Abstract

A parallel demodulation system for extrinsic Fabry–Perot interferometer (EFPI) and fiber Bragg grating (FBG) sensors is presented that is based on a Michelson interferometer and combines the methods of low-coherence interference and Fourier transform spectrum. Signals from EFPI and FBG sensors are obtained simultaneously by scanning one arm of a Michelson interferometer, and an algorithm model is established to process the signals and retrieve both the wavelength of the FBG and the cavity length of the EFPI at the same time, which are then used to determine the strain and temperature.

© 2005 Optical Society of America

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  1. S. Magne, J. Boussoir, S. Rougeault, V. Marty-Dewynter, P. Ferdinand, and L. Bureau, Proc. SPIE 5050, 305 (2003).
    [CrossRef]
  2. V. Bhatia, D. Campbell, M. J. Vries, D. Sherr, T. D’Alberto, V. Arya, and R. O. Claus, Proc. SPIE 3042, 390 (1997).
    [CrossRef]
  3. W.-C. Du, X.-M. Tao, and H.-Y. Tam, IEEE Photonics Technol. Lett. 11, 105 (1999).
    [CrossRef]
  4. H.-K. Kang, H.-J. Bang, C.-S. Hong, and C.-G. Kim, Meas. Sci. Technol. 13, 1191 (2002).
    [CrossRef]
  5. A. D. Kersey, M. A. Davis, H. J. Patrick, M. LeBlanc, K. P. Koo, C. G. Askins, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
    [CrossRef]
  6. Y.-J. Rao and D. A. Jackson, Meas. Sci. Technol. 7, 981 (1996).
    [CrossRef]
  7. M. A. Davis and A. D. Kersey, J. Lightwave Technol. 13, 1289 (1995).
    [CrossRef]
  8. G. A. Vanasse, ed., Spectrometric Techniques (Academic, New York, 1981), Vol. 2.

2003

S. Magne, J. Boussoir, S. Rougeault, V. Marty-Dewynter, P. Ferdinand, and L. Bureau, Proc. SPIE 5050, 305 (2003).
[CrossRef]

2002

H.-K. Kang, H.-J. Bang, C.-S. Hong, and C.-G. Kim, Meas. Sci. Technol. 13, 1191 (2002).
[CrossRef]

1999

W.-C. Du, X.-M. Tao, and H.-Y. Tam, IEEE Photonics Technol. Lett. 11, 105 (1999).
[CrossRef]

1997

V. Bhatia, D. Campbell, M. J. Vries, D. Sherr, T. D’Alberto, V. Arya, and R. O. Claus, Proc. SPIE 3042, 390 (1997).
[CrossRef]

A. D. Kersey, M. A. Davis, H. J. Patrick, M. LeBlanc, K. P. Koo, C. G. Askins, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

1996

Y.-J. Rao and D. A. Jackson, Meas. Sci. Technol. 7, 981 (1996).
[CrossRef]

1995

M. A. Davis and A. D. Kersey, J. Lightwave Technol. 13, 1289 (1995).
[CrossRef]

Arya, V.

V. Bhatia, D. Campbell, M. J. Vries, D. Sherr, T. D’Alberto, V. Arya, and R. O. Claus, Proc. SPIE 3042, 390 (1997).
[CrossRef]

Askins, C. G.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. LeBlanc, K. P. Koo, C. G. Askins, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

Bang, H.-J.

H.-K. Kang, H.-J. Bang, C.-S. Hong, and C.-G. Kim, Meas. Sci. Technol. 13, 1191 (2002).
[CrossRef]

Bhatia, V.

V. Bhatia, D. Campbell, M. J. Vries, D. Sherr, T. D’Alberto, V. Arya, and R. O. Claus, Proc. SPIE 3042, 390 (1997).
[CrossRef]

Boussoir, J.

S. Magne, J. Boussoir, S. Rougeault, V. Marty-Dewynter, P. Ferdinand, and L. Bureau, Proc. SPIE 5050, 305 (2003).
[CrossRef]

Bureau, L.

S. Magne, J. Boussoir, S. Rougeault, V. Marty-Dewynter, P. Ferdinand, and L. Bureau, Proc. SPIE 5050, 305 (2003).
[CrossRef]

Campbell, D.

V. Bhatia, D. Campbell, M. J. Vries, D. Sherr, T. D’Alberto, V. Arya, and R. O. Claus, Proc. SPIE 3042, 390 (1997).
[CrossRef]

Claus, R. O.

V. Bhatia, D. Campbell, M. J. Vries, D. Sherr, T. D’Alberto, V. Arya, and R. O. Claus, Proc. SPIE 3042, 390 (1997).
[CrossRef]

D’Alberto, T.

V. Bhatia, D. Campbell, M. J. Vries, D. Sherr, T. D’Alberto, V. Arya, and R. O. Claus, Proc. SPIE 3042, 390 (1997).
[CrossRef]

Davis, M. A.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. LeBlanc, K. P. Koo, C. G. Askins, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

M. A. Davis and A. D. Kersey, J. Lightwave Technol. 13, 1289 (1995).
[CrossRef]

Du, W.-C.

W.-C. Du, X.-M. Tao, and H.-Y. Tam, IEEE Photonics Technol. Lett. 11, 105 (1999).
[CrossRef]

Ferdinand, P.

