Abstract

Dimensional changes in polymerizable storage materials during exposure are a source of pixel misregistration in digital holographic storage. Lateral shrinkage or expansion of photopolymer recording materials can be deduced from quantitative measurement of the shift and the magnification errors of reconstructed holograms.

© 2000 Optical Society of America

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References

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  2. G. Zhao and P. Mouroulis, J. Mod. Opt. 41, 1929 (1994).
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    [CrossRef]
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    [CrossRef] [PubMed]
  6. A. Pu, K. Curtis, and D. Psaltis, Opt. Eng. 35, 2824 (1996).
    [CrossRef]
  7. V. Colvin, R. Larson, A. L. Harris, and M. Schilling, J. Appl. Phys. 81, 5913 (1997).
    [CrossRef]
  8. D. Waldman, H.-Y. S. Li, and M. Horner, J. Imaging Sci. Technol. 41, 497 (1997).
  9. D. Waldman, H.-Y. Li, and E. Cetin, Proc. SPIE 3291, 89 (1998).
    [CrossRef]
  10. L. Dhar, A. Hale, H. E. Katz, M. L. Schilling, M. G. Schnoes, and F. C. Schilling, Opt. Lett. 24, 487 (1999).
    [CrossRef]
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    [CrossRef] [PubMed]
  12. H.-Y. S. Li, “Photorefractive 3-D disks for optical data storage and artificial neural networks,” Ph.D. dissertation (California Institute of Technology, Pasadena, Calif., 1994), Chap. 2.
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    [CrossRef] [PubMed]
  14. D. Waldman, R. Ingwall, E. Cetin, M. Horner, R. Minns, and P. Panchu, presented at the 17th IEEE Symposium on Mass Storage Systems and Technology, College Park, Maryland, March 27–30, 2000.

1999 (1)

1998 (1)

D. Waldman, H.-Y. Li, and E. Cetin, Proc. SPIE 3291, 89 (1998).
[CrossRef]

1997 (2)

V. Colvin, R. Larson, A. L. Harris, and M. Schilling, J. Appl. Phys. 81, 5913 (1997).
[CrossRef]

D. Waldman, H.-Y. S. Li, and M. Horner, J. Imaging Sci. Technol. 41, 497 (1997).

1996 (4)

D. Waldman, R. Ingwall, P. Dhal, M. Horner, E. Kolb, H.-Y. S. Li, R. Minns, and H. Schild, Proc. SPIE 2689, 127 (1996).
[CrossRef]

A. Pu, K. Curtis, and D. Psaltis, Opt. Eng. 35, 2824 (1996).
[CrossRef]

M.-P. Bernal, H. Coufal, R. Grygier, J. Hoffnagle, C. Jefferson, R. Macfarlane, R. Shelby, G. Sincerbox, P. Wimmer, and G. Wittmann, Appl. Opt. 35, 2360 (1996).
[CrossRef] [PubMed]

A. Pu and D. Psaltis, Appl. Opt. 35, 2389 (1996).
[CrossRef] [PubMed]

1995 (1)

1994 (2)

1980 (1)

W. Tomlinson and E. Chandross, Adv. Photochem. 12, 201 (1980).

Bernal, M.-P.

Caulfield, H.

Cetin, E.

D. Waldman, H.-Y. Li, and E. Cetin, Proc. SPIE 3291, 89 (1998).
[CrossRef]

D. Waldman, R. Ingwall, E. Cetin, M. Horner, R. Minns, and P. Panchu, presented at the 17th IEEE Symposium on Mass Storage Systems and Technology, College Park, Maryland, March 27–30, 2000.

Chandross, E.

W. Tomlinson and E. Chandross, Adv. Photochem. 12, 201 (1980).

Colvin, V.

V. Colvin, R. Larson, A. L. Harris, and M. Schilling, J. Appl. Phys. 81, 5913 (1997).
[CrossRef]

Coufal, H.

Curtis, K.

A. Pu, K. Curtis, and D. Psaltis, Opt. Eng. 35, 2824 (1996).
[CrossRef]

K. Curtis, A. Pu, and D. Psaltis, Opt. Lett. 19, 993 (1994).
[CrossRef] [PubMed]

Dhal, P.

