Abstract

We present a systematic study, where effects of the illumination probe design on ptychography reconstruction quality are evaluated under well-controlled conditions. The illumination probe was created using Fresnel zone-plate (FZP) optics with locally displaced zones to provide a fine control over perturbations of the illumination wavefront. We show that optimally designed wavefront modulations not only reduce bias and variance in the reconstruction of the lowest spatial frequencies but also lead to improved imaging resolution and reduction of artefacts compared to a conventional FZP. Both these factors are important for quantitative accuracy and resolution of ptychographic tomography. Our work furthers the understanding of the important characteristics of an optimal illumination for high-resolution X-ray ptychography and how to design optimal FZP wavefront modulations for different applications of ptychographic imaging. These findings are applicable and relevant for ptychography using optical, EUV, and X-ray photons as well as electrons.

© 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

Full Article  |  PDF Article
OSA Recommended Articles
Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging

Joan Vila-Comamala, Ana Diaz, Manuel Guizar-Sicairos, Alexandre Mantion, Cameron M. Kewish, Andreas Menzel, Oliver Bunk, and Christian David
Opt. Express 19(22) 21333-21344 (2011)

X-ray ptychography using a distant analyzer

Esther H. R. Tsai, Ana Diaz, Andreas Menzel, and Manuel Guizar-Sicairos
Opt. Express 24(6) 6441-6450 (2016)

Near-field Fourier ptychography: super-resolution phase retrieval via speckle illumination

He Zhang, Shaowei Jiang, Jun Liao, Junjing Deng, Jian Liu, Yongbing Zhang, and Guoan Zheng
Opt. Express 27(5) 7498-7512 (2019)

References

  • View by:
  • |
  • |
  • |

  1. J. M. Rodenburg and H. M. Faulkner, “A phase retrieval algorithm for shifting illumination,” Appl. Phys. Lett 85, 4795–4797 (2004).
    [Crossref]
  2. P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning X-ray diffraction microscopy,” Science 321, 379–382 (2008).
    [Crossref] [PubMed]
  3. M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
    [Crossref] [PubMed]
  4. M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
    [Crossref] [PubMed]
  5. M. Holler, M. Guizar-Sicairos, E. H. Tsai, R. Dinapoli, E. Müller, O. Bunk, J. Raabe, and G. Aeppli, “High-resolution non-destructive three-dimensional imaging of integrated circuits,” Nature 543, 402–406 (2017).
    [Crossref] [PubMed]
  6. F. Pfeiffer, “X-ray ptychography,” Nat. Photonics 12, 9–17 (2018).
    [Crossref]
  7. M. D. Seaberg, B. Zhang, D. F. Gardner, E. R. Shanblatt, M. M. Murnane, H. C. Kapteyn, and D. E. Adams, “Tabletop nanometer extreme ultraviolet imaging in an extended reflection mode using coherent fresnel ptychography,” Optica 1, 39–44 (2014).
    [Crossref]
  8. D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, D. E. Adams, H. C. Kapteyn, M. M. Murnane, and G. F. Mancini, “Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source,” Nat. Photonics 11, 259 (2017).
    [Crossref]
  9. A. M. Maiden and J. M. Rodenburg, “An improved ptychographical phase retrieval algorithm for diffractive imaging,” Ultramicroscopy 109, 1256–1262 (2009).
    [Crossref] [PubMed]
  10. A. M. Maiden, J. M. Rodenburg, and M. J. Humphry, “Optical ptychography: a practical implementation with useful resolution,” Opt. Lett. 35, 2585–2587 (2010).
    [Crossref] [PubMed]
  11. A. M. Maiden, M. J. Humphry, F. Zhang, and J. M. Rodenburg, “Superresolution imaging via ptychography,” JOSA A 28, 604–612 (2011).
    [Crossref] [PubMed]
  12. S. Gao, P. Wang, F. Zhang, G. T. Martinez, P. D. Nellist, X. Pan, and A. I. Kirkland, “Electron ptychographic microscopy for three-dimensional imaging,” Nat. Commun. 8, 163 (2017).
    [Crossref] [PubMed]
  13. Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller, “Electron ptychography of 2D materials to deep sub-ångström resolution,” Nature 559, 343 (2018).
    [Crossref] [PubMed]
  14. M. Humphry, B. Kraus, A. Hurst, A. Maiden, and J. Rodenburg, “Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging,” Nat. Commun. 3, 730 (2012).
    [Crossref] [PubMed]
  15. K. Giewekemeyer, P. Thibault, S. Kalbfleisch, A. Beerlink, C. M. Kewish, M. Dierolf, F. Pfeiffer, and T. Salditt, “Quantitative biological imaging by ptychographic X-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U. S. A. 107, 529–534 (2010).
    [Crossref]
  16. M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
    [Crossref]
  17. C. T. Putkunz, J. N. Clark, D. J. Vine, G. J. Williams, M. A. Pfeifer, E. Balaur, I. McNulty, K. A. Nugent, and A. G. Peele, “Phase-diverse coherent diffractive imaging: High sensitivity with low dose,” Phys. Rev. Lett. f106, 013903 (2011).
    [Crossref]
  18. D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
    [Crossref]
  19. M. Guizar-Sicairos and J. R. Fienup, “Phase retrieval with transverse translation diversity: a nonlinear optimization approach,” Opt. Express 16, 7264–7278 (2008).
    [Crossref] [PubMed]
  20. P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
    [Crossref] [PubMed]
  21. M. Odstrčil, P. Baksh, S. Boden, R. Card, J. Chad, J. Frey, and W. Brocklesby, “Ptychographic coherent diffractive imaging with orthogonal probe relaxation,” Opt. Express 24, 8360–8369 (2016).
    [Crossref]
  22. M. Odstrčil, A. Menzel, and M. Guizar-Sicairos, “Iterative least-squares solver for generalized maximum-likelihood ptychography,” Opt. Express 26, 3108–3123 (2018).
    [Crossref]
  23. A. Maiden, M. Humphry, M. Sarahan, B. Kraus, and J. Rodenburg, “An annealing algorithm to correct positioning errors in ptychography,” Ultramicroscopy 120, 64–72 (2012).
    [Crossref] [PubMed]
  24. F. Zhang, I. Peterson, J. Vila-Comamala, A. Diaz, F. Berenguer, R. Bean, B. Chen, A. Menzel, I. K. Robinson, and J. M. Rodenburg, “Translation position determination in ptychographic coherent diffraction imaging,” Opt. Express 21, 13592–13606 (2013).
    [Crossref] [PubMed]
  25. J. Sun, Q. Chen, Y. Zhang, and C. Zuo, “Efficient positional misalignment correction method for Fourier ptychographic microscopy,” Biomed. Opt. 7, 1336–1350 (2016).
    [Crossref]
  26. P. Thibault and A. Menzel, “Reconstructing state mixtures from diffraction measurements,” Nature 494, 68–71 (2013).
    [Crossref] [PubMed]
  27. D. J. Batey, D. Claus, and J. M. Rodenburg, “Information multiplexing in ptychography,” Ultramicroscopy 138, 13–21 (2014).
    [Crossref] [PubMed]
  28. R. Karl, C. Bevis, R. Lopez-Rios, J. Reichanadter, D. Gardner, C. Porter, E. Shanblatt, M. Tanksalvala, G. F. Mancini, M. Murnane, H. Kapteyn, and D. Adams, “Spatial, spectral, and polarization multiplexed ptychography,” Opt. Express 23, 30250–30258 (2015).
    [Crossref] [PubMed]
  29. P. Thibault and M. Guizar-Sicairos, “Maximum-likelihood refinement for coherent diffractive imaging,” New J. Phys. 14, 063004 (2012).
    [Crossref]
  30. A. M. Maiden, M. J. Humphry, and J. M. Rodenburg, “Ptychographic transmission microscopy in three dimensions using a multi-slice approach,” J. Opt. Soc. Am. A 29, 1606–1614 (2012).
    [Crossref]
  31. E. H. Tsai, I. Usov, A. Diaz, A. Menzel, and M. Guizar-Sicairos, “X-ray ptychography with extended depth of field,” Opt. Express 24, 29089–29108 (2016).
    [Crossref] [PubMed]
  32. C. M. Kewish, M. Guizar-Sicairos, C. Liu, J. Qian, B. Shi, C. Benson, A. M. Khounsary, J. Vila-Comamala, O. Bunk, J. R. Fienup, A. T. Macrander, and L. Assoufid, “Reconstruction of an astigmatic hard X-ray beam and alignment of KB mirrors from ptychographic coherent diffraction data,” Opt. Express 18, 23420–23427 (2010).
    [Crossref] [PubMed]
  33. J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
    [Crossref] [PubMed]
  34. A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
    [Crossref]
  35. S. Hönig, R. Hoppe, J. Patommel, A. Schropp, S. Stephan, S. Schöder, M. Burghammer, and C. G. Schroer, “Full optical characterization of coherent x-ray nanobeams by ptychographic imaging,” Opt. Express 19, 16324–16329 (2011).
    [Crossref] [PubMed]
  36. X. Huang, M. Wojcik, N. Burdet, I. Peterson, G. R. Morrison, D. J. Vine, D. Legnini, R. Harder, Y. S. Chu, and I. K. Robinson, “Quantitative X-ray wavefront measurements of fresnel zone plate and KB mirrors using phase retrieval,” Opt. Express 20, 24038–24048 (2012).
    [Crossref] [PubMed]
  37. A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
    [Crossref]
  38. X. Huang, H. Yan, E. Nazaretski, R. Conley, N. Bouet, J. Zhou, K. Lauer, L. Li, D. Eom, D. Legnini, R. Harder, I. K. Robinson, and Y. S. Chu, “11 nm hard X-ray focus from a large-aperture multilayer Laue lens,” Sci. Rep. 3, 3562 (2013).
    [Crossref] [PubMed]
  39. J. Deng, D. J. Vine, S. Chen, Y. S. Nashed, Q. Jin, N. W. Phillips, T. Peterka, R. Ross, S. Vogt, and C. J. Jacobsen, “Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae,” Proc. Natl. Acad. Sci. U. S. A. 112, 2314–2319 (2015).
  40. J. Deng, D. J. Vine, S. Chen, Q. Jin, Y. S. Nashed, T. Peterka, S. Vogt, and C. Jacobsen, “X-ray ptychographic and fluorescence microscopy of frozen-hydrated cells using continuous scanning,” Sci. Rep. 7, 445 (2017).
    [Crossref] [PubMed]
  41. J. Deng, Y. H. Lo, M. Gallagher-Jones, S. Chen, A. Pryor, Q. Jin, Y. P. Hong, Y. S. Nashed, S. Vogt, J. Miao, and C. Jacobsen, “Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae,” Sci. Adv. 4, eaau4548 (2018).
    [Crossref] [PubMed]
  42. F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
    [Crossref] [PubMed]
  43. P. Li, T. B. Edo, and J. M. Rodenburg, “Ptychographic inversion via wigner distribution deconvolution: Noise suppression and probe design,” Ultramicroscopy 147, 106–113 (2014).
    [Crossref] [PubMed]
  44. J. C. da Silva and A. Menzel, “Elementary signals in ptychography,” Opt. Express 23, 33812–33821 (2015).
    [Crossref]
  45. S. Marchesini, Y.-C. Tu, and H. Wu, “Alternating projection, ptychographic imaging and phase synchronization,” Appl. Comput. Harmon. Analysis 41, 815–851 (2015).
  46. S. Marchesini and A. Sakdinawat, “Shaping coherent x-rays with binary optics,” Opt. Express 27, 907–917 (2019).
    [Crossref] [PubMed]
  47. M. Guizar-Sicairos, M. Holler, A. Diaz, J. Vila-Comamala, O. Bunk, and A. Menzel, “Role of the illumination spatial-frequency spectrum for ptychography,” Phys. Rev. B 86, 100103 (2012).
    [Crossref]
  48. A. Maiden, G. Morrison, B. Kaulich, A. Gianoncelli, and J. Rodenburg, “Soft X-ray spectromicroscopy using ptychography with randomly phased illumination,” Nat. Commun. 4, 1669 (2013).
    [Crossref] [PubMed]
  49. M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
    [Crossref] [PubMed]
  50. P. Li, D. J. Batey, T. B. Edo, A. D. Parsons, C. Rau, and J. M. Rodenburg, “Multiple mode X-ray ptychography using a lens and a fixed diffuser optic,” J. Opt. 18, 054008 (2016).
    [Crossref]
  51. G. Morrison, F. Zhang, A. Gianoncelli, and I. Robinson, “X-ray ptychography using randomized zone plates,” Opt. Express 26, 14915–14927 (2018).
    [Crossref] [PubMed]
  52. V. Guzenko, J. Romijn, J. Vila-Comamala, S. Gorelick, and C. David, “Efficient e-beam lithography exposure strategies for diffractive X-ray optics,” in AIP Conference Proceedings (AIP, 2011), pp. 92–95.
    [Crossref]
  53. S. Gorelick, V. A. Guzenko, J. Vila-Comamala, and C. David, “Direct e-beam writing of dense and high aspect ratio nanostructures in thick layers of pmma for electroplating,” Nanotechnology 21, 295303 (2010).
    [Crossref] [PubMed]
  54. M. Guizar-Sicairos, I. Johnson, A. Diaz, M. Holler, P. Karvinen, H.-C. Stadler, R. Dinapoli, O. Bunk, and A. Menzel, “High-throughput ptychography using Eiger: scanning X-ray nano-imaging of extended regions,” Opt. Express 22, 14859–14870 (2014).
    [Crossref] [PubMed]
  55. C. Jacobsen, J. Deng, and Y. Nashed, “Strategies for high-throughput focused-beam ptychography,” J. Synchrotron Radiat. 24, 1078–1081 (2017).
    [Crossref] [PubMed]
  56. D. Vine, D. Pelliccia, C. Holzner, S. B. Baines, A. Berry, I. McNulty, S. Vogt, A. G. Peele, and K. A. Nugent, “Simultaneous X-ray fluorescence and ptychographic microscopy of cyclotella meneghiniana,” Opt. Express 20, 18287–18296 (2012).
    [Crossref] [PubMed]
  57. A. Diaz, P. Trtik, M. Guizar-Sicairos, A. Menzel, P. Thibault, and O. Bunk, “Quantitative X-ray phase nanotomography,” Phys. Rev. B 85, 020104 (2012).
    [Crossref]
  58. T. Godden, A. Muñiz-Piniella, J. Claverley, A. Yacoot, and M. Humphry, “Phase calibration target for quantitative phase imaging with ptychography,” Opt. Express 24, 7679–7692 (2016).
    [Crossref] [PubMed]
  59. X. Huang, H. Yan, R. Harder, Y. Hwu, I. K. Robinson, and Y. S. Chu, “Optimization of overlap uniformness for ptychography,” Opt. Express 22, 12634–12644 (2014).
    [Crossref] [PubMed]
  60. O. Bunk, M. Dierolf, S. Kynde, I. Johnson, O. Marti, and F. Pfeiffer, “Influence of the overlap parameter on the convergence of the ptychographical iterative engine,” Ultramicroscopy 108, 481–487 (2008).
    [Crossref]
  61. M. Odstrcil and M. Holler, “X-ray dataset for Illumination improvements for high-resolution ptychography,” http://dx.doi.org/10.5281/zenodo.2639759 (2019).
  62. R. M. Goldstein, H. A. Zebker, and C. L. Werner, “Satellite radar interferometry: Two-dimensional phase unwrapping,” Radio Science 23, 713–720 (1988).
    [Crossref]
  63. J. Elam, D. Routkevitch, P. Mardilovich, and S. George, “Conformal coating on ultrahigh-aspect-ratio nanopores of anodic alumina by atomic layer deposition,” Chem. Mater 15, 3507–3517 (2003).
    [Crossref]
  64. M. Van Heel and M. Schatz, “Fourier shell correlation threshold criteria,” J. Struct. Biol. 151, 250–262 (2005).
    [Crossref] [PubMed]
  65. R. Cerbino, L. Peverini, M. Potenza, A. Robert, P. Bösecke, and M. Giglio, “X-ray-scattering information obtained from near-field speckle,” Nat. Phys. 4, 238–243 (2008).
    [Crossref]
  66. R. M. Clare, M. Stockmar, M. Dierolf, I. Zanette, and F. Pfeiffer, “Characterization of near-field ptychography,” Opt. Express 23, 19728–19742 (2015).
    [Crossref] [PubMed]
  67. M. Odstrčil, M. Lebugle, T. Lachat, J. Raabe, and M. Holler, “Fast positioning for X-ray scanning microscopy by a combined motion of sample and beam defining optics,” J. Synchrotron Radiat. 26, 504–509 (2019).
    [Crossref]
  68. D. A. Shapiro, R. Celestre, P. Denes, M. Farmand, J. Joseph, A. Kilcoyne, S. Marchesini, H. Padmore, S. V. Venkatakrishnan, T. Warwick, and Y.-S. Yu, “Ptychographic Imaging of Nano-Materials at the Advanced Light Source with the Nanosurveyor Instrument,” J. Phys.: Conf. Ser.849, 012028 (2017).
    [Crossref]
  69. T. Edo, D. Batey, A. Maiden, C. Rau, U. Wagner, Z. Pešić, T. Waigh, and J. Rodenburg, “Sampling in x-ray ptychography,” Phys. Rev. A 87, 053850 (2013).
    [Crossref]
  70. I. Mohacsi, I. Vartiainen, M. Guizar-Sicairos, P. Karvinen, V. A. Guzenko, E. Müller, E. Färm, M. Ritala, C. M. Kewish, A. Somogyi, and C. David, “High resolution double-sided diffractive optics for hard X-ray microscopy,” Opt. Express 23, 776–786 (2015).
    [Crossref] [PubMed]
  71. I. Mohacsi, I. Vartiainen, B. Rösner, M. Guizar-Sicairos, V. A. Guzenko, I. McNulty, R. Winarski, M. V. Holt, and C. David, “Interlaced zone plate optics for hard X-ray imaging in the 10 nm range,” Sci. Rep. 7, 43624 (2017).
    [Crossref]
  72. M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius, and K. Urban, “Electron microscopy image enhanced,” Nature 392, 768–769 (1998).
    [Crossref]
  73. P. Batson, N. Dellby, and O. Krivanek, “Sub-ångstrom resolution using aberration corrected electron optics,” Nature 418, 617–620 (2002).
    [Crossref] [PubMed]
  74. J. Verbeeck, A. Béché, K. Müller-Caspary, G. Guzzinati, M. A. Luong, and M. Den Hertog, “Demonstration of a 2× 2 programmable phase plate for electrons,” Ultramicroscopy 190, 58–65 (2018).
    [Crossref] [PubMed]
  75. J. Verbeeck, H. Tian, and P. Schattschneider, “Production and application of electron vortex beams,” Nature 467, 301 (2010).
    [Crossref] [PubMed]
  76. T. R. Harvey, J. S. Pierce, A. K. Agrawal, P. Ercius, M. Linck, and B. J. McMorran, “Efficient diffractive phase optics for electrons,” New J. Phys. 16, 093039 (2014).
    [Crossref]
  77. G. Zheng, R. Horstmeyer, and C. Yang, “Wide-field, high-resolution Fourier ptychographic microscopy,” Nat. Photon. 7, 739–745 (2013).
    [Crossref]
  78. K. Wakonig, A. Diaz, A. Bonnin, M. Stampanoni, A. Bergamaschi, J. Ihli, M. Guizar-Sicairos, and A. Menzel, “X-ray Fourier ptychography,” Sci. Adv 5, 0282 (2019).
    [Crossref]

