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OSA Publishing

12 October 2020, Volume 28, Issue 21, pp. 30340-32238   147 articles


Instrumentation, Measurement, and Optical Sensors

Phase sensitive low-coherence interferometry using microwave photonics

Opt. Express 28(21), 30432-30446 (2020)  View: HTML | PDF

Optical fiber laser refractometer based on an open microcavity Mach-Zehnder interferometer with an ultra-low detection limit

Opt. Express 28(21), 30570-30585 (2020)  View: HTML | PDF

Online fringe pitch selection for defocusing a binary square pattern projection phase-shifting method

Opt. Express 28(21), 30710-30725 (2020)  View: HTML | PDF

Exact equations to measure highly aberrated wavefronts with the Hartmann test

Opt. Express 28(21), 30928-30942 (2020)  View: HTML | PDF

Large depth-of-field three-dimensional shape measurement with the focal sweep technique

Opt. Express 28(21), 31197-31208 (2020)  View: HTML | PDF  [Suppl. Mat. (4)]

Three-dimensional sensing of arbitrarily shaped nanoparticles by whispering gallery mode resonators

Opt. Express 28(21), 31297-31315 (2020)  View: HTML | PDF

Displacement-free stereoscopic phase measuring deflectometry based on phase difference minimization

Opt. Express 28(21), 31658-31674 (2020)  View: HTML | PDF

Phase modulation depth setting technique of a phase-generated-carrier under AOIM in fiber-optic interferometer with laser frequency modulation

Opt. Express 28(21), 31700-31713 (2020)  View: HTML | PDF

Multi-longitudinal mode fiber laser digital vibration-sensing system based on a multi-carrier modulation/demodulation technique

Opt. Express 28(21), 31808-31820 (2020)  View: HTML | PDF

Divided-aperture confocal Brillouin microscopy for simultaneous high-precision topographic and mechanical mapping

Opt. Express 28(21), 31821-31831 (2020)  View: HTML | PDF

Investigation on magnetic field response of a 87Rb-129Xe atomic spin comagnetometer

Opt. Express 28(21), 32033-32041 (2020)  View: HTML | PDF

Miniaturized integrating sphere light sources based on LEDs for radiance responsivity calibration of optical imaging microscopes

Opt. Express 28(21), 32199-32213 (2020)  View: HTML | PDF

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