Quantitative characterization of X-ray lenses from two fabrication techniques with grating interferometry

Frieder J. Koch, Carsten Detlefs, Tobias J. Schröter, Danays Kunka, Arndt Last, and Jürgen Mohr

Opt. Express 24(9), 9168-9177 (2016)  View: HTML | PDF

Wavelength-tunable split-and-delay optical system for hard X-ray free-electron lasers

Taito Osaka, Takashi Hirano, Yasuhisa Sano, Yuichi Inubushi, Satoshi Matsuyama, Kensuke Tono, Tetsuya Ishikawa, Kazuto Yamauchi, and Makina Yabashi

Opt. Express 24(9), 9187-9201 (2016)  View: HTML | PDF