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OSA Publishing

4 September 2017, Volume 25, Issue 18, pp. 20953-22177   107 articles

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Microscopy

Vortex topographic microscopy for full-field reference-free imaging and testing

Opt. Express 25(18), 21428-21443 (2017)  View: HTML | PDF  [Suppl. Mat. (3)]

Editors' Pick

In situ high-resolution thermal microscopy on integrated circuits

Opt. Express 25(18), 21548-21558 (2017)  View: HTML | PDF

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