Abstract

We developed a new absolute wavelength calibration system that uses machine vision for measurement of low-repetition-rate, short-pulse-duration (10-Hz, 5-ns) tunable lasers. Weak fluorescence from an iodine cell was measured by use of machine vision as a spatially gated integrator, and a pulsed dye-laser wavelength was calibrated with an accuracy of ±0.005 nm, which is precise enough for differential absorption lidar application.

© 2001 Optical Society of America

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References

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  1. B. Samoriski, Laser Focus World 28(10), 165 (1992).
  2. W. S. Gornall, Laser Focus World 33(11), 123 (1997).
  3. L.-S. Lee and A. L. Schawlow, Opt. Lett. 6, 610 (1981).
    [CrossRef] [PubMed]
  4. P. S. Bhatia, C. W. McCluskey, and J. W. Keto, Appl. Opt. 38, 2486 (1999).
    [CrossRef]
  5. Pulsed Wavemeter Operating Manual, rev.  ed. (Burleigh Instruments, Fishers, N.Y., 1997).
  6. N. J. Dovichi, D. S. Moore, and R. A. Keller, Appl. Opt. 21, 1468 (1982).
    [CrossRef] [PubMed]
  7. Y. Oki, E. Tashiro, and M. Maeda, Rev. Sci. Instrum. 63, 2927 (1992).
    [CrossRef]
  8. M. Uchiumi, M. Maeda, K. Muraoka, and O. Uchino, Rev. Laser Eng. 21, 29 (1993).
    [CrossRef]
  9. T. Yanagida, M. Uchiumi, K. Ueda, K. Muraoka, M. Maeda, and O. Uchino, in 18th Japanese Laser Sensing Symposium (Optoelectronic Industry and Technology Development Association, Tokyo, 1997), p. 45 ( abstract).
  10. G. Nowak, Manuf. Eng. 89, 56 (1982).
  11. T. Fujii, T. Fukuchi, N. Goto, K. Nemoto, and N. Takeuchi, in 20th Japanese Laser Sensing Symposium (Fukui University, Fukui, Japan, 1999), p. 181 (abstract).
  12. T. Fukuchi, N. Goto, T. Fujii, and K. Nemoto, Opt. Eng. 38, 141 (1999).
    [CrossRef]
  13. S. Gerstenkorn and P. Luc, Atlas de Spectre d’Absorption de la Molecule d’Iode (Editions du CNRS, Paris, 1978).

1999 (2)

P. S. Bhatia, C. W. McCluskey, and J. W. Keto, Appl. Opt. 38, 2486 (1999).
[CrossRef]

T. Fukuchi, N. Goto, T. Fujii, and K. Nemoto, Opt. Eng. 38, 141 (1999).
[CrossRef]

1997 (1)

W. S. Gornall, Laser Focus World 33(11), 123 (1997).

1993 (1)

M. Uchiumi, M. Maeda, K. Muraoka, and O. Uchino, Rev. Laser Eng. 21, 29 (1993).
[CrossRef]

1992 (2)

B. Samoriski, Laser Focus World 28(10), 165 (1992).

Y. Oki, E. Tashiro, and M. Maeda, Rev. Sci. Instrum. 63, 2927 (1992).
[CrossRef]

1982 (2)

1981 (1)

Bhatia, P. S.

Dovichi, N. J.

Fujii, T.

T. Fukuchi, N. Goto, T. Fujii, and K. Nemoto, Opt. Eng. 38, 141 (1999).
[CrossRef]

T. Fujii, T. Fukuchi, N. Goto, K. Nemoto, and N. Takeuchi, in 20th Japanese Laser Sensing Symposium (Fukui University, Fukui, Japan, 1999), p. 181 (abstract).

Fukuchi, T.

T. Fukuchi, N. Goto, T. Fujii, and K. Nemoto, Opt. Eng. 38, 141 (1999).
[CrossRef]

T. Fujii, T. Fukuchi, N. Goto, K. Nemoto, and N. Takeuchi, in 20th Japanese Laser Sensing Symposium (Fukui University, Fukui, Japan, 1999), p. 181 (abstract).

Gerstenkorn, S.

S. Gerstenkorn and P. Luc, Atlas de Spectre d’Absorption de la Molecule d’Iode (Editions du CNRS, Paris, 1978).

Gornall, W. S.

W. S. Gornall, Laser Focus World 33(11), 123 (1997).

Goto, N.

T. Fukuchi, N. Goto, T. Fujii, and K. Nemoto, Opt. Eng. 38, 141 (1999).
[CrossRef]

T. Fujii, T. Fukuchi, N. Goto, K. Nemoto, and N. Takeuchi, in 20th Japanese Laser Sensing Symposium (Fukui University, Fukui, Japan, 1999), p. 181 (abstract).

Keller, R. A.

Keto, J. W.

Lee, L.-S.

Luc, P.

S. Gerstenkorn and P. Luc, Atlas de Spectre d’Absorption de la Molecule d’Iode (Editions du CNRS, Paris, 1978).

Maeda, M.

M. Uchiumi, M. Maeda, K. Muraoka, and O. Uchino, Rev. Laser Eng. 21, 29 (1993).
[CrossRef]

Y. Oki, E. Tashiro, and M. Maeda, Rev. Sci. Instrum. 63, 2927 (1992).
[CrossRef]

T. Yanagida, M. Uchiumi, K. Ueda, K. Muraoka, M. Maeda, and O. Uchino, in 18th Japanese Laser Sensing Symposium (Optoelectronic Industry and Technology Development Association, Tokyo, 1997), p. 45 ( abstract).

