Abstract

An image of a straight edge in confocal self-interference microscopy (CSIM) is analyzed. Simulations of edge images based on a two-dimensional imaging equation are presented that show a 103% increase in edge gradient and a 43.1% decrease in the 10–90% width. The first experimental results, to our knowledge, for CSIM are presented and show good agreement with the simulation results and a 23% decrease in the 10–90% width.

© 2005 Optical Society of America

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References

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  1. D. Kang and D. Gweon, Opt. Lett. 28, 2470 (2003).
    [CrossRef] [PubMed]
  2. D. Kang and D. Gweon, “Two-dimensional imaging theory of confocal self-interference microscopy,” J. Opt. Soc. Am. A (to be published).
  3. T. Wilson and C. Sheppard, Theory and Practice of Scanning Optical Microscopy (Academic, 1984).
  4. T. Wilson and S. J. Hewlett, Opt. Lett. 16, 1062 (1991).
    [CrossRef] [PubMed]
  5. M. Kempe, W. Rudolph, and E. Welsch, J. Opt. Soc. Am. A 13, 46 (1996).
    [CrossRef]

2003 (1)

1996 (1)

1991 (1)

Gweon, D.

D. Kang and D. Gweon, Opt. Lett. 28, 2470 (2003).
[CrossRef] [PubMed]

D. Kang and D. Gweon, “Two-dimensional imaging theory of confocal self-interference microscopy,” J. Opt. Soc. Am. A (to be published).

Hewlett, S. J.

Kang, D.

D. Kang and D. Gweon, Opt. Lett. 28, 2470 (2003).
[CrossRef] [PubMed]

D. Kang and D. Gweon, “Two-dimensional imaging theory of confocal self-interference microscopy,” J. Opt. Soc. Am. A (to be published).

Kempe, M.

Rudolph, W.

Sheppard, C.

T. Wilson and C. Sheppard, Theory and Practice of Scanning Optical Microscopy (Academic, 1984).

Welsch, E.

Wilson, T.

T. Wilson and S. J. Hewlett, Opt. Lett. 16, 1062 (1991).
[CrossRef] [PubMed]

T. Wilson and C. Sheppard, Theory and Practice of Scanning Optical Microscopy (Academic, 1984).

J. Opt. Soc. Am. A (1)

Opt. Lett. (2)

Other (2)

D. Kang and D. Gweon, “Two-dimensional imaging theory of confocal self-interference microscopy,” J. Opt. Soc. Am. A (to be published).

T. Wilson and C. Sheppard, Theory and Practice of Scanning Optical Microscopy (Academic, 1984).

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Figures (4)

Fig. 1
Fig. 1

PSF reduction in CSIM: (a) PSF of confocal microscopy, (b) self-interference, and (c) PSF of CSIM.

Fig. 2
Fig. 2

Images of a straight edge for various self-interference constants c si (solid curve, 0; dotted curve 0.4 π ; dashed curve, 0.8 π ; points 1.2 π ).

Fig. 3
Fig. 3

Summary of simulation results: (a) edge gradient and (b) 10–90% width.

Fig. 4
Fig. 4

Simulation and experimental results of edge images (solid curve, simulation for CSIM; dashed curve, simulation for confocal microscopy; circles, experiment for CSIM; x marks, experiment for confocal microscopy).

Equations (3)

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h csim ( v ) = h cm ( v ) h si ( v ) = h cm ( v ) cos ( c si v x 2 ) exp ( i c si v x 2 ) ,
v = 2 π λ NA ( x , y ) ,
c si = c cal M to λ 2 π r ol ,

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