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Y. Kim, K. Hibino, N. Sugita, and M. Mitsuishi, “Measurement of absolute optical thickness of mask glass by wavelength-tuning Fourier analysis,” Opt. Lett. 40(13), 3169–3172 (2015).

[Crossref]
[PubMed]

Y. Kim, K. Hibino, N. Sugita, and M. Mitsuishi, “Absolute optical thickness measurement of transparent plate using excess fraction method and wavelength-tuning Fizeau interferometer,” Opt. Express 23(4), 4065–4073 (2015).

[Crossref]
[PubMed]

J. Li, Y. R. Wang, X. F. Meng, X. L. Yang, and Q. P. Wang, “Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry,” Opt. Laser Technol. 56(1), 241–246 (2014).

[Crossref]

J J. Park, J. Jin, J. Wan Kim, and J.-A. Kim, “Measurement of thickness profile and refractive index variation of a silicon wafer using the optical comb of a femtosecond pulse laser,” Opt. Commun. 305, 170–174 (2013).

[Crossref]

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[Crossref]
[PubMed]

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[Crossref]
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[Crossref]

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[Crossref]

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Z. Rui, C. Lei, Z. Wen-hua, M. Shi, Z. Dong-hui, and S. Qin-yuan, “Measuring optical homogeneity of parallel plates based on simultaneous phase-shifting by lateral displacement of point sources,” Wuli Xuebao 47(1), 0112002 (2018).

K. Hibino, B. F. Oreb, and P. S. Fairman, “Improved algorithms for wavelength scanning interferometry: application to the simultaneous measurement of surface topography and optical thickness variation in a transparent parallel plate,” Proc. SPIE 4777, 212–219 (2002).

[Crossref]

Y. Kim, K. Hibino, N. Sugita, and M. Mitsuishi, “Absolute optical thickness measurement of transparent plate using excess fraction method and wavelength-tuning Fizeau interferometer,” Opt. Express 23(4), 4065–4073 (2015).

[Crossref]
[PubMed]

Y. Kim, K. Hibino, N. Sugita, and M. Mitsuishi, “Measurement of absolute optical thickness of mask glass by wavelength-tuning Fourier analysis,” Opt. Lett. 40(13), 3169–3172 (2015).

[Crossref]
[PubMed]

K. Hibino, B. F. Oreb, and P. S. Fairman, “Improved algorithms for wavelength scanning interferometry: application to the simultaneous measurement of surface topography and optical thickness variation in a transparent parallel plate,” Proc. SPIE 4777, 212–219 (2002).

[Crossref]

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[Crossref]

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[Crossref]
[PubMed]

J J. Park, J. Jin, J. Wan Kim, and J.-A. Kim, “Measurement of thickness profile and refractive index variation of a silicon wafer using the optical comb of a femtosecond pulse laser,” Opt. Commun. 305, 170–174 (2013).

[Crossref]

Y. Kim, K. Hibino, N. Sugita, and M. Mitsuishi, “Absolute optical thickness measurement of transparent plate using excess fraction method and wavelength-tuning Fizeau interferometer,” Opt. Express 23(4), 4065–4073 (2015).

[Crossref]
[PubMed]

Y. Kim, K. Hibino, N. Sugita, and M. Mitsuishi, “Measurement of absolute optical thickness of mask glass by wavelength-tuning Fourier analysis,” Opt. Lett. 40(13), 3169–3172 (2015).

[Crossref]
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[Crossref]

Z. Rui, C. Lei, Z. Wen-hua, M. Shi, Z. Dong-hui, and S. Qin-yuan, “Measuring optical homogeneity of parallel plates based on simultaneous phase-shifting by lateral displacement of point sources,” Wuli Xuebao 47(1), 0112002 (2018).

J. Li, Y. R. Wang, X. F. Meng, X. L. Yang, and Q. P. Wang, “Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry,” Opt. Laser Technol. 56(1), 241–246 (2014).

[Crossref]

O. Matoušek, V. Lédl, P. Psota, and P. Vojtíšek, “Methods for refractive-index homogeneity calculation using Fourier-transform phase-shifting interferometry,” Proc. SPIE 10151, 101510Y (2016).

[Crossref]

J. Li, Y. R. Wang, X. F. Meng, X. L. Yang, and Q. P. Wang, “Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry,” Opt. Laser Technol. 56(1), 241–246 (2014).

[Crossref]

Y. Kim, K. Hibino, N. Sugita, and M. Mitsuishi, “Absolute optical thickness measurement of transparent plate using excess fraction method and wavelength-tuning Fizeau interferometer,” Opt. Express 23(4), 4065–4073 (2015).

