Abstract

We discuss a spatial filtering interferometry setup that employs a periodic spatial filter with either cosine transmittance or binary phase modulation. The setup’s input plane is formed by two separate windows, one of which supports a phase object and the other, a reference beam. Using the appropriate frequency and orientation of the filter produces an interference pattern of the two input fields at the output plane of the system. The main attributes and advantages of the setup are discussed and experimentally illustrated with the example of a binary phase periodic filter implemented with a spatial light modulator.

© 2004 Optical Society of America

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References

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  1. J. Glükstad and P. C. Mogensen, Appl. Opt. 40, 268 (2001).
    [CrossRef]
  2. M. V. Mantravadi, in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1992), pp. 123–172.
  3. H. Rabal, R. Henao, and R. Torroba, Opt. Commun. 126, 191 (1996).
    [CrossRef]
  4. A. Gundlach, J. M. Huntley, B. Manzke, and J. Schwider, Opt. Eng. 36, 1488 (1997).
    [CrossRef]
  5. M. H. Takeda, H. Ina, and S. Kobayashi, J. Opt. Soc. Am. 72, 156 (1982).

2001

1997

A. Gundlach, J. M. Huntley, B. Manzke, and J. Schwider, Opt. Eng. 36, 1488 (1997).
[CrossRef]

1996

H. Rabal, R. Henao, and R. Torroba, Opt. Commun. 126, 191 (1996).
[CrossRef]

1982

Glükstad, J.

Gundlach, A.

A. Gundlach, J. M. Huntley, B. Manzke, and J. Schwider, Opt. Eng. 36, 1488 (1997).
[CrossRef]

Henao, R.

H. Rabal, R. Henao, and R. Torroba, Opt. Commun. 126, 191 (1996).
[CrossRef]

Huntley, J. M.

A. Gundlach, J. M. Huntley, B. Manzke, and J. Schwider, Opt. Eng. 36, 1488 (1997).
[CrossRef]

Ina, H.

Kobayashi, S.

Mantravadi, M. V.

M. V. Mantravadi, in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1992), pp. 123–172.

Manzke, B.

A. Gundlach, J. M. Huntley, B. Manzke, and J. Schwider, Opt. Eng. 36, 1488 (1997).
[CrossRef]

Mogensen, P. C.

Rabal, H.

H. Rabal, R. Henao, and R. Torroba, Opt. Commun. 126, 191 (1996).
[CrossRef]

Schwider, J.

A. Gundlach, J. M. Huntley, B. Manzke, and J. Schwider, Opt. Eng. 36, 1488 (1997).
[CrossRef]

Takeda, M. H.

Torroba, R.

H. Rabal, R. Henao, and R. Torroba, Opt. Commun. 126, 191 (1996).
[CrossRef]

Appl. Opt.

J. Opt. Soc. Am.

Opt. Commun.

H. Rabal, R. Henao, and R. Torroba, Opt. Commun. 126, 191 (1996).
[CrossRef]

Opt. Eng.

A. Gundlach, J. M. Huntley, B. Manzke, and J. Schwider, Opt. Eng. 36, 1488 (1997).
[CrossRef]

Other

M. V. Mantravadi, in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1992), pp. 123–172.

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Figures (4)

Fig. 1
Fig. 1

Schematic of the spatial filtering optical interferometry setup.

Fig. 2
Fig. 2

Setup input plane, formed by two separate windows.

Fig. 3
Fig. 3

Output interference patterns without an object sample for (a) u0=0 and (b) u0=1/4x0.

Fig. 4
Fig. 4

Output interference patterns for a phase object sample for (a) u0=0 and (b) u0=1/4x0.

Equations (8)

Equations on this page are rendered with MathJax. Learn more.

tfx,y=tx,yfx,y,
Fu,v=cos2πx0u-u0,
tfx,y=½exp-iϕ0tx+x0,y+expiϕ0tx-x0,y,
tfx,y=wx,yψ0x,y+wx-2x0,yψ1x,y+wx+2x0,yψ2x,y,
t0x,ywx,yψ0x,y=wx,yexpi2πx0u0+expiϕx,y-2πx0u0.
I0x,y=2+2 cosϕx,y-4πx0u0.
Fu,v=sgncos2πx0u-u0,
fx,y=n=1anδx+2n-1x0,y+bnδx-2n-1x0,y,

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