Abstract

At a temperature lower than the melting point of pure pentyl-cyanobiphenyl liquid crystal (5CB) we studied the photorefractive effect of 5CB heavily doped with fullerene (C60) and obtained a diffraction efficiency of the photorefractive grating of more than 40%, which is more than twice as high as the best data reported to our knowledge. A quasi-permanent grating was observed with a diffraction efficiency of 11.2% after the grating was kept in the dark for a month.

© 2005 Optical Society of America

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2003 (1)

I. C. Khoo, J. Ding, Y. Zhang, K. Chen, and A. Diaz, Opt. Lett. 82, 3587 (2003).

2002 (2)

2001 (2)

2000 (1)

1999 (1)

1998 (1)

1996 (1)

I. C. Khoo, IEEE J. Quantum Electron. 32, 525 (1996).
[CrossRef]

1995 (2)

G. P. Wiederrecht, B. A. Yoon, and M. R. Wasielewski, Science 270, 1794 (1995).
[CrossRef]

I. C. Khoo, Opt. Lett. 20, 2137 (1995).
[CrossRef] [PubMed]

1994 (4)

W. E. Moerner and S. M. Silence, Chem. Rev. (Washington, D.C.) 94, 127 (1994).
[CrossRef]

I. C. Khoo, H. Li, and Y. Liang, Opt. Lett. 19, 1723 (1994).
[CrossRef] [PubMed]

E. V. Rudenko and A. V. Sukhov, JETP Lett. 59, 142 (1994).

E. V. Rudenko and A. V. Sukhov, JETP 78, 875 (1994).
[CrossRef]

1978 (1)

Chen, H.-Y.

Chen, K.

I. C. Khoo, J. Ding, Y. Zhang, K. Chen, and A. Diaz, Opt. Lett. 82, 3587 (2003).

Chen, P.

Chen, P. H.

Chiu, C.-S.

Cipparrone, G.

P. Pagliusi and G. Cipparrone, Appl. Phys. Lett. 80, 168 (2002).
[CrossRef]

Diaz, A.

I. C. Khoo, J. Ding, Y. Zhang, K. Chen, and A. Diaz, Opt. Lett. 82, 3587 (2003).

Ding, J.

I. C. Khoo, J. Ding, Y. Zhang, K. Chen, and A. Diaz, Opt. Lett. 82, 3587 (2003).

Guenther, B. D.

Khoo, I. C.

Lee, W.

Li, H.

Liang, Y.

Moerner, W. E.

W. E. Moerner and S. M. Silence, Chem. Rev. (Washington, D.C.) 94, 127 (1994).
[CrossRef]

Moharam, M. G.

Ostroverkhov, V.

Pagliusi, P.

P. Pagliusi and G. Cipparrone, Appl. Phys. Lett. 80, 168 (2002).
[CrossRef]

P. Pagliusi, J. Opt. Soc. Am. B 18, 1632 (2001).
[CrossRef]

Rudenko, E. V.

E. V. Rudenko and A. V. Sukhov, JETP Lett. 59, 142 (1994).

E. V. Rudenko and A. V. Sukhov, JETP 78, 875 (1994).
[CrossRef]

Shih, M. Y.

Shih, M.-Y.

Silence, S. M.

W. E. Moerner and S. M. Silence, Chem. Rev. (Washington, D.C.) 94, 127 (1994).
[CrossRef]

Singer, K. D.

Slussarenko, S.

Sukhov, A. V.

E. V. Rudenko and A. V. Sukhov, JETP 78, 875 (1994).
[CrossRef]

E. V. Rudenko and A. V. Sukhov, JETP Lett. 59, 142 (1994).

Wasielewski, M. R.

G. P. Wiederrecht, B. A. Yoon, and M. R. Wasielewski, Science 270, 1794 (1995).
[CrossRef]

Wiederrecht, G. P.

G. P. Wiederrecht, B. A. Yoon, and M. R. Wasielewski, Science 270, 1794 (1995).
[CrossRef]

Wood, M. V.

Wood, W. V.

Wu, S.-T.

I. C. Khoo and S.-T. Wu, Optics and Nonlinear Optics of Liquid Crystals (World Scientific, Singapore, 1993), pp. 87–89.

Yeh, S.-L.

Yoon, B. A.

G. P. Wiederrecht, B. A. Yoon, and M. R. Wasielewski, Science 270, 1794 (1995).
[CrossRef]

Young, L.

Zhang, J.

Zhang, Y.

I. C. Khoo, J. Ding, Y. Zhang, K. Chen, and A. Diaz, Opt. Lett. 82, 3587 (2003).

Appl. Opt. (1)

Appl. Phys. Lett. (1)

P. Pagliusi and G. Cipparrone, Appl. Phys. Lett. 80, 168 (2002).
[CrossRef]

Chem. Rev. (Washington, D.C.) (1)

W. E. Moerner and S. M. Silence, Chem. Rev. (Washington, D.C.) 94, 127 (1994).
[CrossRef]

IEEE J. Quantum Electron. (1)

I. C. Khoo, IEEE J. Quantum Electron. 32, 525 (1996).
[CrossRef]

J. Opt. Soc. Am. B (1)

JETP (1)

E. V. Rudenko and A. V. Sukhov, JETP 78, 875 (1994).
[CrossRef]

JETP Lett. (1)

E. V. Rudenko and A. V. Sukhov, JETP Lett. 59, 142 (1994).

Opt. Express (2)

Opt. Lett. (6)

Science (1)

G. P. Wiederrecht, B. A. Yoon, and M. R. Wasielewski, Science 270, 1794 (1995).
[CrossRef]

Other (1)

I. C. Khoo and S.-T. Wu, Optics and Nonlinear Optics of Liquid Crystals (World Scientific, Singapore, 1993), pp. 87–89.

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Figures (3)

Fig. 1
Fig. 1

Experimental setup. M 1 M 5 , mirrors; BS, beam splitter; I 1 I 3 , beam intensities.

Fig. 2
Fig. 2

Dependence of the first-order diffraction efficiency on the applied electric field.

Fig. 3
Fig. 3

Curve of the first-order diffraction efficiency in the recording and erasing processes.

Equations (1)

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η = ( I d I t ) × 100 % .

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