Abstract

A phase-sensitive optical low-coherence reflectometry (OLCR) technique is demonstrated to simultaneously measure the absolute chromatic dispersion values of each guided LP mode of a few-mode fiber. We show that the OLCR technique requires only short samples of fiber (<1m) and has no need for high-ratio mode converters to reach an accurate wavelength-dependent group delay evolution of every mode. As an example we present for the first time to our knowledge a direct and complete analysis of few-mode fibers with high, low, positive, and negative modal dispersion values, leading to chromatic dispersion parameters in good agreement with theoretical predictions.

© 2007 Optical Society of America

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References

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    [Crossref]
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    [Crossref] [PubMed]
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    [Crossref]
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    [Crossref]
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    [Crossref]
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    [Crossref]
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    [Crossref]
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    [Crossref] [PubMed]
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    [Crossref]
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2006 (1)

2005 (2)

2003 (2)

C. Palavicini, C. Campuzano, B. Thedrez, Y. Jaouën, and P. Gallion, IEEE Photon. Technol. Lett. 15, 1683 (2003).
[Crossref]

J. W. Nicholson, S. Ramachandran, S. Ghalmi, E. A. Monberg, F. V. DiMarcello, M. F. Yan, P. Wisk, and J. W. Fleming, IEEE Photon. Technol. Lett. 15, 831 (2003).
[Crossref]

2001 (1)

D. Menashe, M. Tur, and Y. Danziger, Electron. Lett. 37, 1439 (2001).
[Crossref]

1999 (2)

1998 (1)

1987 (1)

P. L. François, F. Alard, and M. Monerie, Electron. Lett. 23, 357 (1987).
[Crossref]

Alard, F.

P. L. François, F. Alard, and M. Monerie, Electron. Lett. 23, 357 (1987).
[Crossref]

Campuzano, C.

C. Palavicini, C. Campuzano, B. Thedrez, Y. Jaouën, and P. Gallion, IEEE Photon. Technol. Lett. 15, 1683 (2003).
[Crossref]

Danziger, Y.

D. Menashe, M. Tur, and Y. Danziger, Electron. Lett. 37, 1439 (2001).
[Crossref]

Debarge, G.

Dianov, E. M.

Dimarcello, F. V.

S. Ramachandran, J. W. Nicholson, S. Ghalmi, M. F. Yan, P. Wisk, E. Monberg, and F. V. Dimarcello, Opt. Lett. 31, 1797 (2006).
[Crossref] [PubMed]

J. W. Nicholson, S. Ramachandran, S. Ghalmi, E. A. Monberg, F. V. DiMarcello, M. F. Yan, P. Wisk, and J. W. Fleming, IEEE Photon. Technol. Lett. 15, 831 (2003).
[Crossref]

Douay, M.

Duan, G.-H.

Dyer, S.

S. Dyer and K. B. Rochford, Electron. Lett. 35, 1485 (1999).
[Crossref]

Fleming, J. W.

J. W. Nicholson, S. Ramachandran, S. Ghalmi, E. A. Monberg, F. V. DiMarcello, M. F. Yan, P. Wisk, and J. W. Fleming, IEEE Photon. Technol. Lett. 15, 831 (2003).
[Crossref]

François, P. L.

P. L. François, F. Alard, and M. Monerie, Electron. Lett. 23, 357 (1987).
[Crossref]

Gallion, P.

C. Palavicini, C. Campuzano, B. Thedrez, Y. Jaouën, and P. Gallion, IEEE Photon. Technol. Lett. 15, 1683 (2003).
[Crossref]

U. Wiedmann, P. Gallion, and G.-H. Duan, J. Lightwave Technol. 16, 1343 (1998).
[Crossref]

Ghalmi, S.

S. Ramachandran, J. W. Nicholson, S. Ghalmi, M. F. Yan, P. Wisk, E. Monberg, and F. V. Dimarcello, Opt. Lett. 31, 1797 (2006).
[Crossref] [PubMed]

J. W. Nicholson, S. Ramachandran, S. Ghalmi, E. A. Monberg, F. V. DiMarcello, M. F. Yan, P. Wisk, and J. W. Fleming, IEEE Photon. Technol. Lett. 15, 831 (2003).
[Crossref]

Iocco, A.

