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OSA Publishing

4 September 2017, Volume 25, Issue 18, pp. 20953-22177   107 articles

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Instrumentation, Measurement, and Metrology

Mask aligner lithography using laser illumination for versatile pattern generation

Opt. Express 25(18), 20983-20992 (2017)  View: HTML | PDF

Measurement system and model for simultaneously measuring 6DOF geometric errors

Opt. Express 25(18), 20993-21007 (2017)  View: HTML | PDF

Three-dimensional flame measurements with large field angle

Opt. Express 25(18), 21008-21018 (2017)  View: HTML | PDF

Self-calibration of Fizeau interferometer and planar scale gratings in Littrow setup

Opt. Express 25(18), 21567-21582 (2017)  View: HTML | PDF

Phase retrieval in two-shot phase-shifting interferometry based on phase shift estimation in a local mask

Opt. Express 25(18), 21673-21683 (2017)  View: HTML | PDF

Sensitive and broadband measurement of dispersion in a cavity using a Fourier transform spectrometer with kHz resolution

Opt. Express 25(18), 21711-21718 (2017)  View: HTML | PDF

Towards a holographic approach to spherical aberration correction in scanning transmission electron microscopy

Opt. Express 25(18), 21851-21860 (2017)  View: HTML | PDF

Measurement of spectacle lenses using wavefront aberration in real view condition

Opt. Express 25(18), 22125-22139 (2017)  View: HTML | PDF

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