2019 (3)

S. Marchesini and A. Sakdinawat, “Shaping coherent x-rays with binary optics,” Opt. Express 27, 907–917 (2019).
[Crossref] [PubMed]

M. Odstrčil, M. Lebugle, T. Lachat, J. Raabe, and M. Holler, “Fast positioning for X-ray scanning microscopy by a combined motion of sample and beam defining optics,” J. Synchrotron Radiat. 26, 504–509 (2019).
[Crossref]

K. Wakonig, A. Diaz, A. Bonnin, M. Stampanoni, A. Bergamaschi, J. Ihli, M. Guizar-Sicairos, and A. Menzel, “X-ray Fourier ptychography,” Sci. Adv 5, 0282 (2019).
[Crossref]

2018 (6)

J. Verbeeck, A. Béché, K. Müller-Caspary, G. Guzzinati, M. A. Luong, and M. Den Hertog, “Demonstration of a 2× 2 programmable phase plate for electrons,” Ultramicroscopy 190, 58–65 (2018).
[Crossref] [PubMed]

G. Morrison, F. Zhang, A. Gianoncelli, and I. Robinson, “X-ray ptychography using randomized zone plates,” Opt. Express 26, 14915–14927 (2018).
[Crossref] [PubMed]

J. Deng, Y. H. Lo, M. Gallagher-Jones, S. Chen, A. Pryor, Q. Jin, Y. P. Hong, Y. S. Nashed, S. Vogt, J. Miao, and C. Jacobsen, “Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae,” Sci. Adv. 4, eaau4548 (2018).
[Crossref] [PubMed]

F. Pfeiffer, “X-ray ptychography,” Nat. Photonics 12, 9–17 (2018).
[Crossref]

Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller, “Electron ptychography of 2D materials to deep sub-ångström resolution,” Nature 559, 343 (2018).
[Crossref] [PubMed]

M. Odstrčil, A. Menzel, and M. Guizar-Sicairos, “Iterative least-squares solver for generalized maximum-likelihood ptychography,” Opt. Express 26, 3108–3123 (2018).
[Crossref]

2017 (7)

M. Holler, M. Guizar-Sicairos, E. H. Tsai, R. Dinapoli, E. Müller, O. Bunk, J. Raabe, and G. Aeppli, “High-resolution non-destructive three-dimensional imaging of integrated circuits,” Nature 543, 402–406 (2017).
[Crossref] [PubMed]

S. Gao, P. Wang, F. Zhang, G. T. Martinez, P. D. Nellist, X. Pan, and A. I. Kirkland, “Electron ptychographic microscopy for three-dimensional imaging,” Nat. Commun. 8, 163 (2017).
[Crossref] [PubMed]

D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, D. E. Adams, H. C. Kapteyn, M. M. Murnane, and G. F. Mancini, “Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source,” Nat. Photonics 11, 259 (2017).
[Crossref]

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

J. Deng, D. J. Vine, S. Chen, Q. Jin, Y. S. Nashed, T. Peterka, S. Vogt, and C. Jacobsen, “X-ray ptychographic and fluorescence microscopy of frozen-hydrated cells using continuous scanning,” Sci. Rep. 7, 445 (2017).
[Crossref] [PubMed]

C. Jacobsen, J. Deng, and Y. Nashed, “Strategies for high-throughput focused-beam ptychography,” J. Synchrotron Radiat. 24, 1078–1081 (2017).
[Crossref] [PubMed]

I. Mohacsi, I. Vartiainen, B. Rösner, M. Guizar-Sicairos, V. A. Guzenko, I. McNulty, R. Winarski, M. V. Holt, and C. David, “Interlaced zone plate optics for hard X-ray imaging in the 10 nm range,” Sci. Rep. 7, 43624 (2017).
[Crossref]

2016 (5)

2015 (6)

2014 (8)

M. Guizar-Sicairos, I. Johnson, A. Diaz, M. Holler, P. Karvinen, H.-C. Stadler, R. Dinapoli, O. Bunk, and A. Menzel, “High-throughput ptychography using Eiger: scanning X-ray nano-imaging of extended regions,” Opt. Express 22, 14859–14870 (2014).
[Crossref] [PubMed]

X. Huang, H. Yan, R. Harder, Y. Hwu, I. K. Robinson, and Y. S. Chu, “Optimization of overlap uniformness for ptychography,” Opt. Express 22, 12634–12644 (2014).
[Crossref] [PubMed]

P. Li, T. B. Edo, and J. M. Rodenburg, “Ptychographic inversion via wigner distribution deconvolution: Noise suppression and probe design,” Ultramicroscopy 147, 106–113 (2014).
[Crossref] [PubMed]

D. J. Batey, D. Claus, and J. M. Rodenburg, “Information multiplexing in ptychography,” Ultramicroscopy 138, 13–21 (2014).
[Crossref] [PubMed]

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

M. D. Seaberg, B. Zhang, D. F. Gardner, E. R. Shanblatt, M. M. Murnane, H. C. Kapteyn, and D. E. Adams, “Tabletop nanometer extreme ultraviolet imaging in an extended reflection mode using coherent fresnel ptychography,” Optica 1, 39–44 (2014).
[Crossref]

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

T. R. Harvey, J. S. Pierce, A. K. Agrawal, P. Ercius, M. Linck, and B. J. McMorran, “Efficient diffractive phase optics for electrons,” New J. Phys. 16, 093039 (2014).
[Crossref]

2013 (8)

G. Zheng, R. Horstmeyer, and C. Yang, “Wide-field, high-resolution Fourier ptychographic microscopy,” Nat. Photon. 7, 739–745 (2013).
[Crossref]

F. Zhang, I. Peterson, J. Vila-Comamala, A. Diaz, F. Berenguer, R. Bean, B. Chen, A. Menzel, I. K. Robinson, and J. M. Rodenburg, “Translation position determination in ptychographic coherent diffraction imaging,” Opt. Express 21, 13592–13606 (2013).
[Crossref] [PubMed]

P. Thibault and A. Menzel, “Reconstructing state mixtures from diffraction measurements,” Nature 494, 68–71 (2013).
[Crossref] [PubMed]

X. Huang, H. Yan, E. Nazaretski, R. Conley, N. Bouet, J. Zhou, K. Lauer, L. Li, D. Eom, D. Legnini, R. Harder, I. K. Robinson, and Y. S. Chu, “11 nm hard X-ray focus from a large-aperture multilayer Laue lens,” Sci. Rep. 3, 3562 (2013).
[Crossref] [PubMed]

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

A. Maiden, G. Morrison, B. Kaulich, A. Gianoncelli, and J. Rodenburg, “Soft X-ray spectromicroscopy using ptychography with randomly phased illumination,” Nat. Commun. 4, 1669 (2013).
[Crossref] [PubMed]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

T. Edo, D. Batey, A. Maiden, C. Rau, U. Wagner, Z. Pešić, T. Waigh, and J. Rodenburg, “Sampling in x-ray ptychography,” Phys. Rev. A 87, 053850 (2013).
[Crossref]

2012 (8)

D. Vine, D. Pelliccia, C. Holzner, S. B. Baines, A. Berry, I. McNulty, S. Vogt, A. G. Peele, and K. A. Nugent, “Simultaneous X-ray fluorescence and ptychographic microscopy of cyclotella meneghiniana,” Opt. Express 20, 18287–18296 (2012).
[Crossref] [PubMed]

A. Diaz, P. Trtik, M. Guizar-Sicairos, A. Menzel, P. Thibault, and O. Bunk, “Quantitative X-ray phase nanotomography,” Phys. Rev. B 85, 020104 (2012).
[Crossref]

M. Guizar-Sicairos, M. Holler, A. Diaz, J. Vila-Comamala, O. Bunk, and A. Menzel, “Role of the illumination spatial-frequency spectrum for ptychography,” Phys. Rev. B 86, 100103 (2012).
[Crossref]

X. Huang, M. Wojcik, N. Burdet, I. Peterson, G. R. Morrison, D. J. Vine, D. Legnini, R. Harder, Y. S. Chu, and I. K. Robinson, “Quantitative X-ray wavefront measurements of fresnel zone plate and KB mirrors using phase retrieval,” Opt. Express 20, 24038–24048 (2012).
[Crossref] [PubMed]

P. Thibault and M. Guizar-Sicairos, “Maximum-likelihood refinement for coherent diffractive imaging,” New J. Phys. 14, 063004 (2012).
[Crossref]

A. M. Maiden, M. J. Humphry, and J. M. Rodenburg, “Ptychographic transmission microscopy in three dimensions using a multi-slice approach,” J. Opt. Soc. Am. A 29, 1606–1614 (2012).
[Crossref]

A. Maiden, M. Humphry, M. Sarahan, B. Kraus, and J. Rodenburg, “An annealing algorithm to correct positioning errors in ptychography,” Ultramicroscopy 120, 64–72 (2012).
[Crossref] [PubMed]

M. Humphry, B. Kraus, A. Hurst, A. Maiden, and J. Rodenburg, “Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging,” Nat. Commun. 3, 730 (2012).
[Crossref] [PubMed]

2011 (4)

A. M. Maiden, M. J. Humphry, F. Zhang, and J. M. Rodenburg, “Superresolution imaging via ptychography,” JOSA A 28, 604–612 (2011).
[Crossref] [PubMed]

C. T. Putkunz, J. N. Clark, D. J. Vine, G. J. Williams, M. A. Pfeifer, E. Balaur, I. McNulty, K. A. Nugent, and A. G. Peele, “Phase-diverse coherent diffractive imaging: High sensitivity with low dose,” Phys. Rev. Lett. f106, 013903 (2011).
[Crossref]

J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
[Crossref] [PubMed]

S. Hönig, R. Hoppe, J. Patommel, A. Schropp, S. Stephan, S. Schöder, M. Burghammer, and C. G. Schroer, “Full optical characterization of coherent x-ray nanobeams by ptychographic imaging,” Opt. Express 19, 16324–16329 (2011).
[Crossref] [PubMed]

2010 (8)

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

S. Gorelick, V. A. Guzenko, J. Vila-Comamala, and C. David, “Direct e-beam writing of dense and high aspect ratio nanostructures in thick layers of pmma for electroplating,” Nanotechnology 21, 295303 (2010).
[Crossref] [PubMed]

C. M. Kewish, M. Guizar-Sicairos, C. Liu, J. Qian, B. Shi, C. Benson, A. M. Khounsary, J. Vila-Comamala, O. Bunk, J. R. Fienup, A. T. Macrander, and L. Assoufid, “Reconstruction of an astigmatic hard X-ray beam and alignment of KB mirrors from ptychographic coherent diffraction data,” Opt. Express 18, 23420–23427 (2010).
[Crossref] [PubMed]

A. M. Maiden, J. M. Rodenburg, and M. J. Humphry, “Optical ptychography: a practical implementation with useful resolution,” Opt. Lett. 35, 2585–2587 (2010).
[Crossref] [PubMed]

K. Giewekemeyer, P. Thibault, S. Kalbfleisch, A. Beerlink, C. M. Kewish, M. Dierolf, F. Pfeiffer, and T. Salditt, “Quantitative biological imaging by ptychographic X-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U. S. A. 107, 529–534 (2010).
[Crossref]

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

J. Verbeeck, H. Tian, and P. Schattschneider, “Production and application of electron vortex beams,” Nature 467, 301 (2010).
[Crossref] [PubMed]

2009 (2)

A. M. Maiden and J. M. Rodenburg, “An improved ptychographical phase retrieval algorithm for diffractive imaging,” Ultramicroscopy 109, 1256–1262 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

2008 (4)

M. Guizar-Sicairos and J. R. Fienup, “Phase retrieval with transverse translation diversity: a nonlinear optimization approach,” Opt. Express 16, 7264–7278 (2008).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning X-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

O. Bunk, M. Dierolf, S. Kynde, I. Johnson, O. Marti, and F. Pfeiffer, “Influence of the overlap parameter on the convergence of the ptychographical iterative engine,” Ultramicroscopy 108, 481–487 (2008).
[Crossref]

R. Cerbino, L. Peverini, M. Potenza, A. Robert, P. Bösecke, and M. Giglio, “X-ray-scattering information obtained from near-field speckle,” Nat. Phys. 4, 238–243 (2008).
[Crossref]

2005 (1)

M. Van Heel and M. Schatz, “Fourier shell correlation threshold criteria,” J. Struct. Biol. 151, 250–262 (2005).
[Crossref] [PubMed]

2004 (1)

J. M. Rodenburg and H. M. Faulkner, “A phase retrieval algorithm for shifting illumination,” Appl. Phys. Lett 85, 4795–4797 (2004).
[Crossref]

2003 (1)

J. Elam, D. Routkevitch, P. Mardilovich, and S. George, “Conformal coating on ultrahigh-aspect-ratio nanopores of anodic alumina by atomic layer deposition,” Chem. Mater 15, 3507–3517 (2003).
[Crossref]

2002 (1)

P. Batson, N. Dellby, and O. Krivanek, “Sub-ångstrom resolution using aberration corrected electron optics,” Nature 418, 617–620 (2002).
[Crossref] [PubMed]

1998 (1)

M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius, and K. Urban, “Electron microscopy image enhanced,” Nature 392, 768–769 (1998).
[Crossref]

1988 (1)

R. M. Goldstein, H. A. Zebker, and C. L. Werner, “Satellite radar interferometry: Two-dimensional phase unwrapping,” Radio Science 23, 713–720 (1988).
[Crossref]

Adams, D.

Adams, D. E.

D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, D. E. Adams, H. C. Kapteyn, M. M. Murnane, and G. F. Mancini, “Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source,” Nat. Photonics 11, 259 (2017).
[Crossref]

M. D. Seaberg, B. Zhang, D. F. Gardner, E. R. Shanblatt, M. M. Murnane, H. C. Kapteyn, and D. E. Adams, “Tabletop nanometer extreme ultraviolet imaging in an extended reflection mode using coherent fresnel ptychography,” Optica 1, 39–44 (2014).
[Crossref]

Aeppli, G.

M. Holler, M. Guizar-Sicairos, E. H. Tsai, R. Dinapoli, E. Müller, O. Bunk, J. Raabe, and G. Aeppli, “High-resolution non-destructive three-dimensional imaging of integrated circuits,” Nature 543, 402–406 (2017).
[Crossref] [PubMed]

Agrawal, A. K.

T. R. Harvey, J. S. Pierce, A. K. Agrawal, P. Ercius, M. Linck, and B. J. McMorran, “Efficient diffractive phase optics for electrons,” New J. Phys. 16, 093039 (2014).
[Crossref]

Arnold, B.

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

Assoufid, L.

Baines, S. B.

Baksh, P.

Balaur, E.

C. T. Putkunz, J. N. Clark, D. J. Vine, G. J. Williams, M. A. Pfeifer, E. Balaur, I. McNulty, K. A. Nugent, and A. G. Peele, “Phase-diverse coherent diffractive imaging: High sensitivity with low dose,” Phys. Rev. Lett. f106, 013903 (2011).
[Crossref]

Batey, D.

T. Edo, D. Batey, A. Maiden, C. Rau, U. Wagner, Z. Pešić, T. Waigh, and J. Rodenburg, “Sampling in x-ray ptychography,” Phys. Rev. A 87, 053850 (2013).
[Crossref]

Batey, D. J.

P. Li, D. J. Batey, T. B. Edo, A. D. Parsons, C. Rau, and J. M. Rodenburg, “Multiple mode X-ray ptychography using a lens and a fixed diffuser optic,” J. Opt. 18, 054008 (2016).
[Crossref]

D. J. Batey, D. Claus, and J. M. Rodenburg, “Information multiplexing in ptychography,” Ultramicroscopy 138, 13–21 (2014).
[Crossref] [PubMed]

Batson, P.

P. Batson, N. Dellby, and O. Krivanek, “Sub-ångstrom resolution using aberration corrected electron optics,” Nature 418, 617–620 (2002).
[Crossref] [PubMed]

Bean, R.

Béché, A.

J. Verbeeck, A. Béché, K. Müller-Caspary, G. Guzzinati, M. A. Luong, and M. Den Hertog, “Demonstration of a 2× 2 programmable phase plate for electrons,” Ultramicroscopy 190, 58–65 (2018).
[Crossref] [PubMed]

Beerlink, A.

K. Giewekemeyer, P. Thibault, S. Kalbfleisch, A. Beerlink, C. M. Kewish, M. Dierolf, F. Pfeiffer, and T. Salditt, “Quantitative biological imaging by ptychographic X-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U. S. A. 107, 529–534 (2010).
[Crossref]

Benson, C.

Berenguer, F.

Bergamaschi, A.

K. Wakonig, A. Diaz, A. Bonnin, M. Stampanoni, A. Bergamaschi, J. Ihli, M. Guizar-Sicairos, and A. Menzel, “X-ray Fourier ptychography,” Sci. Adv 5, 0282 (2019).
[Crossref]

Berry, A.

Bevis, C.

D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, D. E. Adams, H. C. Kapteyn, M. M. Murnane, and G. F. Mancini, “Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source,” Nat. Photonics 11, 259 (2017).
[Crossref]

R. Karl, C. Bevis, R. Lopez-Rios, J. Reichanadter, D. Gardner, C. Porter, E. Shanblatt, M. Tanksalvala, G. F. Mancini, M. Murnane, H. Kapteyn, and D. Adams, “Spatial, spectral, and polarization multiplexed ptychography,” Opt. Express 23, 30250–30258 (2015).
[Crossref] [PubMed]

Boden, S.

Boesenberg, U.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

Bonnin, A.

K. Wakonig, A. Diaz, A. Bonnin, M. Stampanoni, A. Bergamaschi, J. Ihli, M. Guizar-Sicairos, and A. Menzel, “X-ray Fourier ptychography,” Sci. Adv 5, 0282 (2019).
[Crossref]

Bösecke, P.

