Abstract

We report and demonstrate an optical refractometer based on a compact fiber Michelson interferometer. The Michelson interferometer is composed of an asymmetrical twin-core fiber containing a central core and a side core. By chemically etching a segment of the twin-core fiber until the side core is exposed, the effective index of the side core in the etched region is sensitive to the environmental refractive index, which leads to a shift of the transmission spectrum of the Michelson interferometer. The experimental results show that such a device has a refractive index resolution of more than 800nm/refractive index unit in the range of 1.34–1.37.

© 2011 Optical Society of America

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Chung, Y.

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[CrossRef]

Contessa, L.

Cusano, A.

Cutolo, A.

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Feng, S.

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Finazzi, V.

Frazao, O.

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[CrossRef]

Han, Y.

Han, Y. G.

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[CrossRef]

Harris, E.

Y. Li, L. Chen, E. Harris, and X. Bao, IEEE Photon. Technol. Lett. 22, 1750 (2010).
[CrossRef]

He, Z.

Z. He, Y. Zhu, and H. Du, Appl. Phys. Lett. 92, 044105 (2008).
[CrossRef]

Hewlett, S. J.

J. W. Arkwright, S. J. Hewlett, G. R. Atkins, and B. Wu, J. Lightwave Technol. 14, 1740 (1996).
[CrossRef]

Hong, W.

Iadicicco, A.

Jha, R.

Jian, S.

S. Feng, H. Li, O. Xu, S. Lu, and S. Jian, Proc. SPIE 7630, 76301R (2009).
[CrossRef]

Kang, J. U.

C. S. Kim, Y. G. Han, R. M. Sova, U.-C. Pake, Y. Chung, and J. U. Kang, IEEE Photon. Technol. Lett. 15, 269 (2003).
[CrossRef]

Kim, C. S.

C. S. Kim, Y. G. Han, R. M. Sova, U.-C. Pake, Y. Chung, and J. U. Kang, IEEE Photon. Technol. Lett. 15, 269 (2003).
[CrossRef]

Kim, D. W.

Kobelke, J.

O. Frazao, S. F. O. Silva, J. Viegas, J. M. Baptista, J. L. Santos, J. Kobelke, and K. Schuster, IEEE Photon. Technol. Lett. 22, 1300 (2010).
[CrossRef]

Kreuzer, M. P.

Li, H.

S. Feng, H. Li, O. Xu, S. Lu, and S. Jian, Proc. SPIE 7630, 76301R (2009).
[CrossRef]

Li, Y.

Y. Li, L. Chen, E. Harris, and X. Bao, IEEE Photon. Technol. Lett. 22, 1750 (2010).
[CrossRef]

T. Wei, Y. Han, Y. Li, H. Tsai, and H. Xiao, Opt. Express 16, 5764 (2008).
[CrossRef] [PubMed]

Liu, S.

Liu, Z.

L. Yuan, J. Yang, and Z. Liu, IEEE Sens. J. 8, 1114 (2008).
[CrossRef]

L. Yuan, Z. Liu, and J. Yang, Opt. Lett. 31, 3237 (2006).
[CrossRef] [PubMed]

Loock, H. P.

Lu, P.

Lu, S.

S. Feng, H. Li, O. Xu, S. Lu, and S. Jian, Proc. SPIE 7630, 76301R (2009).
[CrossRef]

Matias, I. R.

Men, L.

P. Lu, L. Men, K. Sooley, and Q. Chena, Appl. Phys. Lett. 94, 131110 (2009).
[CrossRef]

Minkovich, V. P.

Pake, U.-C.

C. S. Kim, Y. G. Han, R. M. Sova, U.-C. Pake, Y. Chung, and J. U. Kang, IEEE Photon. Technol. Lett. 15, 269 (2003).
[CrossRef]

Pilla, P.

Pruneri, V.

Santos, J. L.

O. Frazao, S. F. O. Silva, J. Viegas, J. M. Baptista, J. L. Santos, J. Kobelke, and K. Schuster, IEEE Photon. Technol. Lett. 22, 1300 (2010).
[CrossRef]

Schuster, K.

O. Frazao, S. F. O. Silva, J. Viegas, J. M. Baptista, J. L. Santos, J. Kobelke, and K. Schuster, IEEE Photon. Technol. Lett. 22, 1300 (2010).
[CrossRef]

Shen, F.

Silva, S. F. O.

O. Frazao, S. F. O. Silva, J. Viegas, J. M. Baptista, J. L. Santos, J. Kobelke, and K. Schuster, IEEE Photon. Technol. Lett. 22, 1300 (2010).
[CrossRef]

Sooley, K.

