Abstract

We present a simple scheme to determine the diffusion properties of a thin slab of strongly scattering material by measuring the speckle contrast resulting from the transmission of a femtosecond pulse with controlled bandwidth. In contrast with previous methods, our scheme does not require time measurements nor interferometry. It is well adapted to the characterization of samples for pulse shaping, nonlinear excitation through scattering media, and biological imaging.

© 2011 Optical Society of America

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