Abstract

We determine the nonlinear refractive index, n2, in an optical material through the direct measurement of the phase of an ultrashort optical pulse, using the technique of frequency-resolved optical gating. This method results in the accurate measurement of n2, with the error dominated by the uncertainty in the fluence measurement. We measure n2 in fused silica and in potassium dihydrogen phosphate at 804 and 402 nm. These results are consistent with those from previous measurements of n2 in these materials, and the measured dispersion of n2 in fused silica agrees with theoretical predictions.

© 1996 Optical Society of America

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1996 (1)

1995 (2)

T. Clement, A. J. Taylor, D. J. Kane, Opt. Lett. 20, 70 (1995).
[CrossRef] [PubMed]

E. T. J. Nibbering, M. A. Franco, B. S. Prade, G. Grillon, C. Le Blanc, A. Mysrowicz, Opt. Commun. 119, 479 (1995).
[CrossRef]

1994 (1)

1993 (2)

1992 (1)

R. Adair, L. L. Chase, S. A. Payne, Opt. Mater. 1, 185 (1992).
[CrossRef]

1991 (1)

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, E. W. Van Stryland, IEEE J. Quantum Electron. 27, 1296 (1991).
[CrossRef]

1989 (1)

R. Adair, L. L. Chase, S. Payne, Phys. Rev. B 39, 3337 (1989).
[CrossRef]

1984 (1)

1976 (1)

D. Milam, M. J. Weber, J. Appl. Phys. 47, 2497 (1976).
[CrossRef]

Adair, R.

R. Adair, L. L. Chase, S. A. Payne, Opt. Mater. 1, 185 (1992).
[CrossRef]

R. Adair, L. L. Chase, S. Payne, Phys. Rev. B 39, 3337 (1989).
[CrossRef]

Beck, M.

Chambaret, J.-P.

Chase, L. L.

R. Adair, L. L. Chase, S. A. Payne, Opt. Mater. 1, 185 (1992).
[CrossRef]

R. Adair, L. L. Chase, S. Payne, Phys. Rev. B 39, 3337 (1989).
[CrossRef]

Clement, T.

DeLong, K. W.

Franco, M. A.

E. T. J. Nibbering, M. A. Franco, B. S. Prade, G. Grillon, J.-P. Chambaret, A. Mysyrowicz, J. Opt. Soc. Am. B 13, 317 (1996).
[CrossRef]

E. T. J. Nibbering, M. A. Franco, B. S. Prade, G. Grillon, C. Le Blanc, A. Mysrowicz, Opt. Commun. 119, 479 (1995).
[CrossRef]

Grillon, G.

E. T. J. Nibbering, M. A. Franco, B. S. Prade, G. Grillon, J.-P. Chambaret, A. Mysyrowicz, J. Opt. Soc. Am. B 13, 317 (1996).
[CrossRef]

E. T. J. Nibbering, M. A. Franco, B. S. Prade, G. Grillon, C. Le Blanc, A. Mysrowicz, Opt. Commun. 119, 479 (1995).
[CrossRef]

Hagan, D. J.

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, E. W. Van Stryland, IEEE J. Quantum Electron. 27, 1296 (1991).
[CrossRef]

Hutchings, D. C.

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, E. W. Van Stryland, IEEE J. Quantum Electron. 27, 1296 (1991).
[CrossRef]

Kane, D. J.

Le Blanc, C.

E. T. J. Nibbering, M. A. Franco, B. S. Prade, G. Grillon, C. Le Blanc, A. Mysrowicz, Opt. Commun. 119, 479 (1995).
[CrossRef]

Milam, D.

W. T. White, W. L. Smith, D. Milam, Opt. Lett. 9, 10 (1984).
[CrossRef]

D. Milam, M. J. Weber, J. Appl. Phys. 47, 2497 (1976).
[CrossRef]

Mysrowicz, A.

E. T. J. Nibbering, M. A. Franco, B. S. Prade, G. Grillon, C. Le Blanc, A. Mysrowicz, Opt. Commun. 119, 479 (1995).
[CrossRef]

Mysyrowicz, A.

Nibbering, E. T. J.

