Abstract

Gratings were successfully fabricated by photolithography by using a particular reactive cholesteric liquid crystal at two different temperatures. The reflection band of the grating was found to be wider than that of a film having a single helical order, because the grating exhibited a binary helical order. Moreover, the surface topography of the grating was regulated by using photomasks with different pitches. The optical reflection spectrum of this grating structure spans two reflection spectra of cholesteric liquid crystal films that were prepared by UV curing at two heating temperatures. Experimental results reveal that the method proposed in this study can be used to produce broadband circular polarizing films.

© 2010 Optical Society of America

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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]

2010 (2)

S. Serak, N. Tabiryan, R. Vergara, T. J. White, R. A. Vaia, and T. J. Bunning, Soft Matt. 6, 779 (2010).
[CrossRef]

T. J. White, R. L. Bricker, L. V. Natarajan, V. P. Tondiglia, L. Green, Q. Li, and T. J. Bunning, Opt. Express 18, 173(2010).
[CrossRef] [PubMed]

2009 (2)

Y. Li, T. X. Wu, and S. T. Wu, J. Display Technol. 5, 335 (2009).
[CrossRef]

C. L. V. Oosten, C. W. M. Bastiaansen, and D. J. Broer, Nat. Mater. 8, 677 (2009).
[CrossRef] [PubMed]

2008 (2)

M. Yamada, M. Kondo, J. I. Mamiya, Y. Yu, M. Kinoshita, C. J. Barrett, and T. Ikeda, Angew. Chem., Int. Ed. Engl. 47, 4986 (2008).
[CrossRef]

D. K. Yang, J. Soc. Inf. Disp. 16, 117 (2008).
[CrossRef]

2007 (2)

S. Relaix, C. Bourgerette, and M. Mitov, Liq. Cryst. 34, 1009 (2007).
[CrossRef]

Y. Huang, Y. Zhou, and S. T. Wu, Opt. Express 15, 6414 (2007).
[CrossRef] [PubMed]

2006 (2)

M. E. Sousa, D. J. Broer, C. W. M. Bastiaansen, L. B. Freund, and G. P. Crawford, Adv. Mater. 18, 1842 (2006).
[CrossRef]

H. Xianyu, T. H. Lin, and S. T. Wu, Appl. Phys. Lett. 89, 091124 (2006).
[CrossRef]

2005 (1)

T. H. Lin, Y. J. Chen, C. H. Wu, A. Y. G. Fuh, J. H. Liu, and P. C. Yang, Appl. Phys. Lett. 86, 161120 (2005).
[CrossRef]

2004 (1)

M. Mitov, E. Nouvet, and N. Dessaud, Eur. Phys. J. E 15, 413 (2004).
[CrossRef] [PubMed]

1995 (2)

T. J. Bunning and F. H. Kreuzer, Trends Polym. Sci. 3, 318 (1995).

D. J. Broer, J. Lub, and G. N. Mol, Nature 378, 467 (1995).
[CrossRef]

1991 (2)

F. H. Kreuzer, D. Andrejewski, W. Haas, N. Haberle, G. Riepl, and P. Spes, Mol. Cryst. Liq. Cryst. 199, 345 (1991).
[CrossRef]

D. J. Broer and G. N. Mol, Polym. Eng. Sci. 31, 625 (1991).
[CrossRef]

Andrejewski, D.

F. H. Kreuzer, D. Andrejewski, W. Haas, N. Haberle, G. Riepl, and P. Spes, Mol. Cryst. Liq. Cryst. 199, 345 (1991).
[CrossRef]

Barrett, C. J.

M. Yamada, M. Kondo, J. I. Mamiya, Y. Yu, M. Kinoshita, C. J. Barrett, and T. Ikeda, Angew. Chem., Int. Ed. Engl. 47, 4986 (2008).
[CrossRef]

Bastiaansen, C. W. M.

C. L. V. Oosten, C. W. M. Bastiaansen, and D. J. Broer, Nat. Mater. 8, 677 (2009).
[CrossRef] [PubMed]

M. E. Sousa, D. J. Broer, C. W. M. Bastiaansen, L. B. Freund, and G. P. Crawford, Adv. Mater. 18, 1842 (2006).
[CrossRef]

Bourgerette, C.

S. Relaix, C. Bourgerette, and M. Mitov, Liq. Cryst. 34, 1009 (2007).
[CrossRef]

Bricker, R. L.

