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4 September 2017, Volume 25, Issue 18, pp. 20953-22177  
107 articles

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Vortex topographic microscopy for full-field reference-free imaging and testing

Petr Bouchal, Lenka Štrbková, Zbyněk Dostál, and Zdeněk Bouchal

Opt. Express 25(18), 21428-21443 (2017)  View: HTML | PDF  [Suppl. Mat. (3)]

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In situ high-resolution thermal microscopy on integrated circuits

Guan-Yu Zhuo, Hai-Ching Su, Hsien-Yi Wang, and Ming-Che Chan

Opt. Express 25(18), 21548-21558 (2017)  View: HTML | PDF

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This visualization shows reconstructed perspective view images from various viewpoints and depth. See Z. Yan et al., Fig. 9 for details.

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