S. Magne, J. Boussoir, S. Rougeault, V. Marty-Dewynter, P. Ferdinand, and L. Bureau, Proc. SPIE 5050, 305 (2003).
[CrossRef]

Friebele, E. J.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. LeBlanc, K. P. Koo, C. G. Askins, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

Hong, C.-S.

H.-K. Kang, H.-J. Bang, C.-S. Hong, and C.-G. Kim, Meas. Sci. Technol. 13, 1191 (2002).
[CrossRef]

Jackson, D. A.

Y.-J. Rao and D. A. Jackson, Meas. Sci. Technol. 7, 981 (1996).
[CrossRef]

Kang, H.-K.

H.-K. Kang, H.-J. Bang, C.-S. Hong, and C.-G. Kim, Meas. Sci. Technol. 13, 1191 (2002).
[CrossRef]

Kersey, A. D.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. LeBlanc, K. P. Koo, C. G. Askins, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

M. A. Davis and A. D. Kersey, J. Lightwave Technol. 13, 1289 (1995).
[CrossRef]

Kim, C.-G.

H.-K. Kang, H.-J. Bang, C.-S. Hong, and C.-G. Kim, Meas. Sci. Technol. 13, 1191 (2002).
[CrossRef]

Koo, K. P.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. LeBlanc, K. P. Koo, C. G. Askins, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

LeBlanc, M.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. LeBlanc, K. P. Koo, C. G. Askins, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

Magne, S.

S. Magne, J. Boussoir, S. Rougeault, V. Marty-Dewynter, P. Ferdinand, and L. Bureau, Proc. SPIE 5050, 305 (2003).
[CrossRef]

Marty-Dewynter, V.

S. Magne, J. Boussoir, S. Rougeault, V. Marty-Dewynter, P. Ferdinand, and L. Bureau, Proc. SPIE 5050, 305 (2003).
[CrossRef]

Patrick, H. J.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. LeBlanc, K. P. Koo, C. G. Askins, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

Putnam, M. A.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. LeBlanc, K. P. Koo, C. G. Askins, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

Rao, Y.-J.

Y.-J. Rao and D. A. Jackson, Meas. Sci. Technol. 7, 981 (1996).
[CrossRef]

Rougeault, S.

S. Magne, J. Boussoir, S. Rougeault, V. Marty-Dewynter, P. Ferdinand, and L. Bureau, Proc. SPIE 5050, 305 (2003).
[CrossRef]

Sherr, D.

V. Bhatia, D. Campbell, M. J. Vries, D. Sherr, T. D’Alberto, V. Arya, and R. O. Claus, Proc. SPIE 3042, 390 (1997).
[CrossRef]

Tam, H.-Y.

W.-C. Du, X.-M. Tao, and H.-Y. Tam, IEEE Photonics Technol. Lett. 11, 105 (1999).
[CrossRef]

Tao, X.-M.

W.-C. Du, X.-M. Tao, and H.-Y. Tam, IEEE Photonics Technol. Lett. 11, 105 (1999).
[CrossRef]

Vries, M. J.

V. Bhatia, D. Campbell, M. J. Vries, D. Sherr, T. D’Alberto, V. Arya, and R. O. Claus, Proc. SPIE 3042, 390 (1997).
[CrossRef]

IEEE Photonics Technol. Lett.

W.-C. Du, X.-M. Tao, and H.-Y. Tam, IEEE Photonics Technol. Lett. 11, 105 (1999).
[CrossRef]

J. Lightwave Technol.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. LeBlanc, K. P. Koo, C. G. Askins, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

M. A. Davis and A. D. Kersey, J. Lightwave Technol. 13, 1289 (1995).
[CrossRef]

Meas. Sci. Technol.

Y.-J. Rao and D. A. Jackson, Meas. Sci. Technol. 7, 981 (1996).
[CrossRef]

H.-K. Kang, H.-J. Bang, C.-S. Hong, and C.-G. Kim, Meas. Sci. Technol. 13, 1191 (2002).
[CrossRef]

Proc. SPIE

S. Magne, J. Boussoir, S. Rougeault, V. Marty-Dewynter, P. Ferdinand, and L. Bureau, Proc. SPIE 5050, 305 (2003).
[CrossRef]

V. Bhatia, D. Campbell, M. J. Vries, D. Sherr, T. D’Alberto, V. Arya, and R. O. Claus, Proc. SPIE 3042, 390 (1997).
[CrossRef]

Other

G. A. Vanasse, ed., Spectrometric Techniques (Academic, New York, 1981), Vol. 2.

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Figures (3)

Fig. 1
Fig. 1

Parallel demodulation system of an EFPI and a FBG sensor: GRIN, gradient-index.

Fig. 2
Fig. 2

(a) Whole interferogram, (b) overlapping spectra of an EFPI and a FBG.

Fig. 3
Fig. 3

(a) Part of interferogram away from the signal of the EFPI when the FBG and the EFPI are used simultaneously, (b) local magnification of (a), (c) local magnification of (b), (d) computing spectrum.

Equations (2)

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I ( Δ ) = 1 2 B ( σ 1 ) [ 1 + cos ( 2 π σ 1 Δ ) ] ,
I ( Δ ) = 0 B ( σ ) [ 1 + cos ( 2 π σ Δ ) ] d σ = 0 B ( σ ) d σ + 0 B ( σ ) cos ( 2 π σ Δ ) d σ ,

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