Abstract

Measurements of the diffraction characteristics of one-dimensional surface-relief gratings of locally varying profile are compared with rigorous diffraction theory. These gratings result from the superposition of two linear sinusoidal gratings of uniform depth for which the relative phase between the two gratings varies slowly with position. The resultant surface profile exhibits a relatively large-period variation in profile form. The periodic variation in diffraction efficiency that results yields a visual moiré pattern that has interesting asymmetry and polarization properties that alter as the viewing conditions are changed; the gratings can be exploited by diffractive optically variable devices for document security.

© 1999 Optical Society of America

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1998

W. R. Tompkin and R. Staub, Proc. SPIE 3291, 1 (1998).

1997

1996

P. Lalanne and G. M. Morris, J. Opt. Soc. Am. A 13, 779 (1996).

R. Staub, W. R. Tompkin, and J.-F. Moser, Proc. SPIE 2689, 292 (1996).

1995

1982

1980

S. Johansson and K. Biedermann, Proc. SPIE 240, 44 (1980).

Biedermann, K.

S. Johansson and K. Biedermann, Proc. SPIE 240, 44 (1980).

Gaylord, T. K.

Glytsis, E. N.

Grann, E. B.

Hirayama, K.

Johansson, S.

S. Johansson and K. Biedermann, Proc. SPIE 240, 44 (1980).

Loewen, E. G.

E. G. Loewen and E. Popov, Diffraction Gratings and Applications (Marcel Dekker, New York, 1997), pp. 531–554.

Moharam, M. G.

Morris, G. M.

Moser, J.-F.

R. Staub, W. R. Tompkin, and J.-F. Moser, Proc. SPIE 2689, 292 (1996).

J.-F. Moser, in Optical Document Security, R. van Renesse, ed. (Artech House, London, 1998), pp. 247–266.

Pommet, D. A.

Popov, E.

E. G. Loewen and E. Popov, Diffraction Gratings and Applications (Marcel Dekker, New York, 1997), pp. 531–554.

Staub, R.

W. R. Tompkin and R. Staub, Proc. SPIE 3291, 1 (1998).

R. Staub, W. R. Tompkin, and J.-F. Moser, Proc. SPIE 2689, 292 (1996).

Tompkin, W. R.

W. R. Tompkin and R. Staub, Proc. SPIE 3291, 1 (1998).

R. Staub, W. R. Tompkin, and J.-F. Moser, Proc. SPIE 2689, 292 (1996).

Turunen, J.

J. Turunen, in Micro-Optics, Elements, Systems and Applications, H.-P. Herzig, ed. (Taylor & Francis, London, 1997), pp. 31–52.

J. Opt. Soc. Am.

J. Opt. Soc. Am. A

Proc. SPIE

W. R. Tompkin and R. Staub, Proc. SPIE 3291, 1 (1998).

R. Staub, W. R. Tompkin, and J.-F. Moser, Proc. SPIE 2689, 292 (1996).

S. Johansson and K. Biedermann, Proc. SPIE 240, 44 (1980).

Other

J.-F. Moser, in Optical Document Security, R. van Renesse, ed. (Artech House, London, 1998), pp. 247–266.

J. Turunen, in Micro-Optics, Elements, Systems and Applications, H.-P. Herzig, ed. (Taylor & Francis, London, 1997), pp. 31–52.

E. G. Loewen and E. Popov, Diffraction Gratings and Applications (Marcel Dekker, New York, 1997), pp. 531–554.

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