Abstract

We study theoretically and demonstrate experimentally light-controllable terahertz reflectivity of high-resistivity semiconductor wafers. Photocarriers created by interband light absorption form a thin conducting layer at the semiconductor surface, which allows the terahertz reflectivity of the element to be tuned between antireflective (R<3%) and highly reflective (R>85%) limits by means of the intensity and wavelength of the optical illumination.

© 2005 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. M. C. Nuss and J. Orenstein, in Millimeter and Submillimeter Wave Spectroscopy of Solids, G. Grüner, ed., Vol. 74 of Topics in Applied Physics (Springer-Verlag, 1998), Chap. 2, pp. 7–50.
    [CrossRef]
  2. D. Mittleman, Sensing with Terahertz Radiation (Springer-Verlag, 2003).
    [CrossRef]
  3. B. Ferguson and X.-C. Zhang, Nat. Mater. 1, 26 (2002).
    [CrossRef]
  4. J. Kröll, J. Darmo, and K. Unterrainer, Electron. Lett. 40, 763 (2004).
    [CrossRef]
  5. M. Born and E. Wolf, Principles of Optics, 7th ed. (Cambridge U. Press, 2003).
  6. J. D. Jackson, Classical Electrodynamics (Wiley, 1998).
  7. F. Kadlec, H. N?mec, and P. Kužel, Phys. Rev. B 70, 125205 (2004).
    [CrossRef]
  8. P. Kužel and J. Petzelt, Ferroelectrics 239, 949 (2000).
  9. R. Jacobsson, in Progress in Optics, E. Wolf, ed. (North-Holland, 1965), Chap. 5, pp. 255–258.

2004 (2)

J. Kröll, J. Darmo, and K. Unterrainer, Electron. Lett. 40, 763 (2004).
[CrossRef]

F. Kadlec, H. N?mec, and P. Kužel, Phys. Rev. B 70, 125205 (2004).
[CrossRef]

2002 (1)

B. Ferguson and X.-C. Zhang, Nat. Mater. 1, 26 (2002).
[CrossRef]

2000 (1)

P. Kužel and J. Petzelt, Ferroelectrics 239, 949 (2000).

Born, M.

M. Born and E. Wolf, Principles of Optics, 7th ed. (Cambridge U. Press, 2003).

Darmo, J.

J. Kröll, J. Darmo, and K. Unterrainer, Electron. Lett. 40, 763 (2004).
[CrossRef]

Ferguson, B.

B. Ferguson and X.-C. Zhang, Nat. Mater. 1, 26 (2002).
[CrossRef]

Jackson, J. D.

J. D. Jackson, Classical Electrodynamics (Wiley, 1998).

Jacobsson, R.

R. Jacobsson, in Progress in Optics, E. Wolf, ed. (North-Holland, 1965), Chap. 5, pp. 255–258.

Kadlec, F.

F. Kadlec, H. N?mec, and P. Kužel, Phys. Rev. B 70, 125205 (2004).
[CrossRef]

Kröll, J.

J. Kröll, J. Darmo, and K. Unterrainer, Electron. Lett. 40, 763 (2004).
[CrossRef]

Kužel, P.

F. Kadlec, H. N?mec, and P. Kužel, Phys. Rev. B 70, 125205 (2004).
[CrossRef]

P. Kužel and J. Petzelt, Ferroelectrics 239, 949 (2000).

Mittleman, D.

D. Mittleman, Sensing with Terahertz Radiation (Springer-Verlag, 2003).
[CrossRef]

Nemec, H.

F. Kadlec, H. N?mec, and P. Kužel, Phys. Rev. B 70, 125205 (2004).
[CrossRef]

Nuss, M. C.

M. C. Nuss and J. Orenstein, in Millimeter and Submillimeter Wave Spectroscopy of Solids, G. Grüner, ed., Vol. 74 of Topics in Applied Physics (Springer-Verlag, 1998), Chap. 2, pp. 7–50.
[CrossRef]

Orenstein, J.

M. C. Nuss and J. Orenstein, in Millimeter and Submillimeter Wave Spectroscopy of Solids, G. Grüner, ed., Vol. 74 of Topics in Applied Physics (Springer-Verlag, 1998), Chap. 2, pp. 7–50.
[CrossRef]

Petzelt, J.

P. Kužel and J. Petzelt, Ferroelectrics 239, 949 (2000).

Unterrainer, K.

J. Kröll, J. Darmo, and K. Unterrainer, Electron. Lett. 40, 763 (2004).
[CrossRef]

Wolf, E.

M. Born and E. Wolf, Principles of Optics, 7th ed. (Cambridge U. Press, 2003).

Zhang, X.-C.

B. Ferguson and X.-C. Zhang, Nat. Mater. 1, 26 (2002).
[CrossRef]

Electron. Lett. (1)

J. Kröll, J. Darmo, and K. Unterrainer, Electron. Lett. 40, 763 (2004).
[CrossRef]

Ferroelectrics (1)

P. Kužel and J. Petzelt, Ferroelectrics 239, 949 (2000).

Nat. Mater. (1)

B. Ferguson and X.-C. Zhang, Nat. Mater. 1, 26 (2002).
[CrossRef]

Phys. Rev. B (1)

F. Kadlec, H. N?mec, and P. Kužel, Phys. Rev. B 70, 125205 (2004).
[CrossRef]

Other (5)

R. Jacobsson, in Progress in Optics, E. Wolf, ed. (North-Holland, 1965), Chap. 5, pp. 255–258.

M. Born and E. Wolf, Principles of Optics, 7th ed. (Cambridge U. Press, 2003).

J. D. Jackson, Classical Electrodynamics (Wiley, 1998).

M. C. Nuss and J. Orenstein, in Millimeter and Submillimeter Wave Spectroscopy of Solids, G. Grüner, ed., Vol. 74 of Topics in Applied Physics (Springer-Verlag, 1998), Chap. 2, pp. 7–50.
[CrossRef]

D. Mittleman, Sensing with Terahertz Radiation (Springer-Verlag, 2003).
[CrossRef]

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (3)

Fig. 1
Fig. 1

THz waveforms internally reflected at the photoexcited surface of a GaAs wafer for several pump pulse fluences at 810 nm.

Fig. 2
Fig. 2

Power reflectance and phase change of the internally reflected THz wave versus incident optical pump fluence ϕ and the corresponding free-carrier density for two optical wavelengths ( a = 1 for 810 nm and a = 0.5 for 405 nm) in GaAs.

Fig. 3
Fig. 3

Internal power reflectance at 0.5 THz for Si optically excited at 810 nm. Bulk sample, d 1 = 10.6 μ m ; thin film, d 1 = 4 μ m .

Equations (4)

Equations on this page are rendered with MathJax. Learn more.

r = r 12 exp ( 2 i ω N 1 d 1 c ) r 10 1 r 10 r 12 exp ( 2 i ω N 1 d 1 c ) ,
N 1 [ ( n 0 1 ) c 2 ω d 1 ] 1 2 ( 1 i ) .
d 1 σ 1 = ϵ 0 μ 0 ( n 0 1 ) ,
r ( ω ) = E 1 ( ω ) r 0 E 0 ( ω ) ,

Metrics