B. Li and S. Zhang, “Microscopic structured light 3d profilometry: Binary defocusing technique vs. sinusoidal fringe projection,” Opt. & Lasers Eng. 96, 117–123 (2017).

[Crossref]

A. Silva, J. L. Flores, A. M. noz, G. A. Ayubi, and J. A. Ferrari, “Three-dimensional shape profiling by out-of-focus projection of colored pulse width modulation fringe patterns,” Appl. Opt. 56(18), 5198–5203 (2017).

[Crossref]

A. Kamagara, S. Li, and X. Wang, “Optimal defocus selection based on normed fourier transform for digital fringe pattern profilometry,” Appl. Opt. 56(28), 8014–8022 (2017).

[Crossref]

C. Zuo, H. Li, M. Zhang, Q. Chen, S. Feng, T. Tao, and Y. Hu, “Robust and efficient multi-frequency temporal phase unwrapping: optimal fringe frequency and pattern sequence selection,” Opt. Express 25(17), 20381–20400 (2017).

[Crossref]

W. Lohry and S. Zhang, “3d shape measurement with 2d area modulated binary patterns,” Opt. & Lasers Eng. 50(7), 917–921 (2012).

[Crossref]

Y. Wang and S. Zhang, “Three-dimensional shape measurement with binary dithered patterns,” Appl. Opt. 51(27), 6631–6636 (2012).

[Crossref]

C. Zuo, Q. Chen, S. Feng, F. Feng, G. Gu, and X. Sui, “Optimized pulse width modulation pattern strategy for three-dimensional profilometry with projector defocusing,” Appl. Opt. 51(19), 4477–4490 (2012).

[Crossref]

Y. Xiao, Y. Cao, and Y. Wu, “Improved algorithm for phase-to-height mapping in phase measuring profilometry,” Appl. Opt. 51(8), 1149 (2012).

[Crossref]

M. Nagase, D. Iwai, and K. Sato, “Dynamic defocus and occlusion compensation of projected imagery by model-based optimal projector selection in multi-projection environment,” Virtual Real. 15(2-3), 119–132 (2011).

[Crossref]

L. Ekstrand and S. Zhang, “Three-dimensional profilometry with nearly focused binary phase-shifting algorithms,” Opt. Lett. 36(23), 4518 (2011).

[Crossref]

Y. Wang and S. Zhang, “Superfast multifrequency phase-shifting technique with optimal pulse width modulation,” Opt. Express 19(6), 5149–5155 (2011).

[Crossref]

G. A. Ayubi, J. A. Ayubi, M. J. Di, and J. A. Ferrari, “Pulse-width modulation in defocused three-dimensional fringe projection,” Opt. Lett. 35(21), 3682–3684 (2010).

[Crossref]

Y. Gong and S. Zhang, “Ultrafast 3-d shape measurement with an off-the-shelf dlp projector,” Opt. Express 18(19), 19743–19754 (2010).

[Crossref]

S. S. Gorthi and P. Rastogi, “Fringe projection techniques: Whither we are?” Opt. & Lasers Eng. 48(2), 133–140 (2010).

[Crossref]

X. Su and Q. Zhang, “Dynamic 3-d shape measurement method: A review,” Opt. & Lasers Eng. 48(2), 191–204 (2010).

[Crossref]

V. P. Namboodiri and S. Chaudhuri, “On defocus, diffusion and depth estimation,” Pattern Recognit. Lett. 28(3), 311–319 (2007).

[Crossref]

X. Su, W. Zhou, B. G. Von, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a ronchi grating,” Opt. Commun. 94(6), 561–573 (1992).

[Crossref]

D. Malacara and F. Roddier, “Optical shop testing,” Appl. Opt. 97, 454–464 (1978).

[Crossref]

A. Silva, J. L. Flores, A. M. noz, G. A. Ayubi, and J. A. Ferrari, “Three-dimensional shape profiling by out-of-focus projection of colored pulse width modulation fringe patterns,” Appl. Opt. 56(18), 5198–5203 (2017).

