OSA Publishing

22 June 1998, Volume 2, Issue 13, pp. 515-552   6 articles

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Introduction

Opt. Express 2(13), 515-515 (1998)  View: HTML | PDF

Optical interferometric technique for deformation analysis

Opt. Express 2(13), 516-530 (1998)  View: HTML | PDF  [Suppl. Mat. (1)]

Improved resolution and signal-to-noise ratio in laser-ultrasonics by SAFT processing

Opt. Express 2(13), 531-539 (1998)  View: HTML | PDF

Subsurface defect detection in materials using optical coherence tomography

Opt. Express 2(13), 540-545 (1998)  View: HTML | PDF  [Suppl. Mat. (3)]

A high resolution, holographically corrected microscope with a Fresnel lens objective at large working distances

Opt. Express 2(13), 546-551 (1998)  View: HTML | PDF

Direct-to-video holographic 3-D imaging using photorefractive multiple quantum well devices: errata

Opt. Express 2(13), 552-552 (1998)  View: HTML | PDF

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