Abstract

We present a multilayered optical memory for use in reading data with a confocal reflection microscope system. We use a recording medium in which photosensitive thin films and nonphotosensitive transparent films are stacked alternately. Since the photosensitive films are thinner than the depth of focus of the recording beam, the spatial frequency distribution of the recorded bit data is extended in the axial direction. The extended distribution overlaps the coherent optical transfer function of the reflection-type confocal microscope. Urethane–urea copolymer film is used as a photosensitive material. The recording and reading of two layers are demonstrated.

© 1998 Optical Society of America

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  1. D. A. Parthenopoulos and P. M. Rentzepis, Science 24, 843 (1989).
    [CrossRef]
  2. J. H. Strickler and W. W. Webb, Opt. Lett. 16, 1780 (1991).
    [CrossRef] [PubMed]
  3. S. Kawata, T. Tanaka, Y. Hashimoto, and Y. Kawata, Proc. SPIE 2042, 314 (1993).
    [CrossRef]
  4. Y. Kawata, H. Ishitobi, and S. Kawata, Opt. Lett. 23, 756 (1998).
    [CrossRef]
  5. T. Wilson, Y. Kawata, and S. Kawata, Opt. Lett. 21, 1003 (1996).
    [CrossRef] [PubMed]
  6. A. Toriumi, S. Kawata, and M. Gu, in Proceedings of the 21st Meeting of the Japan Society for Laser Microscopy (Japan Society for Laser Microscopy, Tokyo, 1998), p. 24.
  7. N. Streibl, J. Opt. Soc. Am. A 2, 121 (1985).
    [CrossRef]
  8. C. J. R. Sheppard, Optik 74, 128 (1986).
  9. C. J. R. Sheppard, M. Gu, and X. Q. Mao, Opt. Commun. 81, 281 (1991).
    [CrossRef]
  10. O. Watanabe, M. Tsuchimori, A. Okada, and H. Ito, Appl. Phys. Lett. 71, 750 (1997).
    [CrossRef]
  11. M. Tsuchimori, O. Watanabe, and A. Okada, J. Mater. Chem. 7, 877 (1997).
    [CrossRef]

1998 (1)

1997 (2)

O. Watanabe, M. Tsuchimori, A. Okada, and H. Ito, Appl. Phys. Lett. 71, 750 (1997).
[CrossRef]

M. Tsuchimori, O. Watanabe, and A. Okada, J. Mater. Chem. 7, 877 (1997).
[CrossRef]

1996 (1)

1993 (1)

S. Kawata, T. Tanaka, Y. Hashimoto, and Y. Kawata, Proc. SPIE 2042, 314 (1993).
[CrossRef]

1991 (2)

C. J. R. Sheppard, M. Gu, and X. Q. Mao, Opt. Commun. 81, 281 (1991).
[CrossRef]

J. H. Strickler and W. W. Webb, Opt. Lett. 16, 1780 (1991).
[CrossRef] [PubMed]

1989 (1)

D. A. Parthenopoulos and P. M. Rentzepis, Science 24, 843 (1989).
[CrossRef]

1986 (1)

C. J. R. Sheppard, Optik 74, 128 (1986).

1985 (1)

Gu, M.

C. J. R. Sheppard, M. Gu, and X. Q. Mao, Opt. Commun. 81, 281 (1991).
[CrossRef]

A. Toriumi, S. Kawata, and M. Gu, in Proceedings of the 21st Meeting of the Japan Society for Laser Microscopy (Japan Society for Laser Microscopy, Tokyo, 1998), p. 24.

Hashimoto, Y.

S. Kawata, T. Tanaka, Y. Hashimoto, and Y. Kawata, Proc. SPIE 2042, 314 (1993).
[CrossRef]

Ishitobi, H.

Ito, H.

O. Watanabe, M. Tsuchimori, A. Okada, and H. Ito, Appl. Phys. Lett. 71, 750 (1997).
[CrossRef]

Kawata, S.

Y. Kawata, H. Ishitobi, and S. Kawata, Opt. Lett. 23, 756 (1998).
[CrossRef]

T. Wilson, Y. Kawata, and S. Kawata, Opt. Lett. 21, 1003 (1996).
[CrossRef] [PubMed]

S. Kawata, T. Tanaka, Y. Hashimoto, and Y. Kawata, Proc. SPIE 2042, 314 (1993).
[CrossRef]

A. Toriumi, S. Kawata, and M. Gu, in Proceedings of the 21st Meeting of the Japan Society for Laser Microscopy (Japan Society for Laser Microscopy, Tokyo, 1998), p. 24.

