Abstract

Optical Kerr gating is widely used in ultrafast measurements ranging from pulse characterization to spectroscopy and microscopy. We examined the efficiency and the temporal response of three cubic lattice Kerr media, YAG, GGG and BGO, and compared them with the well studied fused silica (fast response, low efficiency) and STO (high efficiency, slow response). YAG and GGG emerged as superior materials for ultrafast spectroscopy and microscopy applications thanks to their fast Kerr response and considerably higher gating efficiency than silica at low gating energies. Importantly, it was found that in collinear geometry all tested materials except STO are capable of reaching nearly 100% transmission.

© 2011 Optical Society of America

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2005 (2)

T. Fujino, T. Fujima, and T. Tahara, Appl. Phys. Lett. 87, 131105 (2005).
[CrossRef]

S. Arzhantsev and M. Maroncelli, Appl. Spectrosc. 59, 206 (2005).
[CrossRef] [PubMed]

2004 (1)

R. Nakamura and Y. Kanematsu, Rev. Sci. Instrum. 75, 636(2004).
[CrossRef]

2003 (1)

B. Schmidt, S. Laimgruber, W. Zinth, and P. Gilch, Appl. Phys. B 76, 809 (2003).
[CrossRef]

2000 (1)

S. Kinoshita, H. Ozawa, Y. Kanematsu, I. Tanaka, N. Sugimoto, and S. Fujiwara, Rev. Sci. Instrum. 71, 3317(2000).
[CrossRef]

1999 (1)

1980 (1)

1979 (1)

P. P. Ho and R. R. Alfano, Phys. Rev. A 20, 2170 (1979).
[CrossRef]

1975 (1)

R. Hellwarth, J. Cherlow, and T.-T. Yang, Phys. Rev. B 11, 964 (1975).
[CrossRef]

1969 (1)

M. A. Duguay and J. W. Hansen, Appl. Phys. Lett. 15, 192 (1969).
[CrossRef]

Alfano, R. R.

P. P. Ho and R. R. Alfano, Phys. Rev. A 20, 2170 (1979).
[CrossRef]

Arzhantsev, S.

Chen, X.

Cherlow, J.

R. Hellwarth, J. Cherlow, and T.-T. Yang, Phys. Rev. B 11, 964 (1975).
[CrossRef]

Duguay, M. A.

M. A. Duguay and J. W. Hansen, Appl. Phys. Lett. 15, 192 (1969).
[CrossRef]

Fujima, T.

T. Fujino, T. Fujima, and T. Tahara, Appl. Phys. Lett. 87, 131105 (2005).
[CrossRef]

Fujino, T.

T. Fujino, T. Fujima, and T. Tahara, Appl. Phys. Lett. 87, 131105 (2005).
[CrossRef]

Fujiwara, S.

S. Kinoshita, H. Ozawa, Y. Kanematsu, I. Tanaka, N. Sugimoto, and S. Fujiwara, Rev. Sci. Instrum. 71, 3317(2000).
[CrossRef]

N. Sugimoto, H. Kanbara, S. Fujiwara, K. Tanaka, Y. Shimizugawa, and K. Hirao, J. Opt. Soc. Am. B 16, 1904(1999).
[CrossRef]

Gilch, P.

B. Schmidt, S. Laimgruber, W. Zinth, and P. Gilch, Appl. Phys. B 76, 809 (2003).
[CrossRef]

Griffiths, J. E.

Gundlach, L.

Hansen, J. W.

M. A. Duguay and J. W. Hansen, Appl. Phys. Lett. 15, 192 (1969).
[CrossRef]

Hellwarth, R.

R. Hellwarth, J. Cherlow, and T.-T. Yang, Phys. Rev. B 11, 964 (1975).
[CrossRef]

Hirao, K.

Ho, P. P.

P. P. Ho and R. R. Alfano, Phys. Rev. A 20, 2170 (1979).
[CrossRef]

Kanbara, H.

Kanematsu, Y.

R. Nakamura and Y. Kanematsu, Rev. Sci. Instrum. 75, 636(2004).
[CrossRef]

S. Kinoshita, H. Ozawa, Y. Kanematsu, I. Tanaka, N. Sugimoto, and S. Fujiwara, Rev. Sci. Instrum. 71, 3317(2000).
[CrossRef]

Kinoshita, S.

