/refractive index unit in the RI range of 1.409–1.425 and a strain sensitivity of about 60pm/microstrain, which is 30 times higher than that of the normal two-taper-based MZI sensors.

© 2011 Optical Society of America

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2011 (5)

2010 (2)

Y. L. Zhang, Q. D. Chen, H. Xia, and H. B. Sun, Nano Today 5, 435 (2010).
[CrossRef]

Y. Tian, Y. L. Zhang, J. F. Ku, Y. He, B. B. Xu, Q. D. Chen, H. Xia, and H. B. Sun, Lab Chip 10, 2902 (2010).
[CrossRef] [PubMed]

2009 (2)

Z. Tian and S. S. H. Yam, IEEE Photon. Technol. Lett. 21, 161 (2009).
[CrossRef]

P. Lu, L. Men, K. Sooley, and Q. Chen, Appl. Phys. Lett. 94, 131110 (2009).
[CrossRef]

2008 (1)

Z. Tian, S. S. H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

2002 (2)

T. Allsop, R. Reeves, D. J. Webb, I. Bennion, and R. Neal, Rev. Sci. Instrum. 73, 1702 (2002).
[CrossRef]

X. Shu, L. Zhang, and I. Bennion, J. Lightwave Technol. 20, 255 (2002).
[CrossRef]

Allsop, T.

T. Allsop, R. Reeves, D. J. Webb, I. Bennion, and R. Neal, Rev. Sci. Instrum. 73, 1702 (2002).
[CrossRef]

Barnes, J.

Z. Tian, S. S. H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Becker, R. G.

Bennion, I.

X. Shu, L. Zhang, and I. Bennion, J. Lightwave Technol. 20, 255 (2002).
[CrossRef]

T. Allsop, R. Reeves, D. J. Webb, I. Bennion, and R. Neal, Rev. Sci. Instrum. 73, 1702 (2002).
[CrossRef]

Bock, W.

Z. Tian, S. S. H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Chen, C.

Chen, Q.

P. Lu and Q. Chen, Opt. Lett. 36, 268 (2011).
[CrossRef] [PubMed]

L. Men, P. Lu, and Q. Chen, IEEE Photon. Technol. Lett. 23, 320 (2011).
[CrossRef]

P. Lu, L. Men, K. Sooley, and Q. Chen, Appl. Phys. Lett. 94, 131110 (2009).
[CrossRef]

Chen, Q. D.

C. Chen, Y. S. Yu, R. Yang, L. Wang, J. C. Guo, Q. D. Chen, and H. B. Sun, J. Lightwave Technol. 29, 2126 (2011).
[CrossRef]

Y. L. Zhang, Q. D. Chen, H. Xia, and H. B. Sun, Nano Today 5, 435 (2010).
[CrossRef]

Y. Tian, Y. L. Zhang, J. F. Ku, Y. He, B. B. Xu, Q. D. Chen, H. Xia, and H. B. Sun, Lab Chip 10, 2902 (2010).
[CrossRef] [PubMed]

Deng, M.

Duan, D. W.

Fraser, J. M.

Z. Tian, S. S. H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Greig, P.

Z. Tian, S. S. H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Guo, J. C.

He, Y.

Y. Tian, Y. L. Zhang, J. F. Ku, Y. He, B. B. Xu, Q. D. Chen, H. Xia, and H. B. Sun, Lab Chip 10, 2902 (2010).
[CrossRef] [PubMed]

Jovanovic, N.

Ku, J. F.

Y. Tian, Y. L. Zhang, J. F. Ku, Y. He, B. B. Xu, Q. D. Chen, H. Xia, and H. B. Sun, Lab Chip 10, 2902 (2010).
[CrossRef] [PubMed]

Loock, H. P.

Z. Tian, S. S. H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Lu, P.

L. Men, P. Lu, and Q. Chen, IEEE Photon. Technol. Lett. 23, 320 (2011).
[CrossRef]

P. Lu and Q. Chen, Opt. Lett. 36, 268 (2011).
[CrossRef] [PubMed]

P. Lu, L. Men, K. Sooley, and Q. Chen, Appl. Phys. Lett. 94, 131110 (2009).
[CrossRef]

Marshall, G. D.

Men, L.

L. Men, P. Lu, and Q. Chen, IEEE Photon. Technol. Lett. 23, 320 (2011).
[CrossRef]

P. Lu, L. Men, K. Sooley, and Q. Chen, Appl. Phys. Lett. 94, 131110 (2009).
[CrossRef]

Neal, R.

T. Allsop, R. Reeves, D. J. Webb, I. Bennion, and R. Neal, Rev. Sci. Instrum. 73, 1702 (2002).
[CrossRef]

Nolte, S.

Oleschuk, R. D.

Z. Tian, S. S. H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Rao, Y. J.

Reeves, R.

T. Allsop, R. Reeves, D. J. Webb, I. Bennion, and R. Neal, Rev. Sci. Instrum. 73, 1702 (2002).
[CrossRef]

Shi, L. L.