E. T. J. Nibbering, M. A. Franco, B. S. Prade, G. Grillon, J.-P. Chambaret, A. Mysyrowicz, J. Opt. Soc. Am. B 13, 317 (1996).
[CrossRef]

E. T. J. Nibbering, M. A. Franco, B. S. Prade, G. Grillon, C. Le Blanc, A. Mysrowicz, Opt. Commun. 119, 479 (1995).
[CrossRef]

Payne, S.

R. Adair, L. L. Chase, S. Payne, Phys. Rev. B 39, 3337 (1989).
[CrossRef]

Payne, S. A.

R. Adair, L. L. Chase, S. A. Payne, Opt. Mater. 1, 185 (1992).
[CrossRef]

Prade, B. S.

E. T. J. Nibbering, M. A. Franco, B. S. Prade, G. Grillon, J.-P. Chambaret, A. Mysyrowicz, J. Opt. Soc. Am. B 13, 317 (1996).
[CrossRef]

E. T. J. Nibbering, M. A. Franco, B. S. Prade, G. Grillon, C. Le Blanc, A. Mysrowicz, Opt. Commun. 119, 479 (1995).
[CrossRef]

Raymer, M. G.

Sheik-Bahae, M.

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, E. W. Van Stryland, IEEE J. Quantum Electron. 27, 1296 (1991).
[CrossRef]

Smith, W. L.

W. T. White, W. L. Smith, D. Milam, Opt. Lett. 9, 10 (1984).
[CrossRef]

W. L. Smith, in CRC Handbook of Laser Science and Technology, M. J. Weber, ed. (CRC, Boca Raton, Fla., 1986), Vol. III, Part I, p. 259.

Taylor, A. J.

Trebino, R.

Van Stryland, E. W.

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, E. W. Van Stryland, IEEE J. Quantum Electron. 27, 1296 (1991).
[CrossRef]

Walmsley, I. A.

Weber, M. J.

D. Milam, M. J. Weber, J. Appl. Phys. 47, 2497 (1976).
[CrossRef]

White, W. T.

Wong, V.

IEEE J. Quantum Electron. (1)

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, E. W. Van Stryland, IEEE J. Quantum Electron. 27, 1296 (1991).
[CrossRef]

J. Appl. Phys. (1)

D. Milam, M. J. Weber, J. Appl. Phys. 47, 2497 (1976).
[CrossRef]

J. Opt. Soc. Am. A (1)

J. Opt. Soc. Am. B (1)

Opt. Commun. (1)

E. T. J. Nibbering, M. A. Franco, B. S. Prade, G. Grillon, C. Le Blanc, A. Mysrowicz, Opt. Commun. 119, 479 (1995).
[CrossRef]

Opt. Lett. (4)

Opt. Mater. (1)

R. Adair, L. L. Chase, S. A. Payne, Opt. Mater. 1, 185 (1992).
[CrossRef]

Phys. Rev. B (1)

R. Adair, L. L. Chase, S. Payne, Phys. Rev. B 39, 3337 (1989).
[CrossRef]

Other (1)

W. L. Smith, in CRC Handbook of Laser Science and Technology, M. J. Weber, ed. (CRC, Boca Raton, Fla., 1986), Vol. III, Part I, p. 259.

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Figures (2)

Fig. 1
Fig. 1

Intensity and phase data derived from FROG spectrograms for n2 measurements: normalized intensity and phase (a) as a function of time for the input pulse and ( b) after traversal of 0.95 cm of fused silica with an intensity of 52 GW/cm 2. (c) Δϕ(t), the change in phase with and without the sample, is plotted for these data (points), along with a fit (solid curve) of the measured normalized temporal intensity profile to Δϕ(t).

Fig. 2
Fig. 2

Δϕ(t) versus time measured with FROG for KDP (e) at 402 nm (points), along with a fit (solid curve) of the measured normalized temporal intensity profile to Δϕ(t).

Tables (2)

Tables Icon

Table 1 Measurements of n2 for Fused Silica at 804 nm

Tables Icon

Table 2 Measured n2 Values (×10−16 cm2/W)

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