Abstract

We propose, for the first time to our knowledge, a method for realizing one-step measurement of two-dimensional Jones matrix parameters of polarization-sensitive materials. This method could be called one-step Jones matrix polarization holography (JMPH). Our theoretical analysis and the experimental results demonstrate that a double-source polarization interferometer combined with angular multiplexing holography make it possible to realize one-step holographic measurements of four spatially resolved Jones matrix parameters. Compared with the existing methods, our one-step JMPH has a simpler optical arrangement and easier measuring procedure. We believe that it will provide a new approach for development of an integrated system suitable for measuring, in real-time, a Jones matrix or transmittance matrix, as well as dynamic polarization imaging.

© 2014 Optical Society of America

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