R. Cerbino, L. Peverini, M. Potenza, A. Robert, P. Bösecke, and M. Giglio, “X-ray-scattering information obtained from near-field speckle,” Nat. Phys. 4, 238–243 (2008).
[Crossref]

Bouet, N.

X. Huang, H. Yan, E. Nazaretski, R. Conley, N. Bouet, J. Zhou, K. Lauer, L. Li, D. Eom, D. Legnini, R. Harder, I. K. Robinson, and Y. S. Chu, “11 nm hard X-ray focus from a large-aperture multilayer Laue lens,” Sci. Rep. 3, 3562 (2013).
[Crossref] [PubMed]

Boye, P.

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Brocklesby, W.

Bunk, O.

M. Holler, M. Guizar-Sicairos, E. H. Tsai, R. Dinapoli, E. Müller, O. Bunk, J. Raabe, and G. Aeppli, “High-resolution non-destructive three-dimensional imaging of integrated circuits,” Nature 543, 402–406 (2017).
[Crossref] [PubMed]

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

M. Guizar-Sicairos, I. Johnson, A. Diaz, M. Holler, P. Karvinen, H.-C. Stadler, R. Dinapoli, O. Bunk, and A. Menzel, “High-throughput ptychography using Eiger: scanning X-ray nano-imaging of extended regions,” Opt. Express 22, 14859–14870 (2014).
[Crossref] [PubMed]

M. Guizar-Sicairos, M. Holler, A. Diaz, J. Vila-Comamala, O. Bunk, and A. Menzel, “Role of the illumination spatial-frequency spectrum for ptychography,” Phys. Rev. B 86, 100103 (2012).
[Crossref]

A. Diaz, P. Trtik, M. Guizar-Sicairos, A. Menzel, P. Thibault, and O. Bunk, “Quantitative X-ray phase nanotomography,” Phys. Rev. B 85, 020104 (2012).
[Crossref]

J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
[Crossref] [PubMed]

C. M. Kewish, M. Guizar-Sicairos, C. Liu, J. Qian, B. Shi, C. Benson, A. M. Khounsary, J. Vila-Comamala, O. Bunk, J. R. Fienup, A. T. Macrander, and L. Assoufid, “Reconstruction of an astigmatic hard X-ray beam and alignment of KB mirrors from ptychographic coherent diffraction data,” Opt. Express 18, 23420–23427 (2010).
[Crossref] [PubMed]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning X-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

O. Bunk, M. Dierolf, S. Kynde, I. Johnson, O. Marti, and F. Pfeiffer, “Influence of the overlap parameter on the convergence of the ptychographical iterative engine,” Ultramicroscopy 108, 481–487 (2008).
[Crossref]

Burdet, N.

Burghammer, M.

S. Hönig, R. Hoppe, J. Patommel, A. Schropp, S. Stephan, S. Schöder, M. Burghammer, and C. G. Schroer, “Full optical characterization of coherent x-ray nanobeams by ptychographic imaging,” Opt. Express 19, 16324–16329 (2011).
[Crossref] [PubMed]

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Cabana, J.

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

Card, R.

Celestre, R.

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

D. A. Shapiro, R. Celestre, P. Denes, M. Farmand, J. Joseph, A. Kilcoyne, S. Marchesini, H. Padmore, S. V. Venkatakrishnan, T. Warwick, and Y.-S. Yu, “Ptychographic Imaging of Nano-Materials at the Advanced Light Source with the Nanosurveyor Instrument,” J. Phys.: Conf. Ser.849, 012028 (2017).
[Crossref]

Cerbino, R.

R. Cerbino, L. Peverini, M. Potenza, A. Robert, P. Bösecke, and M. Giglio, “X-ray-scattering information obtained from near-field speckle,” Nat. Phys. 4, 238–243 (2008).
[Crossref]

Chad, J.

Chao, W.

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

Chen, B.

Chen, Q.

J. Sun, Q. Chen, Y. Zhang, and C. Zuo, “Efficient positional misalignment correction method for Fourier ptychographic microscopy,” Biomed. Opt. 7, 1336–1350 (2016).
[Crossref]

Chen, S.

J. Deng, Y. H. Lo, M. Gallagher-Jones, S. Chen, A. Pryor, Q. Jin, Y. P. Hong, Y. S. Nashed, S. Vogt, J. Miao, and C. Jacobsen, “Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae,” Sci. Adv. 4, eaau4548 (2018).
[Crossref] [PubMed]

J. Deng, D. J. Vine, S. Chen, Q. Jin, Y. S. Nashed, T. Peterka, S. Vogt, and C. Jacobsen, “X-ray ptychographic and fluorescence microscopy of frozen-hydrated cells using continuous scanning,” Sci. Rep. 7, 445 (2017).
[Crossref] [PubMed]

J. Deng, D. J. Vine, S. Chen, Y. S. Nashed, Q. Jin, N. W. Phillips, T. Peterka, R. Ross, S. Vogt, and C. J. Jacobsen, “Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae,” Proc. Natl. Acad. Sci. U. S. A. 112, 2314–2319 (2015).

Chen, Z.

Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller, “Electron ptychography of 2D materials to deep sub-ångström resolution,” Nature 559, 343 (2018).
[Crossref] [PubMed]

Christian, S.

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

Chu, Y. S.

Clare, R. M.

Clark, J. N.

C. T. Putkunz, J. N. Clark, D. J. Vine, G. J. Williams, M. A. Pfeifer, E. Balaur, I. McNulty, K. A. Nugent, and A. G. Peele, “Phase-diverse coherent diffractive imaging: High sensitivity with low dose,” Phys. Rev. Lett. f106, 013903 (2011).
[Crossref]

Claus, D.

D. J. Batey, D. Claus, and J. M. Rodenburg, “Information multiplexing in ptychography,” Ultramicroscopy 138, 13–21 (2014).
[Crossref] [PubMed]

Claverley, J.

Cloetens, P.

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

Conley, R.

X. Huang, H. Yan, E. Nazaretski, R. Conley, N. Bouet, J. Zhou, K. Lauer, L. Li, D. Eom, D. Legnini, R. Harder, I. K. Robinson, and Y. S. Chu, “11 nm hard X-ray focus from a large-aperture multilayer Laue lens,” Sci. Rep. 3, 3562 (2013).
[Crossref] [PubMed]

da Silva, J. C.

David, C.

I. Mohacsi, I. Vartiainen, B. Rösner, M. Guizar-Sicairos, V. A. Guzenko, I. McNulty, R. Winarski, M. V. Holt, and C. David, “Interlaced zone plate optics for hard X-ray imaging in the 10 nm range,” Sci. Rep. 7, 43624 (2017).
[Crossref]

I. Mohacsi, I. Vartiainen, M. Guizar-Sicairos, P. Karvinen, V. A. Guzenko, E. Müller, E. Färm, M. Ritala, C. M. Kewish, A. Somogyi, and C. David, “High resolution double-sided diffractive optics for hard X-ray microscopy,” Opt. Express 23, 776–786 (2015).
[Crossref] [PubMed]

J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
[Crossref] [PubMed]

S. Gorelick, V. A. Guzenko, J. Vila-Comamala, and C. David, “Direct e-beam writing of dense and high aspect ratio nanostructures in thick layers of pmma for electroplating,” Nanotechnology 21, 295303 (2010).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning X-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

V. Guzenko, J. Romijn, J. Vila-Comamala, S. Gorelick, and C. David, “Efficient e-beam lithography exposure strategies for diffractive X-ray optics,” in AIP Conference Proceedings (AIP, 2011), pp. 92–95.
[Crossref]

Deb, P.

Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller, “Electron ptychography of 2D materials to deep sub-ångström resolution,” Nature 559, 343 (2018).
[Crossref] [PubMed]

Dellby, N.

P. Batson, N. Dellby, and O. Krivanek, “Sub-ångstrom resolution using aberration corrected electron optics,” Nature 418, 617–620 (2002).
[Crossref] [PubMed]

Den Hertog, M.

J. Verbeeck, A. Béché, K. Müller-Caspary, G. Guzzinati, M. A. Luong, and M. Den Hertog, “Demonstration of a 2× 2 programmable phase plate for electrons,” Ultramicroscopy 190, 58–65 (2018).
[Crossref] [PubMed]

Denes, P.

D. A. Shapiro, R. Celestre, P. Denes, M. Farmand, J. Joseph, A. Kilcoyne, S. Marchesini, H. Padmore, S. V. Venkatakrishnan, T. Warwick, and Y.-S. Yu, “Ptychographic Imaging of Nano-Materials at the Advanced Light Source with the Nanosurveyor Instrument,” J. Phys.: Conf. Ser.849, 012028 (2017).
[Crossref]

Deng, J.

J. Deng, Y. H. Lo, M. Gallagher-Jones, S. Chen, A. Pryor, Q. Jin, Y. P. Hong, Y. S. Nashed, S. Vogt, J. Miao, and C. Jacobsen, “Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae,” Sci. Adv. 4, eaau4548 (2018).
[Crossref] [PubMed]

J. Deng, D. J. Vine, S. Chen, Q. Jin, Y. S. Nashed, T. Peterka, S. Vogt, and C. Jacobsen, “X-ray ptychographic and fluorescence microscopy of frozen-hydrated cells using continuous scanning,” Sci. Rep. 7, 445 (2017).
[Crossref] [PubMed]

C. Jacobsen, J. Deng, and Y. Nashed, “Strategies for high-throughput focused-beam ptychography,” J. Synchrotron Radiat. 24, 1078–1081 (2017).
[Crossref] [PubMed]

J. Deng, D. J. Vine, S. Chen, Y. S. Nashed, Q. Jin, N. W. Phillips, T. Peterka, R. Ross, S. Vogt, and C. J. Jacobsen, “Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae,” Proc. Natl. Acad. Sci. U. S. A. 112, 2314–2319 (2015).

Diaz, A.

K. Wakonig, A. Diaz, A. Bonnin, M. Stampanoni, A. Bergamaschi, J. Ihli, M. Guizar-Sicairos, and A. Menzel, “X-ray Fourier ptychography,” Sci. Adv 5, 0282 (2019).
[Crossref]

E. H. Tsai, I. Usov, A. Diaz, A. Menzel, and M. Guizar-Sicairos, “X-ray ptychography with extended depth of field,” Opt. Express 24, 29089–29108 (2016).
[Crossref] [PubMed]

M. Guizar-Sicairos, I. Johnson, A. Diaz, M. Holler, P. Karvinen, H.-C. Stadler, R. Dinapoli, O. Bunk, and A. Menzel, “High-throughput ptychography using Eiger: scanning X-ray nano-imaging of extended regions,” Opt. Express 22, 14859–14870 (2014).
[Crossref] [PubMed]

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

F. Zhang, I. Peterson, J. Vila-Comamala, A. Diaz, F. Berenguer, R. Bean, B. Chen, A. Menzel, I. K. Robinson, and J. M. Rodenburg, “Translation position determination in ptychographic coherent diffraction imaging,” Opt. Express 21, 13592–13606 (2013).
[Crossref] [PubMed]

A. Diaz, P. Trtik, M. Guizar-Sicairos, A. Menzel, P. Thibault, and O. Bunk, “Quantitative X-ray phase nanotomography,” Phys. Rev. B 85, 020104 (2012).
[Crossref]

M. Guizar-Sicairos, M. Holler, A. Diaz, J. Vila-Comamala, O. Bunk, and A. Menzel, “Role of the illumination spatial-frequency spectrum for ptychography,” Phys. Rev. B 86, 100103 (2012).
[Crossref]

J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
[Crossref] [PubMed]

Dierolf, M.

R. M. Clare, M. Stockmar, M. Dierolf, I. Zanette, and F. Pfeiffer, “Characterization of near-field ptychography,” Opt. Express 23, 19728–19742 (2015).
[Crossref] [PubMed]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

K. Giewekemeyer, P. Thibault, S. Kalbfleisch, A. Beerlink, C. M. Kewish, M. Dierolf, F. Pfeiffer, and T. Salditt, “Quantitative biological imaging by ptychographic X-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U. S. A. 107, 529–534 (2010).
[Crossref]

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning X-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

O. Bunk, M. Dierolf, S. Kynde, I. Johnson, O. Marti, and F. Pfeiffer, “Influence of the overlap parameter on the convergence of the ptychographical iterative engine,” Ultramicroscopy 108, 481–487 (2008).
[Crossref]

Dinapoli, R.

M. Holler, M. Guizar-Sicairos, E. H. Tsai, R. Dinapoli, E. Müller, O. Bunk, J. Raabe, and G. Aeppli, “High-resolution non-destructive three-dimensional imaging of integrated circuits,” Nature 543, 402–406 (2017).
[Crossref] [PubMed]

M. Guizar-Sicairos, I. Johnson, A. Diaz, M. Holler, P. Karvinen, H.-C. Stadler, R. Dinapoli, O. Bunk, and A. Menzel, “High-throughput ptychography using Eiger: scanning X-ray nano-imaging of extended regions,” Opt. Express 22, 14859–14870 (2014).
[Crossref] [PubMed]

Edo, T.

T. Edo, D. Batey, A. Maiden, C. Rau, U. Wagner, Z. Pešić, T. Waigh, and J. Rodenburg, “Sampling in x-ray ptychography,” Phys. Rev. A 87, 053850 (2013).
[Crossref]

Edo, T. B.

P. Li, D. J. Batey, T. B. Edo, A. D. Parsons, C. Rau, and J. M. Rodenburg, “Multiple mode X-ray ptychography using a lens and a fixed diffuser optic,” J. Opt. 18, 054008 (2016).
[Crossref]

P. Li, T. B. Edo, and J. M. Rodenburg, “Ptychographic inversion via wigner distribution deconvolution: Noise suppression and probe design,” Ultramicroscopy 147, 106–113 (2014).
[Crossref] [PubMed]

Elam, J.

J. Elam, D. Routkevitch, P. Mardilovich, and S. George, “Conformal coating on ultrahigh-aspect-ratio nanopores of anodic alumina by atomic layer deposition,” Chem. Mater 15, 3507–3517 (2003).
[Crossref]

Elser, V.

Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller, “Electron ptychography of 2D materials to deep sub-ångström resolution,” Nature 559, 343 (2018).
[Crossref] [PubMed]

Enders, B.

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

Eom, D.

X. Huang, H. Yan, E. Nazaretski, R. Conley, N. Bouet, J. Zhou, K. Lauer, L. Li, D. Eom, D. Legnini, R. Harder, I. K. Robinson, and Y. S. Chu, “11 nm hard X-ray focus from a large-aperture multilayer Laue lens,” Sci. Rep. 3, 3562 (2013).
[Crossref] [PubMed]

Ercius, P.

T. R. Harvey, J. S. Pierce, A. K. Agrawal, P. Ercius, M. Linck, and B. J. McMorran, “Efficient diffractive phase optics for electrons,” New J. Phys. 16, 093039 (2014).
[Crossref]

Falkenberg, G.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

Färm, E.

I. Mohacsi, I. Vartiainen, M. Guizar-Sicairos, P. Karvinen, V. A. Guzenko, E. Müller, E. Färm, M. Ritala, C. M. Kewish, A. Somogyi, and C. David, “High resolution double-sided diffractive optics for hard X-ray microscopy,” Opt. Express 23, 776–786 (2015).
[Crossref] [PubMed]

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

Farmand, M.

D. A. Shapiro, R. Celestre, P. Denes, M. Farmand, J. Joseph, A. Kilcoyne, S. Marchesini, H. Padmore, S. V. Venkatakrishnan, T. Warwick, and Y.-S. Yu, “Ptychographic Imaging of Nano-Materials at the Advanced Light Source with the Nanosurveyor Instrument,” J. Phys.: Conf. Ser.849, 012028 (2017).
[Crossref]

Faulkner, H. M.

J. M. Rodenburg and H. M. Faulkner, “A phase retrieval algorithm for shifting illumination,” Appl. Phys. Lett 85, 4795–4797 (2004).
[Crossref]

Feldkamp, J.

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Fienup, J. R.

Frey, J.

Gallagher-Jones, M.

J. Deng, Y. H. Lo, M. Gallagher-Jones, S. Chen, A. Pryor, Q. Jin, Y. P. Hong, Y. S. Nashed, S. Vogt, J. Miao, and C. Jacobsen, “Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae,” Sci. Adv. 4, eaau4548 (2018).
[Crossref] [PubMed]

Galloway, B. R.

D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, D. E. Adams, H. C. Kapteyn, M. M. Murnane, and G. F. Mancini, “Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source,” Nat. Photonics 11, 259 (2017).
[Crossref]

Galtier, E. C.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

Gao, H.

Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller, “Electron ptychography of 2D materials to deep sub-ångström resolution,” Nature 559, 343 (2018).
[Crossref] [PubMed]

Gao, S.

S. Gao, P. Wang, F. Zhang, G. T. Martinez, P. D. Nellist, X. Pan, and A. I. Kirkland, “Electron ptychographic microscopy for three-dimensional imaging,” Nat. Commun. 8, 163 (2017).
[Crossref] [PubMed]

Gardner, D.

Gardner, D. F.

D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, D. E. Adams, H. C. Kapteyn, M. M. Murnane, and G. F. Mancini, “Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source,” Nat. Photonics 11, 259 (2017).
[Crossref]

M. D. Seaberg, B. Zhang, D. F. Gardner, E. R. Shanblatt, M. M. Murnane, H. C. Kapteyn, and D. E. Adams, “Tabletop nanometer extreme ultraviolet imaging in an extended reflection mode using coherent fresnel ptychography,” Optica 1, 39–44 (2014).
[Crossref]

Garrevoet, J.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

George, S.

J. Elam, D. Routkevitch, P. Mardilovich, and S. George, “Conformal coating on ultrahigh-aspect-ratio nanopores of anodic alumina by atomic layer deposition,” Chem. Mater 15, 3507–3517 (2003).
[Crossref]

Giakoumidis, S.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

Gianoncelli, A.

G. Morrison, F. Zhang, A. Gianoncelli, and I. Robinson, “X-ray ptychography using randomized zone plates,” Opt. Express 26, 14915–14927 (2018).
[Crossref] [PubMed]

A. Maiden, G. Morrison, B. Kaulich, A. Gianoncelli, and J. Rodenburg, “Soft X-ray spectromicroscopy using ptychography with randomly phased illumination,” Nat. Commun. 4, 1669 (2013).
[Crossref] [PubMed]

Giewekemeyer, K.

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

K. Giewekemeyer, P. Thibault, S. Kalbfleisch, A. Beerlink, C. M. Kewish, M. Dierolf, F. Pfeiffer, and T. Salditt, “Quantitative biological imaging by ptychographic X-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U. S. A. 107, 529–534 (2010).
[Crossref]

Giglio, M.

