Abstract

We have used spectral hole burning to measure the homogeneous linewidth of the H631F331 transition of Tm3+ ions doped into oxyfluoride glass ceramics consisting of nanocrystals of LaF3 in an aluminosilicate glass matrix. From the magnitude of the hole width in the nanocrystals and its dependence on temperature, we propose that excitation of tunneling modes in the adjacent glassy phase as well as of confined mechanical modes in the nanocrystals is responsible for the broadening.

© 2001 Optical Society of America

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  1. D. E. McCumber and M. D. Sturge, J. Appl. Phys. 13, 1682 (1963).
    [CrossRef]
  2. R. M. Macfarlane and R. M. Shelby, J. Lumin. 36, 179 (1987).
    [CrossRef]
  3. T. Okuno, K. Tanaka, K. Koyama, M. Namiki, and T. Suemoto, J. Lumin. 58, 184 (1994).
    [CrossRef]
  4. R. M. Macfarlane, F. Könz, Y. Sun, and R. L. Cone, J. Lumin. 86, 311 (2000).
    [CrossRef]
  5. D. M. Mittleman, R. W. Schoenlein, J. J. Shiang, V. L. Colvin, A. P. Alivisatos, and C. V. Shank, Phys. Rev. B 49, 14435 (1994).
    [CrossRef]
  6. R. S. Meltzer and K. S. Hong, Phys. Rev. B 61, 3396 (2000).
    [CrossRef]
  7. A. Tamura, Phys. Rev. B 52, 2668 (1995).
    [CrossRef]
  8. M. J. Dejneka, J. Non. Cryst. Sol. 239, 147 (1998).
    [CrossRef]
  9. R. M. Macfarlane, Opt. Lett. 18, 829 (1997).
    [CrossRef]
  10. P. F. Moulton, in CRC Handbook of Laser Science and Technology, M. J. Weber, ed. (CRC Press, Boca Raton, Fla., 1982), Vol. I, p. 21.
  11. D. A. van de Straat, J. Baak, H. B. Brom, Th. Schmidt, and S. Völker, Phys. Rev. B 53, 2179 (1996).
    [CrossRef]
  12. A. Tamura, K. Higeta, and T. Ichinokawa, J. Phys. C 15, 4975 (1982).
    [CrossRef]

2000 (2)

R. M. Macfarlane, F. Könz, Y. Sun, and R. L. Cone, J. Lumin. 86, 311 (2000).
[CrossRef]

R. S. Meltzer and K. S. Hong, Phys. Rev. B 61, 3396 (2000).
[CrossRef]

1998 (1)

M. J. Dejneka, J. Non. Cryst. Sol. 239, 147 (1998).
[CrossRef]

1997 (1)

1996 (1)

D. A. van de Straat, J. Baak, H. B. Brom, Th. Schmidt, and S. Völker, Phys. Rev. B 53, 2179 (1996).
[CrossRef]

1995 (1)

A. Tamura, Phys. Rev. B 52, 2668 (1995).
[CrossRef]

1994 (2)

T. Okuno, K. Tanaka, K. Koyama, M. Namiki, and T. Suemoto, J. Lumin. 58, 184 (1994).
[CrossRef]

D. M. Mittleman, R. W. Schoenlein, J. J. Shiang, V. L. Colvin, A. P. Alivisatos, and C. V. Shank, Phys. Rev. B 49, 14435 (1994).
[CrossRef]

1987 (1)

R. M. Macfarlane and R. M. Shelby, J. Lumin. 36, 179 (1987).
[CrossRef]

1982 (1)

A. Tamura, K. Higeta, and T. Ichinokawa, J. Phys. C 15, 4975 (1982).
[CrossRef]

1963 (1)

D. E. McCumber and M. D. Sturge, J. Appl. Phys. 13, 1682 (1963).
[CrossRef]

Alivisatos, A. P.

D. M. Mittleman, R. W. Schoenlein, J. J. Shiang, V. L. Colvin, A. P. Alivisatos, and C. V. Shank, Phys. Rev. B 49, 14435 (1994).
[CrossRef]

Baak, J.