Jaouën, Y.

C. Palavicini, Y. Jaouën, G. Debarge, E. Kerrinckx, Y. Quiquempois, M. Douay, C. Lepers, A.-F. Obaton, and G. Melin, Opt. Lett. 30, 361 (2005).
[Crossref] [PubMed]

C. Palavicini, C. Campuzano, B. Thedrez, Y. Jaouën, and P. Gallion, IEEE Photon. Technol. Lett. 15, 1683 (2003).
[Crossref]

A.-F. Obaton, Y. Jaouën, C. Palavicini, and C. Lepers, in Proceedings of the Lightwave Technologies in Instrumentation and Measurement Conference, 2004 (IEEE, 2004), p. 62.
[Crossref]

Kerrinckx, E.

Lepers, C.

C. Palavicini, Y. Jaouën, G. Debarge, E. Kerrinckx, Y. Quiquempois, M. Douay, C. Lepers, A.-F. Obaton, and G. Melin, Opt. Lett. 30, 361 (2005).
[Crossref] [PubMed]

A.-F. Obaton, Y. Jaouën, C. Palavicini, and C. Lepers, in Proceedings of the Lightwave Technologies in Instrumentation and Measurement Conference, 2004 (IEEE, 2004), p. 62.
[Crossref]

Limberger, H. G.

Medvedkov, O. I.

Melin, G.

Menashe, D.

D. Menashe, M. Tur, and Y. Danziger, Electron. Lett. 37, 1439 (2001).
[Crossref]

Monberg, E.

Monberg, E. A.

J. W. Nicholson, S. Ramachandran, S. Ghalmi, E. A. Monberg, F. V. DiMarcello, M. F. Yan, P. Wisk, and J. W. Fleming, IEEE Photon. Technol. Lett. 15, 831 (2003).
[Crossref]

Monerie, M.

P. L. François, F. Alard, and M. Monerie, Electron. Lett. 23, 357 (1987).
[Crossref]

Nicholson, J. W.

S. Ramachandran, J. W. Nicholson, S. Ghalmi, M. F. Yan, P. Wisk, E. Monberg, and F. V. Dimarcello, Opt. Lett. 31, 1797 (2006).
[Crossref] [PubMed]

J. W. Nicholson, S. Ramachandran, S. Ghalmi, E. A. Monberg, F. V. DiMarcello, M. F. Yan, P. Wisk, and J. W. Fleming, IEEE Photon. Technol. Lett. 15, 831 (2003).
[Crossref]

Obaton, A.-F.

C. Palavicini, Y. Jaouën, G. Debarge, E. Kerrinckx, Y. Quiquempois, M. Douay, C. Lepers, A.-F. Obaton, and G. Melin, Opt. Lett. 30, 361 (2005).
[Crossref] [PubMed]

A.-F. Obaton, Y. Jaouën, C. Palavicini, and C. Lepers, in Proceedings of the Lightwave Technologies in Instrumentation and Measurement Conference, 2004 (IEEE, 2004), p. 62.
[Crossref]

Palavicini, C.

C. Palavicini, Y. Jaouën, G. Debarge, E. Kerrinckx, Y. Quiquempois, M. Douay, C. Lepers, A.-F. Obaton, and G. Melin, Opt. Lett. 30, 361 (2005).
[Crossref] [PubMed]

C. Palavicini, C. Campuzano, B. Thedrez, Y. Jaouën, and P. Gallion, IEEE Photon. Technol. Lett. 15, 1683 (2003).
[Crossref]

A.-F. Obaton, Y. Jaouën, C. Palavicini, and C. Lepers, in Proceedings of the Lightwave Technologies in Instrumentation and Measurement Conference, 2004 (IEEE, 2004), p. 62.
[Crossref]

Protopopov, V. N.

Quiquempois, Y.

Ramachandran, S.

