Abstract

Focus measure plays a fundamental role in the shape from focus technique. In this Letter, we suggest a focus measure in the S-transform domain that is based on the energy of high-frequency components. A localized spectrum by using variable window size provides a more accurate method of measuring image sharpness as compared to other focus measures proposed in spectral domains. An optimal focus measure is obtained by selecting an appropriate frequency-dependent window width. The performance of the proposed focus measure is compared with those of existing focus measures in terms of three-dimensional shape recovery. Experimental results demonstrate the effectiveness of the proposed focus measure.

© 2010 Optical Society of America

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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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2010

R. A. Brown, M. L. Lauzon, and R. Frayne, IEEE Trans. Signal Process.  58, 281 (2010).
[CrossRef]

2009

M. T. Mahmood, S. O. Shim, and T. S. Choi, Opt. Eng.  48, 057203 (2009).
[CrossRef]

A. N. Simonov and M. C. Rombach, Opt. Lett.  34, 2111 (2009).
[CrossRef]

2008

L. Sang-Yong, Y. Kumar, C. Ji-Man, L. Sang-Won, and K. Soo-Won, IEEE Trans. Circuits Syst. Video Technol.  18, 1237 (2008).
[CrossRef]

E. Sejdic, I. Djurovic, and J. Jiang, EURASIP J. Adv. Signal Process.  672941, 13 (2008).

2007

A. S. Malik and T. S. Choi, Pattern Recogn.  40, 154 (2007).

2005

M. B. Ahmad and T. S. Choi, IEEE Trans. Circuits Syst. Video Technol.  15, 566 (2005).
[CrossRef]

1996

R. G. Stockwell, L. Mansinha, and R. P. Lowe, IEEE Trans. Signal Process.  44, 998 (1996).
[CrossRef]

1994

S. K. Nayar and Y. Nakagawa, IEEE Trans. Pattern Anal. Mach. Intell.  16, 824 (1994).
[CrossRef]

Ahmad, M. B.

M. B. Ahmad and T. S. Choi, IEEE Trans. Circuits Syst. Video Technol.  15, 566 (2005).
[CrossRef]

Brown, R. A.

R. A. Brown, M. L. Lauzon, and R. Frayne, IEEE Trans. Signal Process.  58, 281 (2010).
[CrossRef]

Choi, T. S.

M. T. Mahmood, S. O. Shim, and T. S. Choi, Opt. Eng.  48, 057203 (2009).
[CrossRef]

A. S. Malik and T. S. Choi, Pattern Recogn.  40, 154 (2007).

M. B. Ahmad and T. S. Choi, IEEE Trans. Circuits Syst. Video Technol.  15, 566 (2005).
[CrossRef]

Djurovic, I.

E. Sejdic, I. Djurovic, and J. Jiang, EURASIP J. Adv. Signal Process.  672941, 13 (2008).

Frayne, R.

R. A. Brown, M. L. Lauzon, and R. Frayne, IEEE Trans. Signal Process.  58, 281 (2010).
[CrossRef]

Jiang, J.

E. Sejdic, I. Djurovic, and J. Jiang, EURASIP J. Adv. Signal Process.  672941, 13 (2008).

Ji-Man, C.

L. Sang-Yong, Y. Kumar, C. Ji-Man, L. Sang-Won, and K. Soo-Won, IEEE Trans. Circuits Syst. Video Technol.  18, 1237 (2008).
[CrossRef]

Kumar, Y.

L. Sang-Yong, Y. Kumar, C. Ji-Man, L. Sang-Won, and K. Soo-Won, IEEE Trans. Circuits Syst. Video Technol.  18, 1237 (2008).
[CrossRef]

Lauzon, M. L.

R. A. Brown, M. L. Lauzon, and R. Frayne, IEEE Trans. Signal Process.  58, 281 (2010).
[CrossRef]

Lowe, R. P.

R. G. Stockwell, L. Mansinha, and R. P. Lowe, IEEE Trans. Signal Process.  44, 998 (1996).
[CrossRef]

Mahmood, M. T.

M. T. Mahmood, S. O. Shim, and T. S. Choi, Opt. Eng.  48, 057203 (2009).
[CrossRef]

Malik, A. S.

A. S. Malik and T. S. Choi, Pattern Recogn.  40, 154 (2007).

Mansinha, L.

R. G. Stockwell, L. Mansinha, and R. P. Lowe, IEEE Trans. Signal Process.  44, 998 (1996).
[CrossRef]

Nakagawa, Y.

S. K. Nayar and Y. Nakagawa, IEEE Trans. Pattern Anal. Mach. Intell.  16, 824 (1994).
[CrossRef]

Nayar, S. K.

S. K. Nayar and Y. Nakagawa, IEEE Trans. Pattern Anal. Mach. Intell.  16, 824 (1994).
[CrossRef]

Rombach, M. C.

Sang-Won, L.

L. Sang-Yong, Y. Kumar, C. Ji-Man, L. Sang-Won, and K. Soo-Won, IEEE Trans. Circuits Syst. Video Technol.  18, 1237 (2008).
[CrossRef]

Sang-Yong, L.

L. Sang-Yong, Y. Kumar, C. Ji-Man, L. Sang-Won, and K. Soo-Won, IEEE Trans. Circuits Syst. Video Technol.  18, 1237 (2008).
[CrossRef]

Sejdic, E.

E. Sejdic, I. Djurovic, and J. Jiang, EURASIP J. Adv. Signal Process.  672941, 13 (2008).

Shim, S. O.

M. T. Mahmood, S. O. Shim, and T. S. Choi, Opt. Eng.  48, 057203 (2009).
[CrossRef]

Simonov, A. N.

Soo-Won, K.

L. Sang-Yong, Y. Kumar, C. Ji-Man, L. Sang-Won, and K. Soo-Won, IEEE Trans. Circuits Syst. Video Technol.  18, 1237 (2008).
[CrossRef]

Stockwell, R. G.

R. G. Stockwell, L. Mansinha, and R. P. Lowe, IEEE Trans. Signal Process.  44, 998 (1996).
[CrossRef]

EURASIP J. Adv. Signal Process.

E. Sejdic, I. Djurovic, and J. Jiang, EURASIP J. Adv. Signal Process.  672941, 13 (2008).

IEEE Trans. Circuits Syst. Video Technol.

L. Sang-Yong, Y. Kumar, C. Ji-Man, L. Sang-Won, and K. Soo-Won, IEEE Trans. Circuits Syst. Video Technol.  18, 1237 (2008).
[CrossRef]

M. B. Ahmad and T. S. Choi, IEEE Trans. Circuits Syst. Video Technol.  15, 566 (2005).
[CrossRef]

IEEE Trans. Pattern Anal. Mach. Intell.

S. K. Nayar and Y. Nakagawa, IEEE Trans. Pattern Anal. Mach. Intell.  16, 824 (1994).
[CrossRef]

IEEE Trans. Signal Process.

R. G. Stockwell, L. Mansinha, and R. P. Lowe, IEEE Trans. Signal Process.  44, 998 (1996).
[CrossRef]

R. A. Brown, M. L. Lauzon, and R. Frayne, IEEE Trans. Signal Process.  58, 281 (2010).
[CrossRef]

Opt. Eng.

M. T. Mahmood, S. O. Shim, and T. S. Choi, Opt. Eng.  48, 057203 (2009).
[CrossRef]

Opt. Lett.

Pattern Recogn.

A. S. Malik and T. S. Choi, Pattern Recogn.  40, 154 (2007).

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