Abstract

A novel scheme for an interferometric microscope with which to visualize a geometrical spin-redirection phase image that represents the local inclination of microsurface structures of an object is proposed. The observed phase depends on the state of polarization and the optical constants of the object material, which enable one to distinguish the spin-redirection phase from the conventional dynamical-phase. A preliminary experiment was performed, and the phase images obtained were found to be consistent with those predicted by computer simulation based on a theoretical model.

© 2000 Optical Society of America

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References

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  1. M. Berry, Phys. Today 43(12), 34 (1990).
    [CrossRef]
  2. H. Jiao, S. R. Wilkinson, R. Y. Chiao, and H. Nathel, Phys. Rev. A 39, 3475 (1989).
    [CrossRef] [PubMed]
  3. W. W. Chow, J. Gea-Banacloche, L. M. Pedrotti, V. E. Sanders, W. Schleich, and M. O. Scully, Rev. Mod. Phys. 57, 61 (1985).
    [CrossRef]
  4. A. V. Tavrov, Y. Miyamoto, T. Kawabata, M. Takeda, and V. A. Andreev, J. Opt. Soc. Am. A 17, 154 (2000).
    [CrossRef]
  5. M. Takeda, H. Ina, and S. Kobayashi, J. Opt. Soc. Am. 72, 156 (1982).

2000

A. V. Tavrov, Y. Miyamoto, T. Kawabata, M. Takeda, and V. A. Andreev, J. Opt. Soc. Am. A 17, 154 (2000).
[CrossRef]

1990

M. Berry, Phys. Today 43(12), 34 (1990).
[CrossRef]

1989

H. Jiao, S. R. Wilkinson, R. Y. Chiao, and H. Nathel, Phys. Rev. A 39, 3475 (1989).
[CrossRef] [PubMed]

1985

W. W. Chow, J. Gea-Banacloche, L. M. Pedrotti, V. E. Sanders, W. Schleich, and M. O. Scully, Rev. Mod. Phys. 57, 61 (1985).
[CrossRef]

1982

M. Takeda, H. Ina, and S. Kobayashi, J. Opt. Soc. Am. 72, 156 (1982).

Andreev, V. A.

A. V. Tavrov, Y. Miyamoto, T. Kawabata, M. Takeda, and V. A. Andreev, J. Opt. Soc. Am. A 17, 154 (2000).
[CrossRef]

Berry, M.

M. Berry, Phys. Today 43(12), 34 (1990).
[CrossRef]

Chiao, R. Y.

H. Jiao, S. R. Wilkinson, R. Y. Chiao, and H. Nathel, Phys. Rev. A 39, 3475 (1989).
[CrossRef] [PubMed]

Chow, W. W.

W. W. Chow, J. Gea-Banacloche, L. M. Pedrotti, V. E. Sanders, W. Schleich, and M. O. Scully, Rev. Mod. Phys. 57, 61 (1985).
[CrossRef]

Gea-Banacloche, J.

W. W. Chow, J. Gea-Banacloche, L. M. Pedrotti, V. E. Sanders, W. Schleich, and M. O. Scully, Rev. Mod. Phys. 57, 61 (1985).
[CrossRef]

Ina, H.

M. Takeda, H. Ina, and S. Kobayashi, J. Opt. Soc. Am. 72, 156 (1982).

Jiao, H.

H. Jiao, S. R. Wilkinson, R. Y. Chiao, and H. Nathel, Phys. Rev. A 39, 3475 (1989).
[CrossRef] [PubMed]

Kawabata, T.

A. V. Tavrov, Y. Miyamoto, T. Kawabata, M. Takeda, and V. A. Andreev, J. Opt. Soc. Am. A 17, 154 (2000).
[CrossRef]

Kobayashi, S.

M. Takeda, H. Ina, and S. Kobayashi, J. Opt. Soc. Am. 72, 156 (1982).

Miyamoto, Y.

A. V. Tavrov, Y. Miyamoto, T. Kawabata, M. Takeda, and V. A. Andreev, J. Opt. Soc. Am. A 17, 154 (2000).
[CrossRef]

Nathel, H.

H. Jiao, S. R. Wilkinson, R. Y. Chiao, and H. Nathel, Phys. Rev. A 39, 3475 (1989).
[CrossRef] [PubMed]

Pedrotti, L. M.

W. W. Chow, J. Gea-Banacloche, L. M. Pedrotti, V. E. Sanders, W. Schleich, and M. O. Scully, Rev. Mod. Phys. 57, 61 (1985).
[CrossRef]

Sanders, V. E.

W. W. Chow, J. Gea-Banacloche, L. M. Pedrotti, V. E. Sanders, W. Schleich, and M. O. Scully, Rev. Mod. Phys. 57, 61 (1985).
[CrossRef]

Schleich, W.

W. W. Chow, J. Gea-Banacloche, L. M. Pedrotti, V. E. Sanders, W. Schleich, and M. O. Scully, Rev. Mod. Phys. 57, 61 (1985).
[CrossRef]

Scully, M. O.

W. W. Chow, J. Gea-Banacloche, L. M. Pedrotti, V. E. Sanders, W. Schleich, and M. O. Scully, Rev. Mod. Phys. 57, 61 (1985).
[CrossRef]

Takeda, M.

A. V. Tavrov, Y. Miyamoto, T. Kawabata, M. Takeda, and V. A. Andreev, J. Opt. Soc. Am. A 17, 154 (2000).
[CrossRef]

M. Takeda, H. Ina, and S. Kobayashi, J. Opt. Soc. Am. 72, 156 (1982).

Tavrov, A. V.

A. V. Tavrov, Y. Miyamoto, T. Kawabata, M. Takeda, and V. A. Andreev, J. Opt. Soc. Am. A 17, 154 (2000).
[CrossRef]

Wilkinson, S. R.

H. Jiao, S. R. Wilkinson, R. Y. Chiao, and H. Nathel, Phys. Rev. A 39, 3475 (1989).
[CrossRef] [PubMed]

J. Opt. Soc. Am.

M. Takeda, H. Ina, and S. Kobayashi, J. Opt. Soc. Am. 72, 156 (1982).

J. Opt. Soc. Am. A

A. V. Tavrov, Y. Miyamoto, T. Kawabata, M. Takeda, and V. A. Andreev, J. Opt. Soc. Am. A 17, 154 (2000).
[CrossRef]

Phys. Rev. A

H. Jiao, S. R. Wilkinson, R. Y. Chiao, and H. Nathel, Phys. Rev. A 39, 3475 (1989).
[CrossRef] [PubMed]

Phys. Today

M. Berry, Phys. Today 43(12), 34 (1990).
[CrossRef]

Rev. Mod. Phys.

W. W. Chow, J. Gea-Banacloche, L. M. Pedrotti, V. E. Sanders, W. Schleich, and M. O. Scully, Rev. Mod. Phys. 57, 61 (1985).
[CrossRef]

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Figures (3)

Fig. 1
Fig. 1

Mach–Zehnder interference microscope. (A) Probe part: split beams become out of plane along L2 and in plane along L1. (B) Block schematic.

Fig. 2
Fig. 2

Dependence of geometrical rotation Ω, obtained by variation of tilt azimuth ξ. Elevation, η=20°. Solid curve, computed; error bars, experiment.

Fig. 3
Fig. 3

Portraits of the wafer cleavage area. (A) Reconstructed microinterferogram in linear polarization, (B) estimated amount of Ω, (C) measured amount of Ω.

Equations (5)

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k0=kn.
Pn=MP0
=exp±iΩP0.
M=FnTnEn-1tF1T1E0t,
Ti=1000rpi000rsi,

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