Abstract

The effect of modulation caused by a microsphere resonator is experimentally investigated with a model system consisting of a microsphere resonator and a plane substrate. We used total internal reflection microscopy (TIRM), which is a combination of conventional optical microscopy and the total internal reflection method, and observed the intensity distribution under the resonator in the evanescent-wave incidence condition. The TIRM patterns drastically change when the wavelength of the incident beam is scanned across a resonance. The response of the system is discussed on the basis of a recent proposal of traveling-wave resonance.

© 1999 Optical Society of America

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References

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  1. P. W. Barber and K. Chang, eds., Optical Effects Associated With Small Particles (World Scientific, Singapore, 1988).
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    [CrossRef]

1998 (2)

1997 (1)

B. E. Little, S. T. Chu, H. A. Haus, J. Foresi, and J.-P. Laine, J. Lightwave Technol. 15, 998 (1997).
[CrossRef]

1996 (1)

1991 (1)

1990 (1)

D. C. Prieve and N. A. Frej, Langmuir 6, 396 (1990).
[CrossRef]

Arnold, S.

Barton, J. P.

Byer, R. L.

Campillo, A. J.

Chu, S. T.

B. E. Little, S. T. Chu, and H. A. Haus, Opt. Lett. 23, 894 (1998).
[CrossRef]

B. E. Little, S. T. Chu, H. A. Haus, J. Foresi, and J.-P. Laine, J. Lightwave Technol. 15, 998 (1997).
[CrossRef]

Connolly, J.

Eversole, J. D.

Foresi, J.

B. E. Little, S. T. Chu, H. A. Haus, J. Foresi, and J.-P. Laine, J. Lightwave Technol. 15, 998 (1997).
[CrossRef]

Frej, N. A.

D. C. Prieve and N. A. Frej, Langmuir 6, 396 (1990).
[CrossRef]

Griffel, G.

Haus, H. A.

B. E. Little, S. T. Chu, and H. A. Haus, Opt. Lett. 23, 894 (1998).
[CrossRef]

B. E. Little, S. T. Chu, H. A. Haus, J. Foresi, and J.-P. Laine, J. Lightwave Technol. 15, 998 (1997).
[CrossRef]

Laine, J.-P.

B. E. Little, S. T. Chu, H. A. Haus, J. Foresi, and J.-P. Laine, J. Lightwave Technol. 15, 998 (1997).
[CrossRef]

Lin, H.-B.

Little, B. E.

B. E. Little, S. T. Chu, and H. A. Haus, Opt. Lett. 23, 894 (1998).
[CrossRef]

B. E. Little, S. T. Chu, H. A. Haus, J. Foresi, and J.-P. Laine, J. Lightwave Technol. 15, 998 (1997).
[CrossRef]

Morris, N.

Prieve, D. C.

D. C. Prieve and N. A. Frej, Langmuir 6, 396 (1990).
[CrossRef]

Schiller, S.

Serpengüzel, A.

Taskent, D.

J. Lightwave Technol. (1)

B. E. Little, S. T. Chu, H. A. Haus, J. Foresi, and J.-P. Laine, J. Lightwave Technol. 15, 998 (1997).
[CrossRef]

Langmuir (1)

D. C. Prieve and N. A. Frej, Langmuir 6, 396 (1990).
[CrossRef]

Opt. Lett. (4)

Other (1)

P. W. Barber and K. Chang, eds., Optical Effects Associated With Small Particles (World Scientific, Singapore, 1988).

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Figures (4)

Fig. 1
Fig. 1

Schematic diagram of the experimental setup (TIRM): PW, power and wavelength monitor; ND, neutral-density filter; P1, polarizer; P2, analyzer; L1, lens f=60 cm; L2, relay lens; L3, objective lens 5×; L4, objective lens 10×; M’s, mirrors; O, objective lens (N.A., 1.3; 40×).

Fig. 2
Fig. 2

(a)–(m) TIRM images: (a) 566.96  nm, (b) 570.50  nm, (c) 572.17  nm, (d) 574.34  nm, (e) 575.62  nm, (f) 577.46  nm, (g) 578.27  nm, (h) 578.32  nm, (i) 578.46  nm, (j) 578.60  nm, (k) 579.84  nm, (l) 581.10  nm, (m) 583.52  nm. The wavelengths are also indicated by the bars in Fig.  3. The arrow in (a) indicates the pixel used to plot Fig.  3(a). (n) TIRM image without a microsphere resonator. (o) Transmission image of the sphere.

Fig. 3
Fig. 3

Open circles: wavelength versus intensity at the center of the fringe [indicated in Fig.  2(a)] normalized against the peak intensity of the incident Gaussian beam. Filled circles: wavelength versus integrated intensity over the view normalized against Fig.  2(n), i.e., the total incident light intensity. The positions of the modes are indicated by the triangles. Solid and open triangles correspond to the first- and the second-order modes, respectively.

Fig. 4
Fig. 4

Wavelength versus intensity scattered upward [into CCD(2) in Fig.  1].

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