D. Waldman, R. Ingwall, P. Dhal, M. Horner, E. Kolb, H.-Y. S. Li, R. Minns, and H. Schild, Proc. SPIE 2689, 127 (1996).
[CrossRef]

Dhar, L.

Grygier, R.

Hale, A.

Harris, A. L.

V. Colvin, R. Larson, A. L. Harris, and M. Schilling, J. Appl. Phys. 81, 5913 (1997).
[CrossRef]

Hoffnagle, J.

Horner, M.

D. Waldman, H.-Y. S. Li, and M. Horner, J. Imaging Sci. Technol. 41, 497 (1997).

D. Waldman, R. Ingwall, P. Dhal, M. Horner, E. Kolb, H.-Y. S. Li, R. Minns, and H. Schild, Proc. SPIE 2689, 127 (1996).
[CrossRef]

D. Waldman, R. Ingwall, E. Cetin, M. Horner, R. Minns, and P. Panchu, presented at the 17th IEEE Symposium on Mass Storage Systems and Technology, College Park, Maryland, March 27–30, 2000.

Ingwall, R.

D. Waldman, R. Ingwall, P. Dhal, M. Horner, E. Kolb, H.-Y. S. Li, R. Minns, and H. Schild, Proc. SPIE 2689, 127 (1996).
[CrossRef]

D. Waldman, R. Ingwall, E. Cetin, M. Horner, R. Minns, and P. Panchu, presented at the 17th IEEE Symposium on Mass Storage Systems and Technology, College Park, Maryland, March 27–30, 2000.

Jefferson, C.

Katz, H. E.

Kolb, E.

D. Waldman, R. Ingwall, P. Dhal, M. Horner, E. Kolb, H.-Y. S. Li, R. Minns, and H. Schild, Proc. SPIE 2689, 127 (1996).
[CrossRef]

Larson, R.

V. Colvin, R. Larson, A. L. Harris, and M. Schilling, J. Appl. Phys. 81, 5913 (1997).
[CrossRef]

Li, H.-Y.

D. Waldman, H.-Y. Li, and E. Cetin, Proc. SPIE 3291, 89 (1998).
[CrossRef]

Li, H.-Y. S.

D. Waldman, H.-Y. S. Li, and M. Horner, J. Imaging Sci. Technol. 41, 497 (1997).

D. Waldman, R. Ingwall, P. Dhal, M. Horner, E. Kolb, H.-Y. S. Li, R. Minns, and H. Schild, Proc. SPIE 2689, 127 (1996).
[CrossRef]

H.-Y. S. Li, “Photorefractive 3-D disks for optical data storage and artificial neural networks,” Ph.D. dissertation (California Institute of Technology, Pasadena, Calif., 1994), Chap. 2.

Macfarlane, R.

Minns, R.

D. Waldman, R. Ingwall, P. Dhal, M. Horner, E. Kolb, H.-Y. S. Li, R. Minns, and H. Schild, Proc. SPIE 2689, 127 (1996).
[CrossRef]

D. Waldman, R. Ingwall, E. Cetin, M. Horner, R. Minns, and P. Panchu, presented at the 17th IEEE Symposium on Mass Storage Systems and Technology, College Park, Maryland, March 27–30, 2000.

Mouroulis, P.

G. Zhao and P. Mouroulis, J. Mod. Opt. 41, 1929 (1994).
[CrossRef]

Panchu, P.

D. Waldman, R. Ingwall, E. Cetin, M. Horner, R. Minns, and P. Panchu, presented at the 17th IEEE Symposium on Mass Storage Systems and Technology, College Park, Maryland, March 27–30, 2000.

Psaltis, D.

Pu, A.

Rhee, U.-S.

Schild, H.

D. Waldman, R. Ingwall, P. Dhal, M. Horner, E. Kolb, H.-Y. S. Li, R. Minns, and H. Schild, Proc. SPIE 2689, 127 (1996).
[CrossRef]

Schilling, F. C.

Schilling, M.

V. Colvin, R. Larson, A. L. Harris, and M. Schilling, J. Appl. Phys. 81, 5913 (1997).
[CrossRef]

Schilling, M. L.

Schnoes, M. G.

Shamir, J.

Shelby, R.

Sincerbox, G.

Tomlinson, W.

W. Tomlinson and E. Chandross, Adv. Photochem. 12, 201 (1980).

Vikram, C.

