Abstract

Shape measurements by fringe projection methods require high-quality sinusoidal fringes. We present a sinusoidal fringe generation technique that utilizes slightly defocused binary fringe projection. The proposed method is a spatial version of the well-known pulse-width modulation (PWM) technique of electrical engineering. PWM is easy to implement using off-the-shelf projectors, and it allows us to overcome the gamma problem (i.e., the nonlinear projector response) in the output light intensity. We will demonstrate that, with a small defocusing level--lower than with other techniques proposed in the literature--a high-quality sinusoidal pattern is obtained. Validation experiments using a commercial video projector are presented.

© 2010 Optical Society of America

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    [CrossRef]
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    [CrossRef]
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  14. B. W. Williams, Principles and Elements of Power Electronics (B. W. Williams, 2006), Chap. 15.

2009 (2)

2007 (2)

S. Zhang and S.-T. Yau, Appl. Opt. 46, 36 (2007).
[CrossRef]

S. Zhang and P. S. Huang, Opt. Eng. 46, 063601 (2007).
[CrossRef]

2004 (1)

2003 (2)

Z. Song and D. V. Sarwate, Signal Process. 83, 2227 (2003).
[CrossRef]

P. S. Huang, C. Zhang, and F.-P. Chiang, Opt. Eng. 42, 163(2003).
[CrossRef]

1999 (1)

1975 (1)

S. R. Bowes, Proc. IEEE 122, 1285 (1975).

Asundi, A.

Bowes, S. R.

S. R. Bowes, Proc. IEEE 122, 1285 (1975).

Bruning, J. H.

H. Schreiber and J. H. Bruning, in Optical Shop Testing, 3rd ed., D.Malacara, ed. (Wiley, 2007), Chap. 14.

Chen, M.

Chiang, F.-P.

P. S. Huang, C. Zhang, and F.-P. Chiang, Opt. Eng. 42, 163(2003).
[CrossRef]

Creath, K.

K. Creath, J. Schmit, and J. C. Wyant, in Optical Shop Testing, 3rd ed., D.Malacara, ed. (Wiley, 2007), Chap. 16.

Guo, H.

He, H.

Huang, L.

Huang, P. S.

S. Zhang and P. S. Huang, Opt. Eng. 46, 063601 (2007).
[CrossRef]

P. S. Huang, C. Zhang, and F.-P. Chiang, Opt. Eng. 42, 163(2003).
[CrossRef]

Iwata, K.

Kakunai, S.

Kemao, Q.

Lei, S.

Pan, B.

Sakamoto, T.

Sarwate, D. V.

Z. Song and D. V. Sarwate, Signal Process. 83, 2227 (2003).
[CrossRef]

Schmit, J.

K. Creath, J. Schmit, and J. C. Wyant, in Optical Shop Testing, 3rd ed., D.Malacara, ed. (Wiley, 2007), Chap. 16.

Schreiber, H.

H. Schreiber and J. H. Bruning, in Optical Shop Testing, 3rd ed., D.Malacara, ed. (Wiley, 2007), Chap. 14.

Song, Z.

Z. Song and D. V. Sarwate, Signal Process. 83, 2227 (2003).
[CrossRef]

Williams, B. W.

B. W. Williams, Principles and Elements of Power Electronics (B. W. Williams, 2006), Chap. 15.

Wyant, J. C.

K. Creath, J. Schmit, and J. C. Wyant, in Optical Shop Testing, 3rd ed., D.Malacara, ed. (Wiley, 2007), Chap. 16.

Yau, S.-T.

Zhang, C.

P. S. Huang, C. Zhang, and F.-P. Chiang, Opt. Eng. 42, 163(2003).
[CrossRef]

Zhang, S.

Appl. Opt. (3)

Opt. Eng. (2)

P. S. Huang, C. Zhang, and F.-P. Chiang, Opt. Eng. 42, 163(2003).
[CrossRef]

S. Zhang and P. S. Huang, Opt. Eng. 46, 063601 (2007).
[CrossRef]

Opt. Lett. (2)

Proc. IEEE (1)

S. R. Bowes, Proc. IEEE 122, 1285 (1975).

Signal Process. (1)

Z. Song and D. V. Sarwate, Signal Process. 83, 2227 (2003).
[CrossRef]

Other (5)

B. W. Williams, Principles and Elements of Power Electronics (B. W. Williams, 2006), Chap. 15.

“Airy disk,” http://en.wikipedia.org/wiki/Airy_disc.

K. Creath, J. Schmit, and J. C. Wyant, in Optical Shop Testing, 3rd ed., D.Malacara, ed. (Wiley, 2007), Chap. 16.

H. Schreiber and J. H. Bruning, in Optical Shop Testing, 3rd ed., D.Malacara, ed. (Wiley, 2007), Chap. 14.

3-D Machine Vision Laboratory, http://www.vrac.iastate.edu/~song/.

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