Abstract

We propose a picosecond single-beam open Z-scan experiment in which the usual apertured detection scheme is replaced by a two-dimensional single-shot CCD camera. This enables us to extract the two-dimensional transverse modifications of the whole far-field pattern that are due to nonlinear refraction as well as to measure the induced nonlinear phase shift with increased sensitivity compared with that of the conventional Z scan.

© 1996 Optical Society of America

Effects of beam ellipticity on Z-scan measurements

S. M. Mian, B. Taheri, and J. P. Wicksted
J. Opt. Soc. Am. B 13(5) 856-863 (1996)

Reflection Z-scan technique for the study of nonlinear refraction and absorption of a single interface and thin film

D. V. Petrov
J. Opt. Soc. Am. B 13(7) 1491-1498 (1996)

Femtosecond time-resolved Z-scan investigations of optical nonlinearities in ZnSe

K. Y. Tseng, K. S. Wong, and G. K. L. Wong
Opt. Lett. 21(3) 180-182 (1996)

Characterization of dynamic optical nonlinearities by continuous time-resolved Z-scan

David O. Caplan, Gregory S. Kanter, and Prem Kumar
Opt. Lett. 21(17) 1342-1344 (1996)

Simultaneous determination of two or more nonlinear refractive constants by z-scan measurement

A. Hochbaum
Opt. Lett. 20(22) 2261-2263 (1995)