Abstract

We demonstrate a new optical element consisting of a phase mask made of a nonlinear material. The element uses the nonlinearity to produce an intensity-dependent lens that controls its imaging properties. We demonstrate this element by optically controlling the imaging of an array produced by a diffractive spot generator in direct contact with a thin semiconductor-doped glass slab. The image at 632.8 nm is controlled by 514.5-nm light from an argon-ion laser.

© 1996 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. N. B. Abraham, W. J. Firth, J. Opt. Soc. Am. B 7, 951 (1990).
    [CrossRef]
  2. G. I. Stegeman, R. H. Stolen, J. Opt. Soc. Am. B 6, 652 (1989).
    [CrossRef]
  3. H. M. Gibbs, ed., Optical Bistability: Controlling Light with Light (Academic, Orlando, Fla., 1985).
  4. J. Glückstad, Opt. Commun. 120, 194 (1995).
    [CrossRef]
  5. Z. Chen, H. Lai, J. Opt. Soc. Am. B 9, 2248 (1992).
    [CrossRef]
  6. J. P. Gordon, R. C. C. Leite, R. S. Moore, S. P. S. Porto, J. R. Whinnery, J. Appl. Phys. 36, 3 (1965).
    [CrossRef]
  7. J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, New York, 1968).
  8. F. A. P. Tooley, S. M. Prince, M. R. Taghizadeh, F. B. McCormick, M. W. Derstine, S. Wakelin, Appl. Opt. 34, 6471 (1995).
    [CrossRef] [PubMed]
  9. Z. Zhou, T. J. Drabik, Appl. Opt. 34, 3048 (1995).
    [CrossRef] [PubMed]
  10. A. Vasara, M. R. Taghizadeh, J. Turunen, J. Westerholm, E. Noponen, H. Ichikawa, J. M. Miller, T. Jaakkola, S. Kuisma, Appl. Opt. 31, 3320 (1995).
    [CrossRef]
  11. K. J. Li, B. K. Jenkins, Appl. Opt. 34, 358 (1995).
    [CrossRef] [PubMed]
  12. N. Finlayson, W. C. Banyai, C. T. Seaton, G. I. Stegeman, M. O’Neil, T. J. Cullen, C. N. Ironside, J. Opt. Soc. Am. B 6, 675 (1989).
    [CrossRef]
  13. M. Sheik-Bahae, J. Wang, R. DeSalvo, D. J. Hagan, E. W. Van Stryland, Opt. Lett. 17, 258 (1992).
    [CrossRef] [PubMed]
  14. R. L. Sutherland, Appl. Opt. 33, 5576 (1995).
    [CrossRef]

1995 (6)

1992 (2)

1990 (1)

1989 (2)

1965 (1)

J. P. Gordon, R. C. C. Leite, R. S. Moore, S. P. S. Porto, J. R. Whinnery, J. Appl. Phys. 36, 3 (1965).
[CrossRef]

Abraham, N. B.

Banyai, W. C.

Chen, Z.

Cullen, T. J.

Derstine, M. W.

DeSalvo, R.

Drabik, T. J.

Finlayson, N.

Firth, W. J.

Glückstad, J.

J. Glückstad, Opt. Commun. 120, 194 (1995).
[CrossRef]

Goodman, J. W.

J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, New York, 1968).

Gordon, J. P.

J. P. Gordon, R. C. C. Leite, R. S. Moore, S. P. S. Porto, J. R. Whinnery, J. Appl. Phys. 36, 3 (1965).
[CrossRef]

Hagan, D. J.

Ichikawa, H.

Ironside, C. N.

Jaakkola, T.

Jenkins, B. K.

Kuisma, S.

Lai, H.

Leite, R. C. C.

J. P. Gordon, R. C. C. Leite, R. S. Moore, S. P. S. Porto, J. R. Whinnery, J. Appl. Phys. 36, 3 (1965).
[CrossRef]

Li, K. J.

McCormick, F. B.

Miller, J. M.

Moore, R. S.

J. P. Gordon, R. C. C. Leite, R. S. Moore, S. P. S. Porto, J. R. Whinnery, J. Appl. Phys. 36, 3 (1965).
[CrossRef]

Noponen, E.

O’Neil, M.

Porto, S. P. S.

J. P. Gordon, R. C. C. Leite, R. S. Moore, S. P. S. Porto, J. R. Whinnery, J. Appl. Phys. 36, 3 (1965).
[CrossRef]

Prince, S. M.

Seaton, C. T.

Sheik-Bahae, M.

Stegeman, G. I.

Stolen, R. H.

Sutherland, R. L.

Taghizadeh, M. R.

Tooley, F. A. P.

Turunen, J.

Van Stryland, E. W.

Vasara, A.

Wakelin, S.

Wang, J.

Westerholm, J.

Whinnery, J. R.

J. P. Gordon, R. C. C. Leite, R. S. Moore, S. P. S. Porto, J. R. Whinnery, J. Appl. Phys. 36, 3 (1965).
[CrossRef]

Zhou, Z.

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (3)

Fig. 1
Fig. 1

Experimental layout for the demonstration of the hybrid element: M1, mirror; M2, dichroic mirror; H1, pinhole, L1, lens; P, spot array generator phase mask; F, SDG filter acting as a lens; S, screen. When d ≥ the sum of the focal lengths of lenses L1 and F, a sharp spot array can be formed on the screen.

Fig. 2
Fig. 2

Images of phase mask P at a wavelength of 632.8 nm with a Schott RG610 filter with the 514.5-nm beam (a) off and (b) on.

Fig. 3
Fig. 3

Experimental layout to measure n2 for SDG filters using the two-color Z scan: M1, mirror; M2, dichroic mirror; C, chopper; H1, pinhole; L1, focusing lens; F, SDG filter; TS, translation stage; H2, pinhole; L2, collecting lens, D, detector.

Tables (1)

Tables Icon

Table 1 Characterization of Thermal Lensing Parameters in SDG Filters

Equations (10)

Equations on this page are rendered with MathJax. Learn more.

U = U 0 exp ( x 2 + y 2 R 2 ) exp ( i k z ) ,
U = U 0 ' exp [ i T ( x , y ) ] exp ( i k 2 ( x 2 + y 2 ) { 1 d + k 2 ( 1 f 1 1 d ) 4 d 2 [ 1 R 4 + k 2 4 ( 1 f 1 1 d ) 2 ] 1 f 2 } ) ,
U ( x l , y l ) = exp [ i k 2 l ( x l 2 + y l 2 ) ] i λ l × U exp [ i k 2 l ( x 2 + y 2 ) ] × exp [ i k 2 l ( x x l + y y l ) ] d x d y ,
l = { 1 f 2 1 d k 2 ( 1 f 1 1 d ) 4 d 2 [ 1 R 4 + k 2 4 ( 1 f 1 1 d ) 2 ] } 1 .
f 2 { 1 d + k 2 ( 1 f 1 1 d ) 4 d 2 [ 1 R 4 + k 2 4 ( 1 f 1 1 d ) 2 ] } 1 .
f 2 d f 1
1 R 2 k 2 ( 1 d 1 f 1 ) .
I = I 0 ( 1 r 2 a 2 ) ,
f 2 = n 0 2 n 2 I 0 a 2 l eff ,
l eff = 1 exp ( α l ) α ,

Metrics