McCluskey, C. W.

Moore, D. S.

Muraoka, K.

M. Uchiumi, M. Maeda, K. Muraoka, and O. Uchino, Rev. Laser Eng. 21, 29 (1993).
[CrossRef]

T. Yanagida, M. Uchiumi, K. Ueda, K. Muraoka, M. Maeda, and O. Uchino, in 18th Japanese Laser Sensing Symposium (Optoelectronic Industry and Technology Development Association, Tokyo, 1997), p. 45 ( abstract).

Nemoto, K.

T. Fukuchi, N. Goto, T. Fujii, and K. Nemoto, Opt. Eng. 38, 141 (1999).
[CrossRef]

T. Fujii, T. Fukuchi, N. Goto, K. Nemoto, and N. Takeuchi, in 20th Japanese Laser Sensing Symposium (Fukui University, Fukui, Japan, 1999), p. 181 (abstract).

Nowak, G.

G. Nowak, Manuf. Eng. 89, 56 (1982).

Oki, Y.

Y. Oki, E. Tashiro, and M. Maeda, Rev. Sci. Instrum. 63, 2927 (1992).
[CrossRef]

Samoriski, B.

B. Samoriski, Laser Focus World 28(10), 165 (1992).

Schawlow, A. L.

Takeuchi, N.

T. Fujii, T. Fukuchi, N. Goto, K. Nemoto, and N. Takeuchi, in 20th Japanese Laser Sensing Symposium (Fukui University, Fukui, Japan, 1999), p. 181 (abstract).

Tashiro, E.

Y. Oki, E. Tashiro, and M. Maeda, Rev. Sci. Instrum. 63, 2927 (1992).
[CrossRef]

Uchino, O.

M. Uchiumi, M. Maeda, K. Muraoka, and O. Uchino, Rev. Laser Eng. 21, 29 (1993).
[CrossRef]

T. Yanagida, M. Uchiumi, K. Ueda, K. Muraoka, M. Maeda, and O. Uchino, in 18th Japanese Laser Sensing Symposium (Optoelectronic Industry and Technology Development Association, Tokyo, 1997), p. 45 ( abstract).

Uchiumi, M.

M. Uchiumi, M. Maeda, K. Muraoka, and O. Uchino, Rev. Laser Eng. 21, 29 (1993).
[CrossRef]

T. Yanagida, M. Uchiumi, K. Ueda, K. Muraoka, M. Maeda, and O. Uchino, in 18th Japanese Laser Sensing Symposium (Optoelectronic Industry and Technology Development Association, Tokyo, 1997), p. 45 ( abstract).

Ueda, K.

T. Yanagida, M. Uchiumi, K. Ueda, K. Muraoka, M. Maeda, and O. Uchino, in 18th Japanese Laser Sensing Symposium (Optoelectronic Industry and Technology Development Association, Tokyo, 1997), p. 45 ( abstract).

Yanagida, T.

T. Yanagida, M. Uchiumi, K. Ueda, K. Muraoka, M. Maeda, and O. Uchino, in 18th Japanese Laser Sensing Symposium (Optoelectronic Industry and Technology Development Association, Tokyo, 1997), p. 45 ( abstract).

Appl. Opt. (2)

Laser Focus World (2)

B. Samoriski, Laser Focus World 28(10), 165 (1992).

W. S. Gornall, Laser Focus World 33(11), 123 (1997).

Manuf. Eng. (1)

G. Nowak, Manuf. Eng. 89, 56 (1982).

Opt. Eng. (1)

T. Fukuchi, N. Goto, T. Fujii, and K. Nemoto, Opt. Eng. 38, 141 (1999).
[CrossRef]

Opt. Lett. (1)

Rev. Laser Eng. (1)

M. Uchiumi, M. Maeda, K. Muraoka, and O. Uchino, Rev. Laser Eng. 21, 29 (1993).
[CrossRef]

Rev. Sci. Instrum. (1)

Y. Oki, E. Tashiro, and M. Maeda, Rev. Sci. Instrum. 63, 2927 (1992).
[CrossRef]

Other (4)

T. Yanagida, M. Uchiumi, K. Ueda, K. Muraoka, M. Maeda, and O. Uchino, in 18th Japanese Laser Sensing Symposium (Optoelectronic Industry and Technology Development Association, Tokyo, 1997), p. 45 ( abstract).

Pulsed Wavemeter Operating Manual, rev.  ed. (Burleigh Instruments, Fishers, N.Y., 1997).

S. Gerstenkorn and P. Luc, Atlas de Spectre d’Absorption de la Molecule d’Iode (Editions du CNRS, Paris, 1978).

T. Fujii, T. Fukuchi, N. Goto, K. Nemoto, and N. Takeuchi, in 20th Japanese Laser Sensing Symposium (Fukui University, Fukui, Japan, 1999), p. 181 (abstract).

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Figures (6)

Fig. 1
Fig. 1

Block diagram of the measurement system.

Fig. 2
Fig. 2

Operation timing of the measurement system.

Fig. 3
Fig. 3

Model used for the spectral profile of the pulsed laser beam.

Fig. 4
Fig. 4

Iodine absorption lines measured with a scanning dye-laser wavelength near 576  nm.

Fig. 5
Fig. 5

Iodine absorption spectra obtained by convolution with atlas data13 and experimental data after smoothing.

Fig. 6
Fig. 6

Calibration results of the wavelength meter with an iodine cell and the machine vision technique.

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