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OSA Publishing

13 November 2017, Volume 25, Issue 23, pp. 27968-29525   131 articles

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Instrumentation, Measurement, and Metrology

Optimized method for spectral reflectance reconstruction from camera responses

Opt. Express 25(23), 28273-28287 (2017)  View: HTML | PDF

Automatic real-time focus control system for laser processing using dynamic focusing optical system

Opt. Express 25(23), 28427-28441 (2017)  View: HTML | PDF  [Suppl. Mat. (1)]

Complete dispersion characterization of microstructured optical fibers from a single interferogram using the windowed Fourier-ridges algorithm

Opt. Express 25(23), 28459-28468 (2017)  View: HTML | PDF

Laser differential confocal inner-surface profile measurement method for an ICF capsule

Opt. Express 25(23), 28510-28523 (2017)  View: HTML | PDF

Broad wavelength range infrared lens refractive index measurement using confocal tomography

Opt. Express 25(23), 28674-28683 (2017)  View: HTML | PDF

Performance characteristics of 4-port in-plane and out-of-plane in-line metasurface polarimeters

Opt. Express 25(23), 28697-28709 (2017)  View: HTML | PDF

Simultaneous measurement of refractive index and flow rate using graphene-coated optofluidic anti-resonant reflecting guidance

Opt. Express 25(23), 28731-28742 (2017)  View: HTML | PDF

Single-shot planar temperature imaging of radiatively heated fluidized particles

Opt. Express 25(23), 28764-28775 (2017)  View: HTML | PDF

Quantitative estimation of crazing in sol-gel layers by automated optical microscopy analysis.

Opt. Express 25(23), 28851-28869 (2017)  View: HTML | PDF

Slewing mirror telescope of the UFFO-pathfinder: first report on performance in space

Opt. Express 25(23), 29143-29154 (2017)  View: HTML | PDF

Simultaneous fluorescence and surface charge measurements on organic semiconductor-coated silica microspheres in (non)polar liquids

Opt. Express 25(23), 29161-29171 (2017)  View: HTML | PDF

Depth recovering method immune to projector errors in fringe projection profilometry by use of cross-ratio invariance

Opt. Express 25(23), 29272-29286 (2017)  View: HTML | PDF

Hyper ellipse fitting in subspace method for phase-shifting interferometry: practical implementation with automatic pixel selection

Opt. Express 25(23), 29401-29416 (2017)  View: HTML | PDF

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