Abstract

A two-dimensional (2D) subwavelength nanostructure for antireflection coating is fabricated upon a transparent substrate. Self-assembled 2D colloidal crystals are used as a nanoscale composite material with controlled thickness and low refractive index. The feature size of the structure is 105nm. The structure is used for antireflection coating, and the measured reflectivity of a glass substrate is reduced to 0.3%. Enhanced transmission through the substrate is also observed.

© 2005 Optical Society of America

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References

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2001 (1)

2000 (2)

I. D. Nikolov and C. D. Ivanov, Appl. Opt. 39, 2067 (2000).
[CrossRef]

I. Avrutsky, V. Kochergin, and Y. Zhao, IEEE Photon. Technol. Lett. 12, 1647 (2000).
[CrossRef]

1999 (3)

1998 (1)

1997 (2)

P. Lalanne and G. M. Morris, Nanotechnology 8, 53 (1997).
[CrossRef]

O. D. Velev, T. A. Jede, R. F. Lobo, and A. M. Lenhoff, Nature 389, 447 (1997).
[CrossRef]

1995 (1)

1994 (2)

G. S. Lazarov, N. D. Denkov, O. D. Velev, P. A. Kralchevsky, and N. Nagayama, J. Chem. Soc., Faraday Trans. 90, 2077 (1994).
[CrossRef]

D. L. Brundrett, E. N. Glytsis, and T. K. Gaylord, Appl. Opt. 33, 2695 (1994).
[CrossRef] [PubMed]

1992 (2)

M. W. Farn, Appl. Opt. 31, 4453 (1992).
[CrossRef] [PubMed]

N. D. Denkov, O. D. Velev, P. A. Kralchevsky, I. B. Ivanov, H. Yoshimura, and K. Nagayama, Langmuir 8, 3138 (1992).
[CrossRef]

1988 (1)

M. G. Moharam, Proc. SPIE 883, 8 (1988).
[CrossRef]

Avrutsky, I.

I. Avrutsky, V. Kochergin, and Y. Zhao, IEEE Photon. Technol. Lett. 12, 1647 (2000).
[CrossRef]

Y. Zhao and I. Avrutsky, Opt. Lett. 24, 817 (1999).
[CrossRef]

Y. Zhao, I. Avrutsky, and B. Li, Appl. Phys. Lett. 75, 3596 (1999).
[CrossRef]

Brundrett, D. L.

Denkov, N. D.

G. S. Lazarov, N. D. Denkov, O. D. Velev, P. A. Kralchevsky, and N. Nagayama, J. Chem. Soc., Faraday Trans. 90, 2077 (1994).
[CrossRef]

N. D. Denkov, O. D. Velev, P. A. Kralchevsky, I. B. Ivanov, H. Yoshimura, and K. Nagayama, Langmuir 8, 3138 (1992).
[CrossRef]

Farn, M. W.

Gale, M. T.

Gaylord, T. K.

Glytsis, E. N.

Grann, E. B.

Hane, K.

Hutley, M.

P. Lalanne and M. Hutley, in Encyclopedia of Optical Engineering, R. Driggers, ed. (Marcel Dekker, 2003), pp. 62–71.

Ivanov, C. D.

Ivanov, I. B.

N. D. Denkov, O. D. Velev, P. A. Kralchevsky, I. B. Ivanov, H. Yoshimura, and K. Nagayama, Langmuir 8, 3138 (1992).
[CrossRef]

Jede, T. A.

O. D. Velev, T. A. Jede, R. F. Lobo, and A. M. Lenhoff, Nature 389, 447 (1997).
[CrossRef]

Kanamori, Y.

Kochergin, V.

I. Avrutsky, V. Kochergin, and Y. Zhao, IEEE Photon. Technol. Lett. 12, 1647 (2000).
[CrossRef]

Kralchevsky, P. A.

G. S. Lazarov, N. D. Denkov, O. D. Velev, P. A. Kralchevsky, and N. Nagayama, J. Chem. Soc., Faraday Trans. 90, 2077 (1994).
[CrossRef]

N. D. Denkov, O. D. Velev, P. A. Kralchevsky, I. B. Ivanov, H. Yoshimura, and K. Nagayama, Langmuir 8, 3138 (1992).
[CrossRef]

Lalanne, P.

P. Lalanne and G. M. Morris, Nanotechnology 8, 53 (1997).
[CrossRef]

P. Lalanne and M. Hutley, in Encyclopedia of Optical Engineering, R. Driggers, ed. (Marcel Dekker, 2003), pp. 62–71.

Lazarov, G. S.

G. S. Lazarov, N. D. Denkov, O. D. Velev, P. A. Kralchevsky, and N. Nagayama, J. Chem. Soc., Faraday Trans. 90, 2077 (1994).
[CrossRef]

Lenhoff, A. M.