R. Cerbino, L. Peverini, M. Potenza, A. Robert, P. Bösecke, and M. Giglio, “X-ray-scattering information obtained from near-field speckle,” Nat. Phys. 4, 238–243 (2008).
[Crossref]

Godden, T.

Goldstein, R. M.

R. M. Goldstein, H. A. Zebker, and C. L. Werner, “Satellite radar interferometry: Two-dimensional phase unwrapping,” Radio Science 23, 713–720 (1988).
[Crossref]

Gorelick, S.

S. Gorelick, V. A. Guzenko, J. Vila-Comamala, and C. David, “Direct e-beam writing of dense and high aspect ratio nanostructures in thick layers of pmma for electroplating,” Nanotechnology 21, 295303 (2010).
[Crossref] [PubMed]

V. Guzenko, J. Romijn, J. Vila-Comamala, S. Gorelick, and C. David, “Efficient e-beam lithography exposure strategies for diffractive X-ray optics,” in AIP Conference Proceedings (AIP, 2011), pp. 92–95.
[Crossref]

Gruner, S. M.

Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller, “Electron ptychography of 2D materials to deep sub-ångström resolution,” Nature 559, 343 (2018).
[Crossref] [PubMed]

Guizar-Sicairos, M.

K. Wakonig, A. Diaz, A. Bonnin, M. Stampanoni, A. Bergamaschi, J. Ihli, M. Guizar-Sicairos, and A. Menzel, “X-ray Fourier ptychography,” Sci. Adv 5, 0282 (2019).
[Crossref]

M. Odstrčil, A. Menzel, and M. Guizar-Sicairos, “Iterative least-squares solver for generalized maximum-likelihood ptychography,” Opt. Express 26, 3108–3123 (2018).
[Crossref]

I. Mohacsi, I. Vartiainen, B. Rösner, M. Guizar-Sicairos, V. A. Guzenko, I. McNulty, R. Winarski, M. V. Holt, and C. David, “Interlaced zone plate optics for hard X-ray imaging in the 10 nm range,” Sci. Rep. 7, 43624 (2017).
[Crossref]

M. Holler, M. Guizar-Sicairos, E. H. Tsai, R. Dinapoli, E. Müller, O. Bunk, J. Raabe, and G. Aeppli, “High-resolution non-destructive three-dimensional imaging of integrated circuits,” Nature 543, 402–406 (2017).
[Crossref] [PubMed]

E. H. Tsai, I. Usov, A. Diaz, A. Menzel, and M. Guizar-Sicairos, “X-ray ptychography with extended depth of field,” Opt. Express 24, 29089–29108 (2016).
[Crossref] [PubMed]

I. Mohacsi, I. Vartiainen, M. Guizar-Sicairos, P. Karvinen, V. A. Guzenko, E. Müller, E. Färm, M. Ritala, C. M. Kewish, A. Somogyi, and C. David, “High resolution double-sided diffractive optics for hard X-ray microscopy,” Opt. Express 23, 776–786 (2015).
[Crossref] [PubMed]

M. Guizar-Sicairos, I. Johnson, A. Diaz, M. Holler, P. Karvinen, H.-C. Stadler, R. Dinapoli, O. Bunk, and A. Menzel, “High-throughput ptychography using Eiger: scanning X-ray nano-imaging of extended regions,” Opt. Express 22, 14859–14870 (2014).
[Crossref] [PubMed]

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

P. Thibault and M. Guizar-Sicairos, “Maximum-likelihood refinement for coherent diffractive imaging,” New J. Phys. 14, 063004 (2012).
[Crossref]

A. Diaz, P. Trtik, M. Guizar-Sicairos, A. Menzel, P. Thibault, and O. Bunk, “Quantitative X-ray phase nanotomography,” Phys. Rev. B 85, 020104 (2012).
[Crossref]

M. Guizar-Sicairos, M. Holler, A. Diaz, J. Vila-Comamala, O. Bunk, and A. Menzel, “Role of the illumination spatial-frequency spectrum for ptychography,” Phys. Rev. B 86, 100103 (2012).
[Crossref]

J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
[Crossref] [PubMed]

C. M. Kewish, M. Guizar-Sicairos, C. Liu, J. Qian, B. Shi, C. Benson, A. M. Khounsary, J. Vila-Comamala, O. Bunk, J. R. Fienup, A. T. Macrander, and L. Assoufid, “Reconstruction of an astigmatic hard X-ray beam and alignment of KB mirrors from ptychographic coherent diffraction data,” Opt. Express 18, 23420–23427 (2010).
[Crossref] [PubMed]

M. Guizar-Sicairos and J. R. Fienup, “Phase retrieval with transverse translation diversity: a nonlinear optimization approach,” Opt. Express 16, 7264–7278 (2008).
[Crossref] [PubMed]

Gulden, J.

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Guzenko, V.

V. Guzenko, J. Romijn, J. Vila-Comamala, S. Gorelick, and C. David, “Efficient e-beam lithography exposure strategies for diffractive X-ray optics,” in AIP Conference Proceedings (AIP, 2011), pp. 92–95.
[Crossref]

Guzenko, V. A.

I. Mohacsi, I. Vartiainen, B. Rösner, M. Guizar-Sicairos, V. A. Guzenko, I. McNulty, R. Winarski, M. V. Holt, and C. David, “Interlaced zone plate optics for hard X-ray imaging in the 10 nm range,” Sci. Rep. 7, 43624 (2017).
[Crossref]

I. Mohacsi, I. Vartiainen, M. Guizar-Sicairos, P. Karvinen, V. A. Guzenko, E. Müller, E. Färm, M. Ritala, C. M. Kewish, A. Somogyi, and C. David, “High resolution double-sided diffractive optics for hard X-ray microscopy,” Opt. Express 23, 776–786 (2015).
[Crossref] [PubMed]

S. Gorelick, V. A. Guzenko, J. Vila-Comamala, and C. David, “Direct e-beam writing of dense and high aspect ratio nanostructures in thick layers of pmma for electroplating,” Nanotechnology 21, 295303 (2010).
[Crossref] [PubMed]

Guzzinati, G.

J. Verbeeck, A. Béché, K. Müller-Caspary, G. Guzzinati, M. A. Luong, and M. Den Hertog, “Demonstration of a 2× 2 programmable phase plate for electrons,” Ultramicroscopy 190, 58–65 (2018).
[Crossref] [PubMed]

Haider, M.

M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius, and K. Urban, “Electron microscopy image enhanced,” Nature 392, 768–769 (1998).
[Crossref]

Han, Y.

Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller, “Electron ptychography of 2D materials to deep sub-ångström resolution,” Nature 559, 343 (2018).
[Crossref] [PubMed]

Harder, R.

Härkönen, E.

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

Harvey, T. R.

T. R. Harvey, J. S. Pierce, A. K. Agrawal, P. Ercius, M. Linck, and B. J. McMorran, “Efficient diffractive phase optics for electrons,” New J. Phys. 16, 093039 (2014).
[Crossref]

Hastings, J.

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

Hertz, H. M.

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

Holler, M.

M. Odstrčil, M. Lebugle, T. Lachat, J. Raabe, and M. Holler, “Fast positioning for X-ray scanning microscopy by a combined motion of sample and beam defining optics,” J. Synchrotron Radiat. 26, 504–509 (2019).
[Crossref]

M. Holler, M. Guizar-Sicairos, E. H. Tsai, R. Dinapoli, E. Müller, O. Bunk, J. Raabe, and G. Aeppli, “High-resolution non-destructive three-dimensional imaging of integrated circuits,” Nature 543, 402–406 (2017).
[Crossref] [PubMed]

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

M. Guizar-Sicairos, I. Johnson, A. Diaz, M. Holler, P. Karvinen, H.-C. Stadler, R. Dinapoli, O. Bunk, and A. Menzel, “High-throughput ptychography using Eiger: scanning X-ray nano-imaging of extended regions,” Opt. Express 22, 14859–14870 (2014).
[Crossref] [PubMed]

M. Guizar-Sicairos, M. Holler, A. Diaz, J. Vila-Comamala, O. Bunk, and A. Menzel, “Role of the illumination spatial-frequency spectrum for ptychography,” Phys. Rev. B 86, 100103 (2012).
[Crossref]

Holt, M. V.

I. Mohacsi, I. Vartiainen, B. Rösner, M. Guizar-Sicairos, V. A. Guzenko, I. McNulty, R. Winarski, M. V. Holt, and C. David, “Interlaced zone plate optics for hard X-ray imaging in the 10 nm range,” Sci. Rep. 7, 43624 (2017).
[Crossref]

Holzner, C.

Hong, Y. P.

J. Deng, Y. H. Lo, M. Gallagher-Jones, S. Chen, A. Pryor, Q. Jin, Y. P. Hong, Y. S. Nashed, S. Vogt, J. Miao, and C. Jacobsen, “Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae,” Sci. Adv. 4, eaau4548 (2018).
[Crossref] [PubMed]

Hönig, S.

Hoppe, R.

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

S. Hönig, R. Hoppe, J. Patommel, A. Schropp, S. Stephan, S. Schöder, M. Burghammer, and C. G. Schroer, “Full optical characterization of coherent x-ray nanobeams by ptychographic imaging,” Opt. Express 19, 16324–16329 (2011).
[Crossref] [PubMed]

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Horstmeyer, R.

G. Zheng, R. Horstmeyer, and C. Yang, “Wide-field, high-resolution Fourier ptychographic microscopy,” Nat. Photon. 7, 739–745 (2013).
[Crossref]

Huang, X.

Humphry, M.

T. Godden, A. Muñiz-Piniella, J. Claverley, A. Yacoot, and M. Humphry, “Phase calibration target for quantitative phase imaging with ptychography,” Opt. Express 24, 7679–7692 (2016).
[Crossref] [PubMed]

A. Maiden, M. Humphry, M. Sarahan, B. Kraus, and J. Rodenburg, “An annealing algorithm to correct positioning errors in ptychography,” Ultramicroscopy 120, 64–72 (2012).
[Crossref] [PubMed]

M. Humphry, B. Kraus, A. Hurst, A. Maiden, and J. Rodenburg, “Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging,” Nat. Commun. 3, 730 (2012).
[Crossref] [PubMed]

Humphry, M. J.

Hurst, A.

M. Humphry, B. Kraus, A. Hurst, A. Maiden, and J. Rodenburg, “Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging,” Nat. Commun. 3, 730 (2012).
[Crossref] [PubMed]

Hwu, Y.

Ihli, J.

K. Wakonig, A. Diaz, A. Bonnin, M. Stampanoni, A. Bergamaschi, J. Ihli, M. Guizar-Sicairos, and A. Menzel, “X-ray Fourier ptychography,” Sci. Adv 5, 0282 (2019).
[Crossref]

Jacobsen, C.

J. Deng, Y. H. Lo, M. Gallagher-Jones, S. Chen, A. Pryor, Q. Jin, Y. P. Hong, Y. S. Nashed, S. Vogt, J. Miao, and C. Jacobsen, “Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae,” Sci. Adv. 4, eaau4548 (2018).
[Crossref] [PubMed]

J. Deng, D. J. Vine, S. Chen, Q. Jin, Y. S. Nashed, T. Peterka, S. Vogt, and C. Jacobsen, “X-ray ptychographic and fluorescence microscopy of frozen-hydrated cells using continuous scanning,” Sci. Rep. 7, 445 (2017).
[Crossref] [PubMed]

C. Jacobsen, J. Deng, and Y. Nashed, “Strategies for high-throughput focused-beam ptychography,” J. Synchrotron Radiat. 24, 1078–1081 (2017).
[Crossref] [PubMed]

Jacobsen, C. J.

J. Deng, D. J. Vine, S. Chen, Y. S. Nashed, Q. Jin, N. W. Phillips, T. Peterka, R. Ross, S. Vogt, and C. J. Jacobsen, “Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae,” Proc. Natl. Acad. Sci. U. S. A. 112, 2314–2319 (2015).

Jefimovs, K.

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

Jiang, Y.

Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller, “Electron ptychography of 2D materials to deep sub-ångström resolution,” Nature 559, 343 (2018).
[Crossref] [PubMed]

Jin, Q.

J. Deng, Y. H. Lo, M. Gallagher-Jones, S. Chen, A. Pryor, Q. Jin, Y. P. Hong, Y. S. Nashed, S. Vogt, J. Miao, and C. Jacobsen, “Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae,” Sci. Adv. 4, eaau4548 (2018).
[Crossref] [PubMed]

J. Deng, D. J. Vine, S. Chen, Q. Jin, Y. S. Nashed, T. Peterka, S. Vogt, and C. Jacobsen, “X-ray ptychographic and fluorescence microscopy of frozen-hydrated cells using continuous scanning,” Sci. Rep. 7, 445 (2017).
[Crossref] [PubMed]

J. Deng, D. J. Vine, S. Chen, Y. S. Nashed, Q. Jin, N. W. Phillips, T. Peterka, R. Ross, S. Vogt, and C. J. Jacobsen, “Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae,” Proc. Natl. Acad. Sci. U. S. A. 112, 2314–2319 (2015).

Johnson, I.

M. Guizar-Sicairos, I. Johnson, A. Diaz, M. Holler, P. Karvinen, H.-C. Stadler, R. Dinapoli, O. Bunk, and A. Menzel, “High-throughput ptychography using Eiger: scanning X-ray nano-imaging of extended regions,” Opt. Express 22, 14859–14870 (2014).
[Crossref] [PubMed]

O. Bunk, M. Dierolf, S. Kynde, I. Johnson, O. Marti, and F. Pfeiffer, “Influence of the overlap parameter on the convergence of the ptychographical iterative engine,” Ultramicroscopy 108, 481–487 (2008).
[Crossref]

Joseph, J.

D. A. Shapiro, R. Celestre, P. Denes, M. Farmand, J. Joseph, A. Kilcoyne, S. Marchesini, H. Padmore, S. V. Venkatakrishnan, T. Warwick, and Y.-S. Yu, “Ptychographic Imaging of Nano-Materials at the Advanced Light Source with the Nanosurveyor Instrument,” J. Phys.: Conf. Ser.849, 012028 (2017).
[Crossref]

Kabius, B.

M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius, and K. Urban, “Electron microscopy image enhanced,” Nature 392, 768–769 (1998).
[Crossref]

Kalbfleisch, S.

K. Giewekemeyer, P. Thibault, S. Kalbfleisch, A. Beerlink, C. M. Kewish, M. Dierolf, F. Pfeiffer, and T. Salditt, “Quantitative biological imaging by ptychographic X-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U. S. A. 107, 529–534 (2010).
[Crossref]

Kapteyn, H.

Kapteyn, H. C.

D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, D. E. Adams, H. C. Kapteyn, M. M. Murnane, and G. F. Mancini, “Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source,” Nat. Photonics 11, 259 (2017).
[Crossref]

M. D. Seaberg, B. Zhang, D. F. Gardner, E. R. Shanblatt, M. M. Murnane, H. C. Kapteyn, and D. E. Adams, “Tabletop nanometer extreme ultraviolet imaging in an extended reflection mode using coherent fresnel ptychography,” Optica 1, 39–44 (2014).
[Crossref]

Karl, R.

D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, D. E. Adams, H. C. Kapteyn, M. M. Murnane, and G. F. Mancini, “Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source,” Nat. Photonics 11, 259 (2017).
[Crossref]

R. Karl, C. Bevis, R. Lopez-Rios, J. Reichanadter, D. Gardner, C. Porter, E. Shanblatt, M. Tanksalvala, G. F. Mancini, M. Murnane, H. Kapteyn, and D. Adams, “Spatial, spectral, and polarization multiplexed ptychography,” Opt. Express 23, 30250–30258 (2015).
[Crossref] [PubMed]

Karvinen, P.

Kaulich, B.

A. Maiden, G. Morrison, B. Kaulich, A. Gianoncelli, and J. Rodenburg, “Soft X-ray spectromicroscopy using ptychography with randomly phased illumination,” Nat. Commun. 4, 1669 (2013).
[Crossref] [PubMed]

Kaznatcheev, K.

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

Kewish, C. M.

I. Mohacsi, I. Vartiainen, M. Guizar-Sicairos, P. Karvinen, V. A. Guzenko, E. Müller, E. Färm, M. Ritala, C. M. Kewish, A. Somogyi, and C. David, “High resolution double-sided diffractive optics for hard X-ray microscopy,” Opt. Express 23, 776–786 (2015).
[Crossref] [PubMed]

J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
[Crossref] [PubMed]

C. M. Kewish, M. Guizar-Sicairos, C. Liu, J. Qian, B. Shi, C. Benson, A. M. Khounsary, J. Vila-Comamala, O. Bunk, J. R. Fienup, A. T. Macrander, and L. Assoufid, “Reconstruction of an astigmatic hard X-ray beam and alignment of KB mirrors from ptychographic coherent diffraction data,” Opt. Express 18, 23420–23427 (2010).
[Crossref] [PubMed]

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

K. Giewekemeyer, P. Thibault, S. Kalbfleisch, A. Beerlink, C. M. Kewish, M. Dierolf, F. Pfeiffer, and T. Salditt, “Quantitative biological imaging by ptychographic X-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U. S. A. 107, 529–534 (2010).
[Crossref]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

Khounsary, A. M.

Kilcoyne, A.

D. A. Shapiro, R. Celestre, P. Denes, M. Farmand, J. Joseph, A. Kilcoyne, S. Marchesini, H. Padmore, S. V. Venkatakrishnan, T. Warwick, and Y.-S. Yu, “Ptychographic Imaging of Nano-Materials at the Advanced Light Source with the Nanosurveyor Instrument,” J. Phys.: Conf. Ser.849, 012028 (2017).
[Crossref]

Kilcoyne, A. D.

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

Kirkland, A. I.

S. Gao, P. Wang, F. Zhang, G. T. Martinez, P. D. Nellist, X. Pan, and A. I. Kirkland, “Electron ptychographic microscopy for three-dimensional imaging,” Nat. Commun. 8, 163 (2017).
[Crossref] [PubMed]

Kraus, B.

M. Humphry, B. Kraus, A. Hurst, A. Maiden, and J. Rodenburg, “Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging,” Nat. Commun. 3, 730 (2012).
[Crossref] [PubMed]

A. Maiden, M. Humphry, M. Sarahan, B. Kraus, and J. Rodenburg, “An annealing algorithm to correct positioning errors in ptychography,” Ultramicroscopy 120, 64–72 (2012).
[Crossref] [PubMed]

Krivanek, O.

P. Batson, N. Dellby, and O. Krivanek, “Sub-ångstrom resolution using aberration corrected electron optics,” Nature 418, 617–620 (2002).
[Crossref] [PubMed]

Kynde, S.