S. Ramachandran, J. W. Nicholson, S. Ghalmi, M. F. Yan, P. Wisk, E. Monberg, and F. V. Dimarcello, Opt. Lett. 31, 1797 (2006).
[Crossref] [PubMed]

S. Ramachandran, J. Lightwave Technol. 23, 3426 (2005).
[Crossref]

J. W. Nicholson, S. Ramachandran, S. Ghalmi, E. A. Monberg, F. V. DiMarcello, M. F. Yan, P. Wisk, and J. W. Fleming, IEEE Photon. Technol. Lett. 15, 831 (2003).
[Crossref]

Rochford, K. B.

S. Dyer and K. B. Rochford, Electron. Lett. 35, 1485 (1999).
[Crossref]

Salathé, R. P.

Thedrez, B.

C. Palavicini, C. Campuzano, B. Thedrez, Y. Jaouën, and P. Gallion, IEEE Photon. Technol. Lett. 15, 1683 (2003).
[Crossref]

Tur, M.

D. Menashe, M. Tur, and Y. Danziger, Electron. Lett. 37, 1439 (2001).
[Crossref]

Varelas, D.

Vasiliev, S. A.

Wiedmann, U.

Wisk, P.

S. Ramachandran, J. W. Nicholson, S. Ghalmi, M. F. Yan, P. Wisk, E. Monberg, and F. V. Dimarcello, Opt. Lett. 31, 1797 (2006).
[Crossref] [PubMed]

J. W. Nicholson, S. Ramachandran, S. Ghalmi, E. A. Monberg, F. V. DiMarcello, M. F. Yan, P. Wisk, and J. W. Fleming, IEEE Photon. Technol. Lett. 15, 831 (2003).
[Crossref]

Yan, M. F.

S. Ramachandran, J. W. Nicholson, S. Ghalmi, M. F. Yan, P. Wisk, E. Monberg, and F. V. Dimarcello, Opt. Lett. 31, 1797 (2006).
[Crossref] [PubMed]

J. W. Nicholson, S. Ramachandran, S. Ghalmi, E. A. Monberg, F. V. DiMarcello, M. F. Yan, P. Wisk, and J. W. Fleming, IEEE Photon. Technol. Lett. 15, 831 (2003).
[Crossref]

Electron. Lett. (3)

D. Menashe, M. Tur, and Y. Danziger, Electron. Lett. 37, 1439 (2001).
[Crossref]

P. L. François, F. Alard, and M. Monerie, Electron. Lett. 23, 357 (1987).
[Crossref]

S. Dyer and K. B. Rochford, Electron. Lett. 35, 1485 (1999).
[Crossref]

IEEE Photon. Technol. Lett. (2)

C. Palavicini, C. Campuzano, B. Thedrez, Y. Jaouën, and P. Gallion, IEEE Photon. Technol. Lett. 15, 1683 (2003).
[Crossref]

J. W. Nicholson, S. Ramachandran, S. Ghalmi, E. A. Monberg, F. V. DiMarcello, M. F. Yan, P. Wisk, and J. W. Fleming, IEEE Photon. Technol. Lett. 15, 831 (2003).
[Crossref]

J. Lightwave Technol. (2)

Opt. Lett. (3)

Other (1)

A.-F. Obaton, Y. Jaouën, C. Palavicini, and C. Lepers, in Proceedings of the Lightwave Technologies in Instrumentation and Measurement Conference, 2004 (IEEE, 2004), p. 62.
[Crossref]

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Figures (5)

Fig. 1
Fig. 1

Phase-sensitive OLCR setup. DAQ, data acquisition.

Fig. 2
Fig. 2

HOM fiber: (a) input and output face reflectograms; (b) GD evolution.

Fig. 3
Fig. 3

Output face reflectograms of an HOM fiber with overlapping modes: (a) simulated reflectogram; (b) experimental reflectogram.

Fig. 4
Fig. 4

Four output face reflectograms of a HOM fiber: (a) without any specific conditions, (b) filtering the source (L band), (c) bending the fiber, (d) shifting the injection point.

Fig. 5
Fig. 5

Calculated values of (a) the GD and (b) the GVD.

Tables (1)

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Table 1 Theoretical versus Experimental GVD 1550 nm

Equations (2)

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I ( τ ) 1 4 π R e { + S ( ω ) r ̃ ( ω ) e j ω τ d ω } ,
t g = d d ω [ ϕ rear ( ω ) ϕ front ( ω ) ] .

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