Abstract

We demonstrate high-speed terahertz (THz) time-domain spectroscopy based on electronically controlled optical sampling (ECOPS). The ECOPS system utilizes two synchronized Ti:sapphire femtosecond lasers with a 100MHz repetition frequency. The time delay between the two laser pulses is demonstrated to be rapidly swept at a scan rate of 1kHz on a time delay window of 77ps by using an external offset voltage applied to a locking electronics. It is shown that a THz pulse can be exactly measured by ECOPS, as is done by asynchronous optical sampling (ASOPS), and the measurement time is shortened by a factor of 50 by using ECOPS compared with ASOPS in the case of employing 100MHz repetition-rate lasers.

© 2010 Optical Society of America

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2010

Y. Kim, D. S. Yee, M. Yi, and J. Ahn, J. Korean Phys. Soc. 56, 255 (2010).
[CrossRef]

S. Kray, F. Spöler, T. Hellerer, and H. Kurz, Opt. Express 18, 9976 (2010).
[CrossRef]

2009

2008

F. Tauser, C. Rausch, J. H. Posthumus, and F. Lison, Proc. SPIE 6881, 68810O (2008).
[CrossRef]

2007

A. Bartels, R. Cerna, C. Kistner, A. Thoma, F. Hudert, C. Janke, and T. Dekorsy, Rev. Sci. Instrum. 78, 035107 (2007).
[CrossRef]

2006

2005

T. Yasui, E. Saneyoshi, and T. Araki, Appl. Phys. Lett. 87, 061101 (2005).
[CrossRef]

Ahn, J.

Y. Kim, D. S. Yee, M. Yi, and J. Ahn, J. Korean Phys. Soc. 56, 255 (2010).
[CrossRef]

Araki, T.

T. Yasui, E. Saneyoshi, and T. Araki, Appl. Phys. Lett. 87, 061101 (2005).
[CrossRef]

Bartels, A.

Cerna, R.

A. Bartels, R. Cerna, C. Kistner, A. Thoma, F. Hudert, C. Janke, and T. Dekorsy, Rev. Sci. Instrum. 78, 035107 (2007).
[CrossRef]

Dekorsy, T.

Dreyhaupt, A.

Gebs, R.

Hellerer, T.

Helm, M.

Hudert, F.

A. Bartels, R. Cerna, C. Kistner, A. Thoma, F. Hudert, C. Janke, and T. Dekorsy, Rev. Sci. Instrum. 78, 035107 (2007).
[CrossRef]

Janke, C.

Kim, Y.

Y. Kim, D. S. Yee, M. Yi, and J. Ahn, J. Korean Phys. Soc. 56, 255 (2010).
[CrossRef]

Kistner, C.

A. Bartels, R. Cerna, C. Kistner, A. Thoma, F. Hudert, C. Janke, and T. Dekorsy, Rev. Sci. Instrum. 78, 035107 (2007).
[CrossRef]

Klatt, G.

Kray, S.

Kurz, H.

Lison, F.

F. Tauser, C. Rausch, J. H. Posthumus, and F. Lison, Proc. SPIE 6881, 68810O (2008).
[CrossRef]

Posthumus, J. H.

F. Tauser, C. Rausch, J. H. Posthumus, and F. Lison, Proc. SPIE 6881, 68810O (2008).
[CrossRef]

Rausch, C.

F. Tauser, C. Rausch, J. H. Posthumus, and F. Lison, Proc. SPIE 6881, 68810O (2008).
[CrossRef]

Saneyoshi, E.

T. Yasui, E. Saneyoshi, and T. Araki, Appl. Phys. Lett. 87, 061101 (2005).
[CrossRef]

Spöler, F.

Tauser, F.

F. Tauser, C. Rausch, J. H. Posthumus, and F. Lison, Proc. SPIE 6881, 68810O (2008).
[CrossRef]

Thoma, A.

A. Bartels, R. Cerna, C. Kistner, A. Thoma, F. Hudert, C. Janke, and T. Dekorsy, Rev. Sci. Instrum. 78, 035107 (2007).
[CrossRef]

A. Bartels, A. Thoma, C. Janke, T. Dekorsy, A. Dreyhaupt, S. Winnerl, and M. Helm, Opt. Express 14, 430 (2006).
[CrossRef]

Winnerl, S.

Yasui, T.

T. Yasui, E. Saneyoshi, and T. Araki, Appl. Phys. Lett. 87, 061101 (2005).
[CrossRef]

Yee, D. S.

Y. Kim, D. S. Yee, M. Yi, and J. Ahn, J. Korean Phys. Soc. 56, 255 (2010).
[CrossRef]

Yi, M.

Y. Kim, D. S. Yee, M. Yi, and J. Ahn, J. Korean Phys. Soc. 56, 255 (2010).
[CrossRef]

Appl. Phys. Lett.

T. Yasui, E. Saneyoshi, and T. Araki, Appl. Phys. Lett. 87, 061101 (2005).
[CrossRef]

J. Korean Phys. Soc.

Y. Kim, D. S. Yee, M. Yi, and J. Ahn, J. Korean Phys. Soc. 56, 255 (2010).
[CrossRef]

Opt. Express

Proc. SPIE

F. Tauser, C. Rausch, J. H. Posthumus, and F. Lison, Proc. SPIE 6881, 68810O (2008).
[CrossRef]

Rev. Sci. Instrum.

A. Bartels, R. Cerna, C. Kistner, A. Thoma, F. Hudert, C. Janke, and T. Dekorsy, Rev. Sci. Instrum. 78, 035107 (2007).
[CrossRef]

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