D. A. van de Straat, J. Baak, H. B. Brom, Th. Schmidt, and S. Völker, Phys. Rev. B 53, 2179 (1996).
[CrossRef]

Brom, H. B.

D. A. van de Straat, J. Baak, H. B. Brom, Th. Schmidt, and S. Völker, Phys. Rev. B 53, 2179 (1996).
[CrossRef]

Colvin, V. L.

D. M. Mittleman, R. W. Schoenlein, J. J. Shiang, V. L. Colvin, A. P. Alivisatos, and C. V. Shank, Phys. Rev. B 49, 14435 (1994).
[CrossRef]

Cone, R. L.

R. M. Macfarlane, F. Könz, Y. Sun, and R. L. Cone, J. Lumin. 86, 311 (2000).
[CrossRef]

Dejneka, M. J.

M. J. Dejneka, J. Non. Cryst. Sol. 239, 147 (1998).
[CrossRef]

Higeta, K.

A. Tamura, K. Higeta, and T. Ichinokawa, J. Phys. C 15, 4975 (1982).
[CrossRef]

Hong, K. S.

R. S. Meltzer and K. S. Hong, Phys. Rev. B 61, 3396 (2000).
[CrossRef]

Ichinokawa, T.

A. Tamura, K. Higeta, and T. Ichinokawa, J. Phys. C 15, 4975 (1982).
[CrossRef]

Könz, F.

R. M. Macfarlane, F. Könz, Y. Sun, and R. L. Cone, J. Lumin. 86, 311 (2000).
[CrossRef]

Koyama, K.

T. Okuno, K. Tanaka, K. Koyama, M. Namiki, and T. Suemoto, J. Lumin. 58, 184 (1994).
[CrossRef]

Macfarlane, R. M.

R. M. Macfarlane, F. Könz, Y. Sun, and R. L. Cone, J. Lumin. 86, 311 (2000).
[CrossRef]

R. M. Macfarlane, Opt. Lett. 18, 829 (1997).
[CrossRef]

R. M. Macfarlane and R. M. Shelby, J. Lumin. 36, 179 (1987).
[CrossRef]

McCumber, D. E.

D. E. McCumber and M. D. Sturge, J. Appl. Phys. 13, 1682 (1963).
[CrossRef]

Meltzer, R. S.

R. S. Meltzer and K. S. Hong, Phys. Rev. B 61, 3396 (2000).
[CrossRef]

Mittleman, D. M.

D. M. Mittleman, R. W. Schoenlein, J. J. Shiang, V. L. Colvin, A. P. Alivisatos, and C. V. Shank, Phys. Rev. B 49, 14435 (1994).
[CrossRef]

Moulton, P. F.

P. F. Moulton, in CRC Handbook of Laser Science and Technology, M. J. Weber, ed. (CRC Press, Boca Raton, Fla., 1982), Vol. I, p. 21.

Namiki, M.

T. Okuno, K. Tanaka, K. Koyama, M. Namiki, and T. Suemoto, J. Lumin. 58, 184 (1994).
[CrossRef]

Okuno, T.

T. Okuno, K. Tanaka, K. Koyama, M. Namiki, and T. Suemoto, J. Lumin. 58, 184 (1994).
[CrossRef]

Schmidt, Th.

D. A. van de Straat, J. Baak, H. B. Brom, Th. Schmidt, and S. Völker, Phys. Rev. B 53, 2179 (1996).
[CrossRef]

Schoenlein, R. W.

D. M. Mittleman, R. W. Schoenlein, J. J. Shiang, V. L. Colvin, A. P. Alivisatos, and C. V. Shank, Phys. Rev. B 49, 14435 (1994).
[CrossRef]

Shank, C. V.

D. M. Mittleman, R. W. Schoenlein, J. J. Shiang, V. L. Colvin, A. P. Alivisatos, and C. V. Shank, Phys. Rev. B 49, 14435 (1994).
[CrossRef]

Shelby, R. M.

R. M. Macfarlane and R. M. Shelby, J. Lumin. 36, 179 (1987).
[CrossRef]

Shiang, J. J.

D. M. Mittleman, R. W. Schoenlein, J. J. Shiang, V. L. Colvin, A. P. Alivisatos, and C. V. Shank, Phys. Rev. B 49, 14435 (1994).
[CrossRef]

Sturge, M. D.

