Andrew M. Weiner, Editor-in-Chief
Andrew Weiner, Editor-in-Chief
Optimization of instrument matrix for Mueller matrix ellipsometry based on partial elements analysis of the Mueller matrix
Xiaobo Li, Haofeng Hu, Lan Wu, and Tiegen Liu
Opt. Express 25(16), 18872-18884 (2017) View:
Sub-pixel projector calibration method for fringe projection profilometry
Wei Zhang, Weishi Li, Liandong Yu, Hui Luo, Huining Zhao, and Haojie Xia
Opt. Express 25(16), 19158-19169 (2017) View:
This visualization shows a demonstration of near-field light distributions within an oxidized nanoparticle crystal.
See Z.-X. Jia et al., Fig. 3 for details.