O. D. Velev, T. A. Jede, R. F. Lobo, and A. M. Lenhoff, Nature 389, 447 (1997).
[CrossRef]

Li, B.

Y. Zhao, I. Avrutsky, and B. Li, Appl. Phys. Lett. 75, 3596 (1999).
[CrossRef]

Lobo, R. F.

O. D. Velev, T. A. Jede, R. F. Lobo, and A. M. Lenhoff, Nature 389, 447 (1997).
[CrossRef]

Magnusson, R.

Mait, J. N.

Mirotznik, M. S.

Moharam, M. G.

Morris, G. M.

P. Lalanne and G. M. Morris, Nanotechnology 8, 53 (1997).
[CrossRef]

Nagayama, K.

N. D. Denkov, O. D. Velev, P. A. Kralchevsky, I. B. Ivanov, H. Yoshimura, and K. Nagayama, Langmuir 8, 3138 (1992).
[CrossRef]

Nagayama, N.

G. S. Lazarov, N. D. Denkov, O. D. Velev, P. A. Kralchevsky, and N. Nagayama, J. Chem. Soc., Faraday Trans. 90, 2077 (1994).
[CrossRef]

Nikolov, I. D.

Pommet, D. A.

Prather, D. W.

Sasaki, M.

Velev, O. D.

O. D. Velev, T. A. Jede, R. F. Lobo, and A. M. Lenhoff, Nature 389, 447 (1997).
[CrossRef]

G. S. Lazarov, N. D. Denkov, O. D. Velev, P. A. Kralchevsky, and N. Nagayama, J. Chem. Soc., Faraday Trans. 90, 2077 (1994).
[CrossRef]

N. D. Denkov, O. D. Velev, P. A. Kralchevsky, I. B. Ivanov, H. Yoshimura, and K. Nagayama, Langmuir 8, 3138 (1992).
[CrossRef]

Yoshimura, H.

N. D. Denkov, O. D. Velev, P. A. Kralchevsky, I. B. Ivanov, H. Yoshimura, and K. Nagayama, Langmuir 8, 3138 (1992).
[CrossRef]

Zhao, Y.

I. Avrutsky, V. Kochergin, and Y. Zhao, IEEE Photon. Technol. Lett. 12, 1647 (2000).
[CrossRef]

Y. Zhao and I. Avrutsky, Opt. Lett. 24, 817 (1999).
[CrossRef]

Y. Zhao, I. Avrutsky, and B. Li, Appl. Phys. Lett. 75, 3596 (1999).
[CrossRef]

Appl. Opt. (4)

Appl. Phys. Lett. (1)

Y. Zhao, I. Avrutsky, and B. Li, Appl. Phys. Lett. 75, 3596 (1999).
[CrossRef]

IEEE Photon. Technol. Lett. (1)

I. Avrutsky, V. Kochergin, and Y. Zhao, IEEE Photon. Technol. Lett. 12, 1647 (2000).
[CrossRef]

J. Chem. Soc., Faraday Trans. (1)

G. S. Lazarov, N. D. Denkov, O. D. Velev, P. A. Kralchevsky, and N. Nagayama, J. Chem. Soc., Faraday Trans. 90, 2077 (1994).
[CrossRef]

J. Opt. Soc. Am. A (1)

Langmuir (1)

N. D. Denkov, O. D. Velev, P. A. Kralchevsky, I. B. Ivanov, H. Yoshimura, and K. Nagayama, Langmuir 8, 3138 (1992).
[CrossRef]

Nanotechnology (1)

P. Lalanne and G. M. Morris, Nanotechnology 8, 53 (1997).
[CrossRef]

Nature (1)

O. D. Velev, T. A. Jede, R. F. Lobo, and A. M. Lenhoff, Nature 389, 447 (1997).
[CrossRef]

Opt. Lett. (3)

Proc. SPIE (1)

M. G. Moharam, Proc. SPIE 883, 8 (1988).
[CrossRef]

Other (1)

P. Lalanne and M. Hutley, in Encyclopedia of Optical Engineering, R. Driggers, ed. (Marcel Dekker, 2003), pp. 62–71.

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Figures (4)

Fig. 1
Fig. 1

Self-assembled polystyrene nanoparticles for antireflection coating.

Fig. 2
Fig. 2

Atomic-force microscope image of self-assembled monolayer NPs with a polycrystalline pattern. Scan size is 4 μ m × 4 μ m .

Fig. 3
Fig. 3

Measured and calculated reflectivity of the coated surface and measured reflectivity of the substrate without coating.

Fig. 4
Fig. 4

Measured transmittance of glass substrate with and without coating. Reflection loss from the second interface is included.

Equations (1)

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n 2 * = [ n 1 2 ( 1 F ) + n 2 2 F ] 1 2 ,

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