D. E. McCumber and M. D. Sturge, J. Appl. Phys. 13, 1682 (1963).
[CrossRef]

Suemoto, T.

T. Okuno, K. Tanaka, K. Koyama, M. Namiki, and T. Suemoto, J. Lumin. 58, 184 (1994).
[CrossRef]

Sun, Y.

R. M. Macfarlane, F. Könz, Y. Sun, and R. L. Cone, J. Lumin. 86, 311 (2000).
[CrossRef]

Tamura, A.

A. Tamura, Phys. Rev. B 52, 2668 (1995).
[CrossRef]

A. Tamura, K. Higeta, and T. Ichinokawa, J. Phys. C 15, 4975 (1982).
[CrossRef]

Tanaka, K.

T. Okuno, K. Tanaka, K. Koyama, M. Namiki, and T. Suemoto, J. Lumin. 58, 184 (1994).
[CrossRef]

van de Straat, D. A.

D. A. van de Straat, J. Baak, H. B. Brom, Th. Schmidt, and S. Völker, Phys. Rev. B 53, 2179 (1996).
[CrossRef]

Völker, S.

D. A. van de Straat, J. Baak, H. B. Brom, Th. Schmidt, and S. Völker, Phys. Rev. B 53, 2179 (1996).
[CrossRef]

J. Appl. Phys. (1)

D. E. McCumber and M. D. Sturge, J. Appl. Phys. 13, 1682 (1963).
[CrossRef]

J. Lumin. (3)

R. M. Macfarlane and R. M. Shelby, J. Lumin. 36, 179 (1987).
[CrossRef]

T. Okuno, K. Tanaka, K. Koyama, M. Namiki, and T. Suemoto, J. Lumin. 58, 184 (1994).
[CrossRef]

R. M. Macfarlane, F. Könz, Y. Sun, and R. L. Cone, J. Lumin. 86, 311 (2000).
[CrossRef]

J. Non. Cryst. Sol. (1)

M. J. Dejneka, J. Non. Cryst. Sol. 239, 147 (1998).
[CrossRef]

J. Phys. C (1)

A. Tamura, K. Higeta, and T. Ichinokawa, J. Phys. C 15, 4975 (1982).
[CrossRef]

Opt. Lett. (1)

Phys. Rev. B (4)

D. M. Mittleman, R. W. Schoenlein, J. J. Shiang, V. L. Colvin, A. P. Alivisatos, and C. V. Shank, Phys. Rev. B 49, 14435 (1994).
[CrossRef]

R. S. Meltzer and K. S. Hong, Phys. Rev. B 61, 3396 (2000).
[CrossRef]

A. Tamura, Phys. Rev. B 52, 2668 (1995).
[CrossRef]

D. A. van de Straat, J. Baak, H. B. Brom, Th. Schmidt, and S. Völker, Phys. Rev. B 53, 2179 (1996).
[CrossRef]

Other (1)

P. F. Moulton, in CRC Handbook of Laser Science and Technology, M. J. Weber, ed. (CRC Press, Boca Raton, Fla., 1982), Vol. I, p. 21.

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Figures (4)

Fig. 1
Fig. 1

Crystallite size as a function of anneal temperature after a 4-h anneal as measured by x-ray diffraction.

Fig. 2
Fig. 2

Absorption spectrum of the H631F33 transitions of 0.1%Tm:FOX at 1.6  K: (a) sample 775-4, showing the sharp lines of the Tm3+-doped LaF3 nanocrystals, (b) unannealed sample in which the Tm3+ ions are all in the glass phase.

Fig. 3
Fig. 3

Linewidths of the 689.35-nm H631F331 transition of Tm3+ ions in nanocrystals as a function of crystallite size measured at 1.6  K. Top, the inhomogeneous linewidth; bottom, the homogeneous linewidth measured by spectral hole burning.

Fig. 4
Fig. 4

Temperature dependence of the homogeneous linewidth of the 689.35-nm H631F331 transition of Tm3+ ions in sample 775-4 with a crystallite diameter of 30  nm. The width of the same transition in bulk single-crystal LaF3 is also shown.

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