O. Bunk, M. Dierolf, S. Kynde, I. Johnson, O. Marti, and F. Pfeiffer, “Influence of the overlap parameter on the convergence of the ptychographical iterative engine,” Ultramicroscopy 108, 481–487 (2008).
[Crossref]

Lachat, T.

M. Odstrčil, M. Lebugle, T. Lachat, J. Raabe, and M. Holler, “Fast positioning for X-ray scanning microscopy by a combined motion of sample and beam defining optics,” J. Synchrotron Radiat. 26, 504–509 (2019).
[Crossref]

Lauer, K.

X. Huang, H. Yan, E. Nazaretski, R. Conley, N. Bouet, J. Zhou, K. Lauer, L. Li, D. Eom, D. Legnini, R. Harder, I. K. Robinson, and Y. S. Chu, “11 nm hard X-ray focus from a large-aperture multilayer Laue lens,” Sci. Rep. 3, 3562 (2013).
[Crossref] [PubMed]

Lebugle, M.

M. Odstrčil, M. Lebugle, T. Lachat, J. Raabe, and M. Holler, “Fast positioning for X-ray scanning microscopy by a combined motion of sample and beam defining optics,” J. Synchrotron Radiat. 26, 504–509 (2019).
[Crossref]

Lee, H. J.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

Legnini, D.

X. Huang, H. Yan, E. Nazaretski, R. Conley, N. Bouet, J. Zhou, K. Lauer, L. Li, D. Eom, D. Legnini, R. Harder, I. K. Robinson, and Y. S. Chu, “11 nm hard X-ray focus from a large-aperture multilayer Laue lens,” Sci. Rep. 3, 3562 (2013).
[Crossref] [PubMed]

X. Huang, M. Wojcik, N. Burdet, I. Peterson, G. R. Morrison, D. J. Vine, D. Legnini, R. Harder, Y. S. Chu, and I. K. Robinson, “Quantitative X-ray wavefront measurements of fresnel zone plate and KB mirrors using phase retrieval,” Opt. Express 20, 24038–24048 (2012).
[Crossref] [PubMed]

Li, L.

X. Huang, H. Yan, E. Nazaretski, R. Conley, N. Bouet, J. Zhou, K. Lauer, L. Li, D. Eom, D. Legnini, R. Harder, I. K. Robinson, and Y. S. Chu, “11 nm hard X-ray focus from a large-aperture multilayer Laue lens,” Sci. Rep. 3, 3562 (2013).
[Crossref] [PubMed]

Li, P.

P. Li, D. J. Batey, T. B. Edo, A. D. Parsons, C. Rau, and J. M. Rodenburg, “Multiple mode X-ray ptychography using a lens and a fixed diffuser optic,” J. Opt. 18, 054008 (2016).
[Crossref]

P. Li, T. B. Edo, and J. M. Rodenburg, “Ptychographic inversion via wigner distribution deconvolution: Noise suppression and probe design,” Ultramicroscopy 147, 106–113 (2014).
[Crossref] [PubMed]

Linck, M.

T. R. Harvey, J. S. Pierce, A. K. Agrawal, P. Ercius, M. Linck, and B. J. McMorran, “Efficient diffractive phase optics for electrons,” New J. Phys. 16, 093039 (2014).
[Crossref]

Liu, C.

Lo, Y. H.

J. Deng, Y. H. Lo, M. Gallagher-Jones, S. Chen, A. Pryor, Q. Jin, Y. P. Hong, Y. S. Nashed, S. Vogt, J. Miao, and C. Jacobsen, “Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae,” Sci. Adv. 4, eaau4548 (2018).
[Crossref] [PubMed]

Lopez-Rios, R.

Luong, M. A.

J. Verbeeck, A. Béché, K. Müller-Caspary, G. Guzzinati, M. A. Luong, and M. Den Hertog, “Demonstration of a 2× 2 programmable phase plate for electrons,” Ultramicroscopy 190, 58–65 (2018).
[Crossref] [PubMed]

Macrander, A. T.

Maia, F.

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

Maiden, A.

A. Maiden, G. Morrison, B. Kaulich, A. Gianoncelli, and J. Rodenburg, “Soft X-ray spectromicroscopy using ptychography with randomly phased illumination,” Nat. Commun. 4, 1669 (2013).
[Crossref] [PubMed]

T. Edo, D. Batey, A. Maiden, C. Rau, U. Wagner, Z. Pešić, T. Waigh, and J. Rodenburg, “Sampling in x-ray ptychography,” Phys. Rev. A 87, 053850 (2013).
[Crossref]

M. Humphry, B. Kraus, A. Hurst, A. Maiden, and J. Rodenburg, “Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging,” Nat. Commun. 3, 730 (2012).
[Crossref] [PubMed]

A. Maiden, M. Humphry, M. Sarahan, B. Kraus, and J. Rodenburg, “An annealing algorithm to correct positioning errors in ptychography,” Ultramicroscopy 120, 64–72 (2012).
[Crossref] [PubMed]

Maiden, A. M.

A. M. Maiden, M. J. Humphry, and J. M. Rodenburg, “Ptychographic transmission microscopy in three dimensions using a multi-slice approach,” J. Opt. Soc. Am. A 29, 1606–1614 (2012).
[Crossref]

A. M. Maiden, M. J. Humphry, F. Zhang, and J. M. Rodenburg, “Superresolution imaging via ptychography,” JOSA A 28, 604–612 (2011).
[Crossref] [PubMed]

A. M. Maiden, J. M. Rodenburg, and M. J. Humphry, “Optical ptychography: a practical implementation with useful resolution,” Opt. Lett. 35, 2585–2587 (2010).
[Crossref] [PubMed]

A. M. Maiden and J. M. Rodenburg, “An improved ptychographical phase retrieval algorithm for diffractive imaging,” Ultramicroscopy 109, 1256–1262 (2009).
[Crossref] [PubMed]

Mancini, G. F.

D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, D. E. Adams, H. C. Kapteyn, M. M. Murnane, and G. F. Mancini, “Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source,” Nat. Photonics 11, 259 (2017).
[Crossref]

R. Karl, C. Bevis, R. Lopez-Rios, J. Reichanadter, D. Gardner, C. Porter, E. Shanblatt, M. Tanksalvala, G. F. Mancini, M. Murnane, H. Kapteyn, and D. Adams, “Spatial, spectral, and polarization multiplexed ptychography,” Opt. Express 23, 30250–30258 (2015).
[Crossref] [PubMed]

Mancuso, A. P.

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Mantion, A.

Marchesini, S.

S. Marchesini and A. Sakdinawat, “Shaping coherent x-rays with binary optics,” Opt. Express 27, 907–917 (2019).
[Crossref] [PubMed]

S. Marchesini, Y.-C. Tu, and H. Wu, “Alternating projection, ptychographic imaging and phase synchronization,” Appl. Comput. Harmon. Analysis 41, 815–851 (2015).

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

D. A. Shapiro, R. Celestre, P. Denes, M. Farmand, J. Joseph, A. Kilcoyne, S. Marchesini, H. Padmore, S. V. Venkatakrishnan, T. Warwick, and Y.-S. Yu, “Ptychographic Imaging of Nano-Materials at the Advanced Light Source with the Nanosurveyor Instrument,” J. Phys.: Conf. Ser.849, 012028 (2017).
[Crossref]

Mardilovich, P.

J. Elam, D. Routkevitch, P. Mardilovich, and S. George, “Conformal coating on ultrahigh-aspect-ratio nanopores of anodic alumina by atomic layer deposition,” Chem. Mater 15, 3507–3517 (2003).
[Crossref]

Marti, O.

O. Bunk, M. Dierolf, S. Kynde, I. Johnson, O. Marti, and F. Pfeiffer, “Influence of the overlap parameter on the convergence of the ptychographical iterative engine,” Ultramicroscopy 108, 481–487 (2008).
[Crossref]

Martinez, G. T.

S. Gao, P. Wang, F. Zhang, G. T. Martinez, P. D. Nellist, X. Pan, and A. I. Kirkland, “Electron ptychographic microscopy for three-dimensional imaging,” Nat. Commun. 8, 163 (2017).
[Crossref] [PubMed]

McMorran, B. J.

T. R. Harvey, J. S. Pierce, A. K. Agrawal, P. Ercius, M. Linck, and B. J. McMorran, “Efficient diffractive phase optics for electrons,” New J. Phys. 16, 093039 (2014).
[Crossref]

McNulty, I.

I. Mohacsi, I. Vartiainen, B. Rösner, M. Guizar-Sicairos, V. A. Guzenko, I. McNulty, R. Winarski, M. V. Holt, and C. David, “Interlaced zone plate optics for hard X-ray imaging in the 10 nm range,” Sci. Rep. 7, 43624 (2017).
[Crossref]

D. Vine, D. Pelliccia, C. Holzner, S. B. Baines, A. Berry, I. McNulty, S. Vogt, A. G. Peele, and K. A. Nugent, “Simultaneous X-ray fluorescence and ptychographic microscopy of cyclotella meneghiniana,” Opt. Express 20, 18287–18296 (2012).
[Crossref] [PubMed]

C. T. Putkunz, J. N. Clark, D. J. Vine, G. J. Williams, M. A. Pfeifer, E. Balaur, I. McNulty, K. A. Nugent, and A. G. Peele, “Phase-diverse coherent diffractive imaging: High sensitivity with low dose,” Phys. Rev. Lett. f106, 013903 (2011).
[Crossref]

Meier, V.

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

Meng, Y. S.

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

Menzel, A.

K. Wakonig, A. Diaz, A. Bonnin, M. Stampanoni, A. Bergamaschi, J. Ihli, M. Guizar-Sicairos, and A. Menzel, “X-ray Fourier ptychography,” Sci. Adv 5, 0282 (2019).
[Crossref]

M. Odstrčil, A. Menzel, and M. Guizar-Sicairos, “Iterative least-squares solver for generalized maximum-likelihood ptychography,” Opt. Express 26, 3108–3123 (2018).
[Crossref]

E. H. Tsai, I. Usov, A. Diaz, A. Menzel, and M. Guizar-Sicairos, “X-ray ptychography with extended depth of field,” Opt. Express 24, 29089–29108 (2016).
[Crossref] [PubMed]

J. C. da Silva and A. Menzel, “Elementary signals in ptychography,” Opt. Express 23, 33812–33821 (2015).
[Crossref]

M. Guizar-Sicairos, I. Johnson, A. Diaz, M. Holler, P. Karvinen, H.-C. Stadler, R. Dinapoli, O. Bunk, and A. Menzel, “High-throughput ptychography using Eiger: scanning X-ray nano-imaging of extended regions,” Opt. Express 22, 14859–14870 (2014).
[Crossref] [PubMed]

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

P. Thibault and A. Menzel, “Reconstructing state mixtures from diffraction measurements,” Nature 494, 68–71 (2013).
[Crossref] [PubMed]

F. Zhang, I. Peterson, J. Vila-Comamala, A. Diaz, F. Berenguer, R. Bean, B. Chen, A. Menzel, I. K. Robinson, and J. M. Rodenburg, “Translation position determination in ptychographic coherent diffraction imaging,” Opt. Express 21, 13592–13606 (2013).
[Crossref] [PubMed]

A. Diaz, P. Trtik, M. Guizar-Sicairos, A. Menzel, P. Thibault, and O. Bunk, “Quantitative X-ray phase nanotomography,” Phys. Rev. B 85, 020104 (2012).
[Crossref]

M. Guizar-Sicairos, M. Holler, A. Diaz, J. Vila-Comamala, O. Bunk, and A. Menzel, “Role of the illumination spatial-frequency spectrum for ptychography,” Phys. Rev. B 86, 100103 (2012).
[Crossref]

J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
[Crossref] [PubMed]

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning X-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

Miao, J.

J. Deng, Y. H. Lo, M. Gallagher-Jones, S. Chen, A. Pryor, Q. Jin, Y. P. Hong, Y. S. Nashed, S. Vogt, J. Miao, and C. Jacobsen, “Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae,” Sci. Adv. 4, eaau4548 (2018).
[Crossref] [PubMed]

Mohacsi, I.

I. Mohacsi, I. Vartiainen, B. Rösner, M. Guizar-Sicairos, V. A. Guzenko, I. McNulty, R. Winarski, M. V. Holt, and C. David, “Interlaced zone plate optics for hard X-ray imaging in the 10 nm range,” Sci. Rep. 7, 43624 (2017).
[Crossref]

I. Mohacsi, I. Vartiainen, M. Guizar-Sicairos, P. Karvinen, V. A. Guzenko, E. Müller, E. Färm, M. Ritala, C. M. Kewish, A. Somogyi, and C. David, “High resolution double-sided diffractive optics for hard X-ray microscopy,” Opt. Express 23, 776–786 (2015).
[Crossref] [PubMed]

Morrison, G.

G. Morrison, F. Zhang, A. Gianoncelli, and I. Robinson, “X-ray ptychography using randomized zone plates,” Opt. Express 26, 14915–14927 (2018).
[Crossref] [PubMed]

A. Maiden, G. Morrison, B. Kaulich, A. Gianoncelli, and J. Rodenburg, “Soft X-ray spectromicroscopy using ptychography with randomly phased illumination,” Nat. Commun. 4, 1669 (2013).
[Crossref] [PubMed]

Morrison, G. R.

Muller, D. A.

Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller, “Electron ptychography of 2D materials to deep sub-ångström resolution,” Nature 559, 343 (2018).
[Crossref] [PubMed]

Müller, E.

M. Holler, M. Guizar-Sicairos, E. H. Tsai, R. Dinapoli, E. Müller, O. Bunk, J. Raabe, and G. Aeppli, “High-resolution non-destructive three-dimensional imaging of integrated circuits,” Nature 543, 402–406 (2017).
[Crossref] [PubMed]

I. Mohacsi, I. Vartiainen, M. Guizar-Sicairos, P. Karvinen, V. A. Guzenko, E. Müller, E. Färm, M. Ritala, C. M. Kewish, A. Somogyi, and C. David, “High resolution double-sided diffractive optics for hard X-ray microscopy,” Opt. Express 23, 776–786 (2015).
[Crossref] [PubMed]

Müller-Caspary, K.

J. Verbeeck, A. Béché, K. Müller-Caspary, G. Guzzinati, M. A. Luong, and M. Den Hertog, “Demonstration of a 2× 2 programmable phase plate for electrons,” Ultramicroscopy 190, 58–65 (2018).
[Crossref] [PubMed]

Muñiz-Piniella, A.

Murnane, M.

Murnane, M. M.

D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, D. E. Adams, H. C. Kapteyn, M. M. Murnane, and G. F. Mancini, “Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source,” Nat. Photonics 11, 259 (2017).
[Crossref]

M. D. Seaberg, B. Zhang, D. F. Gardner, E. R. Shanblatt, M. M. Murnane, H. C. Kapteyn, and D. E. Adams, “Tabletop nanometer extreme ultraviolet imaging in an extended reflection mode using coherent fresnel ptychography,” Optica 1, 39–44 (2014).
[Crossref]

Nagler, B.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

Nashed, Y.

C. Jacobsen, J. Deng, and Y. Nashed, “Strategies for high-throughput focused-beam ptychography,” J. Synchrotron Radiat. 24, 1078–1081 (2017).
[Crossref] [PubMed]

Nashed, Y. S.

J. Deng, Y. H. Lo, M. Gallagher-Jones, S. Chen, A. Pryor, Q. Jin, Y. P. Hong, Y. S. Nashed, S. Vogt, J. Miao, and C. Jacobsen, “Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae,” Sci. Adv. 4, eaau4548 (2018).
[Crossref] [PubMed]

J. Deng, D. J. Vine, S. Chen, Q. Jin, Y. S. Nashed, T. Peterka, S. Vogt, and C. Jacobsen, “X-ray ptychographic and fluorescence microscopy of frozen-hydrated cells using continuous scanning,” Sci. Rep. 7, 445 (2017).
[Crossref] [PubMed]

J. Deng, D. J. Vine, S. Chen, Y. S. Nashed, Q. Jin, N. W. Phillips, T. Peterka, R. Ross, S. Vogt, and C. J. Jacobsen, “Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae,” Proc. Natl. Acad. Sci. U. S. A. 112, 2314–2319 (2015).

Nazaretski, E.

X. Huang, H. Yan, E. Nazaretski, R. Conley, N. Bouet, J. Zhou, K. Lauer, L. Li, D. Eom, D. Legnini, R. Harder, I. K. Robinson, and Y. S. Chu, “11 nm hard X-ray focus from a large-aperture multilayer Laue lens,” Sci. Rep. 3, 3562 (2013).
[Crossref] [PubMed]

Nellist, P. D.

S. Gao, P. Wang, F. Zhang, G. T. Martinez, P. D. Nellist, X. Pan, and A. I. Kirkland, “Electron ptychographic microscopy for three-dimensional imaging,” Nat. Commun. 8, 163 (2017).
[Crossref] [PubMed]

Nilsson, D.

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

Nolte, S.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

Nugent, K. A.

D. Vine, D. Pelliccia, C. Holzner, S. B. Baines, A. Berry, I. McNulty, S. Vogt, A. G. Peele, and K. A. Nugent, “Simultaneous X-ray fluorescence and ptychographic microscopy of cyclotella meneghiniana,” Opt. Express 20, 18287–18296 (2012).
[Crossref] [PubMed]

C. T. Putkunz, J. N. Clark, D. J. Vine, G. J. Williams, M. A. Pfeifer, E. Balaur, I. McNulty, K. A. Nugent, and A. G. Peele, “Phase-diverse coherent diffractive imaging: High sensitivity with low dose,” Phys. Rev. Lett. f106, 013903 (2011).
[Crossref]

Odstrcil, M.

Padmore, H.

D. A. Shapiro, R. Celestre, P. Denes, M. Farmand, J. Joseph, A. Kilcoyne, S. Marchesini, H. Padmore, S. V. Venkatakrishnan, T. Warwick, and Y.-S. Yu, “Ptychographic Imaging of Nano-Materials at the Advanced Light Source with the Nanosurveyor Instrument,” J. Phys.: Conf. Ser.849, 012028 (2017).
[Crossref]

Padmore, H. A.

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

Pan, X.

S. Gao, P. Wang, F. Zhang, G. T. Martinez, P. D. Nellist, X. Pan, and A. I. Kirkland, “Electron ptychographic microscopy for three-dimensional imaging,” Nat. Commun. 8, 163 (2017).
[Crossref] [PubMed]

Parfeniukas, K.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

Park, J.

Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller, “Electron ptychography of 2D materials to deep sub-ångström resolution,” Nature 559, 343 (2018).
[Crossref] [PubMed]

Parsons, A. D.