Shu, X.

Sooley, K.

P. Lu, L. Men, K. Sooley, and Q. Chen, Appl. Phys. Lett. 94, 131110 (2009).
[CrossRef]

Steel, M. J.

Sun, H. B.

C. Chen, Y. S. Yu, R. Yang, L. Wang, J. C. Guo, Q. D. Chen, and H. B. Sun, J. Lightwave Technol. 29, 2126 (2011).
[CrossRef]

Y. Tian, Y. L. Zhang, J. F. Ku, Y. He, B. B. Xu, Q. D. Chen, H. Xia, and H. B. Sun, Lab Chip 10, 2902 (2010).
[CrossRef] [PubMed]

Y. L. Zhang, Q. D. Chen, H. Xia, and H. B. Sun, Nano Today 5, 435 (2010).
[CrossRef]

Thomas, J.

Tian, Y.

Y. Tian, Y. L. Zhang, J. F. Ku, Y. He, B. B. Xu, Q. D. Chen, H. Xia, and H. B. Sun, Lab Chip 10, 2902 (2010).
[CrossRef] [PubMed]

Tian, Z.

Z. Tian and S. S. H. Yam, IEEE Photon. Technol. Lett. 21, 161 (2009).
[CrossRef]

Z. Tian, S. S. H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Tunnermann, A.

Wang, L.

Webb, D. J.

T. Allsop, R. Reeves, D. J. Webb, I. Bennion, and R. Neal, Rev. Sci. Instrum. 73, 1702 (2002).
[CrossRef]

Withford, M. J.

Wu, D.

Xia, H.

Y. Tian, Y. L. Zhang, J. F. Ku, Y. He, B. B. Xu, Q. D. Chen, H. Xia, and H. B. Sun, Lab Chip 10, 2902 (2010).
[CrossRef] [PubMed]

Y. L. Zhang, Q. D. Chen, H. Xia, and H. B. Sun, Nano Today 5, 435 (2010).
[CrossRef]

Xu, B. B.

Y. Tian, Y. L. Zhang, J. F. Ku, Y. He, B. B. Xu, Q. D. Chen, H. Xia, and H. B. Sun, Lab Chip 10, 2902 (2010).
[CrossRef] [PubMed]

Yam, S. S. H.

Z. Tian and S. S. H. Yam, IEEE Photon. Technol. Lett. 21, 161 (2009).
[CrossRef]

Z. Tian, S. S. H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Yang, R.

Yao, J.

Yu, Y. S.

Zhang, L.

Zhang, Y. L.

Y. Tian, Y. L. Zhang, J. F. Ku, Y. He, B. B. Xu, Q. D. Chen, H. Xia, and H. B. Sun, Lab Chip 10, 2902 (2010).
[CrossRef] [PubMed]

Y. L. Zhang, Q. D. Chen, H. Xia, and H. B. Sun, Nano Today 5, 435 (2010).
[CrossRef]

Zhu, T.

Appl. Opt. (1)

Appl. Phys. Lett. (1)

P. Lu, L. Men, K. Sooley, and Q. Chen, Appl. Phys. Lett. 94, 131110 (2009).
[CrossRef]

IEEE Photon. Technol. Lett. (3)

L. Men, P. Lu, and Q. Chen, IEEE Photon. Technol. Lett. 23, 320 (2011).
[CrossRef]

Z. Tian, S. S. H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Z. Tian and S. S. H. Yam, IEEE Photon. Technol. Lett. 21, 161 (2009).
[CrossRef]

J. Lightwave Technol. (2)

Lab Chip (1)

Y. Tian, Y. L. Zhang, J. F. Ku, Y. He, B. B. Xu, Q. D. Chen, H. Xia, and H. B. Sun, Lab Chip 10, 2902 (2010).
[CrossRef] [PubMed]

Nano Today (1)

Y. L. Zhang, Q. D. Chen, H. Xia, and H. B. Sun, Nano Today 5, 435 (2010).
[CrossRef]

Opt. Express (1)

Opt. Lett. (1)

Rev. Sci. Instrum. (1)

T. Allsop, R. Reeves, D. J. Webb, I. Bennion, and R. Neal, Rev. Sci. Instrum. 73, 1702 (2002).
[CrossRef]

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Figures (4)

Fig. 1
Fig. 1

(a) Experimental setup for fabrication of the SFT. (b) Schematic diagram of the S-like fiber taper.

Fig. 2
Fig. 2

(a) Side view of the SFT in optical microscopy. (b) Top view of the SFT. (c) Transmission spectrum of the single SFT MZI in air.

Fig. 3
Fig. 3

(a) Transmission spectrum of peak A changes when the SFT MZI is immersed into different RI matching solutions. (b) Relationship between the wavelength of peak A and surrounding RI.

Fig. 4
Fig. 4

(a) Transmission spectrum of peak B changes when different axial stress is applied in the SFT MZI. (b) Relationship between the wavelength of peak B and axial strain.

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