Abstract
We present a theory based on an exact calculation of the radiation forces
on a microsized particle illuminated by evanescent waves created under total
internal reflection in a flat substrate. The influence of the proximity of
this interface to the particle is analyzed by a numerical simulation that
addresses multiple scattering of light between the particle and the dielectric
flat surface. We thus give an interpretation of the experimental results of Kawata and Sugiura [Opt. Lett. 17, 772 (1992)] and put forward a method that is capable of predicting
new effects.
© 1999 Optical Society of America
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