[Crossref]

G. A. Ayubi, J. A. Ayubi, M. J. Di, and J. A. Ferrari, “Pulse-width modulation in defocused three-dimensional fringe projection,” Opt. Lett. 35(21), 3682–3684 (2010).

[Crossref]

V. P. Namboodiri and S. Chaudhuri, “On defocus, diffusion and depth estimation,” Pattern Recognit. Lett. 28(3), 311–319 (2007).

[Crossref]

C. Zuo, H. Li, M. Zhang, Q. Chen, S. Feng, T. Tao, and Y. Hu, “Robust and efficient multi-frequency temporal phase unwrapping: optimal fringe frequency and pattern sequence selection,” Opt. Express 25(17), 20381–20400 (2017).

[Crossref]

C. Zuo, Q. Chen, S. Feng, F. Feng, G. Gu, and X. Sui, “Optimized pulse width modulation pattern strategy for three-dimensional profilometry with projector defocusing,” Appl. Opt. 51(19), 4477–4490 (2012).

[Crossref]

C. Zuo, H. Li, M. Zhang, Q. Chen, S. Feng, T. Tao, and Y. Hu, “Robust and efficient multi-frequency temporal phase unwrapping: optimal fringe frequency and pattern sequence selection,” Opt. Express 25(17), 20381–20400 (2017).

[Crossref]

C. Zuo, Q. Chen, S. Feng, F. Feng, G. Gu, and X. Sui, “Optimized pulse width modulation pattern strategy for three-dimensional profilometry with projector defocusing,” Appl. Opt. 51(19), 4477–4490 (2012).

[Crossref]

A. Silva, J. L. Flores, A. M. noz, G. A. Ayubi, and J. A. Ferrari, “Three-dimensional shape profiling by out-of-focus projection of colored pulse width modulation fringe patterns,” Appl. Opt. 56(18), 5198–5203 (2017).

[Crossref]

G. A. Ayubi, J. A. Ayubi, M. J. Di, and J. A. Ferrari, “Pulse-width modulation in defocused three-dimensional fringe projection,” Opt. Lett. 35(21), 3682–3684 (2010).

[Crossref]

H. Fujita, K. Yamatan, M. Yamamoto, Y. Otani, A. Suguro, S. Morokawa, and T. Yoshizawa, “Three-dimensional profilometry using liquid crystal grating,” Proc. SPIE - The Int. Soc. for Opt. Eng. pp. 51–60 (2003).

S. S. Gorthi and P. Rastogi, “Fringe projection techniques: Whither we are?” Opt. & Lasers Eng. 48(2), 133–140 (2010).

[Crossref]

M. Nagase, D. Iwai, and K. Sato, “Dynamic defocus and occlusion compensation of projected imagery by model-based optimal projector selection in multi-projection environment,” Virtual Real. 15(2-3), 119–132 (2011).

[Crossref]

B. Li and S. Zhang, “Microscopic structured light 3d profilometry: Binary defocusing technique vs. sinusoidal fringe projection,” Opt. & Lasers Eng. 96, 117–123 (2017).

[Crossref]

W. Lohry and S. Zhang, “3d shape measurement with 2d area modulated binary patterns,” Opt. & Lasers Eng. 50(7), 917–921 (2012).

[Crossref]

D. Malacara and F. Roddier, “Optical shop testing,” Appl. Opt. 97, 454–464 (1978).

[Crossref]

H. Fujita, K. Yamatan, M. Yamamoto, Y. Otani, A. Suguro, S. Morokawa, and T. Yoshizawa, “Three-dimensional profilometry using liquid crystal grating,” Proc. SPIE - The Int. Soc. for Opt. Eng. pp. 51–60 (2003).

M. Nagase, D. Iwai, and K. Sato, “Dynamic defocus and occlusion compensation of projected imagery by model-based optimal projector selection in multi-projection environment,” Virtual Real. 15(2-3), 119–132 (2011).

[Crossref]

V. P. Namboodiri and S. Chaudhuri, “On defocus, diffusion and depth estimation,” Pattern Recognit. Lett. 28(3), 311–319 (2007).

