Abstract

We present two methods for three-dimensional particle metrology from a single two-dimensional view. The techniques are based on wavefront sensing where the three-dimensional location of a particle is encoded into a single image plane. The first technique is based on multiplanar imaging, and the second produces three-dimensional location information via anamorphic distortion of the recorded images. Preliminary results show that an uncertainty of 8μm in depth can be obtained for low-particle density over a thin plane, and an uncertainty of 30μm for higher particle density over a 10mm deep volume.

© 2006 Optical Society of America

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2005

B. Wieneke, Exp. Fluids 39, 267 (2005).
[CrossRef]

2002

D. H. Barnhart, N. A. Halliwell, and J. M. Coupland, Proc. R. Soc. London Ser. A 458, 2083 (2002).
[CrossRef]

2000

F. Pereira, M. Gharib, D. Dabiri, and D. Modarress, Exp. Fluids 29, S78 (2000).
[CrossRef]

P. M. Blanchard, D. J. Fisher, S. C. Woods, and A. H. Greenaway, Appl. Opt. 39, 6649 (2000).
[CrossRef]

1999

1998

J. G. Santiago, S. T. Wereley, C. Meinhart, B. J. Beebee, and R. J. Adrian, Exp. Fluids 25, 316 (1998).
[CrossRef]

1997

C. Brücker, Meas. Sci. Technol. 8, 1480 (1997).
[CrossRef]

1996

1995

1992

J. C. Wyant and K. Creath, in Applied Optics and Optical Engineering (Academic, 1992), Vol. XI, Chap. 1.

1991

R. K. Tyson, Principles of Adaptive Optics (Academic, 1991).

M. P. Arroyo and C. A. Greated, Meas. Sci. Technol. 2, 1181 (1991).
[CrossRef]

Adrian, R. J.

J. G. Santiago, S. T. Wereley, C. Meinhart, B. J. Beebee, and R. J. Adrian, Exp. Fluids 25, 316 (1998).
[CrossRef]

Arroyo, M. P.

M. P. Arroyo and C. A. Greated, Meas. Sci. Technol. 2, 1181 (1991).
[CrossRef]

Barnhart, D. H.

D. H. Barnhart, N. A. Halliwell, and J. M. Coupland, Proc. R. Soc. London Ser. A 458, 2083 (2002).
[CrossRef]

Beebee, B. J.

J. G. Santiago, S. T. Wereley, C. Meinhart, B. J. Beebee, and R. J. Adrian, Exp. Fluids 25, 316 (1998).
[CrossRef]

Blanchard, P. M.

Brücker, C.

C. Brücker, Meas. Sci. Technol. 8, 1480 (1997).
[CrossRef]

Coupland, J. M.

D. H. Barnhart, N. A. Halliwell, and J. M. Coupland, Proc. R. Soc. London Ser. A 458, 2083 (2002).
[CrossRef]

Creath, K.

J. C. Wyant and K. Creath, in Applied Optics and Optical Engineering (Academic, 1992), Vol. XI, Chap. 1.

Dabiri, D.

F. Pereira, M. Gharib, D. Dabiri, and D. Modarress, Exp. Fluids 29, S78 (2000).
[CrossRef]

Fisher, D. J.

Gharib, M.

F. Pereira, M. Gharib, D. Dabiri, and D. Modarress, Exp. Fluids 29, S78 (2000).
[CrossRef]

Greated, C. A.

M. P. Arroyo and C. A. Greated, Meas. Sci. Technol. 2, 1181 (1991).
[CrossRef]

Greenaway, A. H.

Gureyev, T. E.

Halliwell, N. A.

D. H. Barnhart, N. A. Halliwell, and J. M. Coupland, Proc. R. Soc. London Ser. A 458, 2083 (2002).
[CrossRef]

Meinhart, C.

J. G. Santiago, S. T. Wereley, C. Meinhart, B. J. Beebee, and R. J. Adrian, Exp. Fluids 25, 316 (1998).
[CrossRef]

Modarress, D.

F. Pereira, M. Gharib, D. Dabiri, and D. Modarress, Exp. Fluids 29, S78 (2000).
[CrossRef]

Nugent, K. A.

Pereira, F.

F. Pereira, M. Gharib, D. Dabiri, and D. Modarress, Exp. Fluids 29, S78 (2000).
[CrossRef]

Roberts, A.

Santiago, J. G.

J. G. Santiago, S. T. Wereley, C. Meinhart, B. J. Beebee, and R. J. Adrian, Exp. Fluids 25, 316 (1998).
[CrossRef]

Tyson, R. K.

R. K. Tyson, Principles of Adaptive Optics (Academic, 1991).

Wereley, S. T.

J. G. Santiago, S. T. Wereley, C. Meinhart, B. J. Beebee, and R. J. Adrian, Exp. Fluids 25, 316 (1998).
[CrossRef]

Wieneke, B.

B. Wieneke, Exp. Fluids 39, 267 (2005).
[CrossRef]

Woods, S. C.

Wyant, J. C.

J. C. Wyant and K. Creath, in Applied Optics and Optical Engineering (Academic, 1992), Vol. XI, Chap. 1.

Appl. Opt.

Exp. Fluids

F. Pereira, M. Gharib, D. Dabiri, and D. Modarress, Exp. Fluids 29, S78 (2000).
[CrossRef]

J. G. Santiago, S. T. Wereley, C. Meinhart, B. J. Beebee, and R. J. Adrian, Exp. Fluids 25, 316 (1998).
[CrossRef]

B. Wieneke, Exp. Fluids 39, 267 (2005).
[CrossRef]

J. Opt. Soc. Am. A

Meas. Sci. Technol.

C. Brücker, Meas. Sci. Technol. 8, 1480 (1997).
[CrossRef]

M. P. Arroyo and C. A. Greated, Meas. Sci. Technol. 2, 1181 (1991).
[CrossRef]

Proc. R. Soc. London Ser. A

D. H. Barnhart, N. A. Halliwell, and J. M. Coupland, Proc. R. Soc. London Ser. A 458, 2083 (2002).
[CrossRef]

Other

R. K. Tyson, Principles of Adaptive Optics (Academic, 1991).

J. C. Wyant and K. Creath, in Applied Optics and Optical Engineering (Academic, 1992), Vol. XI, Chap. 1.

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Figures (3)

Fig. 1
Fig. 1

Multiplanar imaging applied to 3D particle location measurement.

Fig. 2
Fig. 2

Anamorphic imaging for 3D particle metrology.

Fig. 3
Fig. 3

Single anamorphic image of a tracer particle: (a) original image, (b) extracted x image, (c) extracted y image; multiplanar imaging: (d) 1 order, (e) + 1 order (the bright outer ring is due to spherical aberration in the imaging lens used). Each image is 61 pixels square.

Tables (1)

Tables Icon

Table 1 Depth Uncertainty Data (1 Standard Deviation) From Multiplanar (MPI) and Anamorphic Imaging (AI)

Metrics