Abstract

We propose and demonstrate a method for the measurement of the wavefronts of high-power diode laser beams with large dynamic ranges. Our wavefront sensor consists of a movable pinhole and a wavefront-slope detector. The measurement results show that the wavefront sensor exhibits a large dynamic range of π2 to π2 and a high precision on the measured average wavefront slope. The wavefronts of high-power diode laser beams having large divergence angles at arbitrary locations (including near and far fields) can be reconstructed via the wavefront measurement at a given location. The amplitude and phase distributions of a laser beam could be determined from the measured optical field data using diffraction theory. The experimental measurement of the wavefront of a 980nm diode laser beam will be presented and discussed.

© 2008 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. H. Kogelink, Microwave Research Institute Symposia Series (Polytechnic, 1964), Vol. 14, p. 333.
  2. V. S. Shah, L. Curtis, R. S. Vodhanel, D. P. Bour, and W. C. Yang, J. Lightwave Technol. 8, 1313 (1990).
    [CrossRef]
  3. H. M. Presby and C. R. Giles, IEEE Photon. Technol. Lett. 5, 184 (1993).
    [CrossRef]
  4. C. A. Edwards, H. M. Presby, and C. Dragone, J. Lightwave Technol. 11, 252 (1993).
    [CrossRef]
  5. H. Yoda and K. Shiraishi, J. Lightwave Technol. 19, 1910 (2001).
    [CrossRef]
  6. Y.-K. Lu, Y.-C. Tsai, Y.-D. Liu, S.-M. Yeh, C.-C. Lin, and W.-H. Cheng, Opt. Express 15, 1434 (2007).
    [CrossRef] [PubMed]
  7. D. C. Van Eck, IEEE J. Quantum Electron. 19, 966 (1983).
    [CrossRef]
  8. I. Ghozeil, Optical Shop Testing, D.Malacara, ed. (Wiley, 1978), p. 323.
  9. A. F. Brooks, T.-L. Kelly, P. J. Veitch, and J. Munch, Opt. Express 15, 10370 (2007).
    [CrossRef] [PubMed]
  10. J. Primot, Opt. Commun. 222, 81 (2003).
    [CrossRef]
  11. M. Rocktaschel and H. J. Tiziani, Opt. Laser Technol. 34, 631 (2002).
    [CrossRef]
  12. Axcel Photonics, Marborough, Mass. (2006).
  13. W. H. Southwell, J. Opt. Soc. Am. 70, 998 (1980).
    [CrossRef]
  14. B. E. A. Saleh and M. C. Teich, Fundamentals of Photonics (Wiley, 1991), p. 116.

2007 (2)

2003 (1)

J. Primot, Opt. Commun. 222, 81 (2003).
[CrossRef]

2002 (1)

M. Rocktaschel and H. J. Tiziani, Opt. Laser Technol. 34, 631 (2002).
[CrossRef]

2001 (1)

1993 (2)

H. M. Presby and C. R. Giles, IEEE Photon. Technol. Lett. 5, 184 (1993).
[CrossRef]

C. A. Edwards, H. M. Presby, and C. Dragone, J. Lightwave Technol. 11, 252 (1993).
[CrossRef]

1990 (1)

V. S. Shah, L. Curtis, R. S. Vodhanel, D. P. Bour, and W. C. Yang, J. Lightwave Technol. 8, 1313 (1990).
[CrossRef]

1983 (1)

D. C. Van Eck, IEEE J. Quantum Electron. 19, 966 (1983).
[CrossRef]

1980 (1)

Bour, D. P.

V. S. Shah, L. Curtis, R. S. Vodhanel, D. P. Bour, and W. C. Yang, J. Lightwave Technol. 8, 1313 (1990).
[CrossRef]

Brooks, A. F.

Cheng, W.-H.

Curtis, L.

V. S. Shah, L. Curtis, R. S. Vodhanel, D. P. Bour, and W. C. Yang, J. Lightwave Technol. 8, 1313 (1990).
[CrossRef]

Dragone, C.

C. A. Edwards, H. M. Presby, and C. Dragone, J. Lightwave Technol. 11, 252 (1993).
[CrossRef]

Edwards, C. A.

C. A. Edwards, H. M. Presby, and C. Dragone, J. Lightwave Technol. 11, 252 (1993).
[CrossRef]

Ghozeil, I.

I. Ghozeil, Optical Shop Testing, D.Malacara, ed. (Wiley, 1978), p. 323.

Giles, C. R.

H. M. Presby and C. R. Giles, IEEE Photon. Technol. Lett. 5, 184 (1993).
[CrossRef]

Kelly, T.-L.

Kogelink, H.

H. Kogelink, Microwave Research Institute Symposia Series (Polytechnic, 1964), Vol. 14, p. 333.

Lin, C.-C.

