Abstract

A trapped-particle near-field scanning optical microscope is constructed by use of submicrometer- or micrometer-sized metallic particles (gold and silver) to increase scattering efficiency. The image contrast of the evanescent-wave interference pattern on the surface of a prism upon total internal reflection, obtained with trapped gold particles of diameter 0.1 and 2µm , is improved by a factor of approximately 2 and 1.5, respectively, compared with that obtained with trapped polystyrene particles of similar size. The use of a 2-µm gold particle leads to image contrast that is approximately three times as great as that obtained with a 0.1-µm gold particle, and interference patterns of a subwavelength period are obtained in both cases.

© 1999 Optical Society of America

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1998

1997

1994

W. Wright, G. Sonek, and M. Berns, Appl. Opt. 33, 1735 (1994).

J. Mertz, M. Hipp, J. Mlynek, and O. Marti, Appl. Phys. Lett. 64, 2338 (1994).

S. Kawata, Y. Inouye, and T. Sugiura, Jpn. J. Appl. Phys. 33, L1725 (1994).

A. Meixner, M. Bopp, and G. Tarrach, Appl. Opt. 34, 7995 (1994).

Y. Inouye and S. Kawata, Opt. Lett. 19, 159 (1994).

L. Malmqvist and M. Hertz, Opt. Lett. 19, 853 (1994).

K. Svoboda and S. M. Block, Opt. Lett. 19, 930 (1994).

S. Sato, Y. Herada, and Y. Waseda, Opt. Lett. 19, 1807 (1994).

1993

1990

R. Reddick, R. Warmack, D. Chilcott, S. Sharp, and T. Ferrell, Rev. Sci. Instrum. 61, 3669 (1990).

Berns, M.

Block, S. M.

Bopp, M.

A. Meixner, M. Bopp, and G. Tarrach, Appl. Opt. 34, 7995 (1994).

Chilcott, D.

R. Reddick, R. Warmack, D. Chilcott, S. Sharp, and T. Ferrell, Rev. Sci. Instrum. 61, 3669 (1990).

Ferrell, T.

R. Reddick, R. Warmack, D. Chilcott, S. Sharp, and T. Ferrell, Rev. Sci. Instrum. 61, 3669 (1990).

Furukawa, H.

Ghislain, L.

Gu, M.

P. C. Ke and M. Gu, “Characterization of trapping force on metallic Mie particles,” Appl. Opt. (to be published).

Herada, Y.

Hertz, M.

Hipp, M.

J. Mertz, M. Hipp, J. Mlynek, and O. Marti, Appl. Phys. Lett. 64, 2338 (1994).

Inouye, Y.

Kawata, S.

Ke, P. C.

P. C. Ke and M. Gu, “Characterization of trapping force on metallic Mie particles,” Appl. Opt. (to be published).

Malmqvist, L.

Marti, O.

J. Mertz, M. Hipp, J. Mlynek, and O. Marti, Appl. Phys. Lett. 64, 2338 (1994).

Meixner, A.

A. Meixner, M. Bopp, and G. Tarrach, Appl. Opt. 34, 7995 (1994).

Mertz, J.

J. Mertz, M. Hipp, J. Mlynek, and O. Marti, Appl. Phys. Lett. 64, 2338 (1994).

Mlynek, J.

J. Mertz, M. Hipp, J. Mlynek, and O. Marti, Appl. Phys. Lett. 64, 2338 (1994).

Moyer, P.

M. Paesler and P. Moyer, Near-Field Optics (Wiley, New York, 1996).

Nakamura, O.

Okada, T.

Paesler, M.

M. Paesler and P. Moyer, Near-Field Optics (Wiley, New York, 1996).

Reddick, R.

R. Reddick, R. Warmack, D. Chilcott, S. Sharp, and T. Ferrell, Rev. Sci. Instrum. 61, 3669 (1990).

Sato, S.

Sharp, S.

R. Reddick, R. Warmack, D. Chilcott, S. Sharp, and T. Ferrell, Rev. Sci. Instrum. 61, 3669 (1990).

Sonek, G.

Sugiura, T.

T. Sugiura, T. Okada, Y. Inouye, O. Nakamura, and S. Kawata, Opt. Lett. 22, 1663 (1997).

S. Kawata, Y. Inouye, and T. Sugiura, Jpn. J. Appl. Phys. 33, L1725 (1994).

Svoboda, K.

Tarrach, G.

A. Meixner, M. Bopp, and G. Tarrach, Appl. Opt. 34, 7995 (1994).

Warmack, R.

R. Reddick, R. Warmack, D. Chilcott, S. Sharp, and T. Ferrell, Rev. Sci. Instrum. 61, 3669 (1990).

Waseda, Y.

Webb, W.

Wright, W.

Yamaguchi, I.

Appl. Opt.

A. Meixner, M. Bopp, and G. Tarrach, Appl. Opt. 34, 7995 (1994).

Appl. Opt.

P. C. Ke and M. Gu, “Characterization of trapping force on metallic Mie particles,” Appl. Opt. (to be published).

W. Wright, G. Sonek, and M. Berns, Appl. Opt. 33, 1735 (1994).

Appl. Phys. Lett.

J. Mertz, M. Hipp, J. Mlynek, and O. Marti, Appl. Phys. Lett. 64, 2338 (1994).

Jpn. J. Appl. Phys.

S. Kawata, Y. Inouye, and T. Sugiura, Jpn. J. Appl. Phys. 33, L1725 (1994).

Opt. Lett.

Rev. Sci. Instrum.

R. Reddick, R. Warmack, D. Chilcott, S. Sharp, and T. Ferrell, Rev. Sci. Instrum. 61, 3669 (1990).

Other

M. Paesler and P. Moyer, Near-Field Optics (Wiley, New York, 1996).

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