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OSA Publishing

7 August 2017, Volume 25, Issue 16, pp. 18502-19654; Energy Express pp: A628–A869   123 articles

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Instrumentation, Measurement, and Metrology

Optimization of instrument matrix for Mueller matrix ellipsometry based on partial elements analysis of the Mueller matrix

Opt. Express 25(16), 18872-18884 (2017)  View: HTML | PDF

Sub-pixel projector calibration method for fringe projection profilometry

Opt. Express 25(16), 19158-19169 (2017)  View: HTML | PDF

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