Andrew M. Weiner, Editor-in-Chief
Andrew Weiner, Editor-in-Chief
Vortex topographic microscopy for full-field reference-free imaging and testing
Petr Bouchal, Lenka Štrbková, Zbyněk Dostál, and Zdeněk Bouchal
Opt. Express 25(18), 21428-21443 (2017) View:
[Suppl. Mat. (3)]
In situ high-resolution thermal microscopy on integrated circuits
Guan-Yu Zhuo, Hai-Ching Su, Hsien-Yi Wang, and Ming-Che Chan
Opt. Express 25(18), 21548-21558 (2017) View:
This visualization shows reconstructed perspective view images from various viewpoints and depth.
See Z. Yan et al., Fig. 9 for details.