Broer, D. J.

C. L. V. Oosten, C. W. M. Bastiaansen, and D. J. Broer, Nat. Mater. 8, 677 (2009).
[CrossRef] [PubMed]

M. E. Sousa, D. J. Broer, C. W. M. Bastiaansen, L. B. Freund, and G. P. Crawford, Adv. Mater. 18, 1842 (2006).
[CrossRef]

D. J. Broer, J. Lub, and G. N. Mol, Nature 378, 467 (1995).
[CrossRef]

D. J. Broer and G. N. Mol, Polym. Eng. Sci. 31, 625 (1991).
[CrossRef]

Bunning, T. J.

S. Serak, N. Tabiryan, R. Vergara, T. J. White, R. A. Vaia, and T. J. Bunning, Soft Matt. 6, 779 (2010).
[CrossRef]

T. J. White, R. L. Bricker, L. V. Natarajan, V. P. Tondiglia, L. Green, Q. Li, and T. J. Bunning, Opt. Express 18, 173(2010).
[CrossRef] [PubMed]

T. J. Bunning and F. H. Kreuzer, Trends Polym. Sci. 3, 318 (1995).

Chen, Y. J.

T. H. Lin, Y. J. Chen, C. H. Wu, A. Y. G. Fuh, J. H. Liu, and P. C. Yang, Appl. Phys. Lett. 86, 161120 (2005).
[CrossRef]

Crawford, G. P.

M. E. Sousa, D. J. Broer, C. W. M. Bastiaansen, L. B. Freund, and G. P. Crawford, Adv. Mater. 18, 1842 (2006).
[CrossRef]

Dessaud, N.

M. Mitov, E. Nouvet, and N. Dessaud, Eur. Phys. J. E 15, 413 (2004).
[CrossRef] [PubMed]

Freund, L. B.

M. E. Sousa, D. J. Broer, C. W. M. Bastiaansen, L. B. Freund, and G. P. Crawford, Adv. Mater. 18, 1842 (2006).
[CrossRef]

Fuh, A. Y. G.

T. H. Lin, Y. J. Chen, C. H. Wu, A. Y. G. Fuh, J. H. Liu, and P. C. Yang, Appl. Phys. Lett. 86, 161120 (2005).
[CrossRef]

Green, L.

Haas, W.

F. H. Kreuzer, D. Andrejewski, W. Haas, N. Haberle, G. Riepl, and P. Spes, Mol. Cryst. Liq. Cryst. 199, 345 (1991).
[CrossRef]

Haberle, N.

F. H. Kreuzer, D. Andrejewski, W. Haas, N. Haberle, G. Riepl, and P. Spes, Mol. Cryst. Liq. Cryst. 199, 345 (1991).
[CrossRef]

Huang, Y.

Ikeda, T.

M. Yamada, M. Kondo, J. I. Mamiya, Y. Yu, M. Kinoshita, C. J. Barrett, and T. Ikeda, Angew. Chem., Int. Ed. Engl. 47, 4986 (2008).
[CrossRef]

Kinoshita, M.

M. Yamada, M. Kondo, J. I. Mamiya, Y. Yu, M. Kinoshita, C. J. Barrett, and T. Ikeda, Angew. Chem., Int. Ed. Engl. 47, 4986 (2008).
[CrossRef]

Kondo, M.

M. Yamada, M. Kondo, J. I. Mamiya, Y. Yu, M. Kinoshita, C. J. Barrett, and T. Ikeda, Angew. Chem., Int. Ed. Engl. 47, 4986 (2008).
[CrossRef]

Kreuzer, F. H.

T. J. Bunning and F. H. Kreuzer, Trends Polym. Sci. 3, 318 (1995).

F. H. Kreuzer, D. Andrejewski, W. Haas, N. Haberle, G. Riepl, and P. Spes, Mol. Cryst. Liq. Cryst. 199, 345 (1991).
[CrossRef]

Li, Q.

Li, Y.

Lin, T. H.

H. Xianyu, T. H. Lin, and S. T. Wu, Appl. Phys. Lett. 89, 091124 (2006).
[CrossRef]

T. H. Lin, Y. J. Chen, C. H. Wu, A. Y. G. Fuh, J. H. Liu, and P. C. Yang, Appl. Phys. Lett. 86, 161120 (2005).
[CrossRef]

Liu, J. H.

