Abstract

New measurements of the birefringence induced in ultralow-birefringence fibers by a succession of orthogonally polarized UV side exposures show the reversibility of the process. Moreover, it is shown that the birefringence growth depends on two parameters, the total irradiation dose and the nature of the successive polarized UV side exposures. These observations indicate that geometric asymmetry is not the major cause of the birefringence and confirm a model of birefringence growth based on dipole alignment.

© 1996 Optical Society of America

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References

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1995 (1)

P. Niay, P. Bernage, T. Taunay, M. Douay, E. Delevaque, S. Boj, B. Poumellec, IEEE Photon. Technol. Lett. 7, 391 (1995).
[CrossRef]

1994 (2)

1991 (1)

K. O. Hill, F. Bilodeau, B. Malo, D. C. Johnson, Electron. Lett. 27, 1548 (1991).
[CrossRef]

1990 (1)

K. O. Hill, B. Malo, K. A. Vineberg, F. Bilodeau, D. C. Johnson, I. Skinner, Electron. Lett. 26, 1270 (1990).
[CrossRef]

1989 (1)

1985 (1)

1980 (1)

Bernage, P.

P. Niay, P. Bernage, T. Taunay, M. Douay, E. Delevaque, S. Boj, B. Poumellec, IEEE Photon. Technol. Lett. 7, 391 (1995).
[CrossRef]

Bilodeau, F.

K. O. Hill, F. Bilodeau, B. Malo, D. C. Johnson, Electron. Lett. 27, 1548 (1991).
[CrossRef]

K. O. Hill, B. Malo, K. A. Vineberg, F. Bilodeau, D. C. Johnson, I. Skinner, Electron. Lett. 26, 1270 (1990).
[CrossRef]

Boj, S.

P. Niay, P. Bernage, T. Taunay, M. Douay, E. Delevaque, S. Boj, B. Poumellec, IEEE Photon. Technol. Lett. 7, 391 (1995).
[CrossRef]

Bures, J.

Delevaque, E.

P. Niay, P. Bernage, T. Taunay, M. Douay, E. Delevaque, S. Boj, B. Poumellec, IEEE Photon. Technol. Lett. 7, 391 (1995).
[CrossRef]

Douay, M.

P. Niay, P. Bernage, T. Taunay, M. Douay, E. Delevaque, S. Boj, B. Poumellec, IEEE Photon. Technol. Lett. 7, 391 (1995).
[CrossRef]

Eickhoff, W.

Erdogan, T.

Glenn, W. H.

Hill, K. O.

K. O. Hill, F. Bilodeau, B. Malo, D. C. Johnson, Electron. Lett. 27, 1548 (1991).
[CrossRef]

K. O. Hill, B. Malo, K. A. Vineberg, F. Bilodeau, D. C. Johnson, I. Skinner, Electron. Lett. 26, 1270 (1990).
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Inniss, D.

Johnson, D. C.

K. O. Hill, F. Bilodeau, B. Malo, D. C. Johnson, Electron. Lett. 27, 1548 (1991).
[CrossRef]

K. O. Hill, B. Malo, K. A. Vineberg, F. Bilodeau, D. C. Johnson, I. Skinner, Electron. Lett. 26, 1270 (1990).
[CrossRef]

Kosinski, S. G.

Lacroix, S.

Lapierre, J.

Lemaire, P. J.

Malo, B.

K. O. Hill, F. Bilodeau, B. Malo, D. C. Johnson, Electron. Lett. 27, 1548 (1991).
[CrossRef]

K. O. Hill, B. Malo, K. A. Vineberg, F. Bilodeau, D. C. Johnson, I. Skinner, Electron. Lett. 26, 1270 (1990).
[CrossRef]

Meltz, G.

Mizrahi, V.

Morey, W. W.

Niay, P.

P. Niay, P. Bernage, T. Taunay, M. Douay, E. Delevaque, S. Boj, B. Poumellec, IEEE Photon. Technol. Lett. 7, 391 (1995).
[CrossRef]

Nicati, P. A.

P. A. Nicati, Ph. Robert, in Proceedings of the Eighth Optical Fiber Sensor Conference (IEEE/Lasers and Electro-Optics Society, New York, 1992), pp. 402–405.
[CrossRef]

Parent, M.

Poumellec, B.

P. Niay, P. Bernage, T. Taunay, M. Douay, E. Delevaque, S. Boj, B. Poumellec, IEEE Photon. Technol. Lett. 7, 391 (1995).
[CrossRef]

Rashleigh, S. C.

Reed, W. A.

Robert, Ph.

P. A. Nicati, Ph. Robert, in Proceedings of the Eighth Optical Fiber Sensor Conference (IEEE/Lasers and Electro-Optics Society, New York, 1992), pp. 402–405.
[CrossRef]

Skinner, I.

K. O. Hill, B. Malo, K. A. Vineberg, F. Bilodeau, D. C. Johnson, I. Skinner, Electron. Lett. 26, 1270 (1990).
[CrossRef]

Taunay, T.

P. Niay, P. Bernage, T. Taunay, M. Douay, E. Delevaque, S. Boj, B. Poumellec, IEEE Photon. Technol. Lett. 7, 391 (1995).
[CrossRef]

Ulrich, R.

Vengsarkar, A. M.

Vineberg, K. A.

K. O. Hill, B. Malo, K. A. Vineberg, F. Bilodeau, D. C. Johnson, I. Skinner, Electron. Lett. 26, 1270 (1990).
[CrossRef]

Zhong, Q.

Appl. Opt. (1)

Electron. Lett. (2)

K. O. Hill, B. Malo, K. A. Vineberg, F. Bilodeau, D. C. Johnson, I. Skinner, Electron. Lett. 26, 1270 (1990).
[CrossRef]

K. O. Hill, F. Bilodeau, B. Malo, D. C. Johnson, Electron. Lett. 27, 1548 (1991).
[CrossRef]

IEEE Photon. Technol. Lett. (1)

P. Niay, P. Bernage, T. Taunay, M. Douay, E. Delevaque, S. Boj, B. Poumellec, IEEE Photon. Technol. Lett. 7, 391 (1995).
[CrossRef]

J. Opt. Soc. Am. B (1)

Opt. Lett. (3)

Other (1)

P. A. Nicati, Ph. Robert, in Proceedings of the Eighth Optical Fiber Sensor Conference (IEEE/Lasers and Electro-Optics Society, New York, 1992), pp. 402–405.
[CrossRef]

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Figures (3)

Fig. 1
Fig. 1

Experimental setup used for measuring UV-induced birefringence: LD, laser diode; Lo-Bi, low birefringence.

Fig. 2
Fig. 2

Birefringence change during irradiation with s- or p-polarized UV radiation.

Fig. 3
Fig. 3

Growth and relaxation of birefringence as a function of s-polarized exposure dose.

Equations (3)

Equations on this page are rendered with MathJax. Learn more.

T DA 1 ( d = 0 ) T DA ( d ) = T BA 1 T CB ( d ) T BA ,
det [ T DA 1 ( d = 0 ) T DA ( d ) Λ I ] = 0 ,
β = phase ( Λ 1 ) phase ( Λ 2 ) = ± 2 π Δ n B L λ ,

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