S. Kinoshita, H. Ozawa, Y. Kanematsu, I. Tanaka, N. Sugimoto, and S. Fujiwara, Rev. Sci. Instrum. 71, 3317(2000).
[CrossRef]

Laimgruber, S.

B. Schmidt, S. Laimgruber, W. Zinth, and P. Gilch, Appl. Phys. B 76, 809 (2003).
[CrossRef]

Maroncelli, M.

Nakamura, R.

R. Nakamura and Y. Kanematsu, Rev. Sci. Instrum. 75, 636(2004).
[CrossRef]

Nassau, K.

Ozawa, H.

S. Kinoshita, H. Ozawa, Y. Kanematsu, I. Tanaka, N. Sugimoto, and S. Fujiwara, Rev. Sci. Instrum. 71, 3317(2000).
[CrossRef]

Piotrowiak, P.

Schmidt, B.

B. Schmidt, S. Laimgruber, W. Zinth, and P. Gilch, Appl. Phys. B 76, 809 (2003).
[CrossRef]

Shimizugawa, Y.

Sugimoto, N.

S. Kinoshita, H. Ozawa, Y. Kanematsu, I. Tanaka, N. Sugimoto, and S. Fujiwara, Rev. Sci. Instrum. 71, 3317(2000).
[CrossRef]

N. Sugimoto, H. Kanbara, S. Fujiwara, K. Tanaka, Y. Shimizugawa, and K. Hirao, J. Opt. Soc. Am. B 16, 1904(1999).
[CrossRef]

Tahara, T.

T. Fujino, T. Fujima, and T. Tahara, Appl. Phys. Lett. 87, 131105 (2005).
[CrossRef]

Tanaka, I.

S. Kinoshita, H. Ozawa, Y. Kanematsu, I. Tanaka, N. Sugimoto, and S. Fujiwara, Rev. Sci. Instrum. 71, 3317(2000).
[CrossRef]

Tanaka, K.

Weng, Y.

Yang, T.-T.

R. Hellwarth, J. Cherlow, and T.-T. Yang, Phys. Rev. B 11, 964 (1975).
[CrossRef]

Yu, Z.

Zhang, J.-y.

Zinth, W.

B. Schmidt, S. Laimgruber, W. Zinth, and P. Gilch, Appl. Phys. B 76, 809 (2003).
[CrossRef]

Appl. Phys. B (1)

B. Schmidt, S. Laimgruber, W. Zinth, and P. Gilch, Appl. Phys. B 76, 809 (2003).
[CrossRef]

Appl. Phys. Lett. (2)

T. Fujino, T. Fujima, and T. Tahara, Appl. Phys. Lett. 87, 131105 (2005).
[CrossRef]

M. A. Duguay and J. W. Hansen, Appl. Phys. Lett. 15, 192 (1969).
[CrossRef]

Appl. Spectrosc. (2)

J. Opt. Soc. Am. B (1)

Opt. Lett. (2)

Phys. Rev. A (1)

P. P. Ho and R. R. Alfano, Phys. Rev. A 20, 2170 (1979).
[CrossRef]

Phys. Rev. B (1)

R. Hellwarth, J. Cherlow, and T.-T. Yang, Phys. Rev. B 11, 964 (1975).
[CrossRef]

Rev. Sci. Instrum. (2)

S. Kinoshita, H. Ozawa, Y. Kanematsu, I. Tanaka, N. Sugimoto, and S. Fujiwara, Rev. Sci. Instrum. 71, 3317(2000).
[CrossRef]

R. Nakamura and Y. Kanematsu, Rev. Sci. Instrum. 75, 636(2004).
[CrossRef]

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Figures (3)

Fig. 1
Fig. 1

The layout of the Kerr gating experiment: WP, 790 nm λ / 2 wave plate; GP, Glan prism polarizer; DM, dichroic mirror; KM, Kerr medium; PM, parabolic mirror; PD, photodiode.

Fig. 2
Fig. 2

The Kerr gate transmittance T ( t ) of the tested materials at (a) 16 μJ gating energy and (b) at maximum gating energy permitted by a given material.

Fig. 3
Fig. 3

The OKG signal in GGG fitted using the linear approximation and the complete function at (a ) 16 μJ gating power and (b) at maximum gating energy permitted by the material.

Tables (1)

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Table 1 Kerr Gating Parameters of FS, YAG, GGG, BGO, and STO

Equations (1)

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I signal = I probe ( t ) sin 2 ( Δ φ ( t ) / 2 ) d t ,

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