22 June 1998, Volume 2, Issue 13, pp. 515-552
6 articles
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Animation showing various three-dimensional views of Optical Coherence Tomography (OCT) data from 15 different X-Y scans in the silicon carbide sample; the colored regions represent areas of high scatter. Authors used OCT to study the internal structure of a variety of non-biological materials. [See article by M. D. Duncan, M. Bashkansky and J. Reintjes for details.]