Abstract

We propose a full-field low-coherence interference (LCI) microscope that can provide different contrast modes using Fourier-plane filtering by means of a spatial light modulator. By altering the phase and spatial frequencies of the backreflected wavefront from the sample arm of the interferometer, we are able to change the contrast in the depth-resolved LCI images. We demonstrate that different types of contrast modes, such as, e.g., spiral phase contrast, can successfully be emulated to provide specific enhancement of internal structures and edges and to reveal complementary details within the samples under investigation.

© 2010 Optical Society of America

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2010

C. Unverzagt, S. Olfert, and B. Hennig, Phys. Procedia 3, 935 (2010).
[CrossRef]

2009

2008

C. S. Yelleswarapu, S. Kothapalli, and D. V. G. L. N. Rao, Opt. Commun. 281, 1876 (2008).
[CrossRef] [PubMed]

2007

S. Fürhapter, A. Jesacher, C. Maurer, S. Bernet, and M. Ritsch-Marte, Adv. Imag. Electron. Phys. 146, 1(2007).
[CrossRef]

2006

2005

2004

2002

2001

M. Felsberg and G. Sommer, IEEE Trans. Signal Process. 49, 3136 (2001).
[CrossRef]

Ahrens, G.

Bauer, S.

Beaurepaire, E.

Bernet, S.

S. Fürhapter, A. Jesacher, C. Maurer, S. Bernet, and M. Ritsch-Marte, Adv. Imag. Electron. Phys. 146, 1(2007).
[CrossRef]

S. Fürhapter, A. Jesacher, S. Bernet, and M. Ritsch-Marte, Opt. Lett. 30, 1953 (2005).
[CrossRef] [PubMed]

S. Fürhapter, A. Jesacher, S. Bernet, and M. Ritsch-Marte, Opt. Express 13, 689 (2005).
[CrossRef] [PubMed]

C. Maurer, A. Jesacher, S. Bernet, and M. Ritsch-Marte, Laser Photon. Rev., doi: 10.1002/lpor.200900047.

Boccara, A.

Boccara, A. C.

Boccara, C.

Cai, X.

Chang, S.

Dubois, A.

Engelke, R.

Felsberg, M.

M. Felsberg and G. Sommer, IEEE Trans. Signal Process. 49, 3136 (2001).
[CrossRef]

Flueraru, C.

Fürhapter, S.

Götzinger, E.

Grieve, K.

Grützner, G.

Hahn, S. L.

S. L. Hahn, Hilbert Transform in Signal Processing(Artech, 1996).

Hennig, B.

C. Unverzagt, S. Olfert, and B. Hennig, Phys. Procedia 3, 935 (2010).
[CrossRef]

Hitzenberger, C. K.

Jesacher, A.

S. Fürhapter, A. Jesacher, C. Maurer, S. Bernet, and M. Ritsch-Marte, Adv. Imag. Electron. Phys. 146, 1(2007).
[CrossRef]

S. Fürhapter, A. Jesacher, S. Bernet, and M. Ritsch-Marte, Opt. Lett. 30, 1953 (2005).
[CrossRef] [PubMed]

S. Fürhapter, A. Jesacher, S. Bernet, and M. Ritsch-Marte, Opt. Express 13, 689 (2005).
[CrossRef] [PubMed]

C. Maurer, A. Jesacher, S. Bernet, and M. Ritsch-Marte, Laser Photon. Rev., doi: 10.1002/lpor.200900047.

Kothapalli, S.

C. S. Yelleswarapu, S. Kothapalli, and D. V. G. L. N. Rao, Opt. Commun. 281, 1876 (2008).
[CrossRef] [PubMed]

Lecaque, R.

Loriette, V.

Maurer, C.

S. Fürhapter, A. Jesacher, C. Maurer, S. Bernet, and M. Ritsch-Marte, Adv. Imag. Electron. Phys. 146, 1(2007).
[CrossRef]

C. Maurer, A. Jesacher, S. Bernet, and M. Ritsch-Marte, Laser Photon. Rev., doi: 10.1002/lpor.200900047.

Moneron, G.