Liu, Y.-D.

Lu, Y.-K.

Munch, J.

Presby, H. M.

H. M. Presby and C. R. Giles, IEEE Photon. Technol. Lett. 5, 184 (1993).
[CrossRef]

C. A. Edwards, H. M. Presby, and C. Dragone, J. Lightwave Technol. 11, 252 (1993).
[CrossRef]

Primot, J.

J. Primot, Opt. Commun. 222, 81 (2003).
[CrossRef]

Rocktaschel, M.

M. Rocktaschel and H. J. Tiziani, Opt. Laser Technol. 34, 631 (2002).
[CrossRef]

Saleh, B. E. A.

B. E. A. Saleh and M. C. Teich, Fundamentals of Photonics (Wiley, 1991), p. 116.

Shah, V. S.

V. S. Shah, L. Curtis, R. S. Vodhanel, D. P. Bour, and W. C. Yang, J. Lightwave Technol. 8, 1313 (1990).
[CrossRef]

Shiraishi, K.

Southwell, W. H.

Teich, M. C.

B. E. A. Saleh and M. C. Teich, Fundamentals of Photonics (Wiley, 1991), p. 116.

Tiziani, H. J.

M. Rocktaschel and H. J. Tiziani, Opt. Laser Technol. 34, 631 (2002).
[CrossRef]

Tsai, Y.-C.

Van Eck, D. C.

D. C. Van Eck, IEEE J. Quantum Electron. 19, 966 (1983).
[CrossRef]

Veitch, P. J.

Vodhanel, R. S.

V. S. Shah, L. Curtis, R. S. Vodhanel, D. P. Bour, and W. C. Yang, J. Lightwave Technol. 8, 1313 (1990).
[CrossRef]

Yang, W. C.

V. S. Shah, L. Curtis, R. S. Vodhanel, D. P. Bour, and W. C. Yang, J. Lightwave Technol. 8, 1313 (1990).
[CrossRef]

Yeh, S.-M.

Yoda, H.

IEEE J. Quantum Electron. (1)

D. C. Van Eck, IEEE J. Quantum Electron. 19, 966 (1983).
[CrossRef]

IEEE Photon. Technol. Lett. (1)

H. M. Presby and C. R. Giles, IEEE Photon. Technol. Lett. 5, 184 (1993).
[CrossRef]

J. Lightwave Technol. (3)

C. A. Edwards, H. M. Presby, and C. Dragone, J. Lightwave Technol. 11, 252 (1993).
[CrossRef]

H. Yoda and K. Shiraishi, J. Lightwave Technol. 19, 1910 (2001).
[CrossRef]

V. S. Shah, L. Curtis, R. S. Vodhanel, D. P. Bour, and W. C. Yang, J. Lightwave Technol. 8, 1313 (1990).
[CrossRef]

J. Opt. Soc. Am. (1)

Opt. Commun. (1)

J. Primot, Opt. Commun. 222, 81 (2003).
[CrossRef]

Opt. Express (2)

Opt. Laser Technol. (1)

M. Rocktaschel and H. J. Tiziani, Opt. Laser Technol. 34, 631 (2002).
[CrossRef]

Other (4)

Axcel Photonics, Marborough, Mass. (2006).

B. E. A. Saleh and M. C. Teich, Fundamentals of Photonics (Wiley, 1991), p. 116.

H. Kogelink, Microwave Research Institute Symposia Series (Polytechnic, 1964), Vol. 14, p. 333.

I. Ghozeil, Optical Shop Testing, D.Malacara, ed. (Wiley, 1978), p. 323.

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

Fig. 1
Fig. 1

Setup of wavefront measurement.

Fig. 2
Fig. 2

Measured wavefront slopes in the (a) vertical and (b) horizontal axes for 980 nm high-power laser diodes.

Fig. 3
Fig. 3

Reconstructed wavefront at z = 4.5 mm (in units of rad 2 π ) for the light source along the (a) vertical and (b) horizontal axes.

Fig. 4
Fig. 4

Experimental intensity distributions and numerical results of the intensity of the reconstructed field in the (a) vertical and (b) horizontal axes.

Equations (6)

Equations on this page are rendered with MathJax. Learn more.

U ( x , y ) = U ( x , y ) exp [ i φ ( x , y ) ] .
k = ( k x , k y , k z ) ,
k x = φ ( x , y ) x , k y = φ ( x , y ) y , k z = ( ω c ) 2 k x 2 k y 2 .
φ ( x , y ) = k x d x + k y d y .
F ( k x , k y ) = U ( x , y ) exp ( i k x x + i k y y ) d x d y .
U z ( x , y ) = F ( k x , k y ) exp ( i k x x i k y y i k z z ) d k x d k y ,

Metrics