[Crossref]

H. Fujita, K. Yamatan, M. Yamamoto, Y. Otani, A. Suguro, S. Morokawa, and T. Yoshizawa, “Three-dimensional profilometry using liquid crystal grating,” Proc. SPIE - The Int. Soc. for Opt. Eng. pp. 51–60 (2003).

D. Zheng, F. Da, K. Qian, and H. S. Seah, “Phase error analysis and compensation for phase shifting profilometry with projector defocusing,” Appl. Opt. 55(21), 5721 (2016).

[Crossref]

B. Pan, K. Qian, L. Huang, and A. Anand, “Phase error analysis and compensation for nonsinusoidal waveforms in phase-shifting digital fringe projection profilometry,” Opt. Lett. 34(4), 416–428 (2009).

[Crossref]

S. S. Gorthi and P. Rastogi, “Fringe projection techniques: Whither we are?” Opt. & Lasers Eng. 48(2), 133–140 (2010).

[Crossref]

D. Malacara and F. Roddier, “Optical shop testing,” Appl. Opt. 97, 454–464 (1978).

[Crossref]

M. Nagase, D. Iwai, and K. Sato, “Dynamic defocus and occlusion compensation of projected imagery by model-based optimal projector selection in multi-projection environment,” Virtual Real. 15(2-3), 119–132 (2011).

[Crossref]

X. Su and Q. Zhang, “Dynamic 3-d shape measurement method: A review,” Opt. & Lasers Eng. 48(2), 191–204 (2010).

[Crossref]

T. Xian and X. Su, “Area modulation grating for sinusoidal structure illumination on phase-measuring profilometry,” Appl. Opt. 40(8), 1201–1206 (2001).

[Crossref]

X. Su, W. Zhou, B. G. Von, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a ronchi grating,” Opt. Commun. 94(6), 561–573 (1992).

[Crossref]

H. Fujita, K. Yamatan, M. Yamamoto, Y. Otani, A. Suguro, S. Morokawa, and T. Yoshizawa, “Three-dimensional profilometry using liquid crystal grating,” Proc. SPIE - The Int. Soc. for Opt. Eng. pp. 51–60 (2003).

X. Su, W. Zhou, B. G. Von, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a ronchi grating,” Opt. Commun. 94(6), 561–573 (1992).

[Crossref]

X. Su, W. Zhou, B. G. Von, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a ronchi grating,” Opt. Commun. 94(6), 561–573 (1992).

[Crossref]

Y. Wang, H. Zhao, H. Jiang, and X. Li, “Defocusing parameter selection strategies based on psf measurement for square-binary defocusing fringe projection profilometry,” Opt. Express 26(16), 20351–20367 (2018).

[Crossref]

Y. Wang and S. Zhang, “Three-dimensional shape measurement with binary dithered patterns,” Appl. Opt. 51(27), 6631–6636 (2012).

[Crossref]

Y. Wang and S. Zhang, “Superfast multifrequency phase-shifting technique with optimal pulse width modulation,” Opt. Express 19(6), 5149–5155 (2011).

[Crossref]

H. Fujita, K. Yamatan, M. Yamamoto, Y. Otani, A. Suguro, S. Morokawa, and T. Yoshizawa, “Three-dimensional profilometry using liquid crystal grating,” Proc. SPIE - The Int. Soc. for Opt. Eng. pp. 51–60 (2003).

H. Fujita, K. Yamatan, M. Yamamoto, Y. Otani, A. Suguro, S. Morokawa, and T. Yoshizawa, “Three-dimensional profilometry using liquid crystal grating,” Proc. SPIE - The Int. Soc. for Opt. Eng. pp. 51–60 (2003).

H. Fujita, K. Yamatan, M. Yamamoto, Y. Otani, A. Suguro, S. Morokawa, and T. Yoshizawa, “Three-dimensional profilometry using liquid crystal grating,” Proc. SPIE - The Int. Soc. for Opt. Eng. pp. 51–60 (2003).

X. Su and Q. Zhang, “Dynamic 3-d shape measurement method: A review,” Opt. & Lasers Eng. 48(2), 191–204 (2010).

[Crossref]

S. Zhang, “High-speed 3d shape measurement with structured light methods: A review,” Opt. & Lasers Eng. 106, 119–131 (2018).

[Crossref]

B. Li and S. Zhang, “Microscopic structured light 3d profilometry: Binary defocusing technique vs. sinusoidal fringe projection,” Opt. & Lasers Eng. 96, 117–123 (2017).

[Crossref]

L. William and S. Zhang, “Genetic method to optimize binary dithering technique for high-quality fringe generation,” Opt. Lett. 38(4), 540 (2013).

[Crossref]

Y. Wang and S. Zhang, “Three-dimensional shape measurement with binary dithered patterns,” Appl. Opt. 51(27), 6631–6636 (2012).

[Crossref]

W. Lohry and S. Zhang, “3d shape measurement with 2d area modulated binary patterns,” Opt. & Lasers Eng. 50(7), 917–921 (2012).

[Crossref]

Y. Wang and S. Zhang, “Superfast multifrequency phase-shifting technique with optimal pulse width modulation,” Opt. Express 19(6), 5149–5155 (2011).

[Crossref]

L. Ekstrand and S. Zhang, “Three-dimensional profilometry with nearly focused binary phase-shifting algorithms,” Opt. Lett. 36(23), 4518 (2011).

[Crossref]

Y. Gong and S. Zhang, “Ultrafast 3-d shape measurement with an off-the-shelf dlp projector,” Opt. Express 18(19), 19743–19754 (2010).

[Crossref]

S. Lei and S. Zhang, “Flexible 3-d shape measurement using projector defocusing,” Opt. Lett. 34(20), 3080–3082 (2009).

[Crossref]

X. Su, W. Zhou, B. G. Von, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a ronchi grating,” Opt. Commun. 94(6), 561–573 (1992).

[Crossref]

C. Zuo, H. Li, M. Zhang, Q. Chen, S. Feng, T. Tao, and Y. Hu, “Robust and efficient multi-frequency temporal phase unwrapping: optimal fringe frequency and pattern sequence selection,” Opt. Express 25(17), 20381–20400 (2017).

[Crossref]

C. Zuo, Q. Chen, S. Feng, F. Feng, G. Gu, and X. Sui, “Optimized pulse width modulation pattern strategy for three-dimensional profilometry with projector defocusing,” Appl. Opt. 51(19), 4477–4490 (2012).

[Crossref]

D. Malacara and F. Roddier, “Optical shop testing,” Appl. Opt. 97, 454–464 (1978).

[Crossref]

T. Xian and X. Su, “Area modulation grating for sinusoidal structure illumination on phase-measuring profilometry,” Appl. Opt. 40(8), 1201–1206 (2001).

[Crossref]

Y. Xiao, Y. Cao, and Y. Wu, “Improved algorithm for phase-to-height mapping in phase measuring profilometry,” Appl. Opt. 51(8), 1149 (2012).

[Crossref]

C. Zuo, Q. Chen, S. Feng, F. Feng, G. Gu, and X. Sui, “Optimized pulse width modulation pattern strategy for three-dimensional profilometry with projector defocusing,” Appl. Opt. 51(19), 4477–4490 (2012).

[Crossref]

Y. Wang and S. Zhang, “Three-dimensional shape measurement with binary dithered patterns,” Appl. Opt. 51(27), 6631–6636 (2012).

[Crossref]

D. Zheng, F. Da, K. Qian, and H. S. Seah, “Phase error analysis and compensation for phase shifting profilometry with projector defocusing,” Appl. Opt. 55(21), 5721 (2016).

[Crossref]

A. Silva, J. L. Flores, A. M. noz, G. A. Ayubi, and J. A. Ferrari, “Three-dimensional shape profiling by out-of-focus projection of colored pulse width modulation fringe patterns,” Appl. Opt. 56(18), 5198–5203 (2017).

[Crossref]

A. Kamagara, S. Li, and X. Wang, “Optimal defocus selection based on normed fourier transform for digital fringe pattern profilometry,” Appl. Opt. 56(28), 8014–8022 (2017).

[Crossref]

W. Lohry and S. Zhang, “3d shape measurement with 2d area modulated binary patterns,” Opt. & Lasers Eng. 50(7), 917–921 (2012).

[Crossref]

S. S. Gorthi and P. Rastogi, “Fringe projection techniques: Whither we are?” Opt. & Lasers Eng. 48(2), 133–140 (2010).

[Crossref]

X. Su and Q. Zhang, “Dynamic 3-d shape measurement method: A review,” Opt. & Lasers Eng. 48(2), 191–204 (2010).

[Crossref]

S. Zhang, “High-speed 3d shape measurement with structured light methods: A review,” Opt. & Lasers Eng. 106, 119–131 (2018).

[Crossref]

B. Li and S. Zhang, “Microscopic structured light 3d profilometry: Binary defocusing technique vs. sinusoidal fringe projection,” Opt. & Lasers Eng. 96, 117–123 (2017).

[Crossref]

X. Su, W. Zhou, B. G. Von, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a ronchi grating,” Opt. Commun. 94(6), 561–573 (1992).

[Crossref]

Y. Gong and S. Zhang, “Ultrafast 3-d shape measurement with an off-the-shelf dlp projector,” Opt. Express 18(19), 19743–19754 (2010).

[Crossref]

Y. Wang and S. Zhang, “Superfast multifrequency phase-shifting technique with optimal pulse width modulation,” Opt. Express 19(6), 5149–5155 (2011).

[Crossref]

Y. Wang, H. Zhao, H. Jiang, and X. Li, “Defocusing parameter selection strategies based on psf measurement for square-binary defocusing fringe projection profilometry,” Opt. Express 26(16), 20351–20367 (2018).

[Crossref]

C. Zuo, H. Li, M. Zhang, Q. Chen, S. Feng, T. Tao, and Y. Hu, “Robust and efficient multi-frequency temporal phase unwrapping: optimal fringe frequency and pattern sequence selection,” Opt. Express 25(17), 20381–20400 (2017).

[Crossref]

L. Ekstrand and S. Zhang, “Three-dimensional profilometry with nearly focused binary phase-shifting algorithms,” Opt. Lett. 36(23), 4518 (2011).

[Crossref]

G. A. Ayubi, J. A. Ayubi, M. J. Di, and J. A. Ferrari, “Pulse-width modulation in defocused three-dimensional fringe projection,” Opt. Lett. 35(21), 3682–3684 (2010).

[Crossref]

L. William and S. Zhang, “Genetic method to optimize binary dithering technique for high-quality fringe generation,” Opt. Lett. 38(4), 540 (2013).

[Crossref]

B. Pan, K. Qian, L. Huang, and A. Anand, “Phase error analysis and compensation for nonsinusoidal waveforms in phase-shifting digital fringe projection profilometry,” Opt. Lett. 34(4), 416–428 (2009).

[Crossref]

S. Lei and S. Zhang, “Flexible 3-d shape measurement using projector defocusing,” Opt. Lett. 34(20), 3080–3082 (2009).

[Crossref]

V. P. Namboodiri and S. Chaudhuri, “On defocus, diffusion and depth estimation,” Pattern Recognit. Lett. 28(3), 311–319 (2007).

[Crossref]

M. Nagase, D. Iwai, and K. Sato, “Dynamic defocus and occlusion compensation of projected imagery by model-based optimal projector selection in multi-projection environment,” Virtual Real. 15(2-3), 119–132 (2011).

[Crossref]

H. Fujita, K. Yamatan, M. Yamamoto, Y. Otani, A. Suguro, S. Morokawa, and T. Yoshizawa, “Three-dimensional profilometry using liquid crystal grating,” Proc. SPIE - The Int. Soc. for Opt. Eng. pp. 51–60 (2003).