P. Li, D. J. Batey, T. B. Edo, A. D. Parsons, C. Rau, and J. M. Rodenburg, “Multiple mode X-ray ptychography using a lens and a fixed diffuser optic,” J. Opt. 18, 054008 (2016).
[Crossref]

Patommel, J.

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

S. Hönig, R. Hoppe, J. Patommel, A. Schropp, S. Stephan, S. Schöder, M. Burghammer, and C. G. Schroer, “Full optical characterization of coherent x-ray nanobeams by ptychographic imaging,” Opt. Express 19, 16324–16329 (2011).
[Crossref] [PubMed]

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Peele, A. G.

D. Vine, D. Pelliccia, C. Holzner, S. B. Baines, A. Berry, I. McNulty, S. Vogt, A. G. Peele, and K. A. Nugent, “Simultaneous X-ray fluorescence and ptychographic microscopy of cyclotella meneghiniana,” Opt. Express 20, 18287–18296 (2012).
[Crossref] [PubMed]

C. T. Putkunz, J. N. Clark, D. J. Vine, G. J. Williams, M. A. Pfeifer, E. Balaur, I. McNulty, K. A. Nugent, and A. G. Peele, “Phase-diverse coherent diffractive imaging: High sensitivity with low dose,” Phys. Rev. Lett. f106, 013903 (2011).
[Crossref]

Pelliccia, D.

Pešic, Z.

T. Edo, D. Batey, A. Maiden, C. Rau, U. Wagner, Z. Pešić, T. Waigh, and J. Rodenburg, “Sampling in x-ray ptychography,” Phys. Rev. A 87, 053850 (2013).
[Crossref]

Peterka, T.

J. Deng, D. J. Vine, S. Chen, Q. Jin, Y. S. Nashed, T. Peterka, S. Vogt, and C. Jacobsen, “X-ray ptychographic and fluorescence microscopy of frozen-hydrated cells using continuous scanning,” Sci. Rep. 7, 445 (2017).
[Crossref] [PubMed]

J. Deng, D. J. Vine, S. Chen, Y. S. Nashed, Q. Jin, N. W. Phillips, T. Peterka, R. Ross, S. Vogt, and C. J. Jacobsen, “Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae,” Proc. Natl. Acad. Sci. U. S. A. 112, 2314–2319 (2015).

Peterson, I.

Peverini, L.

R. Cerbino, L. Peverini, M. Potenza, A. Robert, P. Bösecke, and M. Giglio, “X-ray-scattering information obtained from near-field speckle,” Nat. Phys. 4, 238–243 (2008).
[Crossref]

Pfeifer, M. A.

C. T. Putkunz, J. N. Clark, D. J. Vine, G. J. Williams, M. A. Pfeifer, E. Balaur, I. McNulty, K. A. Nugent, and A. G. Peele, “Phase-diverse coherent diffractive imaging: High sensitivity with low dose,” Phys. Rev. Lett. f106, 013903 (2011).
[Crossref]

Pfeiffer, F.

F. Pfeiffer, “X-ray ptychography,” Nat. Photonics 12, 9–17 (2018).
[Crossref]

R. M. Clare, M. Stockmar, M. Dierolf, I. Zanette, and F. Pfeiffer, “Characterization of near-field ptychography,” Opt. Express 23, 19728–19742 (2015).
[Crossref] [PubMed]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

K. Giewekemeyer, P. Thibault, S. Kalbfleisch, A. Beerlink, C. M. Kewish, M. Dierolf, F. Pfeiffer, and T. Salditt, “Quantitative biological imaging by ptychographic X-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U. S. A. 107, 529–534 (2010).
[Crossref]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning X-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

O. Bunk, M. Dierolf, S. Kynde, I. Johnson, O. Marti, and F. Pfeiffer, “Influence of the overlap parameter on the convergence of the ptychographical iterative engine,” Ultramicroscopy 108, 481–487 (2008).
[Crossref]

Phillips, N. W.

J. Deng, D. J. Vine, S. Chen, Y. S. Nashed, Q. Jin, N. W. Phillips, T. Peterka, R. Ross, S. Vogt, and C. J. Jacobsen, “Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae,” Proc. Natl. Acad. Sci. U. S. A. 112, 2314–2319 (2015).

Pierce, J. S.

T. R. Harvey, J. S. Pierce, A. K. Agrawal, P. Ercius, M. Linck, and B. J. McMorran, “Efficient diffractive phase optics for electrons,” New J. Phys. 16, 093039 (2014).
[Crossref]

Porter, C.

Porter, C. L.

D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, D. E. Adams, H. C. Kapteyn, M. M. Murnane, and G. F. Mancini, “Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source,” Nat. Photonics 11, 259 (2017).
[Crossref]

Potenza, M.

R. Cerbino, L. Peverini, M. Potenza, A. Robert, P. Bösecke, and M. Giglio, “X-ray-scattering information obtained from near-field speckle,” Nat. Phys. 4, 238–243 (2008).
[Crossref]

Pryor, A.

J. Deng, Y. H. Lo, M. Gallagher-Jones, S. Chen, A. Pryor, Q. Jin, Y. P. Hong, Y. S. Nashed, S. Vogt, J. Miao, and C. Jacobsen, “Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae,” Sci. Adv. 4, eaau4548 (2018).
[Crossref] [PubMed]

Purohit, P.

Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller, “Electron ptychography of 2D materials to deep sub-ångström resolution,” Nature 559, 343 (2018).
[Crossref] [PubMed]

Putkunz, C. T.

C. T. Putkunz, J. N. Clark, D. J. Vine, G. J. Williams, M. A. Pfeifer, E. Balaur, I. McNulty, K. A. Nugent, and A. G. Peele, “Phase-diverse coherent diffractive imaging: High sensitivity with low dose,” Phys. Rev. Lett. f106, 013903 (2011).
[Crossref]

Qian, J.

Raabe, J.

M. Odstrčil, M. Lebugle, T. Lachat, J. Raabe, and M. Holler, “Fast positioning for X-ray scanning microscopy by a combined motion of sample and beam defining optics,” J. Synchrotron Radiat. 26, 504–509 (2019).
[Crossref]

M. Holler, M. Guizar-Sicairos, E. H. Tsai, R. Dinapoli, E. Müller, O. Bunk, J. Raabe, and G. Aeppli, “High-resolution non-destructive three-dimensional imaging of integrated circuits,” Nature 543, 402–406 (2017).
[Crossref] [PubMed]

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

Rahomäki, J.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

Rau, C.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

P. Li, D. J. Batey, T. B. Edo, A. D. Parsons, C. Rau, and J. M. Rodenburg, “Multiple mode X-ray ptychography using a lens and a fixed diffuser optic,” J. Opt. 18, 054008 (2016).
[Crossref]

T. Edo, D. Batey, A. Maiden, C. Rau, U. Wagner, Z. Pešić, T. Waigh, and J. Rodenburg, “Sampling in x-ray ptychography,” Phys. Rev. A 87, 053850 (2013).
[Crossref]

Reichanadter, J.

Ritala, M.

I. Mohacsi, I. Vartiainen, M. Guizar-Sicairos, P. Karvinen, V. A. Guzenko, E. Müller, E. Färm, M. Ritala, C. M. Kewish, A. Somogyi, and C. David, “High resolution double-sided diffractive optics for hard X-ray microscopy,” Opt. Express 23, 776–786 (2015).
[Crossref] [PubMed]

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

Robert, A.

R. Cerbino, L. Peverini, M. Potenza, A. Robert, P. Bösecke, and M. Giglio, “X-ray-scattering information obtained from near-field speckle,” Nat. Phys. 4, 238–243 (2008).
[Crossref]

Robinson, I.

Robinson, I. K.

Rödel, C.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

Rodenburg, J.

A. Maiden, G. Morrison, B. Kaulich, A. Gianoncelli, and J. Rodenburg, “Soft X-ray spectromicroscopy using ptychography with randomly phased illumination,” Nat. Commun. 4, 1669 (2013).
[Crossref] [PubMed]

T. Edo, D. Batey, A. Maiden, C. Rau, U. Wagner, Z. Pešić, T. Waigh, and J. Rodenburg, “Sampling in x-ray ptychography,” Phys. Rev. A 87, 053850 (2013).
[Crossref]

A. Maiden, M. Humphry, M. Sarahan, B. Kraus, and J. Rodenburg, “An annealing algorithm to correct positioning errors in ptychography,” Ultramicroscopy 120, 64–72 (2012).
[Crossref] [PubMed]

M. Humphry, B. Kraus, A. Hurst, A. Maiden, and J. Rodenburg, “Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging,” Nat. Commun. 3, 730 (2012).
[Crossref] [PubMed]

Rodenburg, J. M.

P. Li, D. J. Batey, T. B. Edo, A. D. Parsons, C. Rau, and J. M. Rodenburg, “Multiple mode X-ray ptychography using a lens and a fixed diffuser optic,” J. Opt. 18, 054008 (2016).
[Crossref]

P. Li, T. B. Edo, and J. M. Rodenburg, “Ptychographic inversion via wigner distribution deconvolution: Noise suppression and probe design,” Ultramicroscopy 147, 106–113 (2014).
[Crossref] [PubMed]

D. J. Batey, D. Claus, and J. M. Rodenburg, “Information multiplexing in ptychography,” Ultramicroscopy 138, 13–21 (2014).
[Crossref] [PubMed]

F. Zhang, I. Peterson, J. Vila-Comamala, A. Diaz, F. Berenguer, R. Bean, B. Chen, A. Menzel, I. K. Robinson, and J. M. Rodenburg, “Translation position determination in ptychographic coherent diffraction imaging,” Opt. Express 21, 13592–13606 (2013).
[Crossref] [PubMed]

A. M. Maiden, M. J. Humphry, and J. M. Rodenburg, “Ptychographic transmission microscopy in three dimensions using a multi-slice approach,” J. Opt. Soc. Am. A 29, 1606–1614 (2012).
[Crossref]

A. M. Maiden, M. J. Humphry, F. Zhang, and J. M. Rodenburg, “Superresolution imaging via ptychography,” JOSA A 28, 604–612 (2011).
[Crossref] [PubMed]

A. M. Maiden, J. M. Rodenburg, and M. J. Humphry, “Optical ptychography: a practical implementation with useful resolution,” Opt. Lett. 35, 2585–2587 (2010).
[Crossref] [PubMed]

A. M. Maiden and J. M. Rodenburg, “An improved ptychographical phase retrieval algorithm for diffractive imaging,” Ultramicroscopy 109, 1256–1262 (2009).
[Crossref] [PubMed]

J. M. Rodenburg and H. M. Faulkner, “A phase retrieval algorithm for shifting illumination,” Appl. Phys. Lett 85, 4795–4797 (2004).
[Crossref]

Romijn, J.

V. Guzenko, J. Romijn, J. Vila-Comamala, S. Gorelick, and C. David, “Efficient e-beam lithography exposure strategies for diffractive X-ray optics,” in AIP Conference Proceedings (AIP, 2011), pp. 92–95.
[Crossref]

Rose, H.

M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius, and K. Urban, “Electron microscopy image enhanced,” Nature 392, 768–769 (1998).
[Crossref]

Rösner, B.

I. Mohacsi, I. Vartiainen, B. Rösner, M. Guizar-Sicairos, V. A. Guzenko, I. McNulty, R. Winarski, M. V. Holt, and C. David, “Interlaced zone plate optics for hard X-ray imaging in the 10 nm range,” Sci. Rep. 7, 43624 (2017).
[Crossref]

Ross, R.

J. Deng, D. J. Vine, S. Chen, Y. S. Nashed, Q. Jin, N. W. Phillips, T. Peterka, R. Ross, S. Vogt, and C. J. Jacobsen, “Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae,” Proc. Natl. Acad. Sci. U. S. A. 112, 2314–2319 (2015).

Routkevitch, D.

J. Elam, D. Routkevitch, P. Mardilovich, and S. George, “Conformal coating on ultrahigh-aspect-ratio nanopores of anodic alumina by atomic layer deposition,” Chem. Mater 15, 3507–3517 (2003).
[Crossref]

Sakdinawat, A.

Salditt, T.

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

K. Giewekemeyer, P. Thibault, S. Kalbfleisch, A. Beerlink, C. M. Kewish, M. Dierolf, F. Pfeiffer, and T. Salditt, “Quantitative biological imaging by ptychographic X-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U. S. A. 107, 529–534 (2010).
[Crossref]

Samberg, D.

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Sarahan, M.

A. Maiden, M. Humphry, M. Sarahan, B. Kraus, and J. Rodenburg, “An annealing algorithm to correct positioning errors in ptychography,” Ultramicroscopy 120, 64–72 (2012).
[Crossref] [PubMed]

Schattschneider, P.

J. Verbeeck, H. Tian, and P. Schattschneider, “Production and application of electron vortex beams,” Nature 467, 301 (2010).
[Crossref] [PubMed]

Schatz, M.

M. Van Heel and M. Schatz, “Fourier shell correlation threshold criteria,” J. Struct. Biol. 151, 250–262 (2005).
[Crossref] [PubMed]

Schlichting, I.

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

Schneider, P.

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

Schoder, S.

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Schöder, S.

Scholz, M.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

Schroer, C. G.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

S. Hönig, R. Hoppe, J. Patommel, A. Schropp, S. Stephan, S. Schöder, M. Burghammer, and C. G. Schroer, “Full optical characterization of coherent x-ray nanobeams by ptychographic imaging,” Opt. Express 19, 16324–16329 (2011).
[Crossref] [PubMed]

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Schropp, A.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

S. Hönig, R. Hoppe, J. Patommel, A. Schropp, S. Stephan, S. Schöder, M. Burghammer, and C. G. Schroer, “Full optical characterization of coherent x-ray nanobeams by ptychographic imaging,” Opt. Express 19, 16324–16329 (2011).
[Crossref] [PubMed]

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Schwan, E.

M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius, and K. Urban, “Electron microscopy image enhanced,” Nature 392, 768–769 (1998).
[Crossref]

Seaberg, M. D.

Seiboth, F.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

Shanblatt, E.

Shanblatt, E. R.

D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, D. E. Adams, H. C. Kapteyn, M. M. Murnane, and G. F. Mancini, “Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source,” Nat. Photonics 11, 259 (2017).
[Crossref]

M. D. Seaberg, B. Zhang, D. F. Gardner, E. R. Shanblatt, M. M. Murnane, H. C. Kapteyn, and D. E. Adams, “Tabletop nanometer extreme ultraviolet imaging in an extended reflection mode using coherent fresnel ptychography,” Optica 1, 39–44 (2014).
[Crossref]

Shapiro, D. A.

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

D. A. Shapiro, R. Celestre, P. Denes, M. Farmand, J. Joseph, A. Kilcoyne, S. Marchesini, H. Padmore, S. V. Venkatakrishnan, T. Warwick, and Y.-S. Yu, “Ptychographic Imaging of Nano-Materials at the Advanced Light Source with the Nanosurveyor Instrument,” J. Phys.: Conf. Ser.849, 012028 (2017).
[Crossref]

Shi, B.

Somogyi, A.

Stadler, H.-C.

Stampanoni, M.

K. Wakonig, A. Diaz, A. Bonnin, M. Stampanoni, A. Bergamaschi, J. Ihli, M. Guizar-Sicairos, and A. Menzel, “X-ray Fourier ptychography,” Sci. Adv 5, 0282 (2019).
[Crossref]

Stephan, S.

S. Hönig, R. Hoppe, J. Patommel, A. Schropp, S. Stephan, S. Schöder, M. Burghammer, and C. G. Schroer, “Full optical characterization of coherent x-ray nanobeams by ptychographic imaging,” Opt. Express 19, 16324–16329 (2011).
[Crossref] [PubMed]

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Stockmar, M.

R. M. Clare, M. Stockmar, M. Dierolf, I. Zanette, and F. Pfeiffer, “Characterization of near-field ptychography,” Opt. Express 23, 19728–19742 (2015).
[Crossref] [PubMed]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

Sun, J.

J. Sun, Q. Chen, Y. Zhang, and C. Zuo, “Efficient positional misalignment correction method for Fourier ptychographic microscopy,” Biomed. Opt. 7, 1336–1350 (2016).
[Crossref]

Tanksalvala, M.

D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, D. E. Adams, H. C. Kapteyn, M. M. Murnane, and G. F. Mancini, “Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source,” Nat. Photonics 11, 259 (2017).
[Crossref]

R. Karl, C. Bevis, R. Lopez-Rios, J. Reichanadter, D. Gardner, C. Porter, E. Shanblatt, M. Tanksalvala, G. F. Mancini, M. Murnane, H. Kapteyn, and D. Adams, “Spatial, spectral, and polarization multiplexed ptychography,” Opt. Express 23, 30250–30258 (2015).
[Crossref] [PubMed]

Tate, M. W.

Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller, “Electron ptychography of 2D materials to deep sub-ångström resolution,” Nature 559, 343 (2018).
[Crossref] [PubMed]

Thibault, P.

P. Thibault and A. Menzel, “Reconstructing state mixtures from diffraction measurements,” Nature 494, 68–71 (2013).
[Crossref] [PubMed]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

P. Thibault and M. Guizar-Sicairos, “Maximum-likelihood refinement for coherent diffractive imaging,” New J. Phys. 14, 063004 (2012).
[Crossref]

A. Diaz, P. Trtik, M. Guizar-Sicairos, A. Menzel, P. Thibault, and O. Bunk, “Quantitative X-ray phase nanotomography,” Phys. Rev. B 85, 020104 (2012).
[Crossref]

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

K. Giewekemeyer, P. Thibault, S. Kalbfleisch, A. Beerlink, C. M. Kewish, M. Dierolf, F. Pfeiffer, and T. Salditt, “Quantitative biological imaging by ptychographic X-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U. S. A. 107, 529–534 (2010).
[Crossref]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning X-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

Tian, H.

J. Verbeeck, H. Tian, and P. Schattschneider, “Production and application of electron vortex beams,” Nature 467, 301 (2010).
[Crossref] [PubMed]

Trtik, P.

A. Diaz, P. Trtik, M. Guizar-Sicairos, A. Menzel, P. Thibault, and O. Bunk, “Quantitative X-ray phase nanotomography,” Phys. Rev. B 85, 020104 (2012).
[Crossref]

Tsai, E. H.

M. Holler, M. Guizar-Sicairos, E. H. Tsai, R. Dinapoli, E. Müller, O. Bunk, J. Raabe, and G. Aeppli, “High-resolution non-destructive three-dimensional imaging of integrated circuits,” Nature 543, 402–406 (2017).
[Crossref] [PubMed]

E. H. Tsai, I. Usov, A. Diaz, A. Menzel, and M. Guizar-Sicairos, “X-ray ptychography with extended depth of field,” Opt. Express 24, 29089–29108 (2016).
[Crossref] [PubMed]

Tu, Y.-C.