Moreau, J.

Olfert, S.

C. Unverzagt, S. Olfert, and B. Hennig, Phys. Procedia 3, 935 (2010).
[CrossRef]

Osten, W.

Pedrini, G.

Pircher, M.

Rao, D. V. G. L. N.

C. S. Yelleswarapu, S. Kothapalli, and D. V. G. L. N. Rao, Opt. Commun. 281, 1876 (2008).
[CrossRef] [PubMed]

Ritsch-Marte, M.

S. Fürhapter, A. Jesacher, C. Maurer, S. Bernet, and M. Ritsch-Marte, Adv. Imag. Electron. Phys. 146, 1(2007).
[CrossRef]

S. Fürhapter, A. Jesacher, S. Bernet, and M. Ritsch-Marte, Opt. Lett. 30, 1953 (2005).
[CrossRef] [PubMed]

S. Fürhapter, A. Jesacher, S. Bernet, and M. Ritsch-Marte, Opt. Express 13, 689 (2005).
[CrossRef] [PubMed]

C. Maurer, A. Jesacher, S. Bernet, and M. Ritsch-Marte, Laser Photon. Rev., doi: 10.1002/lpor.200900047.

Roy, M.

Sharma, M. D.

Sheppard, C. J. R.

Situ, G.

Sommer, G.

M. Felsberg and G. Sommer, IEEE Trans. Signal Process. 49, 3136 (2001).
[CrossRef]

Stifter, D.

Unverzagt, C.

C. Unverzagt, S. Olfert, and B. Hennig, Phys. Procedia 3, 935 (2010).
[CrossRef]

Vabre, L.

Wiesauer, K.

Yelleswarapu, C. S.

C. S. Yelleswarapu, S. Kothapalli, and D. V. G. L. N. Rao, Opt. Commun. 281, 1876 (2008).
[CrossRef] [PubMed]

Adv. Imag. Electron. Phys.

S. Fürhapter, A. Jesacher, C. Maurer, S. Bernet, and M. Ritsch-Marte, Adv. Imag. Electron. Phys. 146, 1(2007).
[CrossRef]

Appl. Opt.

IEEE Trans. Signal Process.

M. Felsberg and G. Sommer, IEEE Trans. Signal Process. 49, 3136 (2001).
[CrossRef]

J. Opt. Soc. Am. A

Opt. Commun.

C. S. Yelleswarapu, S. Kothapalli, and D. V. G. L. N. Rao, Opt. Commun. 281, 1876 (2008).
[CrossRef] [PubMed]

Opt. Express

Opt. Lett.

Phys. Procedia

C. Unverzagt, S. Olfert, and B. Hennig, Phys. Procedia 3, 935 (2010).
[CrossRef]

Other

C. Maurer, A. Jesacher, S. Bernet, and M. Ritsch-Marte, Laser Photon. Rev., doi: 10.1002/lpor.200900047.

S. L. Hahn, Hilbert Transform in Signal Processing(Artech, 1996).

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Figures (3)

Fig. 1
Fig. 1

Scheme of LCI microscope setup with FPF by using an SLM.

Fig. 2
Fig. 2

Interferometric imaging with FPF exemplified on a planar feature, with indicated SLM filter–functions for (a) bright field, (b) DF, (c) SP, and SC contrast under (d)  45 ° and (e)  90 ° orientation. In (a), a set of raw phase-shifted interference images is given.

Fig. 3
Fig. 3

Depth-resolved FPF imaging on a glass slide with partly opaque features on the front and back side: (a) conventional microscopy image, (b) LCI image from front, and (c) back side in the bright-field mode. (d)–(f) Same series with SP filter.

Equations (5)

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u ˜ S ( x ) F 1 { H ( k ) F { u S ( x ) } } ,
H DF ( k ) = { 0 for     | k | k a 1 for     | k | > k a ,
H SC ( k ) = 1 sgn ( k · e n ) ,
H PC ( k ) = { exp ( ± i π / 2 ) for    | k | k a 1 for    | k | > k a ,
H SP ( k ) = i k | k | = i exp ( i Θ ) ,

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