P. Lu, L. Men, K. Sooley, and Q. Chena, Appl. Phys. Lett. 94, 131110 (2009).
[CrossRef]

Sova, R. M.

C. S. Kim, Y. G. Han, R. M. Sova, U.-C. Pake, Y. Chung, and J. U. Kang, IEEE Photon. Technol. Lett. 15, 269 (2003).
[CrossRef]

Tian, Z.

Tsai, H.

Viegas, J.

O. Frazao, S. F. O. Silva, J. Viegas, J. M. Baptista, J. L. Santos, J. Kobelke, and K. Schuster, IEEE Photon. Technol. Lett. 22, 1300 (2010).
[CrossRef]

Villatoro, J.

Wang, A.

Wang, D. N.

Wang, Y.

Wei, T.

Wu, B.

J. W. Arkwright, S. J. Hewlett, G. R. Atkins, and B. Wu, J. Lightwave Technol. 14, 1740 (1996).
[CrossRef]

Xiao, H.

Xu, O.

S. Feng, H. Li, O. Xu, S. Lu, and S. Jian, Proc. SPIE 7630, 76301R (2009).
[CrossRef]

Yam, S. S. H.

Yang, J.

L. Yuan, J. Yang, and Z. Liu, IEEE Sens. J. 8, 1114 (2008).
[CrossRef]

L. Yuan, Z. Liu, and J. Yang, Opt. Lett. 31, 3237 (2006).
[CrossRef] [PubMed]

Yang, M.

Yuan, L.

L. Yuan, J. Yang, and Z. Liu, IEEE Sens. J. 8, 1114 (2008).
[CrossRef]

L. Yuan, Z. Liu, and J. Yang, Opt. Lett. 31, 3237 (2006).
[CrossRef] [PubMed]

Zhang, L.

Zhou, K.

Zhu, Y.

Z. He, Y. Zhu, and H. Du, Appl. Phys. Lett. 92, 044105 (2008).
[CrossRef]

Appl. Phys. Lett. (2)

Z. He, Y. Zhu, and H. Du, Appl. Phys. Lett. 92, 044105 (2008).
[CrossRef]

P. Lu, L. Men, K. Sooley, and Q. Chena, Appl. Phys. Lett. 94, 131110 (2009).
[CrossRef]

IEEE Photon. Technol. Lett. (3)

Y. Li, L. Chen, E. Harris, and X. Bao, IEEE Photon. Technol. Lett. 22, 1750 (2010).
[CrossRef]

O. Frazao, S. F. O. Silva, J. Viegas, J. M. Baptista, J. L. Santos, J. Kobelke, and K. Schuster, IEEE Photon. Technol. Lett. 22, 1300 (2010).
[CrossRef]

C. S. Kim, Y. G. Han, R. M. Sova, U.-C. Pake, Y. Chung, and J. U. Kang, IEEE Photon. Technol. Lett. 15, 269 (2003).
[CrossRef]

IEEE Sens. J. (1)

L. Yuan, J. Yang, and Z. Liu, IEEE Sens. J. 8, 1114 (2008).
[CrossRef]

J. Lightwave Technol. (1)

J. W. Arkwright, S. J. Hewlett, G. R. Atkins, and B. Wu, J. Lightwave Technol. 14, 1740 (1996).
[CrossRef]

J. Opt. Soc. Am. B (1)

Opt. Express (3)

Opt. Lett. (7)

Proc. SPIE (1)

S. Feng, H. Li, O. Xu, S. Lu, and S. Jian, Proc. SPIE 7630, 76301R (2009).
[CrossRef]

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Figures (4)

Fig. 1
Fig. 1

Cross views of the asymmetrical TCF (a) before and (b) after being etched; (c) transition zone of the TCF from the unetched to the etched region.

Fig. 2
Fig. 2

Configuration of the optical refractometer based on an asymmetrical TCF Michelson interferometer. A section of the TCF is chemically etched to make the effective RI of the side core sensitive to the environmental RI.

Fig. 3
Fig. 3

Transmission spectra and responses to environmental RI changes of the TCF Michelson interferometer under different bending angles. FSR is (a) 6.88, (b) 15.92, and (c)  24.16 nm .

Fig. 4
Fig. 4

Wavelength of a peak in the transmission spectrum versus the external RI.

Equations (2)

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Δ λ = Δ n · l · λ m / ( n 1 L 1 - n 2 L 2 ) .
δ λ = λ m + 1 - λ m = λ m + 1 · λ m / 2 ( n 1 L 1 - n 2 L 2 ) .

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