S. Marchesini, Y.-C. Tu, and H. Wu, “Alternating projection, ptychographic imaging and phase synchronization,” Appl. Comput. Harmon. Analysis 41, 815–851 (2015).

Tyliszczak, T.

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

Uhlemann, S.

M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius, and K. Urban, “Electron microscopy image enhanced,” Nature 392, 768–769 (1998).
[Crossref]

Uhlen, F.

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

Ullsperger, T.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

Urban, K.

M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius, and K. Urban, “Electron microscopy image enhanced,” Nature 392, 768–769 (1998).
[Crossref]

Usov, I.

Van Heel, M.

M. Van Heel and M. Schatz, “Fourier shell correlation threshold criteria,” J. Struct. Biol. 151, 250–262 (2005).
[Crossref] [PubMed]

Vartanyants, I. A.

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Vartiainen, I.

I. Mohacsi, I. Vartiainen, B. Rösner, M. Guizar-Sicairos, V. A. Guzenko, I. McNulty, R. Winarski, M. V. Holt, and C. David, “Interlaced zone plate optics for hard X-ray imaging in the 10 nm range,” Sci. Rep. 7, 43624 (2017).
[Crossref]

I. Mohacsi, I. Vartiainen, M. Guizar-Sicairos, P. Karvinen, V. A. Guzenko, E. Müller, E. Färm, M. Ritala, C. M. Kewish, A. Somogyi, and C. David, “High resolution double-sided diffractive optics for hard X-ray microscopy,” Opt. Express 23, 776–786 (2015).
[Crossref] [PubMed]

Venkatakrishnan, S. V.

D. A. Shapiro, R. Celestre, P. Denes, M. Farmand, J. Joseph, A. Kilcoyne, S. Marchesini, H. Padmore, S. V. Venkatakrishnan, T. Warwick, and Y.-S. Yu, “Ptychographic Imaging of Nano-Materials at the Advanced Light Source with the Nanosurveyor Instrument,” J. Phys.: Conf. Ser.849, 012028 (2017).
[Crossref]

Verbeeck, J.

J. Verbeeck, A. Béché, K. Müller-Caspary, G. Guzzinati, M. A. Luong, and M. Den Hertog, “Demonstration of a 2× 2 programmable phase plate for electrons,” Ultramicroscopy 190, 58–65 (2018).
[Crossref] [PubMed]

J. Verbeeck, H. Tian, and P. Schattschneider, “Production and application of electron vortex beams,” Nature 467, 301 (2010).
[Crossref] [PubMed]

Vila-Comamala, J.

F. Zhang, I. Peterson, J. Vila-Comamala, A. Diaz, F. Berenguer, R. Bean, B. Chen, A. Menzel, I. K. Robinson, and J. M. Rodenburg, “Translation position determination in ptychographic coherent diffraction imaging,” Opt. Express 21, 13592–13606 (2013).
[Crossref] [PubMed]

M. Guizar-Sicairos, M. Holler, A. Diaz, J. Vila-Comamala, O. Bunk, and A. Menzel, “Role of the illumination spatial-frequency spectrum for ptychography,” Phys. Rev. B 86, 100103 (2012).
[Crossref]

J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
[Crossref] [PubMed]

C. M. Kewish, M. Guizar-Sicairos, C. Liu, J. Qian, B. Shi, C. Benson, A. M. Khounsary, J. Vila-Comamala, O. Bunk, J. R. Fienup, A. T. Macrander, and L. Assoufid, “Reconstruction of an astigmatic hard X-ray beam and alignment of KB mirrors from ptychographic coherent diffraction data,” Opt. Express 18, 23420–23427 (2010).
[Crossref] [PubMed]

S. Gorelick, V. A. Guzenko, J. Vila-Comamala, and C. David, “Direct e-beam writing of dense and high aspect ratio nanostructures in thick layers of pmma for electroplating,” Nanotechnology 21, 295303 (2010).
[Crossref] [PubMed]

V. Guzenko, J. Romijn, J. Vila-Comamala, S. Gorelick, and C. David, “Efficient e-beam lithography exposure strategies for diffractive X-ray optics,” in AIP Conference Proceedings (AIP, 2011), pp. 92–95.
[Crossref]

Vine, D.

Vine, D. J.

J. Deng, D. J. Vine, S. Chen, Q. Jin, Y. S. Nashed, T. Peterka, S. Vogt, and C. Jacobsen, “X-ray ptychographic and fluorescence microscopy of frozen-hydrated cells using continuous scanning,” Sci. Rep. 7, 445 (2017).
[Crossref] [PubMed]

J. Deng, D. J. Vine, S. Chen, Y. S. Nashed, Q. Jin, N. W. Phillips, T. Peterka, R. Ross, S. Vogt, and C. J. Jacobsen, “Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae,” Proc. Natl. Acad. Sci. U. S. A. 112, 2314–2319 (2015).

X. Huang, M. Wojcik, N. Burdet, I. Peterson, G. R. Morrison, D. J. Vine, D. Legnini, R. Harder, Y. S. Chu, and I. K. Robinson, “Quantitative X-ray wavefront measurements of fresnel zone plate and KB mirrors using phase retrieval,” Opt. Express 20, 24038–24048 (2012).
[Crossref] [PubMed]

C. T. Putkunz, J. N. Clark, D. J. Vine, G. J. Williams, M. A. Pfeifer, E. Balaur, I. McNulty, K. A. Nugent, and A. G. Peele, “Phase-diverse coherent diffractive imaging: High sensitivity with low dose,” Phys. Rev. Lett. f106, 013903 (2011).
[Crossref]

Vogt, S.

J. Deng, Y. H. Lo, M. Gallagher-Jones, S. Chen, A. Pryor, Q. Jin, Y. P. Hong, Y. S. Nashed, S. Vogt, J. Miao, and C. Jacobsen, “Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae,” Sci. Adv. 4, eaau4548 (2018).
[Crossref] [PubMed]

J. Deng, D. J. Vine, S. Chen, Q. Jin, Y. S. Nashed, T. Peterka, S. Vogt, and C. Jacobsen, “X-ray ptychographic and fluorescence microscopy of frozen-hydrated cells using continuous scanning,” Sci. Rep. 7, 445 (2017).
[Crossref] [PubMed]

J. Deng, D. J. Vine, S. Chen, Y. S. Nashed, Q. Jin, N. W. Phillips, T. Peterka, R. Ross, S. Vogt, and C. J. Jacobsen, “Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae,” Proc. Natl. Acad. Sci. U. S. A. 112, 2314–2319 (2015).

D. Vine, D. Pelliccia, C. Holzner, S. B. Baines, A. Berry, I. McNulty, S. Vogt, A. G. Peele, and K. A. Nugent, “Simultaneous X-ray fluorescence and ptychographic microscopy of cyclotella meneghiniana,” Opt. Express 20, 18287–18296 (2012).
[Crossref] [PubMed]

Vogt, U.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

Von Koenig, K.

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

Wagner, U.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

T. Edo, D. Batey, A. Maiden, C. Rau, U. Wagner, Z. Pešić, T. Waigh, and J. Rodenburg, “Sampling in x-ray ptychography,” Phys. Rev. A 87, 053850 (2013).
[Crossref]

Waigh, T.

T. Edo, D. Batey, A. Maiden, C. Rau, U. Wagner, Z. Pešić, T. Waigh, and J. Rodenburg, “Sampling in x-ray ptychography,” Phys. Rev. A 87, 053850 (2013).
[Crossref]

Wakonig, K.

K. Wakonig, A. Diaz, A. Bonnin, M. Stampanoni, A. Bergamaschi, J. Ihli, M. Guizar-Sicairos, and A. Menzel, “X-ray Fourier ptychography,” Sci. Adv 5, 0282 (2019).
[Crossref]

Wang, P.

S. Gao, P. Wang, F. Zhang, G. T. Martinez, P. D. Nellist, X. Pan, and A. I. Kirkland, “Electron ptychographic microscopy for three-dimensional imaging,” Nat. Commun. 8, 163 (2017).
[Crossref] [PubMed]

Warwick, T.

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

D. A. Shapiro, R. Celestre, P. Denes, M. Farmand, J. Joseph, A. Kilcoyne, S. Marchesini, H. Padmore, S. V. Venkatakrishnan, T. Warwick, and Y.-S. Yu, “Ptychographic Imaging of Nano-Materials at the Advanced Light Source with the Nanosurveyor Instrument,” J. Phys.: Conf. Ser.849, 012028 (2017).
[Crossref]

Weckert, E.

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Wepf, R.

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

Werner, C. L.

R. M. Goldstein, H. A. Zebker, and C. L. Werner, “Satellite radar interferometry: Two-dimensional phase unwrapping,” Radio Science 23, 713–720 (1988).
[Crossref]

Wilke, R.

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Williams, G. J.

C. T. Putkunz, J. N. Clark, D. J. Vine, G. J. Williams, M. A. Pfeifer, E. Balaur, I. McNulty, K. A. Nugent, and A. G. Peele, “Phase-diverse coherent diffractive imaging: High sensitivity with low dose,” Phys. Rev. Lett. f106, 013903 (2011).
[Crossref]

Winarski, R.

I. Mohacsi, I. Vartiainen, B. Rösner, M. Guizar-Sicairos, V. A. Guzenko, I. McNulty, R. Winarski, M. V. Holt, and C. David, “Interlaced zone plate optics for hard X-ray imaging in the 10 nm range,” Sci. Rep. 7, 43624 (2017).
[Crossref]

Wittwer, F.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

Wojcik, M.

Wu, H.

S. Marchesini, Y.-C. Tu, and H. Wu, “Alternating projection, ptychographic imaging and phase synchronization,” Appl. Comput. Harmon. Analysis 41, 815–851 (2015).

Wünsche, M.

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

Xie, S.

Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller, “Electron ptychography of 2D materials to deep sub-ångström resolution,” Nature 559, 343 (2018).
[Crossref] [PubMed]

Yacoot, A.

Yan, H.

X. Huang, H. Yan, R. Harder, Y. Hwu, I. K. Robinson, and Y. S. Chu, “Optimization of overlap uniformness for ptychography,” Opt. Express 22, 12634–12644 (2014).
[Crossref] [PubMed]

X. Huang, H. Yan, E. Nazaretski, R. Conley, N. Bouet, J. Zhou, K. Lauer, L. Li, D. Eom, D. Legnini, R. Harder, I. K. Robinson, and Y. S. Chu, “11 nm hard X-ray focus from a large-aperture multilayer Laue lens,” Sci. Rep. 3, 3562 (2013).
[Crossref] [PubMed]

Yang, C.

G. Zheng, R. Horstmeyer, and C. Yang, “Wide-field, high-resolution Fourier ptychographic microscopy,” Nat. Photon. 7, 739–745 (2013).
[Crossref]

Yang, L. L.

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

Yu, Y.-S.

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

D. A. Shapiro, R. Celestre, P. Denes, M. Farmand, J. Joseph, A. Kilcoyne, S. Marchesini, H. Padmore, S. V. Venkatakrishnan, T. Warwick, and Y.-S. Yu, “Ptychographic Imaging of Nano-Materials at the Advanced Light Source with the Nanosurveyor Instrument,” J. Phys.: Conf. Ser.849, 012028 (2017).
[Crossref]

Zanette, I.

R. M. Clare, M. Stockmar, M. Dierolf, I. Zanette, and F. Pfeiffer, “Characterization of near-field ptychography,” Opt. Express 23, 19728–19742 (2015).
[Crossref] [PubMed]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

Zastrau, U.

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

Zebker, H. A.

R. M. Goldstein, H. A. Zebker, and C. L. Werner, “Satellite radar interferometry: Two-dimensional phase unwrapping,” Radio Science 23, 713–720 (1988).
[Crossref]

Zhang, B.

Zhang, F.

G. Morrison, F. Zhang, A. Gianoncelli, and I. Robinson, “X-ray ptychography using randomized zone plates,” Opt. Express 26, 14915–14927 (2018).
[Crossref] [PubMed]

S. Gao, P. Wang, F. Zhang, G. T. Martinez, P. D. Nellist, X. Pan, and A. I. Kirkland, “Electron ptychographic microscopy for three-dimensional imaging,” Nat. Commun. 8, 163 (2017).
[Crossref] [PubMed]

F. Zhang, I. Peterson, J. Vila-Comamala, A. Diaz, F. Berenguer, R. Bean, B. Chen, A. Menzel, I. K. Robinson, and J. M. Rodenburg, “Translation position determination in ptychographic coherent diffraction imaging,” Opt. Express 21, 13592–13606 (2013).
[Crossref] [PubMed]

A. M. Maiden, M. J. Humphry, F. Zhang, and J. M. Rodenburg, “Superresolution imaging via ptychography,” JOSA A 28, 604–612 (2011).
[Crossref] [PubMed]

Zhang, X.

D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, D. E. Adams, H. C. Kapteyn, M. M. Murnane, and G. F. Mancini, “Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source,” Nat. Photonics 11, 259 (2017).
[Crossref]

Zhang, Y.

J. Sun, Q. Chen, Y. Zhang, and C. Zuo, “Efficient positional misalignment correction method for Fourier ptychographic microscopy,” Biomed. Opt. 7, 1336–1350 (2016).
[Crossref]

Zheng, G.

G. Zheng, R. Horstmeyer, and C. Yang, “Wide-field, high-resolution Fourier ptychographic microscopy,” Nat. Photon. 7, 739–745 (2013).
[Crossref]

Zhou, J.

X. Huang, H. Yan, E. Nazaretski, R. Conley, N. Bouet, J. Zhou, K. Lauer, L. Li, D. Eom, D. Legnini, R. Harder, I. K. Robinson, and Y. S. Chu, “11 nm hard X-ray focus from a large-aperture multilayer Laue lens,” Sci. Rep. 3, 3562 (2013).
[Crossref] [PubMed]

Zuo, C.

J. Sun, Q. Chen, Y. Zhang, and C. Zuo, “Efficient positional misalignment correction method for Fourier ptychographic microscopy,” Biomed. Opt. 7, 1336–1350 (2016).
[Crossref]

Appl. Comput. Harmon. Analysis (1)

S. Marchesini, Y.-C. Tu, and H. Wu, “Alternating projection, ptychographic imaging and phase synchronization,” Appl. Comput. Harmon. Analysis 41, 815–851 (2015).

Appl. Phys. Lett (2)

J. M. Rodenburg and H. M. Faulkner, “A phase retrieval algorithm for shifting illumination,” Appl. Phys. Lett 85, 4795–4797 (2004).
[Crossref]

A. Schropp, P. Boye, J. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schoder, M. Burghammer, and C. G. Schroer, “Hard x-ray nanobeam characterization by coherent diffraction microscopy,” Appl. Phys. Lett 96, 091102 (2010).
[Crossref]

Biomed. Opt. (1)

J. Sun, Q. Chen, Y. Zhang, and C. Zuo, “Efficient positional misalignment correction method for Fourier ptychographic microscopy,” Biomed. Opt. 7, 1336–1350 (2016).
[Crossref]

Chem. Mater (1)

J. Elam, D. Routkevitch, P. Mardilovich, and S. George, “Conformal coating on ultrahigh-aspect-ratio nanopores of anodic alumina by atomic layer deposition,” Chem. Mater 15, 3507–3517 (2003).
[Crossref]

J. Opt. (1)

P. Li, D. J. Batey, T. B. Edo, A. D. Parsons, C. Rau, and J. M. Rodenburg, “Multiple mode X-ray ptychography using a lens and a fixed diffuser optic,” J. Opt. 18, 054008 (2016).
[Crossref]

J. Opt. Soc. Am. A (1)

J. Struct. Biol. (1)

M. Van Heel and M. Schatz, “Fourier shell correlation threshold criteria,” J. Struct. Biol. 151, 250–262 (2005).
[Crossref] [PubMed]

J. Synchrotron Radiat. (2)

M. Odstrčil, M. Lebugle, T. Lachat, J. Raabe, and M. Holler, “Fast positioning for X-ray scanning microscopy by a combined motion of sample and beam defining optics,” J. Synchrotron Radiat. 26, 504–509 (2019).
[Crossref]

C. Jacobsen, J. Deng, and Y. Nashed, “Strategies for high-throughput focused-beam ptychography,” J. Synchrotron Radiat. 24, 1078–1081 (2017).
[Crossref] [PubMed]

JOSA A (1)

A. M. Maiden, M. J. Humphry, F. Zhang, and J. M. Rodenburg, “Superresolution imaging via ptychography,” JOSA A 28, 604–612 (2011).
[Crossref] [PubMed]

Nanotechnology (1)

S. Gorelick, V. A. Guzenko, J. Vila-Comamala, and C. David, “Direct e-beam writing of dense and high aspect ratio nanostructures in thick layers of pmma for electroplating,” Nanotechnology 21, 295303 (2010).
[Crossref] [PubMed]

Nat. Commun. (4)

A. Maiden, G. Morrison, B. Kaulich, A. Gianoncelli, and J. Rodenburg, “Soft X-ray spectromicroscopy using ptychography with randomly phased illumination,” Nat. Commun. 4, 1669 (2013).
[Crossref] [PubMed]

F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wünsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, S. Giakoumidis, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, “Perfect X-ray focusing via fitting corrective glasses to aberrated optics,” Nat. Commun. 8, 14623 (2017).
[Crossref] [PubMed]

S. Gao, P. Wang, F. Zhang, G. T. Martinez, P. D. Nellist, X. Pan, and A. I. Kirkland, “Electron ptychographic microscopy for three-dimensional imaging,” Nat. Commun. 8, 163 (2017).
[Crossref] [PubMed]

M. Humphry, B. Kraus, A. Hurst, A. Maiden, and J. Rodenburg, “Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging,” Nat. Commun. 3, 730 (2012).
[Crossref] [PubMed]

Nat. Photon. (1)

G. Zheng, R. Horstmeyer, and C. Yang, “Wide-field, high-resolution Fourier ptychographic microscopy,” Nat. Photon. 7, 739–745 (2013).
[Crossref]

Nat. Photonics (3)

F. Pfeiffer, “X-ray ptychography,” Nat. Photonics 12, 9–17 (2018).
[Crossref]

D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, D. E. Adams, H. C. Kapteyn, M. M. Murnane, and G. F. Mancini, “Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source,” Nat. Photonics 11, 259 (2017).
[Crossref]

