Abstract

We investigate the inverse-scattering problem that arises in total internal reflection microscopy. An analytic solution to this problem within the weak-scattering approximation is used to develop a novel form of three-dimensional microscopy with subwavelength resolution.

© 2001 Optical Society of America

Full Article  |  PDF Article
Related Articles
Inverse problems with quasi-homogeneous random media

David G. Fischer and Emil Wolf
J. Opt. Soc. Am. A 11(3) 1128-1135 (1994)

Subwavelength depth resolution in near-field microscopy

David G. Fischer
Opt. Lett. 25(20) 1529-1531 (2000)

Inverse problem in optical diffusion tomography. I. Fourier–Laplace inversion formulas

Vadim A. Markel and John C. Schotland
J. Opt. Soc. Am. A 18(6) 1336-1347 (2001)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (3)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (11)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription