Microfabricated devices for single objective single plane illumination microscopy (SoSPIM)

Elisa Zagato, Toon Brans, Steven Verstuyft, Dries van Thourhout, Jeroen Missinne, Geert van Steenberge, Jo Demeester, Stefaan De Smedt, Katrien Remaut, Kristiaan Neyts, and Kevin Braeckmans

Opt. Express 25(3), 1732-1745 (2017)  View: HTML | PDF  [Suppl. Mat. (10)]

Resolution enhancement in confocal microscopy using Bessel-Gauss beams

Louis Thibon, Louis E. Lorenzo, Michel Piché, and Yves De Koninck

Opt. Express 25(3), 2162-2177 (2017)  View: HTML | PDF

Axial beam scanning in multiphoton microscopy with MEMS-based actuator

Xiyu Duan, Haijun Li, Xue Li, Kenn R. Oldham, and Thomas D. Wang

Opt. Express 25(3), 2195-2205 (2017)  View: HTML | PDF

Lateral resolution enhancement of confocal microscopy based on structured detection method with spatial light modulator

He Ni, Limin Zou, Qingyuan Guo, and Xuemei Ding

Opt. Express 25(3), 2872-2882 (2017)  View: HTML | PDF