T. H. Lin, Y. J. Chen, C. H. Wu, A. Y. G. Fuh, J. H. Liu, and P. C. Yang, Appl. Phys. Lett. 86, 161120 (2005).
[CrossRef]

Lub, J.

D. J. Broer, J. Lub, and G. N. Mol, Nature 378, 467 (1995).
[CrossRef]

Mamiya, J. I.

M. Yamada, M. Kondo, J. I. Mamiya, Y. Yu, M. Kinoshita, C. J. Barrett, and T. Ikeda, Angew. Chem., Int. Ed. Engl. 47, 4986 (2008).
[CrossRef]

Mitov, M.

S. Relaix, C. Bourgerette, and M. Mitov, Liq. Cryst. 34, 1009 (2007).
[CrossRef]

M. Mitov, E. Nouvet, and N. Dessaud, Eur. Phys. J. E 15, 413 (2004).
[CrossRef] [PubMed]

Mol, G. N.

D. J. Broer, J. Lub, and G. N. Mol, Nature 378, 467 (1995).
[CrossRef]

D. J. Broer and G. N. Mol, Polym. Eng. Sci. 31, 625 (1991).
[CrossRef]

Natarajan, L. V.

Nouvet, E.

M. Mitov, E. Nouvet, and N. Dessaud, Eur. Phys. J. E 15, 413 (2004).
[CrossRef] [PubMed]

Oosten, C. L. V.

C. L. V. Oosten, C. W. M. Bastiaansen, and D. J. Broer, Nat. Mater. 8, 677 (2009).
[CrossRef] [PubMed]

Relaix, S.

S. Relaix, C. Bourgerette, and M. Mitov, Liq. Cryst. 34, 1009 (2007).
[CrossRef]

Riepl, G.

F. H. Kreuzer, D. Andrejewski, W. Haas, N. Haberle, G. Riepl, and P. Spes, Mol. Cryst. Liq. Cryst. 199, 345 (1991).
[CrossRef]

Serak, S.

S. Serak, N. Tabiryan, R. Vergara, T. J. White, R. A. Vaia, and T. J. Bunning, Soft Matt. 6, 779 (2010).
[CrossRef]

Sousa, M. E.

M. E. Sousa, D. J. Broer, C. W. M. Bastiaansen, L. B. Freund, and G. P. Crawford, Adv. Mater. 18, 1842 (2006).
[CrossRef]

Spes, P.

F. H. Kreuzer, D. Andrejewski, W. Haas, N. Haberle, G. Riepl, and P. Spes, Mol. Cryst. Liq. Cryst. 199, 345 (1991).
[CrossRef]

Tabiryan, N.

S. Serak, N. Tabiryan, R. Vergara, T. J. White, R. A. Vaia, and T. J. Bunning, Soft Matt. 6, 779 (2010).
[CrossRef]

Tondiglia, V. P.

Vaia, R. A.

S. Serak, N. Tabiryan, R. Vergara, T. J. White, R. A. Vaia, and T. J. Bunning, Soft Matt. 6, 779 (2010).
[CrossRef]

Vergara, R.

S. Serak, N. Tabiryan, R. Vergara, T. J. White, R. A. Vaia, and T. J. Bunning, Soft Matt. 6, 779 (2010).
[CrossRef]

White, T. J.

S. Serak, N. Tabiryan, R. Vergara, T. J. White, R. A. Vaia, and T. J. Bunning, Soft Matt. 6, 779 (2010).
[CrossRef]

T. J. White, R. L. Bricker, L. V. Natarajan, V. P. Tondiglia, L. Green, Q. Li, and T. J. Bunning, Opt. Express 18, 173(2010).
[CrossRef] [PubMed]

Wu, C. H.

T. H. Lin, Y. J. Chen, C. H. Wu, A. Y. G. Fuh, J. H. Liu, and P. C. Yang, Appl. Phys. Lett. 86, 161120 (2005).
[CrossRef]

Wu, S. T.

Wu, T. X.

Xianyu, H.

H. Xianyu, T. H. Lin, and S. T. Wu, Appl. Phys. Lett. 89, 091124 (2006).
[CrossRef]

Yamada, M.

M. Yamada, M. Kondo, J. I. Mamiya, Y. Yu, M. Kinoshita, C. J. Barrett, and T. Ikeda, Angew. Chem., Int. Ed. Engl. 47, 4986 (2008).
[CrossRef]

Yang, D. K.