Kawata, Y.

Mao, X. Q.

C. J. R. Sheppard, M. Gu, and X. Q. Mao, Opt. Commun. 81, 281 (1991).
[CrossRef]

Okada, A.

O. Watanabe, M. Tsuchimori, A. Okada, and H. Ito, Appl. Phys. Lett. 71, 750 (1997).
[CrossRef]

M. Tsuchimori, O. Watanabe, and A. Okada, J. Mater. Chem. 7, 877 (1997).
[CrossRef]

Parthenopoulos, D. A.

D. A. Parthenopoulos and P. M. Rentzepis, Science 24, 843 (1989).
[CrossRef]

Rentzepis, P. M.

D. A. Parthenopoulos and P. M. Rentzepis, Science 24, 843 (1989).
[CrossRef]

Sheppard, C. J. R.

C. J. R. Sheppard, M. Gu, and X. Q. Mao, Opt. Commun. 81, 281 (1991).
[CrossRef]

C. J. R. Sheppard, Optik 74, 128 (1986).

Streibl, N.

Strickler, J. H.

Tanaka, T.

S. Kawata, T. Tanaka, Y. Hashimoto, and Y. Kawata, Proc. SPIE 2042, 314 (1993).
[CrossRef]

Toriumi, A.

A. Toriumi, S. Kawata, and M. Gu, in Proceedings of the 21st Meeting of the Japan Society for Laser Microscopy (Japan Society for Laser Microscopy, Tokyo, 1998), p. 24.

Tsuchimori, M.

O. Watanabe, M. Tsuchimori, A. Okada, and H. Ito, Appl. Phys. Lett. 71, 750 (1997).
[CrossRef]

M. Tsuchimori, O. Watanabe, and A. Okada, J. Mater. Chem. 7, 877 (1997).
[CrossRef]

Watanabe, O.

M. Tsuchimori, O. Watanabe, and A. Okada, J. Mater. Chem. 7, 877 (1997).
[CrossRef]

O. Watanabe, M. Tsuchimori, A. Okada, and H. Ito, Appl. Phys. Lett. 71, 750 (1997).
[CrossRef]

Webb, W. W.

Wilson, T.

Appl. Phys. Lett. (1)

O. Watanabe, M. Tsuchimori, A. Okada, and H. Ito, Appl. Phys. Lett. 71, 750 (1997).
[CrossRef]

J. Mater. Chem. (1)

M. Tsuchimori, O. Watanabe, and A. Okada, J. Mater. Chem. 7, 877 (1997).
[CrossRef]

J. Opt. Soc. Am. A (1)

Opt. Commun. (1)

C. J. R. Sheppard, M. Gu, and X. Q. Mao, Opt. Commun. 81, 281 (1991).
[CrossRef]

Opt. Lett. (3)

Optik (1)

C. J. R. Sheppard, Optik 74, 128 (1986).

Proc. SPIE (1)

S. Kawata, T. Tanaka, Y. Hashimoto, and Y. Kawata, Proc. SPIE 2042, 314 (1993).
[CrossRef]

Science (1)

D. A. Parthenopoulos and P. M. Rentzepis, Science 24, 843 (1989).
[CrossRef]

Other (1)

A. Toriumi, S. Kawata, and M. Gu, in Proceedings of the 21st Meeting of the Japan Society for Laser Microscopy (Japan Society for Laser Microscopy, Tokyo, 1998), p. 24.

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Figures (5)

Fig. 1
Fig. 1

Spatial frequency distribution of the recorded bit datum recorded (a) in a thick medium and (b) in a thin layer. The thickness of the recording layer is the same as the wavelength of the recording light. (a) and (b) are truncated at an arbitrary value to show the structure in the high spatial frequency region. (c) CTF of the reflection confocal microscope.

Fig. 2
Fig. 2

(a) Chemical structure of the urethane–urea copolymers and (b) the recording medium that we developed.

Fig. 3
Fig. 3

Optical system for recording and reading data of multilayerd optical memory. BS’s, beam splitters; ND, neutral density.

Fig. 4
Fig. 4

Axial distribution of the two-layer recorded data.

Fig. 5
Fig. 5

Recording and reading results of the two-layer data. The distance between neighboring bits is 3 µm, and the distance between layers is 8 µm.

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