Abstract

An optical configuration for measurement of in-plane displacement and for contouring is reported. In this method an object point is viewed symmetrically with respect to surface normal and combined coherently at the image plane of the imaging system. Because the beams are combined by small apertures at the image plane, decorrelation sets in rather slowly. Owing to low decorrelation, fringes have been obtained for large in-plane deformations and large angular tilts. The method is simple to implement, and its sensitivity can be varied over a wide range. The configuration, therefore, extends the range of measurement.

© 1996 Optical Society of America

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References

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  1. J. A. Leendertz, J. Phys. E 3, 214 (1970).
    [CrossRef]
  2. D. E. Duffy, Appl. Opt. 11, 1778 (1972).
    [CrossRef] [PubMed]
  3. D. E. Duffy, Exp. Mech. 14, 378 (1974).
    [CrossRef]
  4. Y. Y. Hung, in Speckle Metrology, R. K. Erf, ed. (Academic, New York, 1978), Chap. 4, p. 51.
  5. P. K. Rastogi, in Speckle Metrology, R. S. Sirohi, ed. (Dekker, New York, 1993), Chap. 2, p. 41; R. S. Sirohi, in Speckle Metrology, R. S. Sirohi, ed. (Dekker, New York, 1993), Chap. 3, p. 99.
  6. R. S. Sirohi, N. Krishna, Mohan, J. Sci. Ind. Res. (India) 54, 67 (1995).
  7. A. R. Ganesan, R. S. Sirohsi, Proc. SPIE 954, 327 (1988).

1995 (1)

R. S. Sirohi, N. Krishna, Mohan, J. Sci. Ind. Res. (India) 54, 67 (1995).

1988 (1)

A. R. Ganesan, R. S. Sirohsi, Proc. SPIE 954, 327 (1988).

1974 (1)

D. E. Duffy, Exp. Mech. 14, 378 (1974).
[CrossRef]

1972 (1)

1970 (1)

J. A. Leendertz, J. Phys. E 3, 214 (1970).
[CrossRef]

Duffy, D. E.

Ganesan, A. R.

A. R. Ganesan, R. S. Sirohsi, Proc. SPIE 954, 327 (1988).

Hung, Y. Y.

Y. Y. Hung, in Speckle Metrology, R. K. Erf, ed. (Academic, New York, 1978), Chap. 4, p. 51.

Krishna, N.

R. S. Sirohi, N. Krishna, Mohan, J. Sci. Ind. Res. (India) 54, 67 (1995).

Leendertz, J. A.

J. A. Leendertz, J. Phys. E 3, 214 (1970).
[CrossRef]

Mohan,

R. S. Sirohi, N. Krishna, Mohan, J. Sci. Ind. Res. (India) 54, 67 (1995).

Rastogi, P. K.

P. K. Rastogi, in Speckle Metrology, R. S. Sirohi, ed. (Dekker, New York, 1993), Chap. 2, p. 41; R. S. Sirohi, in Speckle Metrology, R. S. Sirohi, ed. (Dekker, New York, 1993), Chap. 3, p. 99.

Sirohi, R. S.

R. S. Sirohi, N. Krishna, Mohan, J. Sci. Ind. Res. (India) 54, 67 (1995).

Sirohsi, R. S.

A. R. Ganesan, R. S. Sirohsi, Proc. SPIE 954, 327 (1988).

Appl. Opt. (1)

Exp. Mech. (1)

D. E. Duffy, Exp. Mech. 14, 378 (1974).
[CrossRef]

J. Phys. E (1)

J. A. Leendertz, J. Phys. E 3, 214 (1970).
[CrossRef]

J. Sci. Ind. Res. (1)

R. S. Sirohi, N. Krishna, Mohan, J. Sci. Ind. Res. (India) 54, 67 (1995).

Proc. SPIE (1)

A. R. Ganesan, R. S. Sirohsi, Proc. SPIE 954, 327 (1988).

Other (2)

Y. Y. Hung, in Speckle Metrology, R. K. Erf, ed. (Academic, New York, 1978), Chap. 4, p. 51.

P. K. Rastogi, in Speckle Metrology, R. S. Sirohi, ed. (Dekker, New York, 1993), Chap. 2, p. 41; R. S. Sirohi, in Speckle Metrology, R. S. Sirohi, ed. (Dekker, New York, 1993), Chap. 3, p. 99.

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Figures (3)

Fig. 1
Fig. 1

Schematic of the experimental arrangement.

Fig. 2
Fig. 2

Experimental results from a cantilevered beam of length 80 mm × 30 mm × 5 mm. The observation angle θ is ~25°. (a) u-family and (b) v-family fringe patterns were photographed from one of the first-order diffraction halos by use of Fourier filtering.

Fig. 3
Fig. 3

Contour fringes of a light bulb filtered by one of the first-order diffraction halos. The contour interval Δz is (a) 1.69 mm and (b) 0.564 mm.

Equations (5)

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I = 2 [ I 1 + I 2 + 2 I 1 I 2 × cos  ( φ 12 + 2 π μ x + δ 12 2 ) cos  δ 12 2 ] ,
δ 12 = ( K 1 - K 2 ) · L = 2 m π .
2 u sin  θ = m λ ,
Δ u = λ 2 sin  θ .
Δ z = λ 2 sin  θ Δ φ .

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