D. K. Yang, J. Soc. Inf. Disp. 16, 117 (2008).
[CrossRef]

Yang, P. C.

T. H. Lin, Y. J. Chen, C. H. Wu, A. Y. G. Fuh, J. H. Liu, and P. C. Yang, Appl. Phys. Lett. 86, 161120 (2005).
[CrossRef]

Yu, Y.

M. Yamada, M. Kondo, J. I. Mamiya, Y. Yu, M. Kinoshita, C. J. Barrett, and T. Ikeda, Angew. Chem., Int. Ed. Engl. 47, 4986 (2008).
[CrossRef]

Zhou, Y.

Adv. Mater. (1)

M. E. Sousa, D. J. Broer, C. W. M. Bastiaansen, L. B. Freund, and G. P. Crawford, Adv. Mater. 18, 1842 (2006).
[CrossRef]

Angew. Chem., Int. Ed. Engl. (1)

M. Yamada, M. Kondo, J. I. Mamiya, Y. Yu, M. Kinoshita, C. J. Barrett, and T. Ikeda, Angew. Chem., Int. Ed. Engl. 47, 4986 (2008).
[CrossRef]

Appl. Phys. Lett. (2)

T. H. Lin, Y. J. Chen, C. H. Wu, A. Y. G. Fuh, J. H. Liu, and P. C. Yang, Appl. Phys. Lett. 86, 161120 (2005).
[CrossRef]

H. Xianyu, T. H. Lin, and S. T. Wu, Appl. Phys. Lett. 89, 091124 (2006).
[CrossRef]

Eur. Phys. J. E (1)

M. Mitov, E. Nouvet, and N. Dessaud, Eur. Phys. J. E 15, 413 (2004).
[CrossRef] [PubMed]

J. Display Technol. (1)

J. Soc. Inf. Disp. (1)

D. K. Yang, J. Soc. Inf. Disp. 16, 117 (2008).
[CrossRef]

Liq. Cryst. (1)

S. Relaix, C. Bourgerette, and M. Mitov, Liq. Cryst. 34, 1009 (2007).
[CrossRef]

Mol. Cryst. Liq. Cryst. (1)

F. H. Kreuzer, D. Andrejewski, W. Haas, N. Haberle, G. Riepl, and P. Spes, Mol. Cryst. Liq. Cryst. 199, 345 (1991).
[CrossRef]

Nat. Mater. (1)

C. L. V. Oosten, C. W. M. Bastiaansen, and D. J. Broer, Nat. Mater. 8, 677 (2009).
[CrossRef] [PubMed]

Nature (1)

D. J. Broer, J. Lub, and G. N. Mol, Nature 378, 467 (1995).
[CrossRef]

Opt. Express (2)

Polym. Eng. Sci. (1)

D. J. Broer and G. N. Mol, Polym. Eng. Sci. 31, 625 (1991).
[CrossRef]

Soft Matt. (1)

S. Serak, N. Tabiryan, R. Vergara, T. J. White, R. A. Vaia, and T. J. Bunning, Soft Matt. 6, 779 (2010).
[CrossRef]

Trends Polym. Sci. (1)

T. J. Bunning and F. H. Kreuzer, Trends Polym. Sci. 3, 318 (1995).

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Figures (4)

Fig. 1
Fig. 1

Scanning electron micrograph (SEM) of cross-sectional CLC and corresponding photographs. (a) Temperature of UV curing is 80 ° C , and thickness of CLC film is 5.3 μm . Inset, SEM of CLC pitch; scale bar represents 470 nm . (b) Temperature of UV curing is 120 ° C , and thickness of CLC film is 4.6 μm . Inset, SEM of CLC pitch; scale bar represents 370 nm .

Fig. 2
Fig. 2

Fabrication of CLC grating.

Fig. 3
Fig. 3

Optical image obtained using POM and corresponding surface topography. (a) Period of grating is 40 μm , and scale bar in optical image represents 80 μm . Inset, right side, three-dimensional surface topography. (b) Period of grating is 20 μm , and scale bar in optical image represents 80 μm . Inset, right side, three-dimensional surface topography.

Fig. 4
Fig. 4

Reflection spectra of gratings with various periods and optical films that contain a single cholesteric mesogen.

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