D. A. Shapiro, Y.-S. Yu, T. Tyliszczak, J. Cabana, R. Celestre, W. Chao, K. Kaznatcheev, A. D. Kilcoyne, F. Maia, S. Marchesini, Y. S. Meng, T. Warwick, L. L. Yang, and H. A. Padmore, “Chemical composition mapping with nanometre resolution by softX-ray microscopy,” Nat. Photonics 8, 765–769 (2014).
[Crossref]

Nat. Phys. (1)

R. Cerbino, L. Peverini, M. Potenza, A. Robert, P. Bösecke, and M. Giglio, “X-ray-scattering information obtained from near-field speckle,” Nat. Phys. 4, 238–243 (2008).
[Crossref]

Nature (7)

M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius, and K. Urban, “Electron microscopy image enhanced,” Nature 392, 768–769 (1998).
[Crossref]

P. Batson, N. Dellby, and O. Krivanek, “Sub-ångstrom resolution using aberration corrected electron optics,” Nature 418, 617–620 (2002).
[Crossref] [PubMed]

P. Thibault and A. Menzel, “Reconstructing state mixtures from diffraction measurements,” Nature 494, 68–71 (2013).
[Crossref] [PubMed]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M. W. Tate, J. Park, S. M. Gruner, V. Elser, and D. A. Muller, “Electron ptychography of 2D materials to deep sub-ångström resolution,” Nature 559, 343 (2018).
[Crossref] [PubMed]

M. Holler, M. Guizar-Sicairos, E. H. Tsai, R. Dinapoli, E. Müller, O. Bunk, J. Raabe, and G. Aeppli, “High-resolution non-destructive three-dimensional imaging of integrated circuits,” Nature 543, 402–406 (2017).
[Crossref] [PubMed]

J. Verbeeck, H. Tian, and P. Schattschneider, “Production and application of electron vortex beams,” Nature 467, 301 (2010).
[Crossref] [PubMed]

New J. Phys. (3)

T. R. Harvey, J. S. Pierce, A. K. Agrawal, P. Ercius, M. Linck, and B. J. McMorran, “Efficient diffractive phase optics for electrons,” New J. Phys. 16, 093039 (2014).
[Crossref]

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

P. Thibault and M. Guizar-Sicairos, “Maximum-likelihood refinement for coherent diffractive imaging,” New J. Phys. 14, 063004 (2012).
[Crossref]

Opt. Express (19)

S. Marchesini and A. Sakdinawat, “Shaping coherent x-rays with binary optics,” Opt. Express 27, 907–917 (2019).
[Crossref] [PubMed]

G. Morrison, F. Zhang, A. Gianoncelli, and I. Robinson, “X-ray ptychography using randomized zone plates,” Opt. Express 26, 14915–14927 (2018).
[Crossref] [PubMed]

M. Guizar-Sicairos, I. Johnson, A. Diaz, M. Holler, P. Karvinen, H.-C. Stadler, R. Dinapoli, O. Bunk, and A. Menzel, “High-throughput ptychography using Eiger: scanning X-ray nano-imaging of extended regions,” Opt. Express 22, 14859–14870 (2014).
[Crossref] [PubMed]

D. Vine, D. Pelliccia, C. Holzner, S. B. Baines, A. Berry, I. McNulty, S. Vogt, A. G. Peele, and K. A. Nugent, “Simultaneous X-ray fluorescence and ptychographic microscopy of cyclotella meneghiniana,” Opt. Express 20, 18287–18296 (2012).
[Crossref] [PubMed]

I. Mohacsi, I. Vartiainen, M. Guizar-Sicairos, P. Karvinen, V. A. Guzenko, E. Müller, E. Färm, M. Ritala, C. M. Kewish, A. Somogyi, and C. David, “High resolution double-sided diffractive optics for hard X-ray microscopy,” Opt. Express 23, 776–786 (2015).
[Crossref] [PubMed]

J. C. da Silva and A. Menzel, “Elementary signals in ptychography,” Opt. Express 23, 33812–33821 (2015).
[Crossref]

R. M. Clare, M. Stockmar, M. Dierolf, I. Zanette, and F. Pfeiffer, “Characterization of near-field ptychography,” Opt. Express 23, 19728–19742 (2015).
[Crossref] [PubMed]

T. Godden, A. Muñiz-Piniella, J. Claverley, A. Yacoot, and M. Humphry, “Phase calibration target for quantitative phase imaging with ptychography,” Opt. Express 24, 7679–7692 (2016).
[Crossref] [PubMed]

X. Huang, H. Yan, R. Harder, Y. Hwu, I. K. Robinson, and Y. S. Chu, “Optimization of overlap uniformness for ptychography,” Opt. Express 22, 12634–12644 (2014).
[Crossref] [PubMed]

F. Zhang, I. Peterson, J. Vila-Comamala, A. Diaz, F. Berenguer, R. Bean, B. Chen, A. Menzel, I. K. Robinson, and J. M. Rodenburg, “Translation position determination in ptychographic coherent diffraction imaging,” Opt. Express 21, 13592–13606 (2013).
[Crossref] [PubMed]

R. Karl, C. Bevis, R. Lopez-Rios, J. Reichanadter, D. Gardner, C. Porter, E. Shanblatt, M. Tanksalvala, G. F. Mancini, M. Murnane, H. Kapteyn, and D. Adams, “Spatial, spectral, and polarization multiplexed ptychography,” Opt. Express 23, 30250–30258 (2015).
[Crossref] [PubMed]

M. Guizar-Sicairos and J. R. Fienup, “Phase retrieval with transverse translation diversity: a nonlinear optimization approach,” Opt. Express 16, 7264–7278 (2008).
[Crossref] [PubMed]

M. Odstrčil, P. Baksh, S. Boden, R. Card, J. Chad, J. Frey, and W. Brocklesby, “Ptychographic coherent diffractive imaging with orthogonal probe relaxation,” Opt. Express 24, 8360–8369 (2016).
[Crossref]

M. Odstrčil, A. Menzel, and M. Guizar-Sicairos, “Iterative least-squares solver for generalized maximum-likelihood ptychography,” Opt. Express 26, 3108–3123 (2018).
[Crossref]

E. H. Tsai, I. Usov, A. Diaz, A. Menzel, and M. Guizar-Sicairos, “X-ray ptychography with extended depth of field,” Opt. Express 24, 29089–29108 (2016).
[Crossref] [PubMed]

C. M. Kewish, M. Guizar-Sicairos, C. Liu, J. Qian, B. Shi, C. Benson, A. M. Khounsary, J. Vila-Comamala, O. Bunk, J. R. Fienup, A. T. Macrander, and L. Assoufid, “Reconstruction of an astigmatic hard X-ray beam and alignment of KB mirrors from ptychographic coherent diffraction data,” Opt. Express 18, 23420–23427 (2010).
[Crossref] [PubMed]

J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
[Crossref] [PubMed]

S. Hönig, R. Hoppe, J. Patommel, A. Schropp, S. Stephan, S. Schöder, M. Burghammer, and C. G. Schroer, “Full optical characterization of coherent x-ray nanobeams by ptychographic imaging,” Opt. Express 19, 16324–16329 (2011).
[Crossref] [PubMed]

X. Huang, M. Wojcik, N. Burdet, I. Peterson, G. R. Morrison, D. J. Vine, D. Legnini, R. Harder, Y. S. Chu, and I. K. Robinson, “Quantitative X-ray wavefront measurements of fresnel zone plate and KB mirrors using phase retrieval,” Opt. Express 20, 24038–24048 (2012).
[Crossref] [PubMed]

Opt. Lett. (1)

Optica (1)

Phys. Rev. A (1)

T. Edo, D. Batey, A. Maiden, C. Rau, U. Wagner, Z. Pešić, T. Waigh, and J. Rodenburg, “Sampling in x-ray ptychography,” Phys. Rev. A 87, 053850 (2013).
[Crossref]

Phys. Rev. B (2)

A. Diaz, P. Trtik, M. Guizar-Sicairos, A. Menzel, P. Thibault, and O. Bunk, “Quantitative X-ray phase nanotomography,” Phys. Rev. B 85, 020104 (2012).
[Crossref]

M. Guizar-Sicairos, M. Holler, A. Diaz, J. Vila-Comamala, O. Bunk, and A. Menzel, “Role of the illumination spatial-frequency spectrum for ptychography,” Phys. Rev. B 86, 100103 (2012).
[Crossref]

Phys. Rev. Lett. (1)

C. T. Putkunz, J. N. Clark, D. J. Vine, G. J. Williams, M. A. Pfeifer, E. Balaur, I. McNulty, K. A. Nugent, and A. G. Peele, “Phase-diverse coherent diffractive imaging: High sensitivity with low dose,” Phys. Rev. Lett. f106, 013903 (2011).
[Crossref]

Proc. Natl. Acad. Sci. U. S. A. (2)

K. Giewekemeyer, P. Thibault, S. Kalbfleisch, A. Beerlink, C. M. Kewish, M. Dierolf, F. Pfeiffer, and T. Salditt, “Quantitative biological imaging by ptychographic X-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U. S. A. 107, 529–534 (2010).
[Crossref]

J. Deng, D. J. Vine, S. Chen, Y. S. Nashed, Q. Jin, N. W. Phillips, T. Peterka, R. Ross, S. Vogt, and C. J. Jacobsen, “Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae,” Proc. Natl. Acad. Sci. U. S. A. 112, 2314–2319 (2015).

Radio Science (1)

R. M. Goldstein, H. A. Zebker, and C. L. Werner, “Satellite radar interferometry: Two-dimensional phase unwrapping,” Radio Science 23, 713–720 (1988).
[Crossref]

Sci. Adv (1)

K. Wakonig, A. Diaz, A. Bonnin, M. Stampanoni, A. Bergamaschi, J. Ihli, M. Guizar-Sicairos, and A. Menzel, “X-ray Fourier ptychography,” Sci. Adv 5, 0282 (2019).
[Crossref]

Sci. Adv. (1)

J. Deng, Y. H. Lo, M. Gallagher-Jones, S. Chen, A. Pryor, Q. Jin, Y. P. Hong, Y. S. Nashed, S. Vogt, J. Miao, and C. Jacobsen, “Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae,” Sci. Adv. 4, eaau4548 (2018).
[Crossref] [PubMed]

Sci. Rep. (6)

J. Deng, D. J. Vine, S. Chen, Q. Jin, Y. S. Nashed, T. Peterka, S. Vogt, and C. Jacobsen, “X-ray ptychographic and fluorescence microscopy of frozen-hydrated cells using continuous scanning,” Sci. Rep. 7, 445 (2017).
[Crossref] [PubMed]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

I. Mohacsi, I. Vartiainen, B. Rösner, M. Guizar-Sicairos, V. A. Guzenko, I. McNulty, R. Winarski, M. V. Holt, and C. David, “Interlaced zone plate optics for hard X-ray imaging in the 10 nm range,” Sci. Rep. 7, 43624 (2017).
[Crossref]

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

X. Huang, H. Yan, E. Nazaretski, R. Conley, N. Bouet, J. Zhou, K. Lauer, L. Li, D. Eom, D. Legnini, R. Harder, I. K. Robinson, and Y. S. Chu, “11 nm hard X-ray focus from a large-aperture multilayer Laue lens,” Sci. Rep. 3, 3562 (2013).
[Crossref] [PubMed]

A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and S. Christian, “Full spatial characterization of a nanofocused X-rayfree-electron laser beam by ptychographic imaging,” Sci. Rep. 3, 1633 (2013).
[Crossref]

Science (1)

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning X-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

Ultramicroscopy (7)

A. M. Maiden and J. M. Rodenburg, “An improved ptychographical phase retrieval algorithm for diffractive imaging,” Ultramicroscopy 109, 1256–1262 (2009).
[Crossref] [PubMed]

A. Maiden, M. Humphry, M. Sarahan, B. Kraus, and J. Rodenburg, “An annealing algorithm to correct positioning errors in ptychography,” Ultramicroscopy 120, 64–72 (2012).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

D. J. Batey, D. Claus, and J. M. Rodenburg, “Information multiplexing in ptychography,” Ultramicroscopy 138, 13–21 (2014).
[Crossref] [PubMed]

J. Verbeeck, A. Béché, K. Müller-Caspary, G. Guzzinati, M. A. Luong, and M. Den Hertog, “Demonstration of a 2× 2 programmable phase plate for electrons,” Ultramicroscopy 190, 58–65 (2018).
[Crossref] [PubMed]

O. Bunk, M. Dierolf, S. Kynde, I. Johnson, O. Marti, and F. Pfeiffer, “Influence of the overlap parameter on the convergence of the ptychographical iterative engine,” Ultramicroscopy 108, 481–487 (2008).
[Crossref]

P. Li, T. B. Edo, and J. M. Rodenburg, “Ptychographic inversion via wigner distribution deconvolution: Noise suppression and probe design,” Ultramicroscopy 147, 106–113 (2014).
[Crossref] [PubMed]

Other (3)

V. Guzenko, J. Romijn, J. Vila-Comamala, S. Gorelick, and C. David, “Efficient e-beam lithography exposure strategies for diffractive X-ray optics,” in AIP Conference Proceedings (AIP, 2011), pp. 92–95.
[Crossref]

M. Odstrcil and M. Holler, “X-ray dataset for Illumination improvements for high-resolution ptychography,” http://dx.doi.org/10.5281/zenodo.2639759 (2019).

D. A. Shapiro, R. Celestre, P. Denes, M. Farmand, J. Joseph, A. Kilcoyne, S. Marchesini, H. Padmore, S. V. Venkatakrishnan, T. Warwick, and Y.-S. Yu, “Ptychographic Imaging of Nano-Materials at the Advanced Light Source with the Nanosurveyor Instrument,” J. Phys.: Conf. Ser.849, 012028 (2017).
[Crossref]

Supplementary Material (2)

NameDescription
» Dataset 1       GDS schemas of the tested Fresnel zone plates that can be used in e-beam lithography to replicate our perturbated zone plates.
» Visualization 1       Reconstructed time evolution of the complex-valued illumination probe (left column) and corresponding far-field amplitude (right column). The top row shows illumination formed by a conventional Fresnel zone plate and the bottom row illumination forme

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (8)

Fig. 1
Fig. 1 Images (a-c) show horizontal components ΔXDVF of the designed DVF for each of the tested spatial frequencies ka in Table 1 and maximal DVF amplitude of 180 nm. Images (d-f) show corresponding measured wavefront aberrations for FZP13, 23 and 33 after subtraction of the reference aberration-free phase wavefront measured on the reference FZP11. The white regions in centers of the images (d-f) could not be measureddue to the central stop. Image (g) shows a scanning electron microscopy (SEM) image of FZP11 (left) and FZP33 (right), where the Moire pattern between the SEM scanning lines and the zone structures clearly highlights the irregularities of the local zonewidths. A detail of the zones is shown in (h).
Fig. 2
Fig. 2 Normalized amplitude of the reconstructed probes for each of the tested Fresnel zone plates listed in Table 1(a) at the sample plane and (b) at the detector plane. In (b) the dark regions in center of the propagated patterns are caused by the central stop. The images of the real-space amplitudes in (a) are cropped from 14×14 μm2 down to 7×7 μm2 and the far-field amplitudes in (b) were cropped down to 19×19 mm2 for better visualization of the effects of the wavefront modulation.
Fig. 3
Fig. 3 Radially integrated intensity distribution (RIID), see Eq. (2), for each of the tested FZPs at the sample plane (a) and at the beam focus plane (b).
Fig. 4
Fig. 4 Calculated beam intensity in the focal plane for each of the tested lenses with S denoting the Strehl ratio. The Strehl ratio was estimated as the ratio of the peak intensity at the focus versus the peak intensity at focus expected from an aberration-free lens.
Fig. 5
Fig. 5 Unwrapped phase of a reconstruction from a fluid catalytic cracking (FCC) catalyst particle. Images (a,b) show reconstructions using ePIE, (c,d) shows the same datasets reconstructed by DM+LSQ-ML. The dataset used in (a,c) was acquired with the reference FZP11, while the dataset in (b,d) was acquired with the FZP33, which has wavefront modulations of the highest amplitude and spatial frequency. The color scale was selected to cover the full range of the phase values for each reconstruction separately. The phase ramp and phase offset were subtracted. Line cuts though the reconstructed phase are presented in Fig. 6.
Fig. 6
Fig. 6 Visualization of horizontal cuts through the reconstructions depicted in Fig. 5, (a) cut through center of the FCC particle, and (b) cut through the air region above the sample. The lines correspond to the average phase and the shadedareas to the standard deviation calculated from four subsequent ptychographic scans of the catalyst particle that were reconstructed independently.
Fig. 7
Fig. 7 Examples of the Siemens star reconstructions with FZP11 (a,b) and with FZP33 (c,d). Conventional single-probe ptychography reconstructions by the LSQ-ML method are shown in (a,c) and identical datasets reconstructed by the LSQ-ML method with additional two orthogonal relaxation modes are shown in (b,d). Insets show in detail the center of the Siemens star. The illumination probes reconstructed using a single-mode algorithm for FZP11 and FZP33 are shown in (a1) and (c1), respectively. Sub-images (b1-b3) and (d1-d3) contain three principal components used to describe temporal evolution of the illumination probes via the orthogonal probe relaxation [21]. Visualization 1 demonstrates the reconstructed temporal evolution of probes in (b1-b3,d1-d3) and its corresponding far-field intensity pattern.
Fig. 8
Fig. 8 Reconstruction quality comparison for a spokes test sample for different levels of wavefront modulation and sampling. Plots (a-c) show reconstructions for detector pixels binning of 1×1, 2×2 and 4×4 pixels respectively.

Tables (5)

Tables Icon

Table 1 Summary of the design parameters for the tested FZPs. The characteristic spatial frequency is denoted by ka [μm−1] and the maximal amplitude difference of the FZP modulations by ‖ΔΦ‖ [rad].

Tables Icon

Table 2 Root mean squared (RMS) value of the phase in air

Tables Icon

Table 3 Average number of phase residues [62] in each reconstruction

Tables Icon

Table 4 Relative variation of the local dose, defined in Eq. (3)

Tables Icon

Table 5 Reciprocal space roughness defined in Eq. (4) normalized by value of the FZP11.

Equations (5)

Equations on this page are rendered with MathJax. Learn more.

Φ ( x ) = [ Δ X DVF ( x ) + Δ Y DVF ( x ) ] / w ( x )
R I I D ( R ) = 0 R 0 2 π | P f ( r , ψ ) | 2 d ψ r d r
I tot ( x ) = i | P ( x + x i ) | 2 ,
R = k [ ( k x | P d | ) 2 + ( k y | P d | ) 2 ] ,
χ 2 ( α ) = lim α 0 k [ | P d | ( k ) | P d | ( k + α k x k x ) ] 2 = α 2 k ( k x | P d | ) 2 .

Metrics