Waldman, D.

D. Waldman, H.-Y. Li, and E. Cetin, Proc. SPIE 3291, 89 (1998).
[CrossRef]

D. Waldman, H.-Y. S. Li, and M. Horner, J. Imaging Sci. Technol. 41, 497 (1997).

D. Waldman, R. Ingwall, P. Dhal, M. Horner, E. Kolb, H.-Y. S. Li, R. Minns, and H. Schild, Proc. SPIE 2689, 127 (1996).
[CrossRef]

D. Waldman, R. Ingwall, E. Cetin, M. Horner, R. Minns, and P. Panchu, presented at the 17th IEEE Symposium on Mass Storage Systems and Technology, College Park, Maryland, March 27–30, 2000.

Wimmer, P.

Wittmann, G.

Zhao, G.

G. Zhao and P. Mouroulis, J. Mod. Opt. 41, 1929 (1994).
[CrossRef]

Adv. Photochem. (1)

W. Tomlinson and E. Chandross, Adv. Photochem. 12, 201 (1980).

Appl. Opt. (3)

J. Appl. Phys. (1)

V. Colvin, R. Larson, A. L. Harris, and M. Schilling, J. Appl. Phys. 81, 5913 (1997).
[CrossRef]

J. Imaging Sci. Technol. (1)

D. Waldman, H.-Y. S. Li, and M. Horner, J. Imaging Sci. Technol. 41, 497 (1997).

J. Mod. Opt. (1)

G. Zhao and P. Mouroulis, J. Mod. Opt. 41, 1929 (1994).
[CrossRef]

Opt. Eng. (1)

A. Pu, K. Curtis, and D. Psaltis, Opt. Eng. 35, 2824 (1996).
[CrossRef]

Opt. Lett. (2)

Proc. SPIE (2)

D. Waldman, R. Ingwall, P. Dhal, M. Horner, E. Kolb, H.-Y. S. Li, R. Minns, and H. Schild, Proc. SPIE 2689, 127 (1996).
[CrossRef]

D. Waldman, H.-Y. Li, and E. Cetin, Proc. SPIE 3291, 89 (1998).
[CrossRef]

Other (2)

H.-Y. S. Li, “Photorefractive 3-D disks for optical data storage and artificial neural networks,” Ph.D. dissertation (California Institute of Technology, Pasadena, Calif., 1994), Chap. 2.

D. Waldman, R. Ingwall, E. Cetin, M. Horner, R. Minns, and P. Panchu, presented at the 17th IEEE Symposium on Mass Storage Systems and Technology, College Park, Maryland, March 27–30, 2000.

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Figures (4)

Fig. 1
Fig. 1

The high-aspect shape of holograms in real space (a) corresponds to a low-aspect volume in k space for allowed wave-vector mismatch (b), shown by the shaded regions. Shrinkage in x and z modifies the written grating vector, K=kO-kR, to K. During reading, ΔkxΔky0, and the reconstructed object wave, kO, is affected only by lateral shrinkage.

Fig. 2
Fig. 2

Mean shift in the x direction for a multiplexed recording run. Holograms read immediately after writing (filled circles) show nearly no shift, whereas the same holograms, read out at the end of the recording run (open circles) reveal a shift that is due to a change in the lateral dimension between writing and final reading.

Fig. 3
Fig. 3

Lateral shrinkage in the x direction, αx, versus total fluence received by the material at time of exposure. Data are shown for ULSH500-7A for preexposure fluence of 75 mJ/cm2 (filled circles) and 90 mJ/cm2 (open squares).

Fig. 4
Fig. 4

Magnification error in the x (filled circles) and the y (open circles) directions from pixel-misregistration data for the 75mJ/cm2 preexposure sample, for zero peristrophic angle only. The dashed curve shows the expected magnification error for the values of αx plotted in Fig. 3.

Equations (8)

Equations on this page are rendered with MathJax. Learn more.

Kx=kOx-kRx=ksin θO-sin θR,
Kx=k1+αxsin θO-sin θR=ksin θO-sin θR,
δθOsin θO-sin θO/cos θO,
δθO=-αxsin θR-sin θO/cos θO.
δθOe|θOe=0=-αx sin θRe,
δMx=dδθOedθOe|θOe=0=αx.
δϕOe=0,
δMy=αy.

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