[Crossref]
[PubMed]

Y. Kim, K. Hibino, N. Sugita, and M. Mitsuishi, “Measurement of absolute optical thickness of mask glass by wavelength-tuning Fourier analysis,” Opt. Lett. 40(13), 3169–3172 (2015).

[Crossref]
[PubMed]

K. Hibino, B. F. Oreb, and P. S. Fairman, “Improved algorithms for wavelength scanning interferometry: application to the simultaneous measurement of surface topography and optical thickness variation in a transparent parallel plate,” Proc. SPIE 4777, 212–219 (2002).

[Crossref]

J J. Park, J. Jin, J. Wan Kim, and J.-A. Kim, “Measurement of thickness profile and refractive index variation of a silicon wafer using the optical comb of a femtosecond pulse laser,” Opt. Commun. 305, 170–174 (2013).

[Crossref]

O. Matoušek, V. Lédl, P. Psota, and P. Vojtíšek, “Methods for refractive-index homogeneity calculation using Fourier-transform phase-shifting interferometry,” Proc. SPIE 10151, 101510Y (2016).

[Crossref]

Z. Rui, C. Lei, Z. Wen-hua, M. Shi, Z. Dong-hui, and S. Qin-yuan, “Measuring optical homogeneity of parallel plates based on simultaneous phase-shifting by lateral displacement of point sources,” Wuli Xuebao 47(1), 0112002 (2018).

Z. Rui, C. Lei, Z. Wen-hua, M. Shi, Z. Dong-hui, and S. Qin-yuan, “Measuring optical homogeneity of parallel plates based on simultaneous phase-shifting by lateral displacement of point sources,” Wuli Xuebao 47(1), 0112002 (2018).

Z. Rui, C. Lei, Z. Wen-hua, M. Shi, Z. Dong-hui, and S. Qin-yuan, “Measuring optical homogeneity of parallel plates based on simultaneous phase-shifting by lateral displacement of point sources,” Wuli Xuebao 47(1), 0112002 (2018).

Y. Kim, K. Hibino, N. Sugita, and M. Mitsuishi, “Measurement of absolute optical thickness of mask glass by wavelength-tuning Fourier analysis,” Opt. Lett. 40(13), 3169–3172 (2015).

[Crossref]
[PubMed]

Y. Kim, K. Hibino, N. Sugita, and M. Mitsuishi, “Absolute optical thickness measurement of transparent plate using excess fraction method and wavelength-tuning Fizeau interferometer,” Opt. Express 23(4), 4065–4073 (2015).

[Crossref]
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[Crossref]

J J. Park, J. Jin, J. Wan Kim, and J.-A. Kim, “Measurement of thickness profile and refractive index variation of a silicon wafer using the optical comb of a femtosecond pulse laser,” Opt. Commun. 305, 170–174 (2013).

[Crossref]

J. Li, Y. R. Wang, X. F. Meng, X. L. Yang, and Q. P. Wang, “Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry,” Opt. Laser Technol. 56(1), 241–246 (2014).

[Crossref]

J. Li, Y. R. Wang, X. F. Meng, X. L. Yang, and Q. P. Wang, “Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry,” Opt. Laser Technol. 56(1), 241–246 (2014).

[Crossref]

Z. Rui, C. Lei, Z. Wen-hua, M. Shi, Z. Dong-hui, and S. Qin-yuan, “Measuring optical homogeneity of parallel plates based on simultaneous phase-shifting by lateral displacement of point sources,” Wuli Xuebao 47(1), 0112002 (2018).

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J. Li, Y. R. Wang, X. F. Meng, X. L. Yang, and Q. P. Wang, “Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry,” Opt. Laser Technol. 56(1), 241–246 (2014).

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[Crossref]

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[Crossref]
[PubMed]

J. Li, Y. R. Wang, X. F. Meng, X. L. Yang, and Q. P. Wang, “Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry,” Opt. Laser Technol. 56(1), 241–246 (2014).

[Crossref]

O. Matoušek, V. Lédl, P. Psota, and P. Vojtíšek, “Methods for refractive-index homogeneity calculation using Fourier-transform phase-shifting interferometry,” Proc. SPIE 10151, 101510Y (2016).

[Crossref]

K. Hibino, B. F. Oreb, and P. S. Fairman, “Improved algorithms for wavelength scanning interferometry: application to the simultaneous measurement of surface topography and optical thickness variation in a transparent parallel plate,” Proc. SPIE 4777, 212–219 (2002).

[Crossref]

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[Crossref]

Z. Rui, C. Lei, Z. Wen-hua, M. Shi, Z. Dong-hui, and S. Qin-yuan, “Measuring optical homogeneity of parallel plates based on simultaneous phase-shifting by lateral displacement of point sources,” Wuli